WO2006103722A1 - 回路遮断器および熱動式引き外し装置 - Google Patents
回路遮断器および熱動式引き外し装置 Download PDFInfo
- Publication number
- WO2006103722A1 WO2006103722A1 PCT/JP2005/005562 JP2005005562W WO2006103722A1 WO 2006103722 A1 WO2006103722 A1 WO 2006103722A1 JP 2005005562 W JP2005005562 W JP 2005005562W WO 2006103722 A1 WO2006103722 A1 WO 2006103722A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- bimetal
- temperature measuring
- heater
- fixed
- circuit breaker
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H71/00—Details of the protective switches or relays covered by groups H01H73/00 - H01H83/00
- H01H71/10—Operating or release mechanisms
- H01H71/12—Automatic release mechanisms with or without manual release
- H01H71/14—Electrothermal mechanisms
- H01H71/16—Electrothermal mechanisms with bimetal element
- H01H71/164—Heating elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H69/00—Apparatus or processes for the manufacture of emergency protective devices
- H01H69/01—Apparatus or processes for the manufacture of emergency protective devices for calibrating or setting of devices to function under predetermined conditions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H11/00—Apparatus or processes specially adapted for the manufacture of electric switches
- H01H11/0062—Testing or measuring non-electrical properties of switches, e.g. contact velocity
- H01H2011/0068—Testing or measuring non-electrical properties of switches, e.g. contact velocity measuring the temperature of the switch or parts thereof
Definitions
- the fixed end portion of the bimetal whose one end portion is an operating end portion and the other end portion is a fixed end portion is fixed to the fixed terminal in a cantilever manner, and is heated by overcurrent flowing through the fixed terminal.
- a circuit breaker having a thermal trip device that causes the operation end to trip the circuit breaker main body due to the curved bimetal, and a heater serving as a fixed terminal, one end of which is an operation end The fixed end of the bimetal, the other end of which is a fixed end, is fixed to the heater in a cantilever manner, and when the heater is overheated by energization, the operating end of the bimetal is bent.
- the present invention relates to a dynamic tripping device.
- a thermal trip device is a device that detects, for example, an overcurrent in a circuit breaker and trips the main circuit of the circuit breaker body, and is a tripping feature when the overcurrent flows.
- the range of properties is defined by standards such as JIS (Japanese Industrial Standard), which is a Japanese industrial standard, and products must satisfy that range.
- JIS Japanese Industrial Standard
- a structure for adjusting the tripping characteristics is usually incorporated, and the characteristics are adjusted for inspection.
- Non-contact temperature measurement in the non-contact temperature measurement method, a radiation thermometer incorporating an infrared absorption element is generally used.
- Non-contact temperature measurement in a conventional thermal tripping device of a circuit breaker heats the bimetal so that the bimetal temperature can be measured with a non-contact thermometer, as seen in Patent Document 1, for example.
- the heater is equipped with a measurement window, and the temperature of the bimetal is measured with a radiation thermometer from the direction perpendicular to the bimetal surface through the window.
- Patent Document 1 US Pat. No. 5,317,471 specification and drawings
- a non-contact temperature measurement method using a non-contact thermometer is desirable, but there is a way of thinking, but since the bimetal surface is usually a metallic glossy surface, contact temperature measurement using a contact thermometer is recommended. There is a problem that accurate temperature measurement is difficult compared to the regular method.
- the earth leakage breaker incorporating the earth leakage detection circuit and the circuit breaker downsized there are few gaps around the bimetal, so there are many shields and the direction perpendicular to the bimetal surface by the non-contact thermometer. It is often difficult to measure the bimetal surface temperature from the outside.
- the present invention has been made in view of the above circumstances, and is provided with a circuit breaker including a thermal trip device that does not affect trip characteristics even when a contact thermometer is used, and a thermal breaker.
- the purpose is to provide a dynamic trip device.
- one end portion is an operating end portion and the other end portion is a fixed end portion.
- the fixed end portion of the bimetal is fixed to the fixed terminal in a cantilever manner, and the fixed terminal is
- the bimeter is connected to the fixed terminal.
- a temperature measuring member is attached to the fixed part with a contact temperature measuring device.
- the bimetal and the fixed terminal force are directly connected to each other so as to be exposed, and the contact-type temperature measuring device is brought into contact with the temperature measuring member without directly contacting the nanometal. Since the temperature of the bimetal can be measured, the temperature of the bimetal can be measured without affecting the trip characteristics.
- the thermal tripping device provides a heater serving as a fixed terminal, and the fixed end of the bimetal whose one end is an operating end and the other end is a fixed end is cantilevered.
- a temperature measuring member is attached to the fixing portion of the bimetal to the heater.
- the bimetal and the heater force are also directly connected so that the contact-type temperature measuring device can be contacted, and the temperature is measured without bringing the contact-type temperature measuring device into direct contact with the bimetal. Since the temperature of the nanometal can be measured in contact with the measurement member, the temperature of the bimetal can be measured without affecting the tripping characteristics.
- the fixed end of the bimetal whose one end is an operating end and the other end is a fixed end is fixed to the heater in a cantilever manner, Thermal tripping, where the working end of the bimetal bends when overheated by energizing
- a temperature measuring member is directly coupled to the fixing portion of the bimetal to the heater so that the bimetal and the heater case are exposed so that a contact temperature measuring device can be contacted. Therefore, the temperature of the bimetal can be measured by bringing the contact-type temperature measuring device into contact with the temperature measuring member without directly contacting the bimetal, and thus the temperature of the bimetal can be measured without affecting the tripping characteristics.
- a contact-type temperature measurement method is used, temperature measurement with higher accuracy is possible than when a non-contact temperature measurement method using a non-contact thermometer is used.
- the time from the start of overcurrent to the trip is defined by JIS standards and the like, and the product trip time must satisfy the range.
- the operating point of the trip mechanism i.e., the position where the bimetal 2 pushes the trip bar 3 varies due to the accumulation of manufacturing variations such as machining errors of assembly parts, material characteristics variations, etc. of each part constituting the trip mechanism. It varies in the time (trip time) from the start of energization to the trip. Will occur. Therefore, in order to absorb such manufacturing variations, an adjustment mechanism 6 is provided at the tip of the bimetal 2 and the trip bar 3 to perform adjustment and inspection work in the assembly process.
- the temperature can be measured at a portion where the metal 2 is bent to push the trip bar 3, that is, at a location different from the operating end 21.
- This makes it possible to measure the temperature with a contact-type thermometer without affecting the amount of bending of the operating end 21 of the bimetal 2. Therefore, the temperature can be measured with higher accuracy and stability than with a conventional non-contact-type thermometer. .
- the fixed end 22 of the bimetal whose one end is the operating end 21 and the other end is the fixed end 22 is fixed to the fixed terminal (that is, the heater) 1 in a cantilevered manner.
- the temperature of the operating end 21 is slightly lower than the temperature of the fixed end 22 fixed to the terminal (ie, heater) 1.
- the temperature of the fixed end 22 is measured.
- the desired amount of bending of the operating end 21 of the bimetal 2 at that temperature can be obtained.
- the standard temperature of the fixed end 22 when the working end 21 of the bimetal 2 has the desired amount of bending should be obtained. Can do.
- the working end 21 of the bimetal 2 has the desired amount of bending (that is, when the amount of bending that causes the circuit breaker to trip is reached, or when the circuit breaker trips) If the measured temperature at the end 22 is the same as the standard temperature, it can be said that the tripping characteristic of the thermal tripping device is a predetermined tripping characteristic.
- the temperature measuring member 7 by adding a part having a temperature equivalent to the temperature of the fixed end part 22 of the nanometal 2, that is, the temperature measuring member 7, this added temperature measuring part is added.
- the temperature of the fixed end 22 of the bimetal 2 can be measured.
- the temperature of the bimetal 2 is indirectly measured by measuring the temperature of the temperature measuring member 7 by bringing the probe 81 of the contact thermometer 8 into contact with the temperature measuring member 7. Can be measured.
- the temperature measuring member 7 is connected to the fixing portion 221 of the bimetal 2 to the fixed terminal (ie, heater) 1 as shown in FIGS. 2 to 4.
- Contact type In order to be able to contact the measuring element 81 of the temperature measuring device 8, it is directly coupled integrally with the bimetal 2 and the fixed terminal (ie, heater) 1 so as to be exposed. That is, as shown in the drawing, the entire area of the temperature measuring member 7 is larger than the area of the portion of the temperature measuring member 7 facing the fixed terminal (ie, heater) 1.
- the tripping characteristic is inspected by the thermal tripping device shown in FIGS. 2 to 5 alone, or the thermal tripping device is incorporated in the circuit breaker as shown in FIG.
- the thermal tripping device is incorporated in the circuit breaker as shown in FIG.
- the temperature measuring member 7 bends like a chain line in the same direction as the operating end 21 of the bimetal 2.
- the temperature measuring member 7 is made of the same material as the bimetal 2 (that is, when the bimetal 2 is a bonding material of iron and copper, the temperature measuring member 7 is also iron and copper).
- the temperature measuring member 7 is shorter than the length of the bimetal 2, and the operating end 21 and the temperature measuring member 7 of the bimetal 2 are Even if it bends like a chain line, the amount of bending of the temperature measuring member 7 is smaller than the amount of bending of the operating end 21 of the bimetal 2, so the tip of the temperature measuring member 7 and the operating end of the bimetal 2 There is a slight gap g between the part 21 and the part 21. Therefore, the temperature measuring member 7 does not come into contact with and press against the operating end 21 of the bimetal 2 due to its bending, and adversely affects the bending amount of the operating end 21 of the bimetal 2. There is no.
- FIGS. 6 is a perspective view showing the thermal tripping device
- FIG. 7 is a side view showing the thermal tripping device
- FIG. 8 is for explaining the bimetal bending operation when the fixed terminal (ie, the heater) is energized.
- FIG. 6 is a perspective view showing the thermal tripping device
- FIG. 7 is a side view showing the thermal tripping device
- FIG. 8 is for explaining the bimetal bending operation when the fixed terminal (ie, the heater) is energized.
- the temperature measuring member 7 is opposite to the working end 21 of the bimetal from the fixing portion 221 of the bimetal 2. This is an example of extending to the side!
- the temperature measuring member 7 is formed by extending the bimetal 2 itself to the side opposite to the operating end 21.
- the temperature measuring member 7 is configured so that the contact temperature measuring device 8 can be brought into contact with the fixing portion 221 of the bimetal 2 to the fixed terminal (that is, the heater) 1. That is, it is directly coupled integrally to the state exposed from the heater 1, and extends from the fixed portion 221 of the bimetal 2 to the side opposite to the operating end 21 of the bimetal.
- the tip of the probe 81 of the contact-type temperature measuring device 8 is brought into contact with the lower surface of the temperature measuring member 7 to By measuring the temperature of the measuring member 7, the temperature of the bimetal 2 is indirectly measured.
- the temperature measuring member 7 is curved as indicated by a dashed-dotted line by applying a current corresponding to a predetermined overcurrent to the fixed terminal (that is, the heater) 1. Even so, a slight force gap G is generated between the tip of the temperature measuring member 7 and the fixed terminal (ie, heater) 1. Therefore, when the temperature measuring member 7 comes into contact with the fixed terminal (ie, heater) 1 due to its curvature, no force is applied to the fixed end 22 of the bimetal 2, and the operation of the bimetal 2 is performed. There is no adverse effect on the bending amount of the end 21.
- Embodiment 3 of the present invention as shown in FIG. 9, a probe having a diameter larger than the diameter of the probe 81 of the contact-type temperature measuring device 8 is inserted into the fixed terminal (ie, heater) 1.
- An insertion through hole 12a is provided, and the measurement element 81 is inserted into the measurement element insertion through hole 12a so as not to contact the fixed terminal (that is, the heater) 1, and the tip of the measurement element 81 is inserted into the warm temperature.
- the part 12 is provided with the probe insertion through hole 12a.
- the third embodiment of the present invention has a structure in which the internal terminal portion 12 extends long to the inside of the circuit breaker main body, and the internal portion of the circuit breaker main body from the measuring element insertion through hole 12a. Connected to the connection terminal (not shown) inside the circuit breaker body, provided with a connection hole 12b that connects to the connection terminal (not shown) inside the circuit breaker body. Can be easily performed.
- FIG. 1 is a side view showing a mechanism part in a case of a circuit breaker having a thermal tripping device, showing Embodiment 1 of the present invention.
- FIG. 2 is a diagram showing the first embodiment of the present invention, and is an enlarged perspective view showing the thermal tripping device of FIG. 1.
- FIG. 2 is a diagram showing the first embodiment of the present invention, and is an enlarged perspective view showing the thermal tripping device of FIG. 1.
- FIG. 3 is a diagram showing the first embodiment of the present invention, and is an enlarged side view showing the thermal tripping device of FIG. 1.
- FIG. 3 is a diagram showing the first embodiment of the present invention, and is an enlarged side view showing the thermal tripping device of FIG. 1.
- FIG. 4 shows the first embodiment of the present invention, and is a perspective view for explaining how to measure the bimetal temperature with a contact-type temperature measuring device.
- FIG. 9 A view showing the third embodiment of the present invention and a side view showing the thermal tripping device.
- ⁇ 10] A diagram showing the fourth embodiment of the present invention and showing the thermal tripping device.
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Breakers (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2005/005562 WO2006103722A1 (ja) | 2005-03-25 | 2005-03-25 | 回路遮断器および熱動式引き外し装置 |
EP05721489A EP1863057B1 (en) | 2005-03-25 | 2005-03-25 | Circuit breaker and thermal trip |
JP2007510253A JP4399498B2 (ja) | 2005-03-25 | 2005-03-25 | 回路遮断器および熱動式引き外し装置 |
CN2005800492537A CN101147224B (zh) | 2005-03-25 | 2005-03-25 | 电路断路器及热动式跳闸装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2005/005562 WO2006103722A1 (ja) | 2005-03-25 | 2005-03-25 | 回路遮断器および熱動式引き外し装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006103722A1 true WO2006103722A1 (ja) | 2006-10-05 |
Family
ID=37052995
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/005562 WO2006103722A1 (ja) | 2005-03-25 | 2005-03-25 | 回路遮断器および熱動式引き外し装置 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1863057B1 (ja) |
JP (1) | JP4399498B2 (ja) |
CN (1) | CN101147224B (ja) |
WO (1) | WO2006103722A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5405971B2 (ja) * | 2008-11-07 | 2014-02-05 | 三菱電機株式会社 | 回路遮断器 |
JP5595225B2 (ja) * | 2010-10-29 | 2014-09-24 | 三菱電機株式会社 | 回路遮断器 |
KR20120004922U (ko) * | 2010-12-28 | 2012-07-06 | 엘에스산전 주식회사 | 배선용 차단기의 바이메탈 조립체 |
JP5419939B2 (ja) * | 2011-09-12 | 2014-02-19 | 三菱電機株式会社 | 過電流引き外し装置および回路遮断器 |
CN109148230A (zh) * | 2018-10-15 | 2019-01-04 | 浙江天正电气股份有限公司 | 一种万能式断路器 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5317471A (en) * | 1991-11-13 | 1994-05-31 | Gerin Merlin | Process and device for setting a thermal trip device with bimetal strip |
JP2002324473A (ja) * | 2001-04-24 | 2002-11-08 | Matsushita Electric Works Ltd | 回路遮断器とその調整方法及び調整装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6466424B1 (en) * | 1999-12-29 | 2002-10-15 | General Electric Company | Circuit protective device with temperature sensing |
-
2005
- 2005-03-25 CN CN2005800492537A patent/CN101147224B/zh not_active Expired - Fee Related
- 2005-03-25 EP EP05721489A patent/EP1863057B1/en not_active Expired - Fee Related
- 2005-03-25 WO PCT/JP2005/005562 patent/WO2006103722A1/ja not_active Application Discontinuation
- 2005-03-25 JP JP2007510253A patent/JP4399498B2/ja not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5317471A (en) * | 1991-11-13 | 1994-05-31 | Gerin Merlin | Process and device for setting a thermal trip device with bimetal strip |
JP2002324473A (ja) * | 2001-04-24 | 2002-11-08 | Matsushita Electric Works Ltd | 回路遮断器とその調整方法及び調整装置 |
Non-Patent Citations (1)
Title |
---|
See also references of EP1863057A4 * |
Also Published As
Publication number | Publication date |
---|---|
JPWO2006103722A1 (ja) | 2008-09-04 |
EP1863057A4 (en) | 2009-10-21 |
EP1863057A1 (en) | 2007-12-05 |
CN101147224B (zh) | 2010-06-16 |
CN101147224A (zh) | 2008-03-19 |
EP1863057B1 (en) | 2011-09-14 |
JP4399498B2 (ja) | 2010-01-13 |
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