EP1789990A4 - Fragmentation par impulsion a valeur q elevee dans des pieges a ions - Google Patents

Fragmentation par impulsion a valeur q elevee dans des pieges a ions

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Publication number
EP1789990A4
EP1789990A4 EP05796150A EP05796150A EP1789990A4 EP 1789990 A4 EP1789990 A4 EP 1789990A4 EP 05796150 A EP05796150 A EP 05796150A EP 05796150 A EP05796150 A EP 05796150A EP 1789990 A4 EP1789990 A4 EP 1789990A4
Authority
EP
European Patent Office
Prior art keywords
ion
ions
mass
ion trap
trapping
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP05796150A
Other languages
German (de)
English (en)
Other versions
EP1789990B1 (fr
EP1789990A1 (fr
Inventor
Jae C Schwartz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Finnigan LLC
Original Assignee
Thermo Finnigan LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/941,653 external-priority patent/US6949743B1/en
Application filed by Thermo Finnigan LLC filed Critical Thermo Finnigan LLC
Publication of EP1789990A1 publication Critical patent/EP1789990A1/fr
Publication of EP1789990A4 publication Critical patent/EP1789990A4/fr
Application granted granted Critical
Publication of EP1789990B1 publication Critical patent/EP1789990B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0063—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by applying a resonant excitation voltage

Definitions

  • the present invention relates generally to mass spectrometry, and more specifically to the use of ion traps for multistage (MS/MS) mass spectrometry.
  • MS/MS typically involves fragmentation of an ion or ions of interest in order to obtain detailed information regarding the ion's structure.
  • MS/MS typically involves fragmentation of an ion or ions of interest in order to obtain detailed information regarding the ion's structure.
  • the most efficient and widely used method involves a resonance excitation process.
  • This method utilizes an auxiliary alternating current voltage (AC) to be applied to the ion trap in addition to the main trapping voltage.
  • This auxiliary voltage typically has a relatively low amplitude (on the order of 1 Volt (V)) and a duration on the order of tens of milliseconds.
  • the frequency of this auxiliary voltage is chosen to match an ion's frequency of motion, which in turn is determined by the main trapping field amplitude and the ion's mass-to-charge ratio (m/z).
  • m/z mass-to-charge ratio
  • the collisions which occur deposit enough energy into the molecular bonds of the ion in order to cause those bonds to break, and the ion to fragment. If sufficient energy is not deposited into the molecular bonds while the ion's amplitude grows, the ion will simply hit the walls of the trap and be neutralized, or the ion will leave the trap through one of its apertures. Efficient MS/MS requires that this loss mechanism be minimized. Consequently, the parameters which affect the rate at which the ion's amplitude grows, and the energy of the collisions which occur, are important in determining the overall efficiency of fragmentation.
  • Proper selection of the RF trapping voltage amplitude to be applied during the activation process therefore involves consideration of two important parameters that depend on the RF trapping voltage amplitude: first, the frequency of the ion's motion, which in turn determines the kinetic energy of the collisions, and; second, the LMCO.
  • Embodiments of the present invention utilize a high-Q, pulsed fragmentation technique wherein the Q value of ions of interest within an ion trap is initially maintained at an elevated value to promote energetic collisions and consequent fragmentation, and then rapidly lowered to reduce the LMCO and allow observation of low-mass fragments. More specifically, a method for fragmenting ions in an ion trap involves first selecting a set of ions having a mass-to-charge ratio of interest (which may include a single mass-to- charge ratio or a range of mass-to-charge ratios.) The selected set of ions is then placed at a high first value of Q by applying a suitable radio-frequency (RF) trapping voltage to the ion trap.
  • RF radio-frequency
  • the first Q value will preferably be in the range of 0.6-0.85.
  • a resonance excitation voltage pulse is applied at a secular frequency of the selected set of ions, causing the ions to collide at high energy with neutral molecules and other ions present within the ion trap, which will result in the fragmentation of at least a portion of the selected ions.
  • the resonance excitation voltage pulse will preferably have an amplitude that is significantly higher (typically by a factor of 5-20) relative to typical resonance excitation voltages used in prior art techniques.
  • the RF trapping voltage applied to the ion trap is reduced to lower the Q to a second value (typically around 0.1 or lower), which in turn lowers the LMCO.
  • the resonance excitation voltage pulse and high-Q delay periods are selected such that the RF trapping voltage can be reduced sufficiently rapidly to prevent or minimize the loss of low-mass fragments, thereby allowing their subsequent detection and measurement.
  • Typical resonance excitation voltage pulse and high-Q delay periods are around 100 microseconds ( ⁇ s) and 45-100 ⁇ s, respectively.
  • the high-Q pulsed technique described above offers several substantial advantages over the prior art resonance excitation technique, including the ability to perform fragmentation at high Q values (thereby improving fragmentation efficiencies and/or accessing higher-energy fragmentation processes) while maintaining the effective LMCO at a value sufficiently low to permit detection of fragment ions which would otherwise be unobservable. Further, the technique of the invention allows fragmentation to be completed in a significantly shorter time period relative to the prior art techniques, thus increasing the rate at which MS/MS analyses may be performed. Other advantages of the invention will be apparent to those of ordinary skill in the art upon review of the detailed description and associated figures.
  • FIG. 1 is a schematic depiction of an exemplary ion trap for implementing the ion fragmentation technique of the invention
  • FIG. 2 is a process flowchart depicting the steps of a method for fragmenting ions in an ion trap, shown in conjunction with stability lines demonstrating how each step affects the values of Q of the ions of interest;
  • FIG. 3 is a diagram representing waveforms generated during implementation of the ion fragmentation technique
  • FIG. 4 is a MS/MS spectrum of the compound MRFA produced using the prior art resonance excitation technique
  • FIG. 5 is a corresponding MS/MS spectrum of the compound MRFA produced using the technique embodied in the present invention.
  • FIG. 6 is a MS/MS mass spectrum of the peptide Bradykinin at m/z 1060 produced using the technique embodied in the present invention.
  • FIG. 1 is a simplified schematic of an exemplary ion trap 102 and associated components in which embodiments of the invention maybe implemented.
  • ion trap 102 includes a set of electrodes which bound a containment region 104 in which ions are trapped by generation of an RF trapping field.
  • ions are trapped by generation of an RF trapping field.
  • Those skilled in the art will recognize that certain ion trap geometries may also require a direct current (DC) component to be included in the trapping field.
  • DC direct current
  • ion trap 102 is depicted in the form of a conventional three-dimensional (3-D) ion trap having a ring electrode 106 and entrance and end cap electrodes 108 and 110. Apertures formed in end cap electrodes 108 and 110 and aligned across the Z-axis permit injection and expulsion of ions into and from containment region 104.
  • An RF trapping voltage source 112 coupled to ring electrode 106 (typically via a transformer) supplies an RF- frequency waveform at an adjustable voltage amplitude.
  • a resonance excitation voltage source 114 coupled to end cap electrodes 108 and 110 supplies a resonance excitation voltage pulse at the secular frequency(ies) of a selected ion set in the manner described below to induce activation and fragmentation of ions for subsequent analysis.
  • the resonance excitation voltage source (or alternatively another supplemental voltage source) may also be configured to apply a supplemental waveform across end caps 108 and 110 for the purposes of isolating selected ions by resonance excitation and ejection.
  • Both the RF trapping voltage source 112 and resonance excitation voltage source 114 are preferably placed in electrical communication with a computer 116 or other suitable processor to enable automated control and setting of operational parameters.
  • a computer 116 or other suitable processor to enable automated control and setting of operational parameters.
  • linear ion traps are formed from pairs of opposed elongated electrodes aligned across orthogonal dimensions (the X- and Y-axes). Ions are contained in a region in the interior of the linear ion trap by the application of RF radial trapping voltages to electrode pairs, in combination with the generation of an axial DC field that collects ions in the medial portion of the ion trap.
  • certain of the electrodes are adapted with apertures to allow expulsion of ions therethrough for subsequent detection.
  • the technique is ideally implemented in devices with mainly quadrupole potentials, the technique described here may also have utility in any multipole device including hexapoles, octopoles, and devices with combinations of various multipole fields.
  • a sample containing one or more analyte substances is ionized using any one or combination of ionization techniques known in the art, including without limitation, electron ionization (EI), chemical ionization (CI), matrix-assisted laser desorption ionization (MALDI), and electrospray ionization (ESI).
  • EI electron ionization
  • CI chemical ionization
  • MALDI matrix-assisted laser desorption ionization
  • ESI electrospray ionization
  • a collision gas (also referred to as a damping or cooling gas), composed of an inert gas such as helium or nitrogen, is introduced into the containment region and maintained at a specified pressure.
  • an inert gas such as helium or nitrogen
  • production of fragment ions is accomplished by resonating selected ions in ion trap 102 such that they collide at high velocity with collision gas atoms. A portion of the ions' translational energy is thereby transferred into excited vibrational modes to create an activated ion, which in turn results in breaking of molecular bonds and the dissociation of the selected ion into fragments.
  • the ion fragmentation method includes steps of selecting a set of ions having a mass-to-charge ratio of interest, applying an RP voltage sufficient to place the Q of the selected ion set at a first elevated value (denoted herein as Q 1 ), applying a resonance excitation pulse, removing the resonance excitation pulse and maintaining the ions at the first elevated value for a delay period, and then reducing the RF trapping voltage to lower the Q of the selected ion to a second value (denoted herein as Q 2 ).
  • FIG. 2 depicts a flowchart of method steps together with the corresponding sequence of stability axes (Q axis) representing the changes in the Q value of ions of interest resulting from execution of the various steps of the fragmentation technique.
  • a set of ions having a mass-to-charge ratio of interest is selected for fragmentation.
  • the mass-to-charge ratio may be a single value or a range of values extending between lower and upper limits (including a range that encompasses all ions in ion trap 102).
  • the selection step 202 may (but does not necessarily) include isolating the selected set of ions within trap 102 by expelling ions from the trap having mass-to-charge ratios that lie outside of the mass-to-charge ratio of interest.
  • Isolation of the selected set of ions may be accomplished by employing any one of several resonant expulsion techniques known in the art, including (i) application of a broadband isolation waveform having frequencies corresponding to the secular frequencies, and (ii) application of an isolation waveform having a single frequency with scanning of the trapping RF voltage such that the resonance frequencies of the undesirable ions are successively matched to the frequency of the isolation waveform.
  • the effect of selection of a set of ions with isolation is represented by stability axes 210 and 212.
  • the first (pre- isolation) stability axis 210 depicts ions having a range of mass-to-charge ratios, including ion 222 having a mass-to charge ratio corresponding to the ratio of interest.
  • the second stability axis shows an isolated ion 222 after the ions having out-of-range mass-to-charge ratios have been expelled.
  • Q may be calculated from ion and field parameters, along with the ion trap geometry parameters, by equations well known in the mass spectrometry art.
  • Q is characterized by the following simplified relation:
  • Vr f is the amplitude of the RF trapping voltage
  • m/z is the mass-to- charge ratio of the selected ion
  • k is a constant that depends on the internal dimensions of ion trap 102 and the frequency of the RF trapping voltage.
  • increasing the RF trapping voltage amplitude produces a proportional increase in Q.
  • raising the Q has the effect of increasing the secular frequency of ion 222, which in turn increases the kinetic energy possessed by the ion during the subsequent resonance excitation process by the square of the secular frequency.
  • the target Q value of the selected ion set (Q 1 ) will lie in the range of 0.4- 0.89, and more particularly in the range of 0.55-0.70.. It should be recognized that while higher values of Q 1 will produce more energetic collisions, setting Q 1 at values closely approaching the instability limit of 0.908 may cause substantial numbers of the selected ions to be expelled from the ion trap.
  • the change in the value of Q is represented in the stability line 216 in FIG. 2 by the rightward shift of ion 222.
  • the RF trapping voltage may simply be initially set at an amplitude sufficient to bring the Q to the elevated value Q 1 , which would remove the need to increase the RF trapping voltage per step 204.
  • a resonance excitation pulse is applied to the appropriate ion trap electrodes, for example, end cap electrodes 108 and 110 of ion trap 102.
  • the resonance excitation pulse is a signal containing a frequency which corresponds to a secular frequency of the selected ion set at the elevated Q 1 . Exact correspondence between the frequency(ies) of the resonance excitation pulse and the secular frequency(ies) of the selected ion set is not necessarily required. The two frequencies need only match sufficiently closely to enable excitation of the selected ions.
  • a range of frequencies can be utilized, which may be particularly useful if the selected ion set includes ions having a range of mass-to- charge ratios, which correspond to a range of secular frequencies (noting that secular frequency depends on mass-to-charge ratio.)
  • the resonance excitation pulse signal may be composed of a plurality of different frequencies (which may take the form of a continuous range of frequencies or plural discrete frequencies), wherein component frequencies correspond to at least one of the secular frequencies of the ion set.
  • the resonance excitation pulse signal may be implemented as a DC or quasi-DC pulse constituting a broad range of component frequencies, at least one of which corresponds to a secular frequency of the selected ion set.
  • the resonance excitation pulse signal may include only a single frequency, and the RF trapping voltage and/or the single frequency excitation itself may be scanned during the application of the resonance excitation pulse so that the secular frequencies of ions having different mass-to-charge ratios (noting that the secular frequencies depend in part on the RF trapping voltage amplitude) are successively matched to the resonance excitation pulse.
  • the resonance excitation pulse signal is characterized by the parameters of pulse amplitude and pulse duration (referred to herein as t pulse ). Optimization of these parameters for a particular instrument environment and for a specific analysis will depend on other parameters and conditions, including Q 1 , ion trap 102 configuration, the mass-to-charge ratio and molecular bond strengths of the selected ions, degree of fragmentation required, fragmentation cycle times, ion population, and collision gas pressure. A general performance consideration is that the chosen pulse amplitude and pulse duration values should be sufficiently great to yield efficient fragmentation but not so great as to cause expulsion from ion trap 102 of the selected ion set or of the ion fragments to be observed.
  • the pulse amplitude and pulse duration parameters are functionally related, in that increased excitation may be obtained by either lengthening the pulse duration or increasing the pulse amplitude, since either action results in greater ion kinetic energy.
  • the resonance excitation pulse amplitude will be in the range of 10-20 Volts (peak-to-peak) for selected ions at m/z near 1000, and the pulse duration will be in the range of 0.25-1000 ⁇ s with a typical value of 100 ⁇ s.
  • the pulse amplitude values can be related to the m/z of the selected ions (e.g. proportionally), i.e., pulse amplitude values will be generally higher for selected ions having relatively greater mass-to-charge ratios.
  • Application of the resonance excitation pulse to the ion trap electrodes generates a supplemental field having a frequency matched to a secular frequency of the selected ion set.
  • the supplemental field causes the oscillations of the ions of the selected ion set to increase in amplitude and a corresponding increase in the ions' kinetic energy, which grows progressively larger as the pulse is applied.
  • some fraction of the kinetic energy of any collisions with atoms of collision gas (e.g., helium atoms) or with other ions is converted to internal energy of the ions. If enough energy is deposited into an ion, fragmentation will occur at some time thereafter.
  • the efficiency of ion fragmentation along with the type of fragmentation which occurs can vary with increasing kinetic energy.
  • the ion fragments produced by collision induced dissociation of the selected ions will have a range of mass-to-charge ratios. Those ions having a mass-to- charge ratio below a LMCO value will develop unstable trajectories and will be expelled or otherwise lost from ion trap 102 and hence cannot be observed during a subsequent scan.
  • the LMCO of observable ion fragments is proportional to the Q value. If Q were to be maintained at a relatively high value, then the LMCO would have an unacceptably high value.
  • step 208 the RF trapping voltage is reduced to decrease Q to a target value Q 2 .
  • this step is executed sufficiently rapidly, decreasing the value of Q prevents the expulsion of ion fragments having relatively low mass-to-charge ratios which would occur if Q were maintained at a high value Q 1 (or even at a value of Q typically employed for the prior art resonance excitation technique), thereby extending the mass-to-charge range of observable ion fragments.
  • Q 2 maybe set at around 0.05, which yields an LMCO of 5.5% of the mass-to-charge ratio of the precursor ion, thereby allowing observation of a broad range of ion fragments.
  • the reduction of the value of Q is represented by the leftward shift of selected ion 222 on stability line 222.
  • Ion fragments 224 which include low-mass ion fragments (those ion fragments that have a stable trajectory within ion trap 102 at the reduced value of Q, but which would develop an unstable trajectory and be eliminated from ion trap 102, either via expulsion or by striking internal trap surfaces, if Q were held at the elevated value) are positioned to the left of the instability limit.
  • the timing of the RF trapping voltage and supplemental excitation voltage pulses are preferably selected to provide effective fragmentation while minimizing the numbers of fragments, including low-mass fragments, eliminated from the ion trap. It is recognized that the sequential processes of ion excitation, collision-induced fragmentation, and expulsion of ion fragments require a characteristic time period, which is a function of, inter alia, resonance excitation pulse amplitude, ion trap 102 geometry and configuration, collision gas pressure, RF trapping voltage amplitude, and the mass-to- charge ratio and bond strengths of the selected ion. Referring to FIG.
  • the two time parameters of pulse duration period (t pu i se ) and high-Q delay period (tdeiay) should be selected such that the aggregate time period between initiation of the resonance excitation pulse and the reduction of the value of Q is less than the characteristic time required for ion excitation, fragmentation, and expulsion of low-mass ion fragments. It should be recognized that there normally exists a time between the kinetic excitation of ions and the resultant collision-induced dissociation of ions in which the internal energy localizes in a molecular bond.
  • t de i a y will be in the range of 1-1000 ⁇ s, such as 50 ⁇ s.
  • the transition from the higher to lower RF trapping voltage is not instantaneous, but instead occurs over a non-zero transition period. This transition period should be taken into account when setting tdeiay to ensure that the Q is dropped sufficiently rapidly to avoid expulsion of ion fragments of interest.
  • the aggregate time associated with the ion excitation process using the pulsed technique of the invention is considerably shorter than the time required to complete the ion excitation process by the prior art technique; the present technique typically requires less than 1 millisecond, whereas ion excitation times for the prior art technique are typically on the order of 10-30 milliseconds.
  • a mass spectrum of the ions held in the ion trap (which includes ion fragments having mass-to-charge ratios below the LMCO for Q 1 ) may be obtained by using a standard mass-selective instability scan.
  • one or more of the ions may be selected for further analysis (e.g., by isolating the selected ion fragments using a conventional resonance expulsion technique) and subjected to another stage of fragmentation using the technique of the invention.
  • the technique outlined above may be utilized for MS/MS analysis of a variety of molecules, but may be particularly useful for analysis of large biological molecules such as peptides and proteins, or for analysis of molecules having high bond strengths that make them difficult to fragment.
  • FIGS. 4 and 5 depict mass spectra obtained for the peptide MRFA using the prior art resonance excitation technique and the high-Q pulsed technique described above using a two dimensional linear ion trap.
  • FIG. 4 shows the mass spectra for MRFA having m/z of 524.3 obtained by employing the prior art technique, with Q set at the typical (compromise) value of 0.25. As can be discerned in the low mass portion of the spectrum depicted on the right, no fragment ions below a mass-to-charge ratio of 144 are observed.
  • FIG. 5 shows results obtained using an implementation of the high-Q pulsed technique.
  • the elevated and lowered RF trapping voltage amplitudes were set in order to obtain Q 1 and Q 2 values of about 0.7 and 0.05, respectively.
  • Values for t pulse and t d ei ay were approximately 120 ⁇ s and 50 ⁇ s. Inspection of the low mass portion of the spectrum on the right of FIG. 5 reveals that many fragment ions absent from the FIG. 4 spectrum (extending down to a mass-to-charge ratio of 56) are observed.
  • FIG. 6 shows further results obtained using an implementation of the high-

Abstract

L'invention porte sur un piège à ions (104) d'un spectromètre de masse comprenant une source de tension radioélectrique de piégeage (112) permettant d'appliquer une tension radioélectrique de piégeage sur au moins une pluralité d'une pluralité des électrodes (102, 106, 110) du piège à ions (104) de façon à piéger au moins une partie des ions; une source de tension d'excitation de résonance (114) permettant d'appliquer une impulsion de tension d'excitation de résonance sur les électrodes (102, 106, 110) de sorte qu'au moins une partie de l'ensemble sélectionné des ions soit soumise à des collisions et se brise en fragments; et un ordinateur (116) permettant de commander la source de tension radioélectrique de piégeage (112) afin de réduire la tension radioélectrique de piégeage au bout d'une durée prédéterminée après l'arrêt de l'impulsion de tension d'excitation de résonance à une seconde amplitude de façon à retenir dans le piège à ions (104) des fragments ioniques de faible masse en vue de leur analyse ultérieure.
EP05796150.0A 2004-09-14 2005-09-12 Fragmentation par impulsion à valeur q élevée dans des pièges à ions Active EP1789990B1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/941,653 US6949743B1 (en) 2004-09-14 2004-09-14 High-Q pulsed fragmentation in ion traps
US11/210,555 US7102129B2 (en) 2004-09-14 2005-08-23 High-Q pulsed fragmentation in ion traps
PCT/US2005/032762 WO2006031896A1 (fr) 2004-09-14 2005-09-12 Fragmentation par impulsion a valeur q elevee dans des pieges a ions

Publications (3)

Publication Number Publication Date
EP1789990A1 EP1789990A1 (fr) 2007-05-30
EP1789990A4 true EP1789990A4 (fr) 2008-07-30
EP1789990B1 EP1789990B1 (fr) 2017-12-13

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EP05796150.0A Active EP1789990B1 (fr) 2004-09-14 2005-09-12 Fragmentation par impulsion à valeur q élevée dans des pièges à ions

Country Status (5)

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US (2) US7102129B2 (fr)
EP (1) EP1789990B1 (fr)
JP (1) JP5284642B2 (fr)
CA (1) CA2575209A1 (fr)
WO (1) WO2006031896A1 (fr)

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EP1789990B1 (fr) 2017-12-13
CA2575209A1 (fr) 2006-03-23
JP2008513961A (ja) 2008-05-01
US20070295903A1 (en) 2007-12-27
US20060054808A1 (en) 2006-03-16
EP1789990A1 (fr) 2007-05-30
WO2006031896A1 (fr) 2006-03-23
JP5284642B2 (ja) 2013-09-11
US7528370B2 (en) 2009-05-05
US7102129B2 (en) 2006-09-05

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