EP1775548A3 - Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten - Google Patents

Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten Download PDF

Info

Publication number
EP1775548A3
EP1775548A3 EP06021500A EP06021500A EP1775548A3 EP 1775548 A3 EP1775548 A3 EP 1775548A3 EP 06021500 A EP06021500 A EP 06021500A EP 06021500 A EP06021500 A EP 06021500A EP 1775548 A3 EP1775548 A3 EP 1775548A3
Authority
EP
European Patent Office
Prior art keywords
deformation
objects
detection
phase image
difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP06021500A
Other languages
English (en)
French (fr)
Other versions
EP1775548A2 (de
EP1775548B1 (de
Inventor
Marcus Dr. Steinbichler
Robert Wilhelm
Junli Sun
Rainer Huber
Volker Rasenberger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Optotechnik GmbH
Original Assignee
Steinbichler Optotechnik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Steinbichler Optotechnik GmbH filed Critical Steinbichler Optotechnik GmbH
Publication of EP1775548A2 publication Critical patent/EP1775548A2/de
Publication of EP1775548A3 publication Critical patent/EP1775548A3/de
Application granted granted Critical
Publication of EP1775548B1 publication Critical patent/EP1775548B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02087—Combining two or more images of the same region
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02094—Speckle interferometers, i.e. for detecting changes in speckle pattern
    • G01B9/02095—Speckle interferometers, i.e. for detecting changes in speckle pattern detecting deformation from original shape
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques
    • G01B9/023—Interferometers using holographic techniques for contour producing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Bei einem Verfahren zur Erfassung der Verformung von Objekten (1) wird während der Verformung des Objekts (1) eine Folge von Bildern des Objekts (1) mit einem Meßverfahren aufgenommen. Aus den Bildern werden Phasenbilder ermittelt. Um ein derartiges Verfahren zu verbessern wird die Differenz zwischen dem aktuellen Phasenbild oder dem jeweiligen aktuellen Phasenbild und dem Phasenbild eines Anfangszustands gebildet. Diese Differenz oder diese Differenzen werden ausgewertet und/oder auf einem Bildanzeigegerät dargestellt und/oder gespeichert (Fig. 1).
EP06021500.1A 2005-10-17 2006-10-13 Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten Active EP1775548B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102005049607A DE102005049607A1 (de) 2005-10-17 2005-10-17 Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten

Publications (3)

Publication Number Publication Date
EP1775548A2 EP1775548A2 (de) 2007-04-18
EP1775548A3 true EP1775548A3 (de) 2009-02-18
EP1775548B1 EP1775548B1 (de) 2019-07-10

Family

ID=37649344

Family Applications (1)

Application Number Title Priority Date Filing Date
EP06021500.1A Active EP1775548B1 (de) 2005-10-17 2006-10-13 Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten

Country Status (4)

Country Link
US (1) US7860297B2 (de)
EP (1) EP1775548B1 (de)
DE (1) DE102005049607A1 (de)
HU (1) HUE045336T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2194836B1 (de) 2007-09-25 2015-11-04 Perception Raisonnement Action En Medecine Gerät zur unterstützung von diagnostischen und therapeutischen verfahren in knorpel
US8704890B2 (en) * 2010-08-19 2014-04-22 Olympus Corporation Inspection apparatus and measuring method
GB2544727A (en) * 2015-11-16 2017-05-31 Optonor As Optical interferometry
US20180052444A1 (en) * 2016-08-18 2018-02-22 General Electric Company Component deformation modeling system
US10180403B1 (en) * 2017-06-21 2019-01-15 The Boeing Company Shearography for sub microcellular substrate nondestructive inspection
CN107576275A (zh) * 2017-08-11 2018-01-12 哈尔滨工业大学 一种利用摄影测量技术对充气结构进行应变场测量的方法
CN110108221B (zh) * 2018-02-01 2022-06-07 卡尔蔡司光电科技有限责任公司 用于通过干涉法来测试轮胎的方法
US10962419B2 (en) * 2019-04-09 2021-03-30 Carl Zeiss Optotechnik GmbH Method for testing a tire by interferometry
CN114877819A (zh) * 2021-02-05 2022-08-09 苏州汉扬精密电子有限公司 一种产品变形检测系统及方法
DE102022106813A1 (de) 2022-03-23 2023-09-28 Italmatic Srl Prüfgerät, insbesondere Reifenprüfgerät
CN116797648A (zh) * 2023-06-08 2023-09-22 深圳市海塞姆科技有限公司 材料变形过程的宽度测量方法、装置、设备、系统及介质

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5467184A (en) * 1992-09-09 1995-11-14 Agency Of Industrial Science & Technology Method of large deformation measurement using speckle interferometry
EP1014036A2 (de) * 1998-12-23 2000-06-28 Stefan Dengler Vorrichtung und Verfahren zur Objektuntersuchung
EP1030161A1 (de) * 1999-02-18 2000-08-23 Bernward Mähner Phasendifferenzbild mit Tiefpassfilterung und Grauwertverschiebung
EP1215465A1 (de) * 2000-11-29 2002-06-19 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4850693A (en) * 1988-05-23 1989-07-25 The United States Of America As Represented By The United States Department Of Energy Compact portable diffraction moire interferometer
DE3930632A1 (de) * 1989-09-13 1991-03-14 Steinbichler Hans Verfahren zur direkten phasenmessung von strahlung, insbesondere lichtstrahlung, und vorrichtung zur durchfuehrung dieses verfahrens

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5467184A (en) * 1992-09-09 1995-11-14 Agency Of Industrial Science & Technology Method of large deformation measurement using speckle interferometry
EP1014036A2 (de) * 1998-12-23 2000-06-28 Stefan Dengler Vorrichtung und Verfahren zur Objektuntersuchung
EP1030161A1 (de) * 1999-02-18 2000-08-23 Bernward Mähner Phasendifferenzbild mit Tiefpassfilterung und Grauwertverschiebung
EP1215465A1 (de) * 2000-11-29 2002-06-19 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten

Also Published As

Publication number Publication date
US20070121121A1 (en) 2007-05-31
DE102005049607A1 (de) 2007-04-19
HUE045336T2 (hu) 2019-12-30
EP1775548A2 (de) 2007-04-18
EP1775548B1 (de) 2019-07-10
US7860297B2 (en) 2010-12-28

Similar Documents

Publication Publication Date Title
EP1775548A3 (de) Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten
EP1330132A3 (de) Verfahren und Vorrichtunng zur Verdeckungsdetektion bei Bildsensorsystemen
EP1901116A3 (de) Kamerasystems, Verfahren zum Betreiben eines Kamerasystems und Sensoreinrichtung eines Kamerasystems
RU2017111779A (ru) Системы и способы анализа, является ли объект живым
WO2008085377A3 (en) Banding artifact detection in digital video content
JP2008219888A5 (de)
EP3506169A3 (de) Fahrerassistenzsystem und verfahren zur objekterkennung und -benachrichtigung
EP2515101A3 (de) Verfahren zur Planung einer Inspektionsbahn und zur Bestimmung von zu inspizierenden Bereichen
EP1199031A3 (de) Röntgenfreies intravaskuläres Lokalisierungs- und Bildgebungsverfahren
EP3296796A3 (de) Fahrerassistenzvorrichtung für ein fahrzeug und verfahren zur sichtbarmachung der umgebung eines fahrzeuges
EP1148442A3 (de) Röntgenuntersuchungsgerät und Verfahren zur Erzeugung eines Röntgenbildes
EP1440856A3 (de) Verfahren und Vorrichtung zur Sichtverbesserung und zur Bestimmung der Wettersituation
ATE498874T1 (de) Verfahren zum detektieren eines beweglichen objekts in einer sequenz von durch eine bewegliche kamera erfassten bildern, computersystem und computerprogrammprodukt
EP1919197A3 (de) Steuerung für eine elektronische Zeilenkamera
EP0984294A3 (de) Phasenempfindliches Inversions-Rückstellungsverfahren der Magnetresonanzbildgebung
CN114723724A (zh) 基于人工智能的危险品识别方法、装置、设备及存储介质
CN109035162B (zh) 一种基于像素重构的图片漂移校正方法及系统
JP2003506908A (ja) シーン変化の識別方法およびそのための監視装置
TW201028960A (en) Filter design method, apparatus and image restoration method and apparatus using the filter
EP2418846A3 (de) Verfahren und Vorrichtung zur korrigierten radiometrischen Messung von Objektpunkten auf Oberflächen von Himmelskörpern
JP2002218452A (ja) 移動体の監視方法および装置
CN109087378A (zh) 图像处理方法及系统
EP1160725A3 (de) Bildaufnehmer und Bildaufnahmeverfahren, insbesondere zur dreidimensionalen Erfassung von Objekten oder Szenen
JP7246363B2 (ja) 情報処理装置、情報処理方法、及びプログラム
EP1122742A3 (de) Verfahren zum Testen der Refresheinrichtung eines Informationsspeichers

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL BA HR MK YU

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL BA HR MK RS

RIC1 Information provided on ipc code assigned before grant

Ipc: G01B 9/023 20060101ALI20090115BHEP

Ipc: G01B 11/25 20060101ALI20090115BHEP

Ipc: G01B 11/16 20060101AFI20070123BHEP

Ipc: G01B 9/02 20060101ALI20090115BHEP

17P Request for examination filed

Effective date: 20090504

17Q First examination report despatched

Effective date: 20090608

AKX Designation fees paid

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: EXAMINATION IS IN PROGRESS

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: CARL ZEISS OPTOTECHNIK GMBH

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: GRANT OF PATENT IS INTENDED

INTG Intention to grant announced

Effective date: 20181221

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE PATENT HAS BEEN GRANTED

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

REG Reference to a national code

Ref country code: GB

Ref legal event code: FG4D

Free format text: NOT ENGLISH

REG Reference to a national code

Ref country code: CH

Ref legal event code: EP

Ref country code: AT

Ref legal event code: REF

Ref document number: 1154055

Country of ref document: AT

Kind code of ref document: T

Effective date: 20190715

REG Reference to a national code

Ref country code: DE

Ref legal event code: R096

Ref document number: 502006016299

Country of ref document: DE

REG Reference to a national code

Ref country code: IE

Ref legal event code: FG4D

Free format text: LANGUAGE OF EP DOCUMENT: GERMAN

REG Reference to a national code

Ref country code: NL

Ref legal event code: FP

REG Reference to a national code

Ref country code: LT

Ref legal event code: MG4D

REG Reference to a national code

Ref country code: HU

Ref legal event code: AG4A

Ref document number: E045336

Country of ref document: HU

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191111

Ref country code: LT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

Ref country code: BG

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191010

Ref country code: FI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

Ref country code: SE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LV

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191011

Ref country code: IS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191110

Ref country code: ES

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: TR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: EE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

Ref country code: RO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

Ref country code: PL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20200224

Ref country code: MC

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

Ref country code: CZ

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

Ref country code: SK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

REG Reference to a national code

Ref country code: CH

Ref legal event code: PL

REG Reference to a national code

Ref country code: DE

Ref legal event code: R097

Ref document number: 502006016299

Country of ref document: DE

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

PG2D Information on lapse in contracting state deleted

Ref country code: IS

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LI

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20191031

Ref country code: CH

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20191031

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20191013

26N No opposition filed

Effective date: 20200603

REG Reference to a national code

Ref country code: BE

Ref legal event code: MM

Effective date: 20191031

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: BE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20191031

Ref country code: SI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20191013

REG Reference to a national code

Ref country code: AT

Ref legal event code: MM01

Ref document number: 1154055

Country of ref document: AT

Kind code of ref document: T

Effective date: 20191013

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: AT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20191013

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CY

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190710

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: NL

Payment date: 20230216

Year of fee payment: 17

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20230216

Year of fee payment: 17

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: IT

Payment date: 20230223

Year of fee payment: 17

Ref country code: HU

Payment date: 20230213

Year of fee payment: 17

Ref country code: GB

Payment date: 20230220

Year of fee payment: 17

Ref country code: DE

Payment date: 20230216

Year of fee payment: 17

REG Reference to a national code

Ref country code: DE

Ref legal event code: R119

Ref document number: 502006016299

Country of ref document: DE

REG Reference to a national code

Ref country code: NL

Ref legal event code: MM

Effective date: 20231101

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20231013

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20231013

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20231101

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20231101

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20231013

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20231031

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20240501

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: HU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20231014