EP1775548A3 - Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten - Google Patents

Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten Download PDF

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Publication number
EP1775548A3
EP1775548A3 EP06021500A EP06021500A EP1775548A3 EP 1775548 A3 EP1775548 A3 EP 1775548A3 EP 06021500 A EP06021500 A EP 06021500A EP 06021500 A EP06021500 A EP 06021500A EP 1775548 A3 EP1775548 A3 EP 1775548A3
Authority
EP
European Patent Office
Prior art keywords
deformation
objects
detection
phase image
difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP06021500A
Other languages
English (en)
French (fr)
Other versions
EP1775548B1 (de
EP1775548A2 (de
Inventor
Marcus Dr. Steinbichler
Robert Wilhelm
Junli Sun
Rainer Huber
Volker Rasenberger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Optotechnik GmbH
Original Assignee
Steinbichler Optotechnik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Steinbichler Optotechnik GmbH filed Critical Steinbichler Optotechnik GmbH
Publication of EP1775548A2 publication Critical patent/EP1775548A2/de
Publication of EP1775548A3 publication Critical patent/EP1775548A3/de
Application granted granted Critical
Publication of EP1775548B1 publication Critical patent/EP1775548B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02087—Combining two or more images of the same region
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02094—Speckle interferometers, i.e. for detecting changes in speckle pattern
    • G01B9/02095—Speckle interferometers, i.e. for detecting changes in speckle pattern detecting deformation from original shape
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques
    • G01B9/023—Interferometers using holographic techniques for contour producing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Bei einem Verfahren zur Erfassung der Verformung von Objekten (1) wird während der Verformung des Objekts (1) eine Folge von Bildern des Objekts (1) mit einem Meßverfahren aufgenommen. Aus den Bildern werden Phasenbilder ermittelt. Um ein derartiges Verfahren zu verbessern wird die Differenz zwischen dem aktuellen Phasenbild oder dem jeweiligen aktuellen Phasenbild und dem Phasenbild eines Anfangszustands gebildet. Diese Differenz oder diese Differenzen werden ausgewertet und/oder auf einem Bildanzeigegerät dargestellt und/oder gespeichert (Fig. 1).
EP06021500.1A 2005-10-17 2006-10-13 Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten Active EP1775548B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102005049607A DE102005049607A1 (de) 2005-10-17 2005-10-17 Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten

Publications (3)

Publication Number Publication Date
EP1775548A2 EP1775548A2 (de) 2007-04-18
EP1775548A3 true EP1775548A3 (de) 2009-02-18
EP1775548B1 EP1775548B1 (de) 2019-07-10

Family

ID=37649344

Family Applications (1)

Application Number Title Priority Date Filing Date
EP06021500.1A Active EP1775548B1 (de) 2005-10-17 2006-10-13 Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten

Country Status (4)

Country Link
US (1) US7860297B2 (de)
EP (1) EP1775548B1 (de)
DE (1) DE102005049607A1 (de)
HU (1) HUE045336T2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009042644A2 (en) 2007-09-25 2009-04-02 Perception Raisonnement Action En Medecine Methods and apparatus for assisting cartilage diagnostic and therapeutic procedures
US8704890B2 (en) * 2010-08-19 2014-04-22 Olympus Corporation Inspection apparatus and measuring method
GB2544727A (en) * 2015-11-16 2017-05-31 Optonor As Optical interferometry
US20180052444A1 (en) * 2016-08-18 2018-02-22 General Electric Company Component deformation modeling system
US10180403B1 (en) * 2017-06-21 2019-01-15 The Boeing Company Shearography for sub microcellular substrate nondestructive inspection
CN107576275A (zh) * 2017-08-11 2018-01-12 哈尔滨工业大学 一种利用摄影测量技术对充气结构进行应变场测量的方法
CN110108221B (zh) * 2018-02-01 2022-06-07 卡尔蔡司光电科技有限责任公司 用于通过干涉法来测试轮胎的方法
US10962419B2 (en) * 2019-04-09 2021-03-30 Carl Zeiss Optotechnik GmbH Method for testing a tire by interferometry
CN114877819A (zh) * 2021-02-05 2022-08-09 苏州汉扬精密电子有限公司 一种产品变形检测系统及方法
DE102022106813A1 (de) 2022-03-23 2023-09-28 Italmatic Srl Prüfgerät, insbesondere Reifenprüfgerät

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5467184A (en) * 1992-09-09 1995-11-14 Agency Of Industrial Science & Technology Method of large deformation measurement using speckle interferometry
EP1014036A2 (de) * 1998-12-23 2000-06-28 Stefan Dengler Vorrichtung und Verfahren zur Objektuntersuchung
EP1030161A1 (de) * 1999-02-18 2000-08-23 Bernward Mähner Phasendifferenzbild mit Tiefpassfilterung und Grauwertverschiebung
EP1215465A1 (de) * 2000-11-29 2002-06-19 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4850693A (en) * 1988-05-23 1989-07-25 The United States Of America As Represented By The United States Department Of Energy Compact portable diffraction moire interferometer
DE3930632A1 (de) * 1989-09-13 1991-03-14 Steinbichler Hans Verfahren zur direkten phasenmessung von strahlung, insbesondere lichtstrahlung, und vorrichtung zur durchfuehrung dieses verfahrens

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5467184A (en) * 1992-09-09 1995-11-14 Agency Of Industrial Science & Technology Method of large deformation measurement using speckle interferometry
EP1014036A2 (de) * 1998-12-23 2000-06-28 Stefan Dengler Vorrichtung und Verfahren zur Objektuntersuchung
EP1030161A1 (de) * 1999-02-18 2000-08-23 Bernward Mähner Phasendifferenzbild mit Tiefpassfilterung und Grauwertverschiebung
EP1215465A1 (de) * 2000-11-29 2002-06-19 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten

Also Published As

Publication number Publication date
US20070121121A1 (en) 2007-05-31
DE102005049607A1 (de) 2007-04-19
US7860297B2 (en) 2010-12-28
EP1775548B1 (de) 2019-07-10
HUE045336T2 (hu) 2019-12-30
EP1775548A2 (de) 2007-04-18

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