EP1775548A3 - Method and device for the detection of the deformation of objects - Google Patents

Method and device for the detection of the deformation of objects Download PDF

Info

Publication number
EP1775548A3
EP1775548A3 EP06021500A EP06021500A EP1775548A3 EP 1775548 A3 EP1775548 A3 EP 1775548A3 EP 06021500 A EP06021500 A EP 06021500A EP 06021500 A EP06021500 A EP 06021500A EP 1775548 A3 EP1775548 A3 EP 1775548A3
Authority
EP
European Patent Office
Prior art keywords
deformation
objects
detection
phase image
difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP06021500A
Other languages
German (de)
French (fr)
Other versions
EP1775548B1 (en
EP1775548A2 (en
Inventor
Marcus Dr. Steinbichler
Robert Wilhelm
Junli Sun
Rainer Huber
Volker Rasenberger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Optotechnik GmbH
Original Assignee
Steinbichler Optotechnik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Steinbichler Optotechnik GmbH filed Critical Steinbichler Optotechnik GmbH
Publication of EP1775548A2 publication Critical patent/EP1775548A2/en
Publication of EP1775548A3 publication Critical patent/EP1775548A3/en
Application granted granted Critical
Publication of EP1775548B1 publication Critical patent/EP1775548B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02087—Combining two or more images of the same region
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02094—Speckle interferometers, i.e. for detecting changes in speckle pattern
    • G01B9/02095—Speckle interferometers, i.e. for detecting changes in speckle pattern detecting deformation from original shape
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques
    • G01B9/023—Interferometers using holographic techniques for contour producing

Abstract

Bei einem Verfahren zur Erfassung der Verformung von Objekten (1) wird während der Verformung des Objekts (1) eine Folge von Bildern des Objekts (1) mit einem Meßverfahren aufgenommen. Aus den Bildern werden Phasenbilder ermittelt. Um ein derartiges Verfahren zu verbessern wird die Differenz zwischen dem aktuellen Phasenbild oder dem jeweiligen aktuellen Phasenbild und dem Phasenbild eines Anfangszustands gebildet. Diese Differenz oder diese Differenzen werden ausgewertet und/oder auf einem Bildanzeigegerät dargestellt und/oder gespeichert (Fig. 1).In a method of detecting the deformation of objects (1), during the deformation of the object (1), a sequence of images of the object (1) is recorded by a measuring method. From the pictures phase images are determined. In order to improve such a method, the difference between the current phase image or the respective current phase image and the phase image of an initial state is formed. This difference or these differences are evaluated and / or displayed on an image display device and / or stored (FIG. 1).

EP06021500.1A 2005-10-17 2006-10-13 Method and device for the detection of the deformation of objects. Active EP1775548B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102005049607A DE102005049607A1 (en) 2005-10-17 2005-10-17 Method and device for detecting the deformation of objects

Publications (3)

Publication Number Publication Date
EP1775548A2 EP1775548A2 (en) 2007-04-18
EP1775548A3 true EP1775548A3 (en) 2009-02-18
EP1775548B1 EP1775548B1 (en) 2019-07-10

Family

ID=37649344

Family Applications (1)

Application Number Title Priority Date Filing Date
EP06021500.1A Active EP1775548B1 (en) 2005-10-17 2006-10-13 Method and device for the detection of the deformation of objects.

Country Status (4)

Country Link
US (1) US7860297B2 (en)
EP (1) EP1775548B1 (en)
DE (1) DE102005049607A1 (en)
HU (1) HUE045336T2 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2194836B1 (en) 2007-09-25 2015-11-04 Perception Raisonnement Action En Medecine Apparatus for assisting cartilage diagnostic and therapeutic procedures
US8704890B2 (en) * 2010-08-19 2014-04-22 Olympus Corporation Inspection apparatus and measuring method
GB2544727A (en) * 2015-11-16 2017-05-31 Optonor As Optical interferometry
US20180052444A1 (en) * 2016-08-18 2018-02-22 General Electric Company Component deformation modeling system
US10180403B1 (en) * 2017-06-21 2019-01-15 The Boeing Company Shearography for sub microcellular substrate nondestructive inspection
CN107576275A (en) * 2017-08-11 2018-01-12 哈尔滨工业大学 A kind of method for carrying out straining field measurement to inflatable structure using photogrammetric technology
CN110108221B (en) * 2018-02-01 2022-06-07 卡尔蔡司光电科技有限责任公司 Method for testing a tyre by interferometry
US10962419B2 (en) * 2019-04-09 2021-03-30 Carl Zeiss Optotechnik GmbH Method for testing a tire by interferometry
CN114877819A (en) * 2021-02-05 2022-08-09 苏州汉扬精密电子有限公司 Product deformation detection system and method
DE102022106813A1 (en) 2022-03-23 2023-09-28 Italmatic Srl Testing device, especially tire testing device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5467184A (en) * 1992-09-09 1995-11-14 Agency Of Industrial Science & Technology Method of large deformation measurement using speckle interferometry
EP1014036A2 (en) * 1998-12-23 2000-06-28 Stefan Dengler Device and procedure to examine an object
EP1030161A1 (en) * 1999-02-18 2000-08-23 Bernward Mähner Phase difference image with low pass filtering and gray scale shifting
EP1215465A1 (en) * 2000-11-29 2002-06-19 Steinbichler Optotechnik Gmbh Method and apparatus for measuring the deformation of objects

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4850693A (en) * 1988-05-23 1989-07-25 The United States Of America As Represented By The United States Department Of Energy Compact portable diffraction moire interferometer
DE3930632A1 (en) * 1989-09-13 1991-03-14 Steinbichler Hans METHOD FOR DIRECT PHASE MEASUREMENT OF RADIATION, IN PARTICULAR LIGHT RADIATION, AND DEVICE FOR CARRYING OUT THIS METHOD

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5467184A (en) * 1992-09-09 1995-11-14 Agency Of Industrial Science & Technology Method of large deformation measurement using speckle interferometry
EP1014036A2 (en) * 1998-12-23 2000-06-28 Stefan Dengler Device and procedure to examine an object
EP1030161A1 (en) * 1999-02-18 2000-08-23 Bernward Mähner Phase difference image with low pass filtering and gray scale shifting
EP1215465A1 (en) * 2000-11-29 2002-06-19 Steinbichler Optotechnik Gmbh Method and apparatus for measuring the deformation of objects

Also Published As

Publication number Publication date
EP1775548B1 (en) 2019-07-10
HUE045336T2 (en) 2019-12-30
EP1775548A2 (en) 2007-04-18
US7860297B2 (en) 2010-12-28
DE102005049607A1 (en) 2007-04-19
US20070121121A1 (en) 2007-05-31

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