EP1639613B1 - Low power consumption bistable microswitch - Google Patents
Low power consumption bistable microswitch Download PDFInfo
- Publication number
- EP1639613B1 EP1639613B1 EP04767860A EP04767860A EP1639613B1 EP 1639613 B1 EP1639613 B1 EP 1639613B1 EP 04767860 A EP04767860 A EP 04767860A EP 04767860 A EP04767860 A EP 04767860A EP 1639613 B1 EP1639613 B1 EP 1639613B1
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- Prior art keywords
- microswitch
- deformed position
- contact
- conductive tracks
- electrical contact
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0036—Switches making use of microelectromechanical systems [MEMS]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0036—Switches making use of microelectromechanical systems [MEMS]
- H01H2001/0042—Bistable switches, i.e. having two stable positions requiring only actuating energy for switching between them, e.g. with snap membrane or by permanent magnet
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H61/00—Electrothermal relays
- H01H2061/006—Micromechanical thermal relay
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H59/00—Electrostatic relays; Electro-adhesion relays
- H01H59/0009—Electrostatic relays; Electro-adhesion relays making use of micromechanics
Definitions
- the present invention relates to a bistable micro-switch, low consumption and horizontal displacement.
- micro-switch is particularly useful in the field of mobile telephony and in the space domain.
- Dual switches have the advantage of obtaining circuits with fewer components (for example 10 redundancy functions require 10 double switches instead of 20 single switches), which means among other things less reliability tests, less assembly, a saving of space and overall a lower cost.
- micro-switches that is, microelectronics
- signal routing impedance matching networks
- gain tuning of amplifiers etc.
- frequency bands of the signals to be switched they can range from a few MHz to several tens of GHz.
- switches from microelectronics are used, which allow integration with the electronics of circuits and which have a low manufacturing cost. In terms of performance, these components are rather limited.
- silicon FET type switches can switch high power signals at low frequencies, but not at high frequencies.
- GaAs Metal Semiconductor Field Effect Transistors (GaAs) or PIN diodes work well at high frequencies, but only for low level signals.
- the ohmic contact There are two types of contact for MEMS microswitches: the ohmic contact and the capacitive contact.
- the ohmic contact switch the two RF tracks are contacted by a short circuit (metal-to-metal contact). This type of contact is suitable for both continuous signals and for high frequency signals (above 10 GHz).
- the capacitive contact switch an air space is electromechanically adjusted to obtain a capacitance variation between the closed state and the open state. This type of contact is particularly well suited to high frequencies (above 10 GHz) but inadequate at low frequencies.
- the thermal actuated micro-switches that can be described as conventional are non-bistable. They offer the advantage of a low operating voltage. They have several drawbacks: excessive consumption (especially in the case of mobile telephony applications), low switching speed (due to thermal inertia) and the need for a supply voltage to maintain contact with closed position.
- the electrostatically actuated micro-switches that can be described as conventional are non-bistable. They offer the advantages of fast switching speed and generally simple technology. They have problems of reliability, this point being particularly sensitive in the case of electrostatic switches with low operating voltage (bonding structures). They also require a supply voltage to maintain contact in the closed position.
- Micro-switches with electromagnetic actuation that can be described as classical are non-bistable. They generally operate on the principle of the electromagnet and essentially use iron-based magnetic circuits and an excitation coil. They have several disadvantages. Their technology is complex (coil, magnetic material, permanent magnet in some cases, etc ). Their consumption is important. They also require a supply voltage to maintain contact in the closed position.
- the contact is made on the side of the tracks.
- This configuration is well suited to double contact, with a symmetrical actuator.
- Metallization "gold" can be done in the very last technological step. All the preceding steps can be compatible with the realization of integrated circuits.
- the shape of the contact is determined during the photolithography step. For example, a rounded contact may be used to make the contact point and thus limit the contact resistance.
- the shape of the beam is determined during the photolithography step. Its stiffness is therefore well controlled.
- the metallization on the flank is delicate. The contact resistance can therefore be poorly controlled. This configuration is unsuitable for electrostatic actuation because of the very small viewing surfaces.
- the number of equilibrium states is another characteristic of the movement of the switches.
- the standard case is one where the actuator has only one state balance. This implies that one of the two states of the switch (switched or non-switched) requires a DC voltage supply for holding in position. Stopping the excitation returns the switch to its equilibrium position.
- the bistable case is the case where the actuator has two distinct equilibrium states.
- the advantage of this mode of operation is that the two positions "closed” and “open” of the switch are stable and do not require power until you switch from one state to another.
- This micro-switch is particularly well suited to the field of mobile telephony and the space domain.
- the subject of the invention is therefore a bistable MEMS micro-switch made on a substrate and capable of electrically connecting the ends of at least two conductive tracks, comprising a beam suspended above the surface of the substrate, the beam being embedded in both ends thereof and being constrained in compression when in an undeformed position, the beam having electrical contact means arranged to provide a lateral connection with the ends of the two conductive tracks upon deformation of the beam in a horizontal direction by relative to the surface of the substrate, the micro-switch having means actuating the beam to place it either in a first deformed position, corresponding to a first stable state, or in a second deformed position, corresponding to a second stable state and opposite to the first deformed position with respect to the undistorted position , the electrical contact means connecting the ends of the two conductive tracks when the beam is in its first deformed position, characterized in that the undeformed position of the beam is the initial position of the beam, that is to say say before commissioning the micro-switch.
- the micro-switch can be a dual micro-switch.
- the first deformed position corresponds to the connection of the ends of two first conductive tracks
- the second deformed position corresponds to the connection of the ends of two second conductive tracks.
- the first deformed position corresponds to the connection of the ends of two conductive tracks
- the second deformed position corresponds to a lack of connection.
- the beam is of dielectric or semiconductor material and the electrical contact means are formed of an electrically conductive pad and secured to the beam.
- the means for actuating the beam may comprise thermal actuators using a bimetallic effect. Each thermal actuator can then comprise a block of thermal conductive material in intimate contact with an electrical resistance.
- the means for actuating the beam may comprise means for implementing forces electrostatic. They may comprise thermal actuators using a bimetallic effect and means for implementing electrostatic forces.
- the beam is made of electrically conductive material.
- the means for actuating the beam may then comprise means for implementing electrostatic forces.
- the electrical contact means may have a shape allowing to fit between the ends of the conductive tracks to be connected.
- the ends of the conductive tracks may have flexibility to match the shape of the electrical contact means during a connection.
- the microswitch may also include relaxation spring means for at least one of the embedded ends of the beam.
- the means forming an electrical contact may be means ensuring an ohmic contact or means providing a capacitive contact.
- FIG. 1 is a view from above of a first variant of a double micro-switch according to the first invention.
- the micro-switch is made on a substrate 1 of which only a portion is represented for the sake of simplification.
- This micro-switch is a double switch. It is intended to make a connection between the ends 12 and 13 of the conductive tracks 2 and 3, or between the ends 14 and 15 of the conductive tracks 4 and 5.
- the micro-switch of FIG. 1 comprises a beam 6 of dielectric or semiconductor material. It is located in the plane of the conductive tracks. The beam is embedded at both ends in raised portions of the substrate 1. It is shown in its initial position and is then subjected to compressive stress. This constraint can be induced by the intrinsic constraints of the materials used to produce the mobile structure of the microswitch, that is to say the beam and the associated elements (actuators).
- the beam shown is of rectangular section. It supports on its face directed towards the tracks 2 and 3 (that is to say on one of its flanks) actuators 20 and 30 and, on its face directed towards the tracks 4 and 5 (that is to say on its other side), actuators 40 and 50.
- the actuators are located near the recess areas of the beam.
- Each actuator consists of a good thermal conductor pad and an electrical resistor.
- the actuator 20 comprises a block 21 which is associated with a resistor 22. The same applies to the other actuators.
- the beam is preferably made of dielectric or semiconductor material with a low coefficient of thermal expansion.
- the pavers of the thermal actuators are preferably made of metal material with a high coefficient of thermal expansion to obtain a bimetallic effect at high efficiency.
- the displacement of the beam being in the horizontal direction (the plane of the figure), the actuators are placed on the sides of the beam and in the vicinity of the recesses, always for the sake of thermomechanical efficiency.
- the beam 6 also supports, in the central part and on its flanks, an electrical contact pad 7, intended to provide an electrical connection of the ohmic type between the ends 12 and 13 of the tracks 2 and 3, and an electrical contact pad 8 between the ends 14 and 15 of the tracks 4 and 5.
- a first set of actuators makes it possible to switch the beam 6 to a position corresponding to one of its two stable states. This is represented by FIG. 2.
- the actuators 40 and 50 which induce a bimetallic effect in the beam 6, the latter is deformed to place in a first stable state shown in the figure.
- the electrical contact pad 7 provides a connection between the ends 12 and 13 of the conductive tracks 2 and 3.
- the power supply resistors of the actuators 40 and 50 are interrupted and the beam remains in this first stable state.
- the electrical resistances of the actuators are preferably made of a conductive material having a high resistivity.
- Conductive tracks and contact pads are preferably made of gold for its good electrical properties and its reliability over time, vis-à-vis oxidation in particular.
- the recesses of the beam can be either rigid (simple embedding), or more or less flexible by adjusting the configuration of the recesses, for example by the addition of relaxation springs. Being able to play on flexibility the beam makes it possible to control the stresses in the beam both initially (intrinsic constraints) and to move from one stable state to another (passing through a state of buckling). This has the advantage of limiting the risk of breaking of the beam but also to allow a limitation of the consumption of the microswitch (lowering of the switching temperature of the microswitch).
- the beam can have a relaxation of stresses only at one of its embedded ends or at both ends.
- FIG. 4 is a view from above of a second variant of a double micro-switch according to the present invention and the two ends of the beam of which have a stress-relieving recess.
- the embodiment variant of FIG. 4 comprises the same elements as the variant embodiment of FIG. 2 with the exception of embedding the ends of the beam.
- the substrate 1 has stress relief slots 111 perpendicular to the axis of the beam. Slots 111 provide some flexibility to the portion of the substrate between them and the beam.
- the microswitch is shown in its initial position, before being put into service.
- electrostatic forces can also be envisaged for the microswitch according to the invention either as an actuation principle or as a switched-position assistance after stopping the power supply of the heating resistors. actuators, to increase the pressure of the electrical contact pad and thus limit the contact resistance.
- FIG. 5 is a view from above of a third variant of a double micro-switch according to the present invention.
- This microswitch uses bimetallic actuators and has electrostatic assistance. It is represented in its initial position, before being put into service.
- the substrate 201 is recognized, tracks 202 and 203 to be connected by the contact pad 207 during a tilting of the beam 206 in a first stable state, tracks 204 and 205 to be connected by the contact pad 208 during a tilting of the beam 206 in a second stable state, actuators 220, 230 and 240, 250.
- the micro-switch of FIG. 5 further comprises electrodes enabling the application of electrostatic forces. These electrodes are distributed on the beam and on the substrate.
- the beam 206 supports on a first side of the electrodes 261 and 262 and on a second side, electrodes 263 and 264. These electrodes are located between the thermal actuators and the electrical contact pads.
- the substrate 201 supports electrodes 271 to 274 facing each electrode supported by the beam 206.
- the electrode 271 has a portion facing the electrode 261, this part not being visible in the figure, and a part intended to at its electrical connection, this part being visible in the figure. The same goes for electrodes 272, 273 and 274 with respect to electrodes 262, 263 and 264 respectively.
- the electrodes 271 to 274 have a shape that corresponds to the shape of the deformed beam. This makes it possible to limit the actuating or holding voltages (electrodes with variable gap).
- the micro-switch can be put in a first stable state, for example that corresponding to the connection of the conductive tracks 202 and 203 by the contact pad 207, by means of the thermal actuators 240 and 250 which are put into service only to obtain the first stable state.
- the application of a voltage between the electrodes 261 and 271 on the one hand and between the electrodes 262 and 272 on the other hand ensures a decrease in the contact resistance between the pad 207 and the tracks 202 and 203.
- the microswitch can be put in the second stable state by means of the actuators 220 and 230 which are put into service only to obtain the changeover from the first stable state to the second stable state.
- the application of a voltage between the electrodes 263 and 273 on the one hand and between the electrodes 264 and 274 on the other hand ensures a decrease in the contact resistance between the pad 208 and the tracks 204 and 205.
- FIG. 6 is a top view of a simple micro-switch according to the present invention.
- This microswitch uses bimetallic actuators without electrostatic assistance. It is represented in its initial position, before being put into service.
- the substrate 301 is recognized, tracks 302 and 303 to be connected by the contact pad 307 during a tilting of the beam 306 in a first stable state, the second stable state corresponds to a lack of connection.
- Actuators 320, 330 and 340, 350 are also recognized.
- FIG. 7 is a top view of a fourth variant of a dual micro-switch according to the present invention.
- This microswitch only uses electrostatic actuators. It is represented in its initial position, before being put into service.
- the substrate 401 is recognized, tracks 402 and 403 to be connected by the contact pad 407 during a tilting of the beam 406 in a first stable state and tracks 404 and 405 to be connected by the contact pad 408 when a tilting of the beam 406 in a second stable state.
- the micro-switch of FIG. 7 comprises electrodes enabling the application of electrostatic forces. These electrodes are distributed over the beam and the substrate.
- the beam 406 supports on a first side 461 and 462 electrodes and, on a second side, electrodes 463 and 464. These electrodes are located on each side of the electrical contact pads 407 and 408.
- the substrate 401 supports electrodes 471 to 474 facing each electrode supported by the beam 406.
- the electrode 471 has a portion facing the electrode 461, this part not being visible in the figure, and a part for its electrical connection, this part being visible in the figure. The same is true for the electrodes 472, 473 and 474 with respect to the electrodes 462, 463 and 464 respectively.
- the micro-switch can be put in a first stable state, for example that corresponding to the connection of the conductive tracks 402 and 403 by the contact pad 407, by applying a voltage between the electrodes 461 and 471 on the one hand and between the electrodes 462 and 472 on the other hand. Once the beam has tilted to its first stable state, the applied voltage may be suppressed or reduced so as to decrease the contact resistance between pad 407 and tracks 402 and 403.
- the microswitch can be put in the second stable state by applying a voltage between the electrodes 463 and 473 on the one hand and between the electrodes 464 and 474 on the other hand (and removing the electrostatic assist voltage from keeping in the first steady state if this assistance was used). Once the beam has switched to its second stable state, the applied voltage can be suppressed or reduced as before.
- FIG. 8 is a view from above of a fifth variant of a double micro-switch according to the present invention.
- This fifth variant is an optimized version of the previous variant.
- the same references as in the previous line have been retained to designate the same elements.
- the electrodes 471 ', 472', 473 'and 474' have the same function as the corresponding electrodes 471, 472, 473 and 474 of the micro-switch of FIG. 7. However, they have a shape which corresponds to the shape of the deformed beam. This makes it possible to limit the actuating or holding voltages (electrodes with variable gap).
- Figure 9 is a top view of a sixth variant of a dual micro-switch according to the present invention. It is represented in its initial position before being put into service.
- the substrate 501 is recognized, tracks 502 and 503 to be connected by the contact pad 507 during a tilting of the beam 506 in a first stable state and tracks 504 and 505 to be connected by the contact pad 508 when a tilting of the beam 506 in a second stable state.
- the beam 506 is in this variant a metal beam, for example aluminum, supporting on its flanks the contact pads 507 and 508.
- the tilting of the beam in a first stable state for example that corresponding to the connection of the conductive tracks 502 and 503 is obtained by applying a tilt voltage between the electrode beam 506 and the electrodes 571 and 572. Once the beam has tilted to its first stable state, the applied voltage can be suppressed or reduced to reduce the contact resistance between the stud 507 and the tracks 502 and 503.
- the micro-switch can be put into the second stable state by applying a voltage between the beam 506 and the electrodes 573 and 574 (and removal of the electrostatic assist voltage maintaining in the first stable state if this assistance was used). Once the beam has switched to its second stable state, the applied voltage can be suppressed or reduced as before.
- the electrostatic actuation has been optimized by the shape given to the electrodes 571 to 574.
- Figure 10 is a top view of a dual micro-switch corresponding to the first variant but provided with optimized contacts. The microswitch is shown in its initial position before being put into service. The same references as in Figure 1 have been retained to designate the same elements.
- the ends 12 ', 13', 14 ', and 15' of the conductive tracks respectively 2, 3, 4 and 5 have been optimized to ensure better electrical contact with the contact pads 7 'and 8' .
- the contact pads 7 'and 8' have a wider shape at their base (that is to say near the beam) than at their top. They can thus fit more easily between the ends 12 ', 13' and 14 ', 15' which are, they, provided with a recess fillet.
- the ends of the conductive tracks may also be slightly flexible to match the shape of the contact pad and thus ensure a better electrical contact. This is what the Figure 11 where the microswitch is shown in a first stable state.
- micro-switch according to the present invention has the following advantages.
- the invention offers the possibility of obtaining a double switch.
- the embodiment of the microswitches according to the invention has a strong compatibility with the processes for producing integrated circuits (metallizations "gold” at the end of the manufacturing process if necessary).
- the bi-stability of the microswitch is perfectly controlled for two reasons.
- the first reason is that the bi-stability is obtained by the fact that the beam must be in compressive stress. This constraint is brought by the constituent materials of the switch (shape, thickness). If the beam is designed perfectly symmetrically, and if the realization of each of the two sets of actuators is made during the same deposit, the stress can only be perfectly symmetrical (same shape, same thickness and symmetry of the actuators). It is therefore in the presence of a device capable of not favoring a stable state with respect to another state which would be less stable.
- the second reason is that it is possible to control the value of the compressive stress by the nature of the deposit and also by the design, by adding "springs" of stress release.
- the micro-switch according to the invention can advantageously be produced on a silicon substrate.
- the embedding portion and the beam may be made of Si 3 N 4 , SiO 2 or polycrystalline silicon.
- the conductive tracks, the contact pads, the electrodes, the thermal actuators can be made of gold, aluminum or copper, nickel, materials that can be deposited under vacuum or electrochemically (electrolysis, electroless plating).
- the heating resistors may be made of TaN, TiN or Ti.
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- Electromagnetism (AREA)
- Micromachines (AREA)
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Abstract
Description
La présente invention concerne un micro-commutateur bistable, à faible consommation et à déplacement horizontal.The present invention relates to a bistable micro-switch, low consumption and horizontal displacement.
Un tel micro-commutateur trouve notamment une utilité dans le domaine de la téléphonie mobile et dans le domaine spatial.Such a micro-switch is particularly useful in the field of mobile telephony and in the space domain.
Les composants RF destinés à ces domaines sont soumis au cahier des charges suivant :
- tension d'alimentation inférieure à 5 volts,
- isolation supérieure à 30 dB,
- pertes d'insertion inférieures à 0,3dB,
- fiabilité correspondant à un nombre de cycles supérieur à 109,
- surface inférieure à 0,05 mm2,
- consommation la plus faible possible.
- supply voltage less than 5 volts,
- insulation greater than 30 dB,
- insertion losses less than 0.3dB,
- reliability corresponding to a number of cycles greater than 10 9 ,
- surface less than 0.05 mm 2 ,
- lowest consumption possible.
Dans le cas du domaine spatial en particulier, certains commutateurs ne sont utilisés qu'une seule fois, pour basculer d'un état à un autre état en cas de panne d'équipement par exemple. Pour ce type d'application, on note actuellement un très fort intérêt pour des commutateurs bistables qui ne nécessitent pas de tension d'alimentation une fois qu'ils ont basculé d'un état à l'autre.In the case of the space domain in particular, some switches are used only once, to switch from one state to another state in case of equipment failure for example. For this type of application, there is currently a very strong interest for bistable switches that do not require a supply voltage once they have switched from one state to another.
On note également un fort intérêt pour des commutateurs doubles qui simplifient considérablement les matrices de commutateurs des circuits redondants utilisées dans le cas de fonctions critiques. Ce type d'application se trouve notamment dans le domaine spatial (antennes satellites). Ces commutateurs doubles permettent de basculer un signal d'entrée d'un circuit électronique à un autre en cas de panne. Ce sont donc des commutateurs qui présentent la possibilité de commuter soit un premier jeu de deux pistes électriques entre elles, soit un deuxième jeu de deux pistes électriques.There is also strong interest in dual switches that greatly simplify the switch matrices of the redundant circuits used in the case of critical functions. This type of application is particularly in the field of space (satellite antennas). These dual switches allow you to switch an input signal from one electronic circuit to another in case of failure. These are therefore switches that have the ability to switch either a first set of two electrical tracks together, or a second set of two electrical tracks.
Les commutateurs doubles présentent l'avantage d'obtenir des circuits comportant moins de composants (par exemple 10 fonctions de redondance demandent 10 commutateurs doubles au lieu de 20 commutateurs simples), ce qui signifie entre autres moins de tests de fiabilité, moins de montage, un gain de place et globalement un coût moindre.Dual switches have the advantage of obtaining circuits with fewer components (for example 10 redundancy functions require 10 double switches instead of 20 single switches), which means among other things less reliability tests, less assembly, a saving of space and overall a lower cost.
Dans le domaine des communications, les micro-commutateurs conventionnels (c'est-à-dire ceux relevant de la microélectronique) sont très largement utilisés. Ils servent dans le routage des signaux, les réseaux d'accord d'impédance, l'ajustage de gain d'amplificateurs, etc... En ce qui concerne les bandes de fréquence des signaux à commuter, elles peuvent aller de quelques MHz à plusieurs dizaines de GHz.In the field of communications, conventional micro-switches (that is, microelectronics) are very widely used. They are used in signal routing, impedance matching networks, gain tuning of amplifiers, etc. With regard to the frequency bands of the signals to be switched, they can range from a few MHz to several tens of GHz.
Classiquement, pour ces circuits RF, on utilise des commutateurs issus de la microélectronique, qui permettent une intégration avec l'électronique des circuits et qui ont un coût de fabrication faible. En termes de performance, ces composants sont par contre assez limités. Ainsi, des commutateurs de type FET en silicium peuvent commuter des signaux de forte puissance à basses fréquences, mais pas à hautes fréquences. Les commutateurs de types MESFET (Metal Semiconductor Field Effect Transistor) en GaAs ou les diodes PIN marchent bien à hautes fréquences, mais uniquement pour des signaux de faibles niveaux. Enfin, d'une manière générale, au-delà de 1 GHz, tous ces commutateurs microélectroniques présentent une perte d'insertion importante (classiquement autour de 1 à 2 dB) à l'état passant et une isolation assez fiable à l'état ouvert (de -20 à -25dB) Le remplacement de ces composants conventionnels par des micro-commutateurs MEMS (Micro-Electro-Mechanical-System) est par conséquent prometteur pour ce type d'application.Conventionally, for these RF circuits, switches from microelectronics are used, which allow integration with the electronics of circuits and which have a low manufacturing cost. In terms of performance, these components are rather limited. Thus, silicon FET type switches can switch high power signals at low frequencies, but not at high frequencies. GaAs Metal Semiconductor Field Effect Transistors (GaAs) or PIN diodes work well at high frequencies, but only for low level signals. Finally, in general, beyond 1 GHz, all these microelectronic switches have a significant loss of insertion (typically around 1 to 2 dB) in the on state and a fairly reliable isolation in the open state (from -20 to -25dB) The replacement of these conventional components by MEMS microswitches (Micro-Electro-Mechanical-System) is therefore promising for this type of application.
De par leur conception et leur principe de fonctionnement, les commutateurs MEMS présentent les caractéristiques suivantes :
- faibles pertes d'insertion (typiquement inférieures à 0,3dB),
- isolation importante du MHz au millimétrique (typiquement supérieure à -30dB),
- pas de non-linéarité de réponse (IP3).
- low insertion losses (typically less than 0.3 dB),
- significant isolation of MHz to millimeter (typically greater than -30 dB),
- no non-linearity of response (IP3).
On distingue deux types de contact pour les micro-commutateurs MEMS : le contact ohmique et le contact capacitif. Dans le commutateur à contact ohmique, les deux pistes RF sont contactées par un court-circuit (contact métal-métal). Ce type de contact est adapté aussi bien pour les signaux continus que pour les signaux hautes fréquences (supérieures à 10 GHz). Dans le commutateur à contact capacitif, un espace d'air est ajusté de manière électromécanique pour obtenir une variation de capacité entre l'état fermé et l'état ouvert. Ce type de contact est particulièrement bien adapté aux hautes fréquences (supérieures à 10 GHz) mais inadéquat aux basses fréquences.There are two types of contact for MEMS microswitches: the ohmic contact and the capacitive contact. In the ohmic contact switch, the two RF tracks are contacted by a short circuit (metal-to-metal contact). This type of contact is suitable for both continuous signals and for high frequency signals (above 10 GHz). In the capacitive contact switch, an air space is electromechanically adjusted to obtain a capacitance variation between the closed state and the open state. This type of contact is particularly well suited to high frequencies (above 10 GHz) but inadequate at low frequencies.
On distingue plusieurs grands principes d'actionnement pour les commutateurs MEMS.There are several major principles of actuation for MEMS switches.
Les micro-commutateurs à actionnement thermique que l'on peut qualifier de classiques sont non bistables. Ils offrent l'avantage d'une faible tension d'actionnement. Ils présentent plusieurs inconvénients : une consommation excessive (surtout dans le cas d'applications en téléphonie mobile), une faible vitesse de commutation (à cause de l'inertie thermique) et la nécessité d'une tension d'alimentation pour maintenir le contact en position fermée.The thermal actuated micro-switches that can be described as conventional are non-bistable. They offer the advantage of a low operating voltage. They have several drawbacks: excessive consumption (especially in the case of mobile telephony applications), low switching speed (due to thermal inertia) and the need for a supply voltage to maintain contact with closed position.
Les micro-commutateurs à actionnement électrostatique que l'on peut qualifier de classiques sont non bistables. Ils offrent les avantages d'une vitesse de commutation rapide et d'une technologie généralement simple. Ils présentent des problèmes de fiabilité, ce point étant particulièrement sensible dans le cas de commutateurs électrostatiques à faible tension d'actionnement (collage des structures). Ils nécessitent également une tension d'alimentation pour maintenir le contact en position fermée.The electrostatically actuated micro-switches that can be described as conventional are non-bistable. They offer the advantages of fast switching speed and generally simple technology. They have problems of reliability, this point being particularly sensitive in the case of electrostatic switches with low operating voltage (bonding structures). They also require a supply voltage to maintain contact in the closed position.
Les micro-commutateurs à actionnement électromagnétique que l'on peut qualifier de classiques sont non bistables. Ils fonctionnent généralement sur le principe de l'électro-aimant et utilisent essentiellement des circuits magnétiques à base de fer et une bobine d'excitation. Ils présentent plusieurs inconvénients. Leur technologie est complexe (bobine, matériau magnétique, aimant permanent dans certains cas, etc...). Leur consommation est importante. Ils nécessitent également une tension d'alimentation pour maintenir le contact en position fermée.Micro-switches with electromagnetic actuation that can be described as classical are non-bistable. They generally operate on the principle of the electromagnet and essentially use iron-based magnetic circuits and an excitation coil. They have several disadvantages. Their technology is complex (coil, magnetic material, permanent magnet in some cases, etc ...). Their consumption is important. They also require a supply voltage to maintain contact in the closed position.
On distingue deux configurations de déplacement du contact : un déplacement vertical et un déplacement horizontal.There are two configurations of displacement of the contact: a vertical displacement and a horizontal displacement.
Dans le cas d'un déplacement vertical, le déplacement se fait hors du plan des pistes RF. Le contact se fait sur le dessus ou sur le dessous des pistes. Cette configuration présente l'avantage que la métallisation du plot de contact est facile à réaliser (dépôt à plat) et, par conséquent, la résistance de contact est faible. Cette configuration est cependant mal adaptée à la réalisation de la fonction de commutateur à double contact. Le contact sur le dessus est en effet difficile à obtenir. Il passe généralement par l'utilisation d'un contact sur le capot. Cette configuration présente aussi une faible compatibilité à l'intégration. En effet, pour les commutateurs résistifs, on utilise classiquement des pistes et des contacts avec une métallisation en or (bonnes propriétés électriques, pas d'oxydation). Ce métal n'est cependant pas compatible à l'intégration alors qu'il intervient quasiment dès le début de la technologie pour ce type de configuration. Il n'y a pas d'optimisation possible du contact. Sa surface ne peut être que plane. La raideur de la poutre formant le contact est mal contrôlée. Cette raideur est conditionnée par la forme finale de la poutre qui dépend de la topologie d'une couche sacrificielle et qui dépend elle-même de la forme et de l'épaisseur des pistes situées en dessous. On se retrouve généralement avec un profil de poutre « chahuté » qui accroît sensiblement la raideur du commutateur et donc ses conditions d'actionnement.In the case of a vertical displacement, the displacement is done off the plane of the RF tracks. The contact is on the top or bottom of the tracks. This configuration has the advantage that the metallization of the contact pad is easy to perform (flat deposition) and, therefore, the contact resistance is low. This configuration is, however, poorly suited to performing the dual contact switch function. The contact on the top is indeed difficult to obtain. It usually goes through the use of a contact on the hood. This configuration also has low integration compatibility. In fact, for resistive switches, tracks and contacts are conventionally used with gold metallization (good electrical properties, no oxidation). This metal is however not compatible with the integration whereas it intervenes almost from the beginning of the technology for this type of configuration. There's no possible optimization of the contact. Its surface can only be flat. The stiffness of the beam forming the contact is poorly controlled. This stiffness is conditioned by the final shape of the beam which depends on the topology of a sacrificial layer and which itself depends on the shape and thickness of the tracks below. It is usually found with a "heckled" beam profile that significantly increases the stiffness of the switch and therefore its operating conditions.
Dans le cas d'un déplacement horizontal, le déplacement de fait dans le plan des pistes. Le contact se fait sur le flanc des pistes. Cette configuration est bien adaptée à un double contact, moyennant un actionneur symétrique. La métallisation « or » peut se faire en toute dernière étape technologique. Toutes les étapes précédentes peuvent être compatibles avec la réalisation de circuits intégrés. La forme du contact est déterminée lors de l'étape de photolithographie. On peut avoir par exemple un contact arrondi pour rendre ponctuel le contact et limiter ainsi la résistance de contact. La forme de la poutre est déterminée lors de l'étape de photolithographie. Sa raideur est de ce fait bien contrôlée. Par contre, la métallisation sur le flanc est délicate. La résistance de contact peut de ce fait être mal contrôlée. Cette configuration est inadaptée à un actionnement électrostatique à cause des surfaces d'actionnement en regard très réduites.In the case of a horizontal displacement, the displacement of fact in the plane of the tracks. The contact is made on the side of the tracks. This configuration is well suited to double contact, with a symmetrical actuator. Metallization "gold" can be done in the very last technological step. All the preceding steps can be compatible with the realization of integrated circuits. The shape of the contact is determined during the photolithography step. For example, a rounded contact may be used to make the contact point and thus limit the contact resistance. The shape of the beam is determined during the photolithography step. Its stiffness is therefore well controlled. On the other hand, the metallization on the flank is delicate. The contact resistance can therefore be poorly controlled. This configuration is unsuitable for electrostatic actuation because of the very small viewing surfaces.
Le nombre d'états d'équilibre est une autre caractéristique du mouvement des commutateurs. Le cas standard est celui où l'actionneur n'a qu'un seul état d'équilibre. Ceci implique qu'un des deux états du commutateur (commuté ou non commuté) nécessite une alimentation en tension continue pour le maintien en position. L'arrêt de l'excitation replace la commutateur dans sa position d'équilibre.The number of equilibrium states is another characteristic of the movement of the switches. The standard case is one where the actuator has only one state balance. This implies that one of the two states of the switch (switched or non-switched) requires a DC voltage supply for holding in position. Stopping the excitation returns the switch to its equilibrium position.
Le cas bistable est le cas où l'actionneur a deux états d'équilibre distincts. L'avantage de ce mode de fonctionnement est que les deux positions « fermé » et « ouvert » du commutateur sont stables et ne nécessitent pas d'alimentation tant que l'on ne bascule pas d'un état à l'autre.The bistable case is the case where the actuator has two distinct equilibrium states. The advantage of this mode of operation is that the two positions "closed" and "open" of the switch are stable and do not require power until you switch from one state to another.
Le document
Il est proposé, selon la présente invention, un micro-commutateur bistable, à faible consommation et à déplacement horizontal. Ce micro-commutateur est particulièrement bien adapté au domaine de la téléphonie mobile et au domaine spatial.It is proposed, according to the present invention, a bistable microswitch, low consumption and horizontal displacement. This micro-switch is particularly well suited to the field of mobile telephony and the space domain.
L'invention a donc pour objet un micro-commutateur MEMS bistable réalisé sur un substrat et apte à raccorder électriquement les extrémités d'au moins deux pistes conductrices, comprenant une poutre suspendue au-dessus de la surface du substrat, la poutre étant encastrée à ses deux extrémités et étant contrainte en compression quand elle est en position non déformée, la poutre possédant des moyens formant contact électrique disposés pour réaliser une connexion latérale avec les extrémités des deux pistes conductrices lors d'une déformation de la poutre dans une direction horizontale par rapport à la surface du substrat, le micro-commutateur possédant des moyens d'actionnement de la poutre pour la placer soit dans une première position déformée, correspondant à un premier état stable, soit dans une deuxième position déformée, correspondant à un deuxième état stable et opposée à la première position déformée par rapport à la position non déformée, les moyens formant contact électrique assurant la connexion des extrémités des deux pistes conductrices lorsque la poutre est dans sa première position déformée, caractérisé en ce que la position non déformée de la poutre est la position initiale de la poutre, c'est-à-dire avant la mise en service du micro-commutateur.The subject of the invention is therefore a bistable MEMS micro-switch made on a substrate and capable of electrically connecting the ends of at least two conductive tracks, comprising a beam suspended above the surface of the substrate, the beam being embedded in both ends thereof and being constrained in compression when in an undeformed position, the beam having electrical contact means arranged to provide a lateral connection with the ends of the two conductive tracks upon deformation of the beam in a horizontal direction by relative to the surface of the substrate, the micro-switch having means actuating the beam to place it either in a first deformed position, corresponding to a first stable state, or in a second deformed position, corresponding to a second stable state and opposite to the first deformed position with respect to the undistorted position , the electrical contact means connecting the ends of the two conductive tracks when the beam is in its first deformed position, characterized in that the undeformed position of the beam is the initial position of the beam, that is to say say before commissioning the micro-switch.
Le micro-commutateur peut être un micro-commutateur double. Dans ce cas, la première position déformée correspond à la connexion des extrémités de deux premières pistes conductrices, la deuxième position déformée correspond à la connexion des extrémités de deux deuxièmes pistes conductrices.The micro-switch can be a dual micro-switch. In this case, the first deformed position corresponds to the connection of the ends of two first conductive tracks, the second deformed position corresponds to the connection of the ends of two second conductive tracks.
Il peut être un micro-commutateur simple. Dans ce cas, la première position déformée correspond à la connexion des extrémités de deux pistes conductrices, la deuxième position déformée correspond à une absence de connexion.It can be a simple micro-switch. In this case, the first deformed position corresponds to the connection of the ends of two conductive tracks, the second deformed position corresponds to a lack of connection.
Selon un premier mode de mise en oeuvre, la poutre est en matériau diélectrique ou semiconducteur et les moyens formant contact électrique sont formés d'un plot électriquement conducteur et solidaire de la poutre. Les moyens d'actionnement de la poutre peuvent comprendre des actionneurs thermiques utilisant un effet bilame. Chaque actionneur thermique peut alors comprendre un pavé de matériau conducteur thermique en contact intime avec une résistance électrique. Les moyens d'actionnement de la poutre peuvent comprendre des moyens pour mettre en oeuvre des forces électrostatiques. Ils peuvent comprendre des actionneurs thermiques utilisant un effet bilame et des moyens pour mettre en oeuvre des forces électrostatiques.According to a first embodiment, the beam is of dielectric or semiconductor material and the electrical contact means are formed of an electrically conductive pad and secured to the beam. The means for actuating the beam may comprise thermal actuators using a bimetallic effect. Each thermal actuator can then comprise a block of thermal conductive material in intimate contact with an electrical resistance. The means for actuating the beam may comprise means for implementing forces electrostatic. They may comprise thermal actuators using a bimetallic effect and means for implementing electrostatic forces.
Selon un deuxième mode de mise en oeuvre, la poutre est en matériau électriquement conducteur. Les moyens d'actionnement de la poutre peuvent alors comprendre des moyens pour mettre en oeuvre des forces électrostatiques.According to a second mode of implementation, the beam is made of electrically conductive material. The means for actuating the beam may then comprise means for implementing electrostatic forces.
Les moyens formant contact électrique peuvent avoir une forme permettant de s'encastrer entre les extrémités des pistes conductrices à connecter. Dans ce cas, les extrémités des pistes conductrices peuvent posséder une flexibilité permettant d'épouser la forme des moyens formant contact électrique lors d'une connexion.The electrical contact means may have a shape allowing to fit between the ends of the conductive tracks to be connected. In this case, the ends of the conductive tracks may have flexibility to match the shape of the electrical contact means during a connection.
Le micro-commutateur peut aussi comprendre des moyens formant ressort de relaxation pour au moins l'une des extrémités encastrées de la poutre.The microswitch may also include relaxation spring means for at least one of the embedded ends of the beam.
Les moyens formant contact électrique peuvent être des moyens assurant un contact ohmique ou des moyens assurant un contact capacitif.The means forming an electrical contact may be means ensuring an ohmic contact or means providing a capacitive contact.
L'invention sera mieux comprise et d'autres avantages et particularités apparaîtront à la lecture de la description qui va suivre, donnée à titre d'exemple non limitatif, accompagnée des dessins annexés parmi lesquels :
- la figure 1 est une vue de dessus d'une première variante de micro-commutateur double selon la présente invention,
- la figure 2 montre le micro-commutateur de la figure 1 dans un premier état stable de fonctionnement,
- la figure 3 montre le micro-commutateur de la figure 1 dans un deuxième état stable de fonctionnement,
- la figure 4 est une vue de dessus d'une deuxième variante de micro-commutateur double selon la présente invention,
- la figure 5 est une vue de dessus d'une troisième variante de micro-commutateur double selon la présente invention,
- La figure 6 est une vue de dessus d'un micro-commutateur simple selon la présente invention,
- la figure 7 est une vue de dessus d'une quatrième variante de micro-commutateur double selon la présente invention,
- la figure 8 est une vue de dessus d'une cinquième variante de micro-commutateur double selon la présente invention,
- la figure 9 est une vue de dessus d'une sixième variante de micro-commutateur double selon la présente invention,
- la figure 10 est une vue de dessus d'un micro-commutateur double correspondant à la première variante mais pourvu de contacts optimisés,
- la figure 11 montre le micro-commutateur de la figure 10 dans un premier état stable de fonctionnement.
- FIG. 1 is a view from above of a first variant of a micro-switch according to the present invention,
- FIG. 2 shows the microswitch of FIG. 1 in a first stable state of operation;
- FIG. 3 shows the microswitch of FIG. 1 in a second stable state of operation;
- FIG. 4 is a view from above of a second variant of a double micro-switch according to the present invention,
- FIG. 5 is a view from above of a third variant of a double micro-switch according to the present invention,
- FIG. 6 is a view from above of a simple microswitch according to the present invention,
- FIG. 7 is a view from above of a fourth variant of a double micro-switch according to the present invention,
- FIG. 8 is a view from above of a fifth variant of a double micro-switch according to the present invention,
- FIG. 9 is a view from above of a sixth variant of a double micro-switch according to the present invention,
- FIG. 10 is a view from above of a double micro-switch corresponding to the first variant but provided with optimized contacts,
- Figure 11 shows the micro switch of Figure 10 in a first stable operating state.
La suite de la description portera à titre d'exemple sur des micro-commutateurs à contact ohmique. Cependant, l'homme du métier n'aura aucun problème pour appliquer l'invention à des micro-commutateurs à contact capacitif.The following description will be given by way of example on micro-switches with ohmic contact. However, those skilled in the art will have no problem applying the invention to capacitive contact microswitches.
La figure 1 est une vue de dessus d'une première variante de micro-commutateur double selon la première invention.FIG. 1 is a view from above of a first variant of a double micro-switch according to the first invention.
Le micro-commutateur est réalisé sur un substrat 1 dont seulement une partie est représentée par souci de simplification. Ce micro-commutateur est un double commutateur. Il est destiné à réaliser une connexion soit entre les extrémités 12 et 13 des pistes conductrices 2 et 3, soit entre les extrémités 14 et 15 des pistes conductrices 4 et 5.The micro-switch is made on a
Le micro-commutateur de la figure 1 comprend une poutre 6 en matériau diélectrique ou semiconducteur. Elle est située dans le plan des pistes conductrices. La poutre est encastrée à ses deux extrémités dans des parties surélevées du substrat 1. Elle est représentée dans sa position initiale et est alors soumise à une contrainte en compression. Cette contrainte peut être induite par les contraintes intrinsèques des matériaux utilisés pour réaliser la structure mobile du micro-commutateur, c'est-à-dire la poutre et les éléments associés (actionneurs).The micro-switch of FIG. 1 comprises a
La poutre représentée est de section rectangulaire. Elle supporte sur sa face dirigée vers les pistes 2 et 3 (c'est-à-dire sur l'un de ses flancs) des actionneurs 20 et 30 et, sur sa face dirigée vers les pistes 4 et 5 (c'est-à-dire sur son autre flanc), des actionneurs 40 et 50. Les actionneurs sont situés près des zones d'encastrement de la poutre. Chaque actionneur est constitué d'un pavé bon conducteur thermique et d'une résistance électrique. Ainsi, l'actionneur 20 comprend un pavé 21 auquel est associée une résistance 22. Il en va de même pour les autres actionneurs.The beam shown is of rectangular section. It supports on its face directed towards the
La poutre est de préférence réalisée en matériau diélectrique ou semiconducteur à faible coefficient de dilatation thermique. Les pavés des actionneurs thermiques sont de préférence réalisés en matériau métallique à fort coefficient de dilatation thermique pour obtenir un effet bilame à rendement élevé. Le déplacement de la poutre se faisant suivant la direction horizontale (le plan de la figure), les actionneurs sont placés sur les flancs de la poutre et au voisinage des encastrements, toujours dans un souci de rendement thermomécanique.The beam is preferably made of dielectric or semiconductor material with a low coefficient of thermal expansion. The pavers of the thermal actuators are preferably made of metal material with a high coefficient of thermal expansion to obtain a bimetallic effect at high efficiency. The displacement of the beam being in the horizontal direction (the plane of the figure), the actuators are placed on the sides of the beam and in the vicinity of the recesses, always for the sake of thermomechanical efficiency.
La poutre 6 supporte également, en partie centrale et sur ses flancs, un plot de contact électrique 7, destiné à assurer une connexion électrique du type ohmique entre les extrémités 12 et 13 des pistes 2 et 3, et un plot de contact électrique 8 entre les extrémités 14 et 15 des pistes 4 et 5.The
A la mise en service du micro-commutateur, un premier jeu d'actionneurs permet de basculer la poutre 6 dans une position correspondant à l'un de ses deux états stables. C'est ce que représente la figure 2. Sous l'action des actionneurs 40 et 50 qui induisent un effet bilame dans la poutre 6, celle-ci se déforme pour se placer dans un premier état stable montré sur la figure. Dans cet état stable, le plot de contact électrique 7 assure une connexion entre les extrémités 12 et 13 des pistes conductrices 2 et 3. Les alimentations des résistances électriques des actionneurs 40 et 50 sont interrompues et la poutre reste dans ce premier état stable.When the micro-switch is put into service, a first set of actuators makes it possible to switch the
Pour commuter le micro-commutateur, c'est-à-dire pour le placer dans son deuxième état stable, il faut alimenter les résistances électriques des actionneurs 20 et 30 pour induire un effet bilame contraire au précédent dans la poutre 6. Celle-ci se déforme alors pour se placer dans son deuxième état stable montré sur la figure 3. Dans ce deuxième état stable, le plot de contact électrique 8 assure une connexion entre les extrémités 14 et 15 des pistes conductrices 4 et 5. Les alimentations des résistances électriques des actionneurs 20 et 30 sont interrompues et la poutre reste dans ce deuxième état stable.To switch the micro-switch, that is to say to place it in its second stable state, it is necessary to supply the electrical resistances of the
Les résistances électriques des actionneurs sont de préférences réalisées dans un matériau conducteur présentant une résistivité élevée. Les pistes conductrices et les plots de contact sont réalisés préférentiellement en or pour ses bonnes propriétés électriques et sa fiabilité dans le temps, vis-à-vis de l'oxydation notamment.The electrical resistances of the actuators are preferably made of a conductive material having a high resistivity. Conductive tracks and contact pads are preferably made of gold for its good electrical properties and its reliability over time, vis-à-vis oxidation in particular.
Les encastrements de la poutre peuvent être soit rigides (encastrement simple), soit plus ou moins souples en jouant sur la configuration des encastrements, par exemple par l'ajout de ressorts de relaxation. Le fait de pouvoir jouer sur la souplesse de la poutre permet de contrôler les contraintes dans la poutre aussi bien initialement (contraintes intrinsèques) que pour passer d'un état stable à l'autre (passage par un état de flambage). Ceci a pour avantage de limiter les risques de rupture de la poutre mais également de permettre une limitation de la consommation du micro-commutateur (abaissement de la température de basculement du micro-commutateur). La poutre peut présenter une relaxation de contraintes seulement à l'une de ses extrémités encastrées ou à ses deux extrémités.The recesses of the beam can be either rigid (simple embedding), or more or less flexible by adjusting the configuration of the recesses, for example by the addition of relaxation springs. Being able to play on flexibility the beam makes it possible to control the stresses in the beam both initially (intrinsic constraints) and to move from one stable state to another (passing through a state of buckling). This has the advantage of limiting the risk of breaking of the beam but also to allow a limitation of the consumption of the microswitch (lowering of the switching temperature of the microswitch). The beam can have a relaxation of stresses only at one of its embedded ends or at both ends.
La figure 4 est une vue de dessus d'une deuxième variante de micro-commutateur double selon la présente invention et dont les deux extrémités de la poutre présentent un encastrement à relaxation de contraintes.FIG. 4 is a view from above of a second variant of a double micro-switch according to the present invention and the two ends of the beam of which have a stress-relieving recess.
La variante de réalisation de la figure 4 comprend les mêmes éléments que la variante de réalisation de la figure 2 à l'exception de l'encastrement des extrémités de la poutre. A ce niveau, le substrat 1 présente des fentes de relâchement des contraintes 111 perpendiculaires à l'axe de la poutre. Les fentes 111 procurent une certaine souplesse à la partie du substrat située entre elles et la poutre. Le micro-commutateur est représenté dans sa position initiale, avant sa mise en service.The embodiment variant of FIG. 4 comprises the same elements as the variant embodiment of FIG. 2 with the exception of embedding the ends of the beam. At this level, the
L'utilisation de forces électrostatiques peut également être envisagée pour le micro-commutateur selon l'invention soit comme principe d'actionnement, soit comme assistance en position commutée après arrêt de l'alimentation des résistances chauffantes des actionneurs, pour augmenter la pression du plot de contact électrique et ainsi limiter la résistance de contact.The use of electrostatic forces can also be envisaged for the microswitch according to the invention either as an actuation principle or as a switched-position assistance after stopping the power supply of the heating resistors. actuators, to increase the pressure of the electrical contact pad and thus limit the contact resistance.
La figure 5 est une vue de dessus d'une troisième variante de micro-commutateur double selon la présente invention. Ce micro-commutateur utilise des actionneurs à effet bilame et présente une assistance électrostatique. Il est représenté dans sa position initiale, avant sa mise en service.FIG. 5 is a view from above of a third variant of a double micro-switch according to the present invention. This microswitch uses bimetallic actuators and has electrostatic assistance. It is represented in its initial position, before being put into service.
On reconnaît le substrat 201, des pistes 202 et 203 à connecter par le plot de contact 207 lors d'un basculement de la poutre 206 dans un premier état stable, des pistes 204 et 205 à connecter par le plot de contact 208 lors d'un basculement de la poutre 206 dans un deuxième état stable, des actionneurs 220, 230 et 240, 250.The
Le micro-commutateur de la figure 5 comporte en outre des électrodes permettant l'application de forces électrostatiques. Ces électrodes sont distribuées sur la poutre et sur le substrat. La poutre 206 supporte sur un premier flanc des électrodes 261 et 262 et, sur un deuxième flanc, des électrodes 263 et 264. Ces électrodes sont situées entre les actionneurs thermiques et les plots de contact électrique. Le substrat 201 supporte des électrodes 271 à 274 en regard de chaque électrode supportée par la poutre 206. L'électrode 271 possède une partie en regard de l'électrode 261, cette partie n'étant pas visible sur la figure, et une partie destinée à sa connexion électrique, cette partie étant visible sur la figure. Il en va de même pour les électrodes 272, 273 et 274 par rapport aux électrodes 262, 263 et 264 respectivement.The micro-switch of FIG. 5 further comprises electrodes enabling the application of electrostatic forces. These electrodes are distributed on the beam and on the substrate. The
On remarque que les électrodes 271 à 274 ont une forme qui correspond à la forme de la poutre déformée. Ceci permet de limiter les tensions d'actionnement ou de maintien (électrodes à entrefer variable).Note that the
Le micro-commutateur peut être mis dans un premier état stable, par exemple celui correspondant à la connexion des pistes conductrices 202 et 203 par le plot de contact 207, au moyen des actionneurs thermiques 240 et 250 qui ne sont mis en service que pour obtenir le premier état stable. L'application d'une tension entre les électrodes 261 et 271 d'une part et entre les électrodes 262 et 272 d'autre part assure une diminution de la résistance de contact entre le plot 207 et les pistes 202 et 203.The micro-switch can be put in a first stable state, for example that corresponding to the connection of the
Le micro-commutateur peut être mis dans le deuxième état stable au moyen des actionneurs 220 et 230 qui ne sont mis en service que pour obtenir le basculement du premier état stable vers le deuxième état stable. L'application d'une tension entre les électrodes 263 et 273 d'une part et entre les électrodes 264 et 274 d'autre part assure une diminution de la résistance de contact entre le plot 208 et les pistes 204 et 205.The microswitch can be put in the second stable state by means of the
La figure 6 est une vue de dessus d'un micro-commutateur simple selon la présente invention. Ce micro-commutateur utilise des actionneurs à effet bilame, sans assistance électrostatique. Il est représenté dans sa position initiale, avant sa mise en service.Figure 6 is a top view of a simple micro-switch according to the present invention. This microswitch uses bimetallic actuators without electrostatic assistance. It is represented in its initial position, before being put into service.
On reconnaît le substrat 301, des pistes 302 et 303 à connecter par le plot de contact 307 lors d'un basculement de la poutre 306 dans un premier état stable, le deuxième état stable correspond à une absence de connexion. On reconnaît également des actionneurs 320, 330 et 340, 350.The
La figure 7 est une vue de dessus d'une quatrième variante de micro-commutateur double selon la présente invention. Ce micro-commutateur utilise uniquement des actionneurs à effet électrostatique. Il est représenté dans sa position initiale, avant sa mise en service.Figure 7 is a top view of a fourth variant of a dual micro-switch according to the present invention. This microswitch only uses electrostatic actuators. It is represented in its initial position, before being put into service.
On reconnaît le substrat 401, des pistes 402 et 403 à connecter par le plot de contact 407 lors d'un basculement de la poutre 406 dans un premier état stable et des pistes 404 et 405 à connecter par le plot de contact 408 lors d'un basculement de la poutre 406 dans un deuxième état stable.The
Le micro-commutateur de la figure 7 comporte des électrodes permettant l'application de forces électrostatiques. Ces électrodes sont distribuées sur la poutre et le substrat. La poutre 406 supporte sur un premier flanc des électrodes 461 et 462 et, sur un deuxième flanc, des électrodes 463 et 464. Ces électrodes sont situées de chaque côté des plots de contact électrique 407 et 408. Le substrat 401 supporte des électrodes 471 à 474 en regard de chaque électrode supportée par la poutre 406. L'électrode 471 possède une partie en regard de l'électrode 461, cette partie n'étant pas visible sur la figure, et une partie destinée à sa connexion électrique, cette partie étant visible sur la figure. Il en va de même pour les électrodes 472, 473 et 474 par rapport aux électrodes 462, 463 et 464 respectivement.The micro-switch of FIG. 7 comprises electrodes enabling the application of electrostatic forces. These electrodes are distributed over the beam and the substrate. The
Le micro-commutateur peut être mis dans un premier état stable, par exemple celui correspondant à la connexion des pistes conductrices 402 et 403 par le plot de contact 407, par application d'une tension entre les électrodes 461 et 471 d'une part et entre les électrodes 462 et 472 d'autre part. Une fois que la poutre a basculé dans son premier état stable, la tension appliquée peut être supprimée ou réduite de façon à diminuer la résistance de contact entre le plot 407 et les pistes 402 et 403.The micro-switch can be put in a first stable state, for example that corresponding to the connection of the
Le micro-commutateur peut être mis dans le deuxième état stable par application d'une tension entre les électrodes 463 et 473 d'une part et entre les électrodes 464 et 474 d'autre part (et suppression de la tension d'assistance électrostatique de maintien dans le premier état stable si cette assistance était utilisée). Une fois que la poutre a basculé dans son deuxième état stable, la tension appliquée peut être supprimée ou réduite comme précédemment.The microswitch can be put in the second stable state by applying a voltage between the
La figure 8 est une vue de dessus d'une cinquième variante de micro-commutateur double selon la présente invention. Cette cinquième variante est une version optimisée de la variante précédente. Les mêmes références qu'à la ligne précédente ont été conservées pour désigner les mêmes éléments.FIG. 8 is a view from above of a fifth variant of a double micro-switch according to the present invention. This fifth variant is an optimized version of the previous variant. The same references as in the previous line have been retained to designate the same elements.
Les électrodes 471', 472', 473' et 474' ont la même fonction que les électrodes correspondantes 471, 472, 473 et 474 du micro-commutateur de la figure 7. Cependant, elles ont une forme qui correspond à la forme de la poutre déformée. Ceci permet de limiter les tensions d'actionnement ou de maintien (électrodes à entrefer variable).The electrodes 471 ', 472', 473 'and 474' have the same function as the corresponding
La figure 9 est une vue de dessus d'une sixième variante de micro-commutateur double selon la présente invention. Il est représenté dans sa position initiale avant sa mise en service.Figure 9 is a top view of a sixth variant of a dual micro-switch according to the present invention. It is represented in its initial position before being put into service.
On reconnaît le substrat 501, des pistes 502 et 503 à connecter par le plot de contact 507 lors d'un basculement de la poutre 506 dans un premier état stable et des pistes 504 et 505 à connecter par le plot de contact 508 lors d'un basculement de la poutre 506 dans un deuxième état stable.The
La poutre 506 est dans cette variante une poutre métallique, par exemple en aluminium, supportant sur ses flancs les plots de contact 507 et 508. Le basculement de la poutre dans un premier état stable, par exemple celui correspondant à la connexion des pistes conductrices 502 et 503 s'obtient en appliquant une tension de basculement entre la poutre 506 servant d'électrode et les électrodes 571 et 572. Une fois que la poutre a basculé dans son premier état stable, la tension appliquée peut être supprimée ou réduite de façon à diminuer la résistance de contact entre le plot 507 et les pistes 502 et 503.The
Le micro-commutateur peut être mis dans le deuxième état stable par application d'une tension entre la poutre 506 et les électrodes 573 et 574 (et suppression de la tension d'assistance électrostatique de maintien dans le premier état stable si cette assistance était utilisée). Une fois que la poutre a basculé dans son deuxième état stable, la tension appliquée peut être supprimée ou réduite comme précédemment. Pour cette variante de micro-commutateur, l'actionnement électrostatique a été optimisé par la forme donnée aux électrodes 571 à 574.The micro-switch can be put into the second stable state by applying a voltage between the
La figure 10 est une vue de dessus d'un micro-commutateur double correspondant à la première variante mais pourvu de contacts optimisés. Le micro-commutateur est représenté dans sa position initiale avant sa mise en service. Les mêmes références qu' à la figure 1 ont été conservées pour désigner les mêmes éléments.Figure 10 is a top view of a dual micro-switch corresponding to the first variant but provided with optimized contacts. The microswitch is shown in its initial position before being put into service. The same references as in Figure 1 have been retained to designate the same elements.
On remarque sur cette figure que les extrémités 12', 13', 14', et 15' des pistes conductrices respectivement 2, 3, 4 et 5 ont été optimisées pour assurer un meilleur contact électrique avec les plots de contact 7' et 8'. Ainsi, les plots de contact 7' et 8' ont une forme plus large à leur base (c'est-à-dire près de la poutre) qu'à leur sommet. Ils peuvent ainsi s'encastrer plus facilement entre les extrémités 12', 13' et 14', 15' qui sont, elles, pourvues d'un congé d'encastrement.Note in this figure that the ends 12 ', 13', 14 ', and 15' of the conductive tracks respectively 2, 3, 4 and 5 have been optimized to ensure better electrical contact with the contact pads 7 'and 8' . Thus, the contact pads 7 'and 8' have a wider shape at their base (that is to say near the beam) than at their top. They can thus fit more easily between the ends 12 ', 13' and 14 ', 15' which are, they, provided with a recess fillet.
Les extrémités des pistes conductrices peuvent également être légèrement flexibles pour épouser la forme du plot de contact et assurer ainsi un meilleur contact électrique. C'est ce que montre la figure 11 où le micro-commutateur est montré dans un premier état stable.The ends of the conductive tracks may also be slightly flexible to match the shape of the contact pad and thus ensure a better electrical contact. This is what the Figure 11 where the microswitch is shown in a first stable state.
Le micro-commutateur selon la présente invention présente les avantages suivants.The micro-switch according to the present invention has the following advantages.
Son fonctionnement nécessite une faible consommation du fait de la bi-stabilité.Its operation requires a low consumption because of the bi-stability.
Les variantes à actionneur thermique possèdent un rendement d'actionnement élevé. Leur temps de commutation est faible dans la mesure où il n'est pas nécessaire de monter très haut en température pour faire basculer la poutre. Ils ont aussi à faible tension de basculement lorsque des actionneurs électrostiques sont associés aux actionneurs thermiques. Ceci est dû :
- à l'utilisation de l'effet bilame thermique ;
- à l'utilisation de résistances chauffantes intégrées sur la poutre et localisées sur (ou au voisinage strict) des parties à fort coefficient de dilatation thermique du bilame (blocs métalliques) permettant d'avoir le rendement électrothermique le plus élevé possible (pertes thermiques les plus faibles) ;
- à l'utilisation d'une poutre diélectrique, à faible conductivité thermique, évitant une dissipation thermique importante en dehors de la zone du bilame.
- the use of the bimetallic thermal effect;
- the use of heating resistors integrated on the beam and located on (or in the strict vicinity) parts with a high coefficient of thermal expansion of the bimetallic strip (metal blocks) allowing the highest possible electrothermal efficiency (most thermal losses). weak);
- the use of a dielectric beam, low thermal conductivity, avoiding significant heat dissipation outside the bimetallic zone.
On utilise donc dans le cas de l'invention, à la fois la différence de dilatation thermique de deux matériaux différents, mais également l'application et le conditionnement de la température des résistances chauffantes au niveau du bilame.In the case of the invention, therefore, both the difference in thermal expansion of two different materials, but also the application and conditioning the temperature of the heating resistances at the bimetallic strip.
L'invention offre la possibilité d'obtenir un commutateur double.The invention offers the possibility of obtaining a double switch.
Elle offre la possibilité d'obtenir un commutateur où la résistance de contact peut être optimisée :
- par la forme qui peut être donnée aux plots de contact et aux extrémités des pistes à commuter, et éventuellement à la souplesse de la zone de contact qui permet un contact plus « adapté » entre plots de contact et pistes ;
- par la possibilité de l'ajout d'électrodes « d'assistance » de forme adaptée qui permettent d'obtenir une forte pression sur le plot de contact avec une faible tension aux bornes de ces électrodes.
- by the shape that can be given to the contact pads and the ends of the tracks to be switched, and possibly to the flexibility of the contact area which allows a more "suitable" contact between contact pads and tracks;
- by the possibility of adding "assistance" electrodes of suitable shape that allow to obtain a high pressure on the contact pad with a low voltage across these electrodes.
La réalisation des micro-commutateurs selon l'invention présente une forte compatibilité avec les procédés de réalisation des circuits intégrés (métallisations « or » en fin de procédé de fabrication si nécessaire).The embodiment of the microswitches according to the invention has a strong compatibility with the processes for producing integrated circuits (metallizations "gold" at the end of the manufacturing process if necessary).
La bi-stabilité que présente le micro-commutateur est parfaitement contrôlée pour deux raisons. La première raison est que la bi-stabilité est obtenue par le fait que la poutre doit être en contrainte de compression. Cette contrainte est amenée par les matériaux constitutifs du commutateur (forme, épaisseur). Si la poutre est conçue de manière parfaitement symétrique, et si la réalisation de chacun des deux jeux d'actionneurs est faite lors du même dépôt, la contrainte ne peut être que parfaitement symétrique (même forme, même épaisseur et symétrie des actionneurs). On est donc en présence d'un dispositif à même de ne pas privilégier un état stable par rapport à un autre état qui serait moins stable. La deuxième raison est qu'il est possible de contrôler la valeur de la contrainte de compression par la nature du dépôt et également par la conception, en ajoutant des « ressorts » de relâchement de contrainte.The bi-stability of the microswitch is perfectly controlled for two reasons. The first reason is that the bi-stability is obtained by the fact that the beam must be in compressive stress. This constraint is brought by the constituent materials of the switch (shape, thickness). If the beam is designed perfectly symmetrically, and if the realization of each of the two sets of actuators is made during the same deposit, the stress can only be perfectly symmetrical (same shape, same thickness and symmetry of the actuators). It is therefore in the presence of a device capable of not favoring a stable state with respect to another state which would be less stable. The second reason is that it is possible to control the value of the compressive stress by the nature of the deposit and also by the design, by adding "springs" of stress release.
Le micro-commutateur selon l'invention peut avantageusement être réalisé sur un substrat de silicium. La partie encastrement et la poutre peuvent être réalisées en Si3N4, SiO2 ou en silicium polycristallin. Les pistes conductrices, les plots de contact, les électrodes, les actionneurs thermiques peuvent être réalisés en or, en aluminium ou en cuivre, en nickel, matériaux pouvant être déposés sous vide ou par voie électrochimique (électrolyse, dépôt autocatalytique). Les résistances chauffantes peuvent être réalisées en TaN, TiN ou en Ti.The micro-switch according to the invention can advantageously be produced on a silicon substrate. The embedding portion and the beam may be made of Si 3 N 4 , SiO 2 or polycrystalline silicon. The conductive tracks, the contact pads, the electrodes, the thermal actuators can be made of gold, aluminum or copper, nickel, materials that can be deposited under vacuum or electrochemically (electrolysis, electroless plating). The heating resistors may be made of TaN, TiN or Ti.
A titre d'exemple, un procédé de réalisation d'un micro-commutateur ohmique à actionnement thermique sur un substrat de silicium peut comprendre les étapes suivantes :
- dépôt d'une couche d'oxyde de 1 µm d'épaisseur par PECVD sur le substrat,
- lithographie et gravure d'une cavité en vue d'obtenir l'encastrement,
- dé pôt d'une couche de polyimide de 1 µm d'épaisseur, servant de couche sacrificielle,
- planarisation sèche ou polissage mécano-chimique (CMP) de la couche sacrificielle,
- dépôt d' une couche de Si02 de 3 µm d'épaisseur,
- gravure de cette couche de Si02 pour obtenir des ouvertures pour les actionneurs, les plots de contact et les pistes conductrices,
- dépôt d'une couche d'aluminium de 3 µm d'épaisseur,
- planarisation par CMP de la couche d'aluminium jusqu'à révéler la couche de SiO2
- dépôt d'une couche de SiO2 de 0,15 µm d'épaisseur,
- dépôt d'une couche de
TiN de 0,2 µm d'épaisseur, - litho-gravure des résistances chauffantes dans la couche de TiN,
- dépôt d'une couche de SiO2 de 0,2 µm d'épaisseur,
- litho-gravure de cette couche de Si02 pour obtenir des plots de contact des résistances chauffantes,
- litho-gravure du SiO2 avec arrêt sur la couche sacrificielle pour obtenir la poutre,
- dépôt d'un bicouche Cr/
Au de 0,3 µm d'épaisseur, - litho-gravure des pistes conductrices et des plots de contact,
- gravure de la couche sacrificielle pour dégager la poutre.
- depositing an
oxide layer 1 μm thick with PECVD on the substrate, - lithography and engraving of a cavity in order to obtain embedding,
- deposition of a layer of
polyimide 1 μm thick, serving as a sacrificial layer, - dry planarization or chemical mechanical polishing (CMP) of the sacrificial layer,
- deposition of a layer of
Si0 2 3 μm thick, - etching of this layer of Si0 2 to obtain openings for the actuators, the contact pads and the conductive tracks,
- deposition of an
aluminum layer 3 μm thick, - planarization by CMP of the aluminum layer until revealing the layer of SiO 2
- deposition of a layer of SiO 2 0.15 μm thick,
- deposition of a TiN layer 0.2 μm thick,
- litho-etching of the heating resistances in the TiN layer,
- deposition of a layer of SiO 2 0.2 μm thick,
- litho-etching of this layer of Si0 2 to obtain contact pads of the heating resistors,
- litho-etching of the SiO 2 with stopping on the sacrificial layer to obtain the beam,
- deposit of a Cr / Au bilayer 0.3 μm thick,
- litho-etching conductive tracks and contact pads,
- etching the sacrificial layer to clear the beam.
Selon un autre exemple de réalisation, un procédé de réalisation d'un micro-commutateur à actionnement thermique sur un substrat de silicium peut comprendre les étapes suivantes :
- dépôt d'une couche d'oxyde de 1 µm d'épaisseur par PECVD sur le substrat,
- lithographie par gravure d'une cavité en vue d'obtenir l'encastrement,
- dépôt d'une couche de polyimide de 1 µm d'épaisseur, servant de couche sacrificielle,
- planarisation sèche ou polissage mécano-chimique (CMP) de la couche sacrificielle,
- dépôt d'une couche de SiO2 de 3 µm d'épaisseur,
- gravure de cette couche de SiO2 pour obtenir des ouvertures pour les actionneurs,
- dépôt d'une couche d'aluminium de 3 µm d'épaisseur,
- planarisation par CMP des actionneurs,
- dépôt d'une couche de
TiN de 0,2 µm d'épaisseur, - litho-gravure des résistances chauffantes dans la couche de TiN,
- dépôt d'une couche de SiO2 de 0,2 µm d'épaisseur,
- litho-gravure de cette couche de SiO2 pour obtenir des plots de contact des résistances chauffantes,
- litho-gravure de cette couche de SiO2 sur une profondeur de 3,2 µm pour obtenir la poutre,
- dépôt d'un tricouche Ti/Ni/
Au de 1 µm d'épaisseur, - litho-gravure des pistes conductrices et des plots de contact,
- gravure de la couche sacrificielle pour dégager la poutre.
- depositing an
oxide layer 1 μm thick with PECVD on the substrate, - lithography by etching a cavity in order to obtain embedding,
- deposition of a layer of
polyimide 1 μm thick, serving as a sacrificial layer, - dry planarization or chemical mechanical polishing (CMP) of the sacrificial layer,
- deposition of a layer of
SiO 2 3 μm thick, - etching of this SiO 2 layer to obtain openings for the actuators,
- deposition of an
aluminum layer 3 μm thick, - CMP planarization of the actuators,
- deposition of a TiN layer 0.2 μm thick,
- litho-etching of the heating resistances in the TiN layer,
- deposition of a layer of SiO 2 0.2 μm thick,
- litho etching of this layer of SiO 2 to obtain contact pads of the heating resistors,
- litho-etching of this SiO 2 layer to a depth of 3.2 μm to obtain the beam,
- deposition of a Ti / Ni / Au trilayer with a thickness of 1 μm,
- litho-etching conductive tracks and contact pads,
- etching the sacrificial layer to clear the beam.
Claims (15)
- Bistable MEMS microswitch produced on a substrate (1) and capable of electrically connecting the ends (12, 13, 14, 15) of at least two conductive tracks (2, 3, 4, 5), including a beam (6) suspended above the surface of the substrate, wherein the beam is embedded at its two ends and is subjected to compressive stress when it is in the non-deformed position, wherein the beam (6) has electrical contact-forming means (7, 8) arranged so as to produce a lateral connection with the ends of the two conductive tracks when the beam is deformed in a horizontal direction with respect to the surface of the substrate, which microswitch has means (20, 30, 40, 50) for actuating the beam so as to place it either in a first deformed position, corresponding to a first stable state, or in a second deformed position, corresponding to a second stable state and opposite the first deformed position with respect to the non-deformed position, wherein the electrical contact-forming means (7, 8) ensure the connection of the ends (12, 13, 14, 15) of the two conductive tracks (2, 3, 4, 5) when the beam is in its deformed position, characterized in that the non-deformed position of the beam is the initial portion of said beam, i.e. prior to the putting into service of the microswitch.
- Microswitch according to claim 1, characterized in that, as the microswitch is a dual microswitch, the first deformed position corresponds to the connection of the ends (12, 13) of two first conductive tracks (2, 3), and the second deformed position corresponds to the connection of the ends (14, 15) of two second conductive tracks (4, 5).
- Microswitch according to claim 1, characterised in that, as the microswitch is a single microswitch, the first deformed position corresponds to the connection of the ends of two conductive tracks (302, 303) and the second deformed position corresponds to an absence of a connection.
- Microswitch according to any one of claims 1 to 3, characterised in that the beam (6) is made of a dielectric or semiconductor material and the electrical contact-forming means are made of an electrically conductive pad (7, 8) integrated into the beam.
- Microswitch according to claim 4, characterised in that the means for actuating the beam include thermal actuators (20, 30, 40, 50) using a bimetal effect.
- Microswitch according to claim 5, characterised in that each thermal actuator (20) includes a block of thermally conductive material (21) in close contact with an electrical resistance (22).
- Microswitch according to claim 4, characterised in that the means for actuating the beam include means for implementing electrostatic forces (271, 272, 273, 274; 261, 262, 263, 264).
- Microswitch according to claim 4, characterised in that the means for actuating the beam include thermal actuators using a bimetal effect and means for implementing the electrostatic forces.
- Microswitch according to any one of claims 1 to 3, characterised in that the beam (506) is made of an electrically-conductive material.
- Microswitch according to claim 9, characterised in that the means for actuating the beam include means for implementing electrostatic forces (506; 571, 572, 573, 574).
- Microswitch according to any one of the preceding claims, characterised in that the electrical contact-forming means (7', 8') have a form enabling them to be embedded between the ends (12', 13', 14', 15') of the conductive tracks (2, 3, 4, 5) to be connected.
- Microswitch according to claim 10, characterised in that the ends (12', 13', 14', 15') of the conductive tracks (2, 3, 4, 5) have a flexibility enabling them to match the form of the electrical contact-forming means (7', 8) during a connection.
- Microswitch according to any one of the previous claims, characterised in that it includes release spring-forming means (111) for at least one of the embedded ends of the beam (106).
- Microswitch according to any one of claims 1 to 13, characterised in that the electrical contact-forming means are means providing an ohmic contact.
- Microswitch according to any one of claims 1 to 13, characterised in that the electrical contact-forming means are means providing a capacitive contact.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0350278A FR2857153B1 (en) | 2003-07-01 | 2003-07-01 | BISTABLE MICRO-SWITCH WITH LOW CONSUMPTION. |
| PCT/FR2004/050298 WO2005006364A1 (en) | 2003-07-01 | 2004-06-30 | Low power consumption bistable microswitch |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP1639613A1 EP1639613A1 (en) | 2006-03-29 |
| EP1639613B1 true EP1639613B1 (en) | 2007-08-08 |
Family
ID=33523072
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP04767860A Expired - Lifetime EP1639613B1 (en) | 2003-07-01 | 2004-06-30 | Low power consumption bistable microswitch |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7489228B2 (en) |
| EP (1) | EP1639613B1 (en) |
| JP (1) | JP4464397B2 (en) |
| AT (1) | ATE369612T1 (en) |
| DE (1) | DE602004008075T2 (en) |
| FR (1) | FR2857153B1 (en) |
| WO (1) | WO2005006364A1 (en) |
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|---|---|---|---|---|
| US7123216B1 (en) | 1994-05-05 | 2006-10-17 | Idc, Llc | Photonic MEMS and structures |
| WO1999052006A2 (en) | 1998-04-08 | 1999-10-14 | Etalon, Inc. | Interferometric modulation of radiation |
| US7532377B2 (en) | 1998-04-08 | 2009-05-12 | Idc, Llc | Movable micro-electromechanical device |
| US8928967B2 (en) | 1998-04-08 | 2015-01-06 | Qualcomm Mems Technologies, Inc. | Method and device for modulating light |
| WO2003007049A1 (en) | 1999-10-05 | 2003-01-23 | Iridigm Display Corporation | Photonic mems and structures |
| TW200413810A (en) | 2003-01-29 | 2004-08-01 | Prime View Int Co Ltd | Light interference display panel and its manufacturing method |
| FR2865724A1 (en) * | 2004-02-04 | 2005-08-05 | St Microelectronics Sa | Micro-electromechanical system for e.g. aerospace field, has beam that is switched between open and closed positions to establish and break contact between two conductors, where positions correspond to beams` buckling positions |
| US7476327B2 (en) | 2004-05-04 | 2009-01-13 | Idc, Llc | Method of manufacture for microelectromechanical devices |
| US20050269688A1 (en) * | 2004-06-03 | 2005-12-08 | Lior Shiv | Microelectromechanical systems (MEMS) devices integrated in a hermetically sealed package |
| KR101354520B1 (en) | 2004-07-29 | 2014-01-21 | 퀄컴 엠이엠에스 테크놀로지스, 인크. | System and method for micro-electromechanical operating of an interferometric modulator |
| US8008736B2 (en) | 2004-09-27 | 2011-08-30 | Qualcomm Mems Technologies, Inc. | Analog interferometric modulator device |
| US7304784B2 (en) | 2004-09-27 | 2007-12-04 | Idc, Llc | Reflective display device having viewable display on both sides |
| US7612932B2 (en) | 2004-09-27 | 2009-11-03 | Idc, Llc | Microelectromechanical device with optical function separated from mechanical and electrical function |
| US7327510B2 (en) | 2004-09-27 | 2008-02-05 | Idc, Llc | Process for modifying offset voltage characteristics of an interferometric modulator |
| US7420725B2 (en) | 2004-09-27 | 2008-09-02 | Idc, Llc | Device having a conductive light absorbing mask and method for fabricating same |
| US7372613B2 (en) | 2004-09-27 | 2008-05-13 | Idc, Llc | Method and device for multistate interferometric light modulation |
| US7289259B2 (en) | 2004-09-27 | 2007-10-30 | Idc, Llc | Conductive bus structure for interferometric modulator array |
| US7527995B2 (en) | 2004-09-27 | 2009-05-05 | Qualcomm Mems Technologies, Inc. | Method of making prestructure for MEMS systems |
| US7564612B2 (en) | 2004-09-27 | 2009-07-21 | Idc, Llc | Photonic MEMS and structures |
| US7554714B2 (en) | 2004-09-27 | 2009-06-30 | Idc, Llc | Device and method for manipulation of thermal response in a modulator |
| US7944599B2 (en) | 2004-09-27 | 2011-05-17 | Qualcomm Mems Technologies, Inc. | Electromechanical device with optical function separated from mechanical and electrical function |
| US7321456B2 (en) | 2004-09-27 | 2008-01-22 | Idc, Llc | Method and device for corner interferometric modulation |
| US7446927B2 (en) * | 2004-09-27 | 2008-11-04 | Idc, Llc | MEMS switch with set and latch electrodes |
| US7724993B2 (en) * | 2004-09-27 | 2010-05-25 | Qualcomm Mems Technologies, Inc. | MEMS switches with deforming membranes |
| US7893919B2 (en) | 2004-09-27 | 2011-02-22 | Qualcomm Mems Technologies, Inc. | Display region architectures |
| US7630119B2 (en) | 2004-09-27 | 2009-12-08 | Qualcomm Mems Technologies, Inc. | Apparatus and method for reducing slippage between structures in an interferometric modulator |
| US7936497B2 (en) | 2004-09-27 | 2011-05-03 | Qualcomm Mems Technologies, Inc. | MEMS device having deformable membrane characterized by mechanical persistence |
| US7302157B2 (en) | 2004-09-27 | 2007-11-27 | Idc, Llc | System and method for multi-level brightness in interferometric modulation |
| US7719500B2 (en) | 2004-09-27 | 2010-05-18 | Qualcomm Mems Technologies, Inc. | Reflective display pixels arranged in non-rectangular arrays |
| US7283030B2 (en) * | 2004-11-22 | 2007-10-16 | Eastman Kodak Company | Doubly-anchored thermal actuator having varying flexural rigidity |
| US7339454B1 (en) * | 2005-04-11 | 2008-03-04 | Sandia Corporation | Tensile-stressed microelectromechanical apparatus and microelectromechanical relay formed therefrom |
| US7460292B2 (en) | 2005-06-03 | 2008-12-02 | Qualcomm Mems Technologies, Inc. | Interferometric modulator with internal polarization and drive method |
| EP2495212A3 (en) | 2005-07-22 | 2012-10-31 | QUALCOMM MEMS Technologies, Inc. | Mems devices having support structures and methods of fabricating the same |
| BRPI0612997A2 (en) | 2005-07-22 | 2010-12-14 | Qualcomm Inc | MEM devices and their manufacturing methods |
| US7630114B2 (en) | 2005-10-28 | 2009-12-08 | Idc, Llc | Diffusion barrier layer for MEMS devices |
| US7916980B2 (en) | 2006-01-13 | 2011-03-29 | Qualcomm Mems Technologies, Inc. | Interconnect structure for MEMS device |
| US7550810B2 (en) | 2006-02-23 | 2009-06-23 | Qualcomm Mems Technologies, Inc. | MEMS device having a layer movable at asymmetric rates |
| US7623287B2 (en) | 2006-04-19 | 2009-11-24 | Qualcomm Mems Technologies, Inc. | Non-planar surface structures and process for microelectromechanical systems |
| US7417784B2 (en) | 2006-04-19 | 2008-08-26 | Qualcomm Mems Technologies, Inc. | Microelectromechanical device and method utilizing a porous surface |
| US7649671B2 (en) | 2006-06-01 | 2010-01-19 | Qualcomm Mems Technologies, Inc. | Analog interferometric modulator device with electrostatic actuation and release |
| US7471442B2 (en) | 2006-06-15 | 2008-12-30 | Qualcomm Mems Technologies, Inc. | Method and apparatus for low range bit depth enhancements for MEMS display architectures |
| US7835061B2 (en) | 2006-06-28 | 2010-11-16 | Qualcomm Mems Technologies, Inc. | Support structures for free-standing electromechanical devices |
| US7385744B2 (en) | 2006-06-28 | 2008-06-10 | Qualcomm Mems Technologies, Inc. | Support structure for free-standing MEMS device and methods for forming the same |
| US7527998B2 (en) | 2006-06-30 | 2009-05-05 | Qualcomm Mems Technologies, Inc. | Method of manufacturing MEMS devices providing air gap control |
| US7545552B2 (en) | 2006-10-19 | 2009-06-09 | Qualcomm Mems Technologies, Inc. | Sacrificial spacer process and resultant structure for MEMS support structure |
| US7684106B2 (en) | 2006-11-02 | 2010-03-23 | Qualcomm Mems Technologies, Inc. | Compatible MEMS switch architecture |
| US7724417B2 (en) * | 2006-12-19 | 2010-05-25 | Qualcomm Mems Technologies, Inc. | MEMS switches with deforming membranes |
| FR2911448B1 (en) * | 2007-01-16 | 2009-07-10 | St Microelectronics Sa | ACOUSTIC RESONATOR IN VOLUME WITH ADJUSTABLE RESONANCE FREQUENCY AND USE OF SUCH RESONATOR IN THE FIELD OF TELEPHONY |
| US7719752B2 (en) | 2007-05-11 | 2010-05-18 | Qualcomm Mems Technologies, Inc. | MEMS structures, methods of fabricating MEMS components on separate substrates and assembly of same |
| US7625825B2 (en) | 2007-06-14 | 2009-12-01 | Qualcomm Mems Technologies, Inc. | Method of patterning mechanical layer for MEMS structures |
| US7630121B2 (en) | 2007-07-02 | 2009-12-08 | Qualcomm Mems Technologies, Inc. | Electromechanical device with optical function separated from mechanical and electrical function |
| US8022896B2 (en) * | 2007-08-08 | 2011-09-20 | Qualcomm Mems Technologies, Inc. | ESD protection for MEMS display panels |
| JP2009077479A (en) * | 2007-09-19 | 2009-04-09 | Japan Radio Co Ltd | Wireless switch control device |
| US20090146773A1 (en) * | 2007-12-07 | 2009-06-11 | Honeywell International Inc. | Lateral snap acting mems micro switch |
| US7642135B2 (en) * | 2007-12-17 | 2010-01-05 | Skyworks Solutions, Inc. | Thermal mechanical flip chip die bonding |
| US8232858B1 (en) * | 2008-02-20 | 2012-07-31 | Sandia Corporation | Microelectromechanical (MEM) thermal actuator |
| US7944604B2 (en) | 2008-03-07 | 2011-05-17 | Qualcomm Mems Technologies, Inc. | Interferometric modulator in transmission mode |
| DE102009018744A1 (en) | 2009-04-27 | 2010-10-28 | Stock E.K. Bernd | Device for mechanical fixing of objects, has base plate, two standing plates and two pivot plates, where plates are movably connected to each other by five hinges |
| US8582254B2 (en) | 2009-05-29 | 2013-11-12 | General Electric Company | Switching array having circuitry to adjust a temporal distribution of a gating signal applied to the array |
| US8427792B2 (en) | 2009-05-29 | 2013-04-23 | General Electric Company | Method and system to enhance reliability of switch array |
| JP5263203B2 (en) * | 2010-03-12 | 2013-08-14 | オムロン株式会社 | Electrostatic relay |
| US8339787B2 (en) * | 2010-09-08 | 2012-12-25 | Apple Inc. | Heat valve for thermal management in a mobile communications device |
| CN102142338A (en) * | 2010-12-16 | 2011-08-03 | 上海交通大学 | Multidirectional and multistable multi-channel micro-electromechanical switch for in-plane movement |
| US8963159B2 (en) | 2011-04-04 | 2015-02-24 | Qualcomm Mems Technologies, Inc. | Pixel via and methods of forming the same |
| US9134527B2 (en) | 2011-04-04 | 2015-09-15 | Qualcomm Mems Technologies, Inc. | Pixel via and methods of forming the same |
| US8659816B2 (en) | 2011-04-25 | 2014-02-25 | Qualcomm Mems Technologies, Inc. | Mechanical layer and methods of making the same |
| FR2984008B1 (en) * | 2011-12-13 | 2014-01-10 | Commissariat Energie Atomique | ELECTRONIC DEVICE |
| FR2990320B1 (en) | 2012-05-07 | 2014-06-06 | Commissariat Energie Atomique | DIGITAL SPEAKER WITH IMPROVED PERFORMANCE |
| ITTO20120691A1 (en) * | 2012-08-01 | 2014-02-02 | Milano Politecnico | IMPACT SENSOR WITH BISTABLE MECHANISM AND METHOD FOR DETECTING IMPACTS |
| FR3012671B1 (en) * | 2013-10-29 | 2015-11-13 | St Microelectronics Rousset | INTEGRATED MECHANICAL DEVICE WITH VERTICAL MOVEMENT |
| WO2017082985A2 (en) * | 2015-08-20 | 2017-05-18 | Northeaslem University | Zero power plasmonic microelectromechanical device |
| KR101968644B1 (en) * | 2018-05-15 | 2019-08-13 | 울산과학기술원 | A bistable structure of twist type manufactured in a 3D printing and use thereof |
| KR101968650B1 (en) * | 2018-05-15 | 2019-04-12 | 울산과학기술원 | Rotationable bistable structure manufactured in a 3D printing and use thereof |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5619061A (en) * | 1993-07-27 | 1997-04-08 | Texas Instruments Incorporated | Micromechanical microwave switching |
| US5536963A (en) * | 1994-05-11 | 1996-07-16 | Regents Of The University Of Minnesota | Microdevice with ferroelectric for sensing or applying a force |
| FR2772512B1 (en) * | 1997-12-16 | 2004-04-16 | Commissariat Energie Atomique | MICROSYSTEM WITH DEFORMABLE ELEMENT UNDER THE EFFECT OF A THERMAL ACTUATOR |
| US6188301B1 (en) * | 1998-11-13 | 2001-02-13 | General Electric Company | Switching structure and method of fabrication |
| DE19937811C2 (en) * | 1999-08-11 | 2001-07-26 | Bosch Gmbh Robert | Relays, in particular micro relays for forming a circuit |
| US6239685B1 (en) * | 1999-10-14 | 2001-05-29 | International Business Machines Corporation | Bistable micromechanical switches |
| FR2818795B1 (en) * | 2000-12-27 | 2003-12-05 | Commissariat Energie Atomique | MICRO-DEVICE WITH THERMAL ACTUATOR |
| US6911891B2 (en) * | 2001-01-19 | 2005-06-28 | Massachusetts Institute Of Technology | Bistable actuation techniques, mechanisms, and applications |
| SE0101183D0 (en) * | 2001-04-02 | 2001-04-02 | Ericsson Telefon Ab L M | Micro electromechanical switches |
| KR100929601B1 (en) * | 2001-08-20 | 2009-12-03 | 허니웰 인터내셔널 인코포레이티드 | Snap-In Thermal Switch |
| US6621392B1 (en) * | 2002-04-25 | 2003-09-16 | International Business Machines Corporation | Micro electromechanical switch having self-aligned spacers |
| JP3969228B2 (en) * | 2002-07-19 | 2007-09-05 | 松下電工株式会社 | Mechanical deformation detection sensor, acceleration sensor using the same, and pressure sensor |
| US7283030B2 (en) * | 2004-11-22 | 2007-10-16 | Eastman Kodak Company | Doubly-anchored thermal actuator having varying flexural rigidity |
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2003
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2004
- 2004-06-30 EP EP04767860A patent/EP1639613B1/en not_active Expired - Lifetime
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- 2004-06-30 US US10/561,948 patent/US7489228B2/en not_active Expired - Lifetime
- 2004-06-30 AT AT04767860T patent/ATE369612T1/en not_active IP Right Cessation
- 2004-06-30 DE DE602004008075T patent/DE602004008075T2/en not_active Expired - Lifetime
- 2004-06-30 JP JP2006516357A patent/JP4464397B2/en not_active Expired - Lifetime
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| DE602004008075T2 (en) | 2008-05-15 |
| JP2007516560A (en) | 2007-06-21 |
| FR2857153B1 (en) | 2005-08-26 |
| EP1639613A1 (en) | 2006-03-29 |
| WO2005006364A1 (en) | 2005-01-20 |
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