EP1606429B1 - Verfahren zur cvd-abscheidung eines silberfilms auf einem substrat - Google Patents
Verfahren zur cvd-abscheidung eines silberfilms auf einem substrat Download PDFInfo
- Publication number
- EP1606429B1 EP1606429B1 EP04742294A EP04742294A EP1606429B1 EP 1606429 B1 EP1606429 B1 EP 1606429B1 EP 04742294 A EP04742294 A EP 04742294A EP 04742294 A EP04742294 A EP 04742294A EP 1606429 B1 EP1606429 B1 EP 1606429B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- silver
- substrate
- process according
- precursor
- amine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 229910052709 silver Inorganic materials 0.000 title claims abstract description 47
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 title claims abstract description 46
- 239000004332 silver Substances 0.000 title claims abstract description 46
- 239000000758 substrate Substances 0.000 title claims abstract description 32
- 238000000034 method Methods 0.000 title claims abstract description 26
- 230000008021 deposition Effects 0.000 title claims abstract description 20
- 239000002243 precursor Substances 0.000 claims abstract description 31
- 239000007788 liquid Substances 0.000 claims abstract description 12
- 239000002904 solvent Substances 0.000 claims abstract description 12
- 150000001412 amines Chemical class 0.000 claims abstract description 11
- 150000002825 nitriles Chemical class 0.000 claims abstract description 10
- 238000000354 decomposition reaction Methods 0.000 claims abstract description 5
- 230000008020 evaporation Effects 0.000 claims abstract description 5
- 238000001704 evaporation Methods 0.000 claims abstract description 5
- 125000004432 carbon atom Chemical group C* 0.000 claims abstract description 3
- -1 silver carboxylate Chemical class 0.000 claims abstract description 3
- UAOMVDZJSHZZME-UHFFFAOYSA-N diisopropylamine Chemical compound CC(C)NC(C)C UAOMVDZJSHZZME-UHFFFAOYSA-N 0.000 claims description 27
- KDSNLYIMUZNERS-UHFFFAOYSA-N 2-methylpropanamine Chemical compound CC(C)CN KDSNLYIMUZNERS-UHFFFAOYSA-N 0.000 claims description 10
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 claims description 9
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 claims description 9
- JFDZBHWFFUWGJE-UHFFFAOYSA-N benzonitrile Chemical compound N#CC1=CC=CC=C1 JFDZBHWFFUWGJE-UHFFFAOYSA-N 0.000 claims description 9
- 229940043279 diisopropylamine Drugs 0.000 claims description 9
- BMVXCPBXGZKUPN-UHFFFAOYSA-N 1-hexanamine Chemical compound CCCCCCN BMVXCPBXGZKUPN-UHFFFAOYSA-N 0.000 claims description 6
- AKEXVWKYUAMNKL-UHFFFAOYSA-N 2,2-dimethylpropanoic acid;silver Chemical compound [Ag].CC(C)(C)C(O)=O AKEXVWKYUAMNKL-UHFFFAOYSA-N 0.000 claims description 6
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 claims description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 6
- WGQKYBSKWIADBV-UHFFFAOYSA-N benzylamine Chemical compound NCC1=CC=CC=C1 WGQKYBSKWIADBV-UHFFFAOYSA-N 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 6
- 239000001301 oxygen Substances 0.000 claims description 6
- 229910052760 oxygen Inorganic materials 0.000 claims description 6
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 5
- 239000001257 hydrogen Substances 0.000 claims description 5
- 229910052739 hydrogen Inorganic materials 0.000 claims description 5
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 claims description 4
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 claims description 4
- NJBCRXCAPCODGX-UHFFFAOYSA-N 2-methyl-n-(2-methylpropyl)propan-1-amine Chemical compound CC(C)CNCC(C)C NJBCRXCAPCODGX-UHFFFAOYSA-N 0.000 claims description 3
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 claims description 3
- RFFFKMOABOFIDF-UHFFFAOYSA-N Pentanenitrile Chemical compound CCCCC#N RFFFKMOABOFIDF-UHFFFAOYSA-N 0.000 claims description 3
- 239000000919 ceramic Substances 0.000 claims description 3
- AUHZEENZYGFFBQ-UHFFFAOYSA-N mesitylene Substances CC1=CC(C)=CC(C)=C1 AUHZEENZYGFFBQ-UHFFFAOYSA-N 0.000 claims description 3
- 125000001827 mesitylenyl group Chemical group [H]C1=C(C(*)=C(C([H])=C1C([H])([H])[H])C([H])([H])[H])C([H])([H])[H] 0.000 claims description 3
- 229920000768 polyamine Polymers 0.000 claims description 3
- FVSKHRXBFJPNKK-UHFFFAOYSA-N propionitrile Chemical compound CCC#N FVSKHRXBFJPNKK-UHFFFAOYSA-N 0.000 claims description 3
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 claims description 2
- 229910000577 Silicon-germanium Inorganic materials 0.000 claims description 2
- 230000005495 cold plasma Effects 0.000 claims description 2
- 239000011521 glass Substances 0.000 claims description 2
- 229910052759 nickel Inorganic materials 0.000 claims description 2
- 150000002894 organic compounds Chemical group 0.000 claims description 2
- 229920000642 polymer Polymers 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 239000008096 xylene Substances 0.000 claims description 2
- 229910017214 AsGa Inorganic materials 0.000 claims 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 claims 1
- 229910002244 LaAlO3 Inorganic materials 0.000 claims 1
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 claims 1
- 239000002887 superconductor Substances 0.000 abstract description 4
- 239000006193 liquid solution Substances 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 27
- 238000000151 deposition Methods 0.000 description 20
- 239000000243 solution Substances 0.000 description 15
- 239000010408 film Substances 0.000 description 13
- 239000000203 mixture Substances 0.000 description 13
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 238000009834 vaporization Methods 0.000 description 6
- 230000008016 vaporization Effects 0.000 description 6
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- IUGYQRQAERSCNH-UHFFFAOYSA-M pivalate Chemical compound CC(C)(C)C([O-])=O IUGYQRQAERSCNH-UHFFFAOYSA-M 0.000 description 4
- 229950010765 pivalate Drugs 0.000 description 4
- OUAVGIYAYBLYCN-UHFFFAOYSA-N n-propan-2-ylpropan-2-amine;1,3,5-trimethylbenzene Chemical compound CC(C)NC(C)C.CC1=CC(C)=CC(C)=C1 OUAVGIYAYBLYCN-UHFFFAOYSA-N 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 230000001464 adherent effect Effects 0.000 description 2
- 150000007942 carboxylates Chemical class 0.000 description 2
- 229910052802 copper Chemical group 0.000 description 2
- 239000010949 copper Chemical group 0.000 description 2
- 238000004090 dissolution Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 2
- 238000001465 metallisation Methods 0.000 description 2
- 238000004377 microelectronic Methods 0.000 description 2
- 238000001878 scanning electron micrograph Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- KWYHDKDOAIKMQN-UHFFFAOYSA-N N,N,N',N'-tetramethylethylenediamine Chemical compound CN(C)CCN(C)C KWYHDKDOAIKMQN-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 229910004200 TaSiN Inorganic materials 0.000 description 1
- 229910008482 TiSiN Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229910008807 WSiN Inorganic materials 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical group [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- ZDWYFWIBTZJGOR-UHFFFAOYSA-N bis(trimethylsilyl)acetylene Chemical group C[Si](C)(C)C#C[Si](C)(C)C ZDWYFWIBTZJGOR-UHFFFAOYSA-N 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- QRXWMOHMRWLFEY-UHFFFAOYSA-N isoniazide Chemical compound NNC(=O)C1=CC=NC=C1 QRXWMOHMRWLFEY-UHFFFAOYSA-N 0.000 description 1
- 239000012705 liquid precursor Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000006911 nucleation Effects 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 238000001226 reprecipitation Methods 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 238000004626 scanning electron microscopy Methods 0.000 description 1
- 150000003378 silver Chemical class 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
Definitions
- the present invention relates to the deposition of thin films of silver on various substrates, in particular on superconducting substrates.
- the object of the present invention is to provide a method of depositing a silver layer on a substrate, by a suitable choice of reagents for the dissolution of a silver precursor in a solvent usable in CVD.
- silver pivalate (CH 3 ) 3 -C-CO 2 Ag is particularly preferred. Its decomposition temperature is 200 ° C.
- organic compounds which are liquid at room temperature and up to about 200 ° C under normal pressure conditions are preferred.
- mesitylene cyclohexane
- xylene xylene
- toluene n-octane
- the amine may be chosen from primary, secondary or tertiary monoamines, or from polyamines.
- monoamines mention may be made of n-hexylamine, isobutylamine, disecbutylamine, triethylamine, benzylamine, ethanolamine and diisopropylamine.
- polyamines include tetramethylethylenediamine.
- the nitrile may be chosen from acetonitrile, valeronitrile, benzonitrile and propionitrile.
- mixtures of mesitylene with n-hexylamine, isobutylamine, diisopropylamine, triethylamine, acetonitrile, benzonitrile or valeronitrile, mixtures of propionitrile with hexylamine, and the like are particularly preferred.
- the substrate on which the silver layer is deposited can be a high-T c superconductor material, a dense ceramic or a porous ceramic, a heat resistant polymer, a glass, MgO, LaAlO 3, Ni, Si, GaAs, InP, SiC and SiGe.
- the process makes it possible to obtain silver deposits having a thickness up to 800 nm.
- the composition containing the silver precursor is sent to a vaporization device through which it is introduced into a high-temperature deposition chamber. which contains the support on which the silver layer must be deposited. Before its arrival in the vaporization device, the composition is generally maintained in a tank at room temperature.
- the vaporization of the precursor composition can be carried out using various devices known to those skilled in the art. By way of a preferred example, mention may be made of the device described in Chem. Mast. 13, 3993 (2001) ), marketed by Jipelec under the name "InJect System for the injection and evaporation of pure liquid precursors or in the form of solutions”.
- the temperature of the substrate to be coated and the temperature in the deposition chamber is between 200 and 450 ° C.
- the deposition chamber is under an oxygen atmosphere or under an atmosphere of hydrogen and at a pressure less than or equal to 15 Torr. Hydrogen or oxygen may be introduced into the deposition chamber in the form of a mixture with N 2 in which the volume ratio H 2 / N 2 or O 2 / N 2 is less than or equal to 1.
- a cold plasma may possibly be added around the support.
- the support intended to receive the silver layer it is sufficient for the support intended to receive the silver layer to be kept at the same temperature that prevails in the evaporator.
- the silver layer may be deposited on the support as a first layer or as an nth metallization layer for electronic devices requiring several levels of metallization.
- the support may be constituted by one of the aforementioned materials taken as such, or by one of these materials carrying one or more intermediate layers.
- intermediate layers include metal films (for example a Ni film), an organic layer (for example a layer of a polymer material), or diffusion layers consisting of for example, TiN, TiSiN, Ta, TaN, TaSiN, WN and WSiN.
- the thickness of the silver layer that is deposited on the support depends on the concentration of the precursor composition, the flow rate of this composition during the passage into the vaporization device, the duration of the vaporization, the respective temperatures in the the reactor and on the support. In general, less concentrated compositions and / or lower flow rates for obtaining thin layers, and more concentrated compositions and / or higher flow rates for obtaining thick layers are used.
- thin layer is generally meant a layer having a thickness of less than or equal to 50 nm, called the nucleation layer.
- thick layer is generally meant a layer having a thickness between 50 nm and 1 micron.
- compositions can be used in a solvent with a high dissolution coefficient at a precursor concentration close to saturation.
- concentration must remain below the saturation value, in order to avoid the reprecipitation of the precursor which would have the effect of hindering the vaporization.
- the implementation of the method of the invention for the deposition of silver layers by CVD makes it possible to obtain silver layers of good quality having a good adhesion to the support on which they are deposited.
- the examples were carried out using a CVD reactor constituted by a device “InJect” supra, coupled to a chemical vapor deposition chamber.
- Said device “InJect” comprises four main parts: the storage tank of the solution, an injector connected by a supply line to the storage tank and provided with an electronic control device, a carrier gas supply line or neutral carrier (for example nitrogen) and an evaporator.
- the chemical vapor deposition chamber which contains the substrate to be coated, comprises heating means, an oxygen supply or hydrogen, and pumping means and reducing pressure.
- the evaporator is connected to the chemical vapor deposition chamber by a pipe which is provided with heating means and which is kept at the same temperature as the evaporator.
- the chemical vapor deposition chamber and the substrate to be coated placed therein are maintained at a temperature higher than that of the evaporator.
- the silver precursor solution is introduced into the tank maintained at a pressure of 1 bar, and then propelled from said tank through the injector by pressure difference in the evaporator which is kept under vacuum.
- the injection rate is controlled by the injector which can be considered as a micro-solenoid valve and which is controlled by a computer.
- a silver film was deposited on a substrate placed in the enclosure deposition at 250 ° C under a pressure of 7.5 Torr.
- FIGS. 1a and 1b show the Scanning Electron Microscopy (SEM) images of the surface of the Ag deposition obtained on the MgO substrate at different magnifications.
- FIGS. 2a and 2b show Scanning Electron Microscopy (SEM) photographs of the surface of the Ag deposition obtained on the LaAlO 3 substrate under different magnifications.
- FIG. 3 represents the X-ray diffraction pattern of the deposit obtained on the monocrystalline MgO substrate.
- N represents the number of shots, in arbitrary units.
- 2 ⁇ represents the diffraction angle, in degrees.
- Example 2 The procedure described in Example 1 was repeated, replacing the diisopropylamine with n-hexylamine, respectively with a monocrystalline substrate of MgO, and with a monocrystalline LaAlO 3 substrate.
- a silver film was deposited on a monocrystalline Si substrate maintained at 300 ° C and placed in the deposition chamber at 150 ° C under a pressure of 7.5 Torr.
- a silver film having a thickness of 250 nm was deposited in 35 minutes, with a growth rate of 0.43 ⁇ m / h.
- a silver film was deposited on a substrate maintained at 320 ° C. and placed in the deposit enclosure at 150 ° C. under a pressure of 7.5 Torr.
- Two samples were prepared according to this method, one with Si monocrystalline substrate, the other with SiO 2 / Si substrate.
- a silver film having a thickness of 150 nm was deposited in 8 minutes, with a growth rate of 1.125 microns / h.
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- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Claims (10)
- Verfahren zur Abscheidung eines Silberfilms auf einem Substrat, das darin besteht, eine Silberabscheidung mittels CVD auf dem Substrat unter Einsatz einer Silbervorläuferlösung durchzuführen, wobei:- der Silbervorläufer ein Silbercarboxylat RCO2Ag ist, worin R ein unverzweigter oder verzweigter Alkylrest mit 3 bis 7 Kohlenstoffatomen ist, das in Form einer Lösung in einer organischen Flüssigkeit eingesetzt wird;- die Konzentration des Vorläufers in der Lösung zwischen 0,01 und 0,6 mol/l beträgt und unter der Sättigungskonzentration bleibt;- die organische Flüssigkeit ein Amin und/oder ein Nitril umfasst, sowie gegebenenfalls ein Lösungsmittel, dessen Verdampfungstemperatur niedriger ist als die Zersetzungstemperatur des Vorläufers;- der Volumsprozentsatz des Amins und/oder Nitrils in der organischen Flüssigkeit mehr als 0,1 % beträgt;wobei das Verfahren dadurch gekennzeichnet ist, dass es unter Sauerstoff- oder Wasserstoffatmosphäre durchgeführt wird.
- Verfahren nach Anspruch 1, dadurch gekennzeichnet, dass der Silbervorläufer Silberpivalat (CH3)3-C-CO2Ag ist.
- Verfahren nach Anspruch 1, dadurch gekennzeichnet, dass das Lösungsmittel eine organische Verbindung ist, die bei Raumtemperatur bis etwa 200 °C unter Normaldruckbedingungen flüssig ist.
- Verfahren nach Anspruch 3, dadurch gekennzeichnet, dass das Lösungsmittel aus Mesitylen, Cyclohexan, Xylol, Toluol und n-Octan ausgewählt wird.
- Verfahren nach Anspruch 1, dadurch gekennzeichnet, dass das Amin ein Monoamin, ausgewählt aus n-Hexylamin, Isobutylamin, Di-sec-butylamin, Triethylamin, Benzylamin, Ethanolamin und Diisopropylamin ist.
- Verfahren nach Anspruch 1, dadurch gekennzeichnet, dass das Amin ein Polyamin ist.
- Verfahren nach Anspruch 1, dadurch gekennzeichnet, dass das Nitril aus Acetonitril, Valeronitril, Benzonitril und Propionitril ausgewählt wird.
- Verfahren nach Anspruch 1, dadurch gekennzeichnet, dass das Substrat aus einem Material besteht, das aus supraleitenden Materialien mit hoher Tc, Keramiken, wärmebeständigen Polymeren, Gläsern, MgO, LaAlO3, Ni, Si, AsGa, InP, SiC und SiGe ausgewählt wird.
- Verfahren nach Anspruch 1, dadurch gekennzeichnet, dass die Temperatur des zu beschichtenden Substrats zwischen 200 und 450 °C beträgt.
- Verfahren nach Anspruch 1, dadurch gekennzeichnet, dass ein Kaltplasma rund um das Substrat zugesetzt wird.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0303613 | 2003-03-25 | ||
FR0303613A FR2852971B1 (fr) | 2003-03-25 | 2003-03-25 | Procede pour le depot par cvd d'un film d'argent sur un substrat |
PCT/FR2004/000678 WO2004087988A1 (fr) | 2003-03-25 | 2004-03-19 | Procede pour le depot par cvd d'un film d'argent sur un substrat |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1606429A1 EP1606429A1 (de) | 2005-12-21 |
EP1606429B1 true EP1606429B1 (de) | 2007-12-26 |
Family
ID=32947138
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP04742294A Expired - Lifetime EP1606429B1 (de) | 2003-03-25 | 2004-03-19 | Verfahren zur cvd-abscheidung eines silberfilms auf einem substrat |
Country Status (6)
Country | Link |
---|---|
US (1) | US7608299B2 (de) |
EP (1) | EP1606429B1 (de) |
AT (1) | ATE382105T1 (de) |
DE (1) | DE602004010894T2 (de) |
FR (1) | FR2852971B1 (de) |
WO (1) | WO2004087988A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102008030900A1 (de) * | 2008-06-30 | 2009-12-31 | Oliver Feddersen-Clausen | Verdampfbare Silbercarboxylat-Amin-Komplexe als Silberprecursor sowie Verdampfungsverfahren für dieselben |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
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FR2880036B1 (fr) * | 2004-12-23 | 2007-09-07 | Commissariat Energie Atomique | Procede de preparation de nonoparticules d'argent ou d'alliage d'argent dispersees sur un substrat par depot chimique en phase vapeur |
FR2887560B1 (fr) * | 2005-06-28 | 2007-10-12 | Commissariat Energie Atomique | Films composites a base de metal et d'oxyde pour applications antimicrobiennes et procede de protection ou de decontamination d'un substrat mettant en oeuvre de tels films |
FR2919308B1 (fr) * | 2007-07-23 | 2009-12-11 | Commissariat Energie Atomique | Procede de preparation d'un materiau nanocomposite par depot chimique en phase vapeur. |
GB0812483D0 (en) * | 2008-07-08 | 2009-01-07 | Bae Systems Plc | Electrical Circuit Assemblies and Structural Components Incorporating same |
CN102633326B (zh) * | 2012-04-28 | 2014-05-21 | 云南铜业股份有限公司 | 处理铜冶金流程中含氯酸性废水的离子交换膜电解方法 |
FR3062327B1 (fr) * | 2017-01-30 | 2019-04-19 | Safran Aircraft Engines | Procede pour le decollement d'un element metallique colle a un element en materiau composite |
FR3129611A1 (fr) | 2021-11-29 | 2023-06-02 | IFP Energies Nouvelles | Catalyseur d’hydrocraquage comprenant une zeolithe y specifique pour la production de naphta |
FR3130641A1 (fr) | 2021-12-16 | 2023-06-23 | IFP Energies Nouvelles | Catalyseur d’hydrocraquage comprenant une zeolithe y specifique et une zeolithe de type mfi pour la production d’une charge de vapocraquage |
FR3133389A1 (fr) | 2022-03-08 | 2023-09-15 | IFP Energies Nouvelles | Catalyseur d’hydrocraquage comprenant deux zeolithes y dont une zeolithe y specifique pour la production de naphta |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
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DE3344343A1 (de) * | 1983-12-08 | 1985-06-13 | Battelle-Institut E.V., 6000 Frankfurt | Verfahren zur herstellung von schalenkatalysatoren |
JPH0940489A (ja) * | 1995-03-30 | 1997-02-10 | Pioneer Electron Corp | Mocvdの固体原料供給方法及び供給装置 |
US20020041928A1 (en) * | 1997-03-26 | 2002-04-11 | Leonid V. Budaragin | Method for coating substrate with metal oxide coating |
US6010969A (en) * | 1996-10-02 | 2000-01-04 | Micron Technology, Inc. | Method of depositing films on semiconductor devices by using carboxylate complexes |
US6267074B1 (en) * | 1997-02-24 | 2001-07-31 | Foi Corporation | Plasma treatment systems |
US6613924B1 (en) * | 1999-11-23 | 2003-09-02 | Research Foundation Of State Of New York | Silver precursors for CVD processes |
JP2005511894A (ja) * | 2001-12-04 | 2005-04-28 | プライマックス・インコーポレーテッド | 化学蒸着用ベーパライザ |
-
2003
- 2003-03-25 FR FR0303613A patent/FR2852971B1/fr not_active Expired - Lifetime
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2004
- 2004-03-19 DE DE602004010894T patent/DE602004010894T2/de not_active Expired - Lifetime
- 2004-03-19 AT AT04742294T patent/ATE382105T1/de not_active IP Right Cessation
- 2004-03-19 US US10/550,459 patent/US7608299B2/en not_active Expired - Fee Related
- 2004-03-19 EP EP04742294A patent/EP1606429B1/de not_active Expired - Lifetime
- 2004-03-19 WO PCT/FR2004/000678 patent/WO2004087988A1/fr active IP Right Grant
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102008030900A1 (de) * | 2008-06-30 | 2009-12-31 | Oliver Feddersen-Clausen | Verdampfbare Silbercarboxylat-Amin-Komplexe als Silberprecursor sowie Verdampfungsverfahren für dieselben |
DE102008030900B4 (de) * | 2008-06-30 | 2011-01-13 | Oliver Feddersen-Clausen | Verdampfbare Silbercarboxylat-Amin-Komplexe als Silberprecursor sowie Verdampfungsverfahren für dieselben |
Also Published As
Publication number | Publication date |
---|---|
DE602004010894T2 (de) | 2008-12-18 |
FR2852971B1 (fr) | 2005-06-03 |
US20070148345A1 (en) | 2007-06-28 |
WO2004087988A1 (fr) | 2004-10-14 |
FR2852971A1 (fr) | 2004-10-01 |
EP1606429A1 (de) | 2005-12-21 |
ATE382105T1 (de) | 2008-01-15 |
US7608299B2 (en) | 2009-10-27 |
DE602004010894D1 (de) | 2008-02-07 |
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