EP1164487A1 - Vorrichtung zur funktionellen Widergabe einer spezifischen integrierten Halbleiterschaltung und seine Verwendung als Emulationsvorrichtung - Google Patents

Vorrichtung zur funktionellen Widergabe einer spezifischen integrierten Halbleiterschaltung und seine Verwendung als Emulationsvorrichtung Download PDF

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Publication number
EP1164487A1
EP1164487A1 EP00480051A EP00480051A EP1164487A1 EP 1164487 A1 EP1164487 A1 EP 1164487A1 EP 00480051 A EP00480051 A EP 00480051A EP 00480051 A EP00480051 A EP 00480051A EP 1164487 A1 EP1164487 A1 EP 1164487A1
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EP
European Patent Office
Prior art keywords
functions
integrated circuit
specific
specific integrated
module
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP00480051A
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English (en)
French (fr)
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EP1164487B1 (de
Inventor
Sghaier Noury
Tristan Bonhomme
Pascal Jullien
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Scaleo Chip SA
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Scaleo Chip SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to DK00480051T priority Critical patent/DK1164487T3/da
Priority to ES00480051T priority patent/ES2193041T3/es
Priority to PT00480051T priority patent/PT1164487E/pt
Priority to EP00480051A priority patent/EP1164487B1/de
Priority to AT00480051T priority patent/ATE233000T1/de
Application filed by Scaleo Chip SA filed Critical Scaleo Chip SA
Priority to DE60001450T priority patent/DE60001450T2/de
Priority to US09/698,247 priority patent/US7130787B1/en
Publication of EP1164487A1 publication Critical patent/EP1164487A1/de
Application granted granted Critical
Publication of EP1164487B1 publication Critical patent/EP1164487B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation

Definitions

  • the present invention relates generally to the prototyping, development and emulation of circuits specific integrated devices intended to be incorporated into application cards and relates in particular to a device for the functional reproduction of a circuit specific integrated and its use as a device emulation when the integrated circuit is incorporated in an application card.
  • the integrated circuits are confronted during their development with three problems: the emulation which consists in replacing in the final application the integrated circuit or the chip by a emulation device performing the same functions as the integrated circuit, prototyping consisting in obtaining a prototype of the future integrated circuit and development consisting of testing both hardware and software applications and possibly debug in case of errors.
  • the main object of the invention is therefore to provide a device for the functional reproduction of a circuit specific built-in intended to be used for emulation of the integrated circuit in a specific application.
  • Another object of the invention is also to provide a device for the functional reproduction of a circuit specific integrated that can be used as a integrated circuit prototyping.
  • Yet another object of the invention is also to provide a device for the functional reproduction of a circuit specific integrated that can be used as a platform development of the integrated circuit.
  • the object of the invention is thus a device for real-time functional reproduction of a circuit specific integrated composed of a processing unit and peripherals to perform specific functions digital and / or analog under software control specific, this specific integrated circuit being intended for be incorporated into a specific application card.
  • the device includes a processing module functionally identical to the processing unit of the specific integrated circuit, a plurality of modules devices that can each run one or more digital and / or analog functions which can be each selected separately, and a module interconnection of functions to establish connections between the processing module and digital functions and / or analogs previously selected found in at least one of the peripheral modules, identical to specific functions of the specific integrated circuit, so the reproductive device behaves the same way as the specific integrated circuit when the specific software is executed.
  • the functional reproduction 10 comprises mainly a processing module 12 connected to peripheral modules 14, 16 or 18 by means of a module interconnection of functions 20, as well as a module input / output interconnection 22 at the module output peripherals and a 24 interface which allows the connection of the one-card functional reproduction device of application 26.
  • the processing module 12 is a processing unit conventional (CPU type), usually in the form of a chip silicon but without the functions that usually do integral part of an integrated circuit. All connections internals which are normally incorporated in the circuit integrated here are the subject of external connections represented generally by bus 28 called internal bus thereafter. Consequently, the processing module 12 occupies a place much more important than the chip that will contain the circuit specific integrated which is functionally reproduced since it has many more connections to outside (around 400) than the final chip (around 150).
  • CPU type central processing unit
  • Peripheral modules are integrated circuits containing on a single chip a plurality of functions which can be implemented in an integrated circuit specific.
  • the modules are divided into two categories: non-programmable modules (NP) such as modules 14 or 16 and programmable modules (PROG) such as the module 18.
  • Non-programmable modules are circuits each incorporating several dozen digital functions and / or analog.
  • Classic digital functions are for example: a time pulse generator or a Timer, a USART (Universal Synchronous) function Asynchronous Receiver Trasmitter), or the specific function CAN which is a communication protocol in the industry and the automobile.
  • Classic analog functions are for example analog to digital converters (ADC) or digital-analog, operational amplifiers or analog comparators.
  • the device according to the invention comprises several so as to provide all the possible functions so as to allow the circuit integrated specific to be adapted to the intended application and to evolve with the applications, since we can reprogram at will the device according to the invention for that it corresponds to a new application.
  • programmable modules these are usually networks FPGA (Field Programmable Gate) type logic Array) which allow by programming them to realize desired digital functions.
  • the function interconnection module 20 is a interconnection matrix that can be programmed so to be connected by means of the first link bus 30, the lines of the internal bus 28 with certain functions of at least one peripheral modules 14, 16 and 18 corresponding to functions which will be incorporated in the integrated circuit final.
  • the input / output interconnection module 22 is also a programmed interconnection matrix of the same way that the function interconnect module for connect the outputs of the functions selected in the peripheral modules by means of a second link bus 32, to the output bus 34.
  • the output bus 34 can be connected to the application card by a cable 36 and a interface circuit 24.
  • the ribbon cable 36 is connected to the output connections of integrated circuit 27 which has no yet been incorporated on card 26 (it is shown in dotted on the figure). This allows the device 10 to serve as an emulation device when the web 36 is connected to the card 26.
  • the functional reproduction device 10 is connected to a host computer 38 by a serial interface of the type JTAG 40 which allows to download code from the computer to the processing module, for the purpose mainly to perform testing and debugging at software level.
  • the functional reproductive device For each specific integrated circuit to be emulated, the functional reproductive device must be configured to reproduce the circuit functions identically integrated. For this, we develop a program in HDL (Hardware Description Language) established according to the functions to to select.
  • HDL Hardware Description Language
  • the obtained code provided by the host computer 38 is stored in a Flash 42 type memory.
  • a programmable controller 44 performs serial parallel code conversion and performs programming the configuration by activating the appropriate connections in the interconnection module 20 first then in the interconnection module 22.
  • the functional reproduction device 10 comprises also a memory module 43 and a ROM emulation module 45, both connected to the processing module 12.
  • the memory module is used to store the software that will be used for the application and which is transmitted to the module treatment 12.
  • ROM 45 emulation module helps to overcome the problem resulting from the fact that it is difficult to use the module memory 43 to emulate the ROM of the integrated circuit given that the access time is not the same and the width of the bus memory (16 bits) is different from the width of 32 bits used internally. Consequently, module 45 is a SSRAM memory having the same type of access as ROM (32 bits and fixed address) with the same access time (1 cycle in reading). A signal is used to initialize (boot) on the module 45, which makes it possible to reproduce the conditions of exact functioning of the future ROM and therefore to validate the entire software before registering it definitively in silicon, hence a reduction in risks in the creation of the specific integrated circuit with ROM.
  • a logic analyzer 46 can be connected to the bus internal 28 by a first external bus 48 and to the bus output 34 by a second external bus 50.
  • the analyzer logic 46 is used during the test phases to test the correct functioning of the functional reproduction device 10 as well as that of map 26 this as well as regards concerns hardware than software.
  • Logic analyzer connections to the device of functional reproduction 10 allow to correlate all the signals which normally leave the integrated circuit.
  • the exploded architecture of the device 10 makes it possible to also monitor internal circuit signals on the internal bus 28 and therefore to see all interactions in real time between code, interconnection module input / output 22 and many internal signals such that module interruptions, the peripheral bus, etc.
  • the implementation of the reproduction device functional according to the invention including the different stages are represented by the flowchart of FIG. 2, begins with defining and selecting functions (60) to be incorporated into the integrated circuit specific to achieve. This selection is made in selecting non-programmable peripheral modules containing the desired functions. The question then arises whether these functions are all within MP modules (62). If not, add the missing digital functions by programming one or several FPGA modules (64). This programming is done generally by means of an automaton which programs the functions of the FPGA module when it is powered up thanks to code that has previously been developed in a job.
  • step next consists in establishing the programming in HDL language (66) which will make it possible to obtain the desired configuration resulting from the previous selection of functions.
  • the code obtained is stored in flash memory 42. This code is used to assemble the modules of the functional reproductive device when executed by the controller 44 which proceeds with the configuration of the module interconnection of functions (68).
  • the next step is to determine if you want to using the device as a prototyping device (70) to get a specific integrated circuit prototype. Yes this is the case, we load the bits in the processing module 12 by means of the host computer 38 (72) and an appropriate test program (74) is carried out.
  • the next step is to determine if you want to serve the device of the invention as a platform for development (76). If this is the case we proceed to the minus part of the code that will be used in the application (78).
  • the functional reproductive system according to the invention which has its own clock (not shown), from its own memory 43 and from its own functionalities 14, 16, 18, is therefore autonomous. It allows therefore to test the correct execution of the algorithms of the application software and changing its PLL allows real-time performance evaluation of algorithms.
  • some functions implemented are connected to standard outputs and can therefore be stimulated by external devices such as terminals and other communication interfaces. In addition, we can view them on the screen of the logic analyzer.
  • the device according to the invention when used as a prototyping device, the user (designer) excites all the functions peripheral modules, whereas when the device is used as a development platform, the user (computer scientist) runs the software to test its algorithms, the interaction between the software and the integrated circuit and the performance of the software.
  • the functional reproduction device is connected to the application card (84). Then the tests of the card and application code are made (86) before to undertake the manufacturing of the specific integrated circuit (88). It should be noted that this manufacturing can be company further upstream, for example after optimization of the configuration.
  • the conventional method of production requires that the application be tested when the integrated circuit is operational, that is to say after its manufacture.
  • the implementation of the application therefore only begins very late in the whole process. It is the same for the software whose realization is located at the end of the process. Thanks to the use of the functional reproduction device according to the invention, the duration of the process of drawing up the application map is considerably reduced. Indeed, as illustrated in FIG. 4, the production of the application can then start after at the same time as the design of the integrated circuit without waiting for its manufacture since the test of the application can start after the design of the integrated circuit and its functional reproduction by the device of the invention. The same is true for software. Qualification tests are however necessary as shown in Figure 4, after the manufacture of the integrated circuit. If the end of the elaboration process is at a time T 1 with the conventional method, the end of the same process is at time T 2 using the device according to the invention, time T 2 which is less by more than 40 % at time T 1 .

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Microcomputers (AREA)
EP00480051A 2000-06-16 2000-06-16 Vorrichtung zur funktionellen Widergabe einer spezifischen integrierten Halbleiterschaltung und deren Verwendung als Emulationsvorrichtung Expired - Lifetime EP1164487B1 (de)

Priority Applications (7)

Application Number Priority Date Filing Date Title
ES00480051T ES2193041T3 (es) 2000-06-16 2000-06-16 Dispositivo de reproduccion funcional de un circuito integrado especifico y su utilizacion como dispositivo de emulacion.
PT00480051T PT1164487E (pt) 2000-06-16 2000-06-16 Dispositivo de reproducao funcional de um circuito integrado especifico e sua utilizacao como dispositivo de emulacao
EP00480051A EP1164487B1 (de) 2000-06-16 2000-06-16 Vorrichtung zur funktionellen Widergabe einer spezifischen integrierten Halbleiterschaltung und deren Verwendung als Emulationsvorrichtung
AT00480051T ATE233000T1 (de) 2000-06-16 2000-06-16 Vorrichtung zur funktionellen widergabe einer spezifischen integrierten halbleiterschaltung und deren verwendung als emulationsvorrichtung
DK00480051T DK1164487T3 (da) 2000-06-16 2000-06-16 Indretning til funktionel reproduktion af et specifikt integreret kredsløb og anvendelse deraf som emuleringsindretning
DE60001450T DE60001450T2 (de) 2000-06-16 2000-06-16 Vorrichtung zur funktionellen Widergabe einer spezifischen integrierten Halbleiterschaltung und deren Verwendung als Emulationsvorrichtung
US09/698,247 US7130787B1 (en) 2000-06-16 2000-10-30 Functional replicator of a specific integrated circuit and its use as an emulation device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP00480051A EP1164487B1 (de) 2000-06-16 2000-06-16 Vorrichtung zur funktionellen Widergabe einer spezifischen integrierten Halbleiterschaltung und deren Verwendung als Emulationsvorrichtung

Publications (2)

Publication Number Publication Date
EP1164487A1 true EP1164487A1 (de) 2001-12-19
EP1164487B1 EP1164487B1 (de) 2003-02-19

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EP00480051A Expired - Lifetime EP1164487B1 (de) 2000-06-16 2000-06-16 Vorrichtung zur funktionellen Widergabe einer spezifischen integrierten Halbleiterschaltung und deren Verwendung als Emulationsvorrichtung

Country Status (7)

Country Link
US (1) US7130787B1 (de)
EP (1) EP1164487B1 (de)
AT (1) ATE233000T1 (de)
DE (1) DE60001450T2 (de)
DK (1) DK1164487T3 (de)
ES (1) ES2193041T3 (de)
PT (1) PT1164487E (de)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100413267C (zh) * 2006-04-29 2008-08-20 中山大学 一种多路无线通信仿真方法及其装置
CN100435158C (zh) * 2006-04-29 2008-11-19 中山大学 基于fpga和usb储存装置的无线通信仿真装置
CN102541707A (zh) * 2010-12-15 2012-07-04 中国科学院电子学研究所 复用jtag接口的fpga片内逻辑分析仪系统和方法
CN102664836A (zh) * 2012-03-29 2012-09-12 中国科学院计算技术研究所 一种用于宽带无线通信数字基带处理器的原型验证平台

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005038676A2 (en) * 2003-10-17 2005-04-28 University Of Delaware Method and apparatus for emulation of logic circuits

Citations (3)

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US5339262A (en) * 1992-07-10 1994-08-16 Lsi Logic Corporation Method and apparatus for interim, in-situ testing of an electronic system with an inchoate ASIC
US5572665A (en) * 1994-04-21 1996-11-05 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit for developing a system using a microprocessor
US5710934A (en) * 1992-05-27 1998-01-20 Sgs-Thomson Microelectronics, S.A. Methods and test platforms for developing an application-specific integrated circuit

Family Cites Families (7)

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JPS61169941A (ja) * 1985-01-22 1986-07-31 Sony Corp 記憶装置
US5321828A (en) * 1991-06-07 1994-06-14 Step Engineering High speed microcomputer in-circuit emulator
US5572710A (en) * 1992-09-11 1996-11-05 Kabushiki Kaisha Toshiba High speed logic simulation system using time division emulation suitable for large scale logic circuits
US5572655A (en) 1993-01-12 1996-11-05 Lsi Logic Corporation High-performance integrated bit-mapped graphics controller
JPH10214201A (ja) * 1997-01-29 1998-08-11 Mitsubishi Electric Corp マイクロコンピュータ
US6668242B1 (en) * 1998-09-25 2003-12-23 Infineon Technologies North America Corp. Emulator chip package that plugs directly into the target system
US6477683B1 (en) * 1999-02-05 2002-11-05 Tensilica, Inc. Automated processor generation system for designing a configurable processor and method for the same

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5710934A (en) * 1992-05-27 1998-01-20 Sgs-Thomson Microelectronics, S.A. Methods and test platforms for developing an application-specific integrated circuit
US5339262A (en) * 1992-07-10 1994-08-16 Lsi Logic Corporation Method and apparatus for interim, in-situ testing of an electronic system with an inchoate ASIC
US5572665A (en) * 1994-04-21 1996-11-05 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit for developing a system using a microprocessor

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100413267C (zh) * 2006-04-29 2008-08-20 中山大学 一种多路无线通信仿真方法及其装置
CN100435158C (zh) * 2006-04-29 2008-11-19 中山大学 基于fpga和usb储存装置的无线通信仿真装置
CN102541707A (zh) * 2010-12-15 2012-07-04 中国科学院电子学研究所 复用jtag接口的fpga片内逻辑分析仪系统和方法
CN102541707B (zh) * 2010-12-15 2014-04-23 中国科学院电子学研究所 复用jtag接口的fpga片内逻辑分析仪系统和方法
CN102664836A (zh) * 2012-03-29 2012-09-12 中国科学院计算技术研究所 一种用于宽带无线通信数字基带处理器的原型验证平台
CN102664836B (zh) * 2012-03-29 2015-12-02 中国科学院计算技术研究所 一种用于宽带无线通信数字基带处理器的原型验证平台

Also Published As

Publication number Publication date
US7130787B1 (en) 2006-10-31
DE60001450T2 (de) 2004-04-08
ATE233000T1 (de) 2003-03-15
DE60001450D1 (de) 2003-03-27
EP1164487B1 (de) 2003-02-19
PT1164487E (pt) 2003-07-31
ES2193041T3 (es) 2003-11-01
DK1164487T3 (da) 2003-06-16

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