EP1029309B1 - Münzprüfvorrichtung - Google Patents

Münzprüfvorrichtung Download PDF

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Publication number
EP1029309B1
EP1029309B1 EP98950225A EP98950225A EP1029309B1 EP 1029309 B1 EP1029309 B1 EP 1029309B1 EP 98950225 A EP98950225 A EP 98950225A EP 98950225 A EP98950225 A EP 98950225A EP 1029309 B1 EP1029309 B1 EP 1029309B1
Authority
EP
European Patent Office
Prior art keywords
coin
sensor
values
acceptor
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP98950225A
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English (en)
French (fr)
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EP1029309A1 (de
Inventor
Dennis Wood
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Crane Payment Innovations Ltd
Original Assignee
Coin Controls Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Priority claimed from GBGB9723223.5A external-priority patent/GB9723223D0/en
Priority claimed from GBGB9804982.8A external-priority patent/GB9804982D0/en
Application filed by Coin Controls Ltd filed Critical Coin Controls Ltd
Publication of EP1029309A1 publication Critical patent/EP1029309A1/de
Application granted granted Critical
Publication of EP1029309B1 publication Critical patent/EP1029309B1/de
Anticipated expiration legal-status Critical
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Classifications

    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/08—Testing the magnetic or electric properties
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/02—Testing the dimensions, e.g. thickness, diameter; Testing the deformation

Definitions

  • This invention relates to a coin acceptor and has particular but not exclusive application to a multi-coin acceptor for validating coins of different denominations.
  • Coin acceptors which discriminate between coins of different denominations are well known and one example is described in our GB-A-2 169 429.
  • the acceptor includes a coin rundown path along which coins pass through a sensing station at which coils perform a series of inductive tests on the coins in order to develop coin parameter signals which are indicative of the material and metallic content of the coin under test.
  • the coin parameter signals are digitised so as to provide digital coin parameter data, which are then compared with stored coin data by means of a microcontroller to determine the acceptability or otherwise of the tested coin. If the coin is found to be acceptable, the microcontroller operates an accept gate so that the coin is directed to an accept path otherwise, the accept gate remains inoperative and the coin is directed to a reject path.
  • the coin sensing station includes a number of different coils which may be energised at different frequencies and may be of different sizes so as to form individual inductive couplings of with the coin under test as it passes through the coin sensing station, on one side only or on both sides of the coin.
  • the coils used hitherto have had a cross-sectional area which is sufficiently large relative to the coin that the inductive coupling produces eddy currents over at least a major part of the surface of the coin, with the result that the sensed parameters constitute an average of a number of different parameters of the coin, for example its metallic content, its thickness and its surface pattern.
  • the averaging effect produced by the relatively large sensor coils gives rise to disadvantages in certain circumstances.
  • coins to be minted to include regions of different materials, for example, from more than one metal or metal alloy, and certain denominations of coins are formed of a central region of a first alloy, which is surrounded by an annular region of a second different alloy (referred to hereinafter as a "bimet" coin).
  • the different regions present different inductive characteristics to the sensor coils of the acceptor but the relatively large area coils tend to average the effect of the two metallic regions, with the result that certain bimet coins cannot satisfactorily be distinguished from coins of other denominations and frauds, for example washers with a central hole.
  • W0-A-93/22747 discloses a coin acceptor for use with multi-metallic coins that uses two magnetic sensors each substantially smaller in width than the diameter of the multi-metallic coin, arranged essentially parallel to the coin path.
  • the sensors are connected in an electrical bridge circuit and the difference between the outputs of the sensors is used to discriminate between multi-metallic coins and frauds.
  • the coils are arranged so that an output signal corresponding to an equivalent portion of the coin may be obtained, for coins of a number of different diameters.
  • the output from one of the sensing coils is selected in accordance with a predetermined criterion, such as a signal peak within a given amplitude range.
  • the selected output is then used to derive the coin thickness and conductivity which, together with an estimated diameter, may be compared with stored reference values.
  • This arrangement depends heavily on the out put of one sensing coil, i.e. from one region of the coin, and may not fully overcome the previous problems distinguishing bi-metallic coins from other coins or objects.
  • the invention provides a coin acceptor comprising a coin acceptor comprising a path for coins, a plurality of sensor coils to sense a coin as it moves along the path, drive circuitry coupled to the sensor coils, the sensor coils being arranged in an array extending transversely of the coin path so as to be energised by the drive circuitry to inductively couple with different regions of the face of a coin as it moves past them, so that the sensor coils produce time varying sensor outputs as a function of the different regions respectively, sampling means to sample repetitively values of the individual sensor outputs produced during the passage of the coin past the sensors to provide corresponding sample values and control means to monitor the sample values and determine when a sampled value of at least one of the sensor outputs accords with a predetermined criterion and to compare the sample values with stored reference data values, wherein, the stored reference data comprises sets of coin parameter data values for coins of different denominations and the control means is arranged to compare the sample values relating to each of the plurality of regions sensed by
  • the array of sensor coils may include coil assemblies that are arranged in one or more lines extending transversely of the coin path. They may be on opposite sides or on one side only of the coin path.
  • the coil assemblies preferably have an area to face the coin of less than 72mm 2 .
  • the sensor coil units may each be coupled in an oscillator circuit and the sampling means may be operative to sample an oscillatory characteristic of the circuit as the coin passes the unit such as frequency or amplitude or both.
  • the control means- may-be configured to select an ensemble of sample values of the sensor outputs that occur when one of the outputs accords with the predetermined criterion, and to compare the selected sample values with the stored data.
  • control means may be configured to determine when the sensor outputs individually accord with a respective predetermined criterion and to compare the values thereof with the stored data.
  • the predetermined criterion may comprise a discontinuity in the value of sensor output such as a main or a localised maximum or minimum in the value of the sensor output that occurs during the passage of the coin.
  • the predetermined criterion may also occur when at least one sample value from one of the sensors forms a predetermined value relationship with at least one sample value from another of the sensors.
  • the value relationship may comprise a crossover of the values of the successive samples from one of the sensors with corresponding sample values from another of the sensors, or may be a function of the relative rate of change of the sample values from the sensors.
  • the invention also includes a coin discrimination method comprising sensing the passage of a coin along a path with a plurality of sensor coils that are spaced apart in an array extending transversely of the coin path and energised to inductively couple with different regions of the face of the coin as it moves past them, sampling values of the sensor outputs repetitively during the passage of the coin past the sensor coils to provide corresponding sample values, monitoring the sample values, determining when a sampled value of at least one of the sensor outputs accords with a predetermined criterion and comparing the sample values with stored reference data values, characterised in that, the comparison is made in response to the criterion being met, where said comparison is between stored reference data comprising sets of individual coin parameter values for coins of different denomination and sample values relating to each of the plurality of regions sensed by the sensor coils with the stored data sets to determine the acceptability of the coin.
  • a first embodiment of coin acceptor according to the invention which comprises a multi-coin acceptor capable of validating a number of coins of different denominations, including bimet coins, for example the new euro coin set and the new UK coin set including the new bimet £2.00 coin.
  • the physical layout of the coin acceptor is shown schematically in Figure 1.
  • the acceptor includes a body 1 with a coin run-down path 2 along which coins under test pass edgewise from an inlet 3 through a coin sensing station 4 and then fall towards a gate 5.
  • a test is performed on each coin as it passes through the sensing station 4. If the outcome of the test indicates the presence of a true coin, the gate 5 is opened so that the coin can pass to an accept path 6, but otherwise the gate remains closed and the coin is deflected to a reject path 7.
  • the coin path through the acceptor for a coin 8 is shown schematically by dotted line 9.
  • the coin sensing station 4 includes four coin sensing coil units C1a,b, C2, C3a,b and C4 shown in dotted outline, which are energised in order to produce an inductive coupling with the coin. Also, a coil unit CC is provided in the accept path 6, downstream of the gate 5, to act as a credit sensor in order to detect whether a coin that was determined to be acceptable, has in fact passed into the accept path 6.
  • the coils are energised at different frequencies by a drive and interface circuit 10 shown in Figure 2. Eddy currents are induced in the coin under test by the coil units. The different inductive couplings between the three coils and the coin characterise the coin substantially uniquely.
  • the drive and interface circuit 10 produces four corresponding coin parameter data signals x 1 , x 2 , x 3 , x 4 , as a function of the different inductive couplings between the coin and the coil units C1, C2, C3 and C4. A corresponding signal x C is produced for the coil unit CC.
  • the four parameter signals x 1 , x 2 , x 3 and x 4 produced by a coin under test are fed to a microcontroller 11 which is coupled to a memory in the form of an EEPROM 12.
  • the microcontroller 11 processes the coin parameter signals derived from the coin under test in a manner that will be described in more detail hereinafter and compares the outcome with corresponding stored values held in the EEPROM 12.
  • the stored values are held in terms of windows having upper and lower value limits. Thus, if the processed data falls within the corresponding windows associated with a true coin of a particular denomination, the coin is indicated to be acceptable, but otherwise is rejected. If acceptable, a signal is provided on line 13 to a drive circuit 14 which operates the gate 5 shown in Figure 1 so as to allow the coin to pass to the accept path 6. Otherwise, the gate 5 is not opened and the coin passes to reject path 7.
  • the microcontroller 11 compares the processed data with a number of different sets of operating window data appropriate for coins of different denominations so that the coin acceptor can accept or reject more than one coin of a particular currency set. If the coin is accepted, its passage along the accept path 6 is detected by a post acceptance credit sensor coil unit CC, and the unit 10 passes corresponding data x C to the microcontroller 11, which in turn provides an output on line 15 that indicates the amount of monetary credit attributed to the accepted coin.
  • the acceptor has a coin door 16 that is hinged on a shaft 17 on the acceptor body 1, in a conventional manner.
  • the coin run-down path 2 is provided between an interior wall 18 of the door 16 and a wall 19 of the acceptor body 1, as shown in more detail in Figure 3.
  • the run-down path 2 comprises an inclined lip 20 on the door 16, down which the coin runs edgewise past the sensor coil units C1, C2, C3 and C4.
  • the coin 8 is shown on the lip 20 of the run-down path 2 in Figure 3
  • the coin is shown schematically in an upright position although in practice, it will lean against one of the walls 18, 19.
  • the door 16 is spring biased to the closed position shown in Figures 1 and 3 but can be hinged outwardly from the body 1 in the event of a coin jam so as to release the jammed coin and allow it to fall to the reject path 7.
  • the coin 8 shown in Figure 1 is illustrated as a bimet coin and in this example comprises the new £2.00 coin.
  • This comprises a first, central cupro-nickel core region 21 surrounded by a second, circular region or ring 22 of an alloy referred to herein as bronze, comprising 76% Cu, 4% Ni and 20% Zn.
  • the invention is not restricted to the detection of bimet coins, as will be evident hereinafter.
  • the coil unit C1a,b comprises a pair of coil assemblies C1a, C1b mounted on the inside of the wall 19 of the acceptor body 1 and on the wall 18 of the door 16.
  • the coil assemblies C1a, C1b are configured to form an inductive coupling selectively with the bronze ring 22 of the bimet coin 8 under test i.e. with no significant inductive coupling to the central cupro-nickel region 21 of the coin.
  • each of the coil assemblies C1a, C1b comprises a generally cylindrical bobbin 23 of plastics material, on which windings of a coil 24 are formed.
  • the bobbin 23 is push-fitted into a so-called half pot core 25 made of sintered ferrite material.
  • the core 25 includes a central, cylindrical yoke 26 formed with a through hole to reduce the amount of ferrite material used, and a surrounding, concentric, cylindrical support flange 27.
  • the windings of the coil 24 may be wound around a former, not shown, and the windings heated to melt their insulation, so that on cooling, a self supporting coil is formed, which is then removed from the former and push-fitted into the half pot core 25.
  • the support flange 27 of the half pot core 25 is push-fitted in a corresponding recess in the wall; thus the flange 27 of assembly C1a is push fitted into a cylindrical recess 28 in wall 19 and the flange 27 of assembly C1b is push fitted into a corresponding recess 29 in the wall 18.
  • the outer diameter d 1 of the windings of the coil 24 is 7.3 mm.
  • the inner diameter d 2 of the coil 24 with its bobbin 23 is 2.78 mm and the diameter of the hole through the yoke 26 is 2mm.
  • the faces 30 of the coil assemblies C1a,b in this example, are spaced apart by 6.24 mm.
  • the coils 24 have an axial length of 2.78 mm.
  • the outer diameter d 3 of the half pot cores 25 is 9 mm and thus the area A of the end face 30 of each coil unit i.e. the end which faces the coin under test, is in this example 63.62 mm 2 .
  • the windings 24 of the assemblies C1a,b are electrically connected in series. As can be seen in Figure 3, the coil assemblies C1a,b are arranged with the coils 24 arranged on a common axis, on opposite sides of the coin 8 under test.
  • the magnetic field of a generally cylindrical coil is concentrated along the coil axis; thus, for each of the coil assemblies C1a,b, the field is concentrated mainly in the ferrite yoke 26 of the half pot core 25 and the flux around the coil is mainly channelled in a loop around the coil by the surrounding ferrite flange 27, except in the region of face 30 where the flux passes through the surrounding material back to the yoke 26. Accordingly, the sensitivity of the assemblies C1a,b to passing coins is for the most part, restricted to the region of the coin which passes between the yokes 26.
  • the assemblies C1a,b are positioned closely adjacent the coin rundown path 2 and the dimension d 3 of the coils is such that the inductive coupling between the coin and the coils is restricted substantially only to the second, outer region 22 of the coin 8, with no significant coupling occurring with the first inner region 21.
  • the half pot cores 25 extend below the coin run-down path 20 in order that the cores 26 be configured in alignment with the outer ring 22 of the coin 8.
  • the coil units C2, C3 and C4 are made up of coil assemblies identical to the assembly C1a shown in Figure 4.
  • the coil units C1-C4 are mounted in an array extending transversely to the coin path 2, along line 31 as shown in Figure 1.
  • the line 31 extends orthogonally of the path 2, although other configurations transverse to the coin path can be used and more generally, it is not essential for the coil units to be arranged in a line.
  • improved discrimination can be achieved by making the area A of the coil assembly which faces the coin, such as the coil C1a,b, smaller than 72 mm 2 , which permits coin regions with individual inductive characteristics to be sensed.
  • the or each coil C need not be circular. In fact, advantages can be obtained from square or rectangular wound coils.
  • the transverse array of sensors preferably includes at least three of the coil units.
  • the coil unit C2 is mounted above the unit C1a, b so as to intersect a chord of the coin as it passes through the coin sensing station 4. It will be understood that as the coin rolls past the coil unit C2, an inductive coupling will first be formed with the outer ring 22 of the coin, then the inner region 21 and then the outer region 22 again.
  • the coil unit C2 comprises a single coil assembly and thus the coil unit 22 detects the characteristics of the coin from one side only.
  • the coil unit C3a, b comprises a pair of the coil assemblies C3a, C3b, mounted on opposite sides of the coin path in a similar way to the coil assemblies C1a, b.
  • the coil unit C3a, b is mounted above the unit C2 and thus is sensitive to the coin at a different chordal position thereof.
  • the coil unit C4 comprises a single one of the coil assemblies as shown in Figure 4, mounted at a location above the coil unit C3a, b.
  • the outputs from the coil units C1-C4 will depend upon the characteristics of the coin, including its diameter, its material characteristics, its thickness, whether it is a bimet coin and a number of other factors, with the coil units being responsive to the characteristics of respective individual regions of the coin under test as it passes the coils.
  • FIG. 5 illustrates how the coil units are connected to the coil drive and interface circuits 10 shown in Figure 1.
  • the coil unit C1 the coil assemblies C1a, C1b, are connected in series, in the feedback loop of an inverting amplifier A1, together with a capacitor C.
  • the circuit thus acts as an oscillator, the output of which has an amplitude and frequency dependent on the inductance presented by the coil assembly C1a, C1b.
  • an inductive coupling occurs between the coin and the coil assemblies with the result that the inductance in the feedback path of the amplifier changes, which in turn changes both the amplitude and frequency of the oscillator, on a transitory basis.
  • the amplitude is detected by an envelope detector E1 for the coil unit C1, and the amplitude of the envelope is successively sampled as the coin passes between the coil assembly C1a, C1b by means of an analog to digital converter D1, so as to provide a series of successive digital sample values x1(a) as the coin passes the coil unit C1.
  • the coil unit C2 is connected in the feedback loop of an inverting amplifier A2 and a corresponding digital coin parameter signal x2(a) is produced by means of envelope detector E2 and analog to digital converter D2.
  • a frequency detector F detects the instantaneous frequency of the oscillator A2 and the output is successively sampled and digitised by analog to digital converter D2', so as to provide coin parameter output signal x2(f).
  • the coil unit C3a, b is connected in the feedback loop of inverting amplifier A3, with the coil assemblies C3a, C3b being connected in series.
  • An envelope detector E3 and an analog to digital converter D3 produce an output digital parameter signal x3(a) which comprises a series of digital samples of the amplitude deviation produced as the coin passes between the coil assemblies C3a, C3b.
  • the coil unit C4 is connected in the feedback of amplifier A4 and envelope detector E4 together with analog to digital converter D4 produces an amplitude deviation signal x4(a).
  • Figure 6 illustrates the way in which the coin parameter signals x vary with time as the coin passes through the coin sensing station 4. It will be appreciated that the shape of the individual curves shown in Figure 6 are dependent upon the characteristics of the coin under test and the curves represent individual "signatures" for the coin denomination.
  • the passage of the coin past the sensor coils C1-4 causes a general reduction in amplitude, but the A/D converters D1-D4 produce a signal inversion so as to product the graphs shown in Figure 6.
  • the analog to digital converters D1-D4 shown in Figure 5 produce an ensemble A t of sample values with successive ensembles being produced for successive sample periods, spaced apart by a time D t .
  • Figure 6 illustrates the individual ensemble values all occurring simultaneously at time t
  • the individual sample values x which make up the ensemble may be taken over a finite period, which is significantly shorter than D t .
  • the microcontroller 11 receives the successive values of the coin parameter signals x that make up the successive ensembles A t . As shown in Figure 7 the microcontroller 11 assembles the successive ensembles A k ⁇ A k + n into a running stack of n successive ensemble values 32.
  • the resulting ensemble data in the stack is processed in a step S1 in order to determine when the value of at least one of the coin parameter signals x adopts a predetermined criterion, such as the occurrence of a peak value in the sample values or when the sample value from one of the sensors forms a predetermined value relationship with the corresponding sample value from another of the sensors.
  • a predetermined criterion such as the occurrence of a peak value in the sample values or when the sample value from one of the sensors forms a predetermined value relationship with the corresponding sample value from another of the sensors.
  • This value relationship may be constituted by a crossover in the graphs, or the reaching or overpassing of a threshold, as will be explained in more detail hereinafter.
  • the ensemble A of data which includes the predetermined criterion is stored at step S2.
  • step S3 the individual coin parameter data values x1(a), x2(a), x2(f), x3(a) and x4(a) are compared with corresponding stored values held in the EEPROM 12 ( Figure 1).
  • a series of different sets of coin windows W are stored in the EEPROM 12, corresponding to different coin denominations, and the results from step S2 are compared in step S3 with all of the stored sets in order to determine whether the coin is of an acceptable denomination.
  • an output is provided at step S4 indicating the denomination of the coin and its acceptability, so as to provide the outputs 13, 15 shown in Figure 2 or, indicating that the coin should be rejected.
  • step S1 a parameter p is set to equal zero.
  • step S1.13 the three successive values of x1(a) are compared with one another. If the intermediate value is greater than the preceding and exceeding values, this indicates that a peak has occurred. Thus, the following inequality is checked x1(a) p-1 ⁇ x1(a) p . > x1(a) p+1 ?
  • the particular value of x1(a) p indicates a peak value. If the inequalities of test (2) are not true, the parameter p is incremented at step S1.14 and the process is repeated so as to sweep through successive ones of the data ensembles in an attempt to find a peak in x1(a).
  • the fetched data ensemble is temporarily stored and, at step S3.10, the individual coin parameter signals from the stored data ensemble, namely x1(a), x2(a), x2(f), x3(a) and x4(a) are individually compared with corresponding windows stored in the EEPROM 12 to determine if the coin is of a particular denomination to be accepted by the acceptor. As previously explained, the process may be repeated for a number of different coin denominations which have associated stored windows in the EEPROM.
  • Figure 9 illustrates the routine for determining when a crossover occurs in the graphs of x1(a) and x2(a) shown in Figure 6.
  • the data ensemble associated with the occurrence of the crossover is used for comparison purposes with stored window data in the EEPROM 12.
  • step S1.23 the fetched data values are compared according to the following inequality in order to determine whether a crossover has occurred for the fetched data.
  • the parameter p is incremented at step S1.24 and the process is repeated for the next successive set of values in the stack 31 of data ensembles A k shown in Figure 7.
  • step S3.20 the individual values stored at step S2.20 are compared with corresponding windows held in the EEPROM 12, as previously described, in order to determine coin authenticity and denomination.
  • the described example of the invention has the advantage that much more fine detail about the characteristics of the coin can be determined using the transverse array of coil units C1-C4.
  • the small size of the coil assemblies relative to the coin allow the characteristics of individual chordal regions of the coin to be determined individually as shown by the individual graphs in Figure 6.
  • the graphs of Figure 6 show the outputs derived from a bimet coin. Hitherto, when larger diameter sensing coils were used, which produced an averaging effect over at least a major portion of the surface area of the coin, it was difficult to distinguish between a bimet coin and a corresponding washer with a central hole. In contrast, the described embodiment of acceptor according to the invention, can readily distinguish between such a bimet coin and a corresponding washer.
  • the output for x2(a) adopts the generally dome shaped configuration in response to a genuine bimet coin of a particular denomination.
  • a fraudulent washer with a central hole is passed through the acceptor, a trace 33 with a central "dip" is produced.
  • a prior art acceptor which averaged the effect of the entire face of the coin, it was difficult to distinguish between the genuine coin and the washer, due to the averaging effect.
  • the corresponding value of the parameter x2(a) in the ensemble A X adopts substantially different values for the true bimet coin and a corresponding washer with a central hole, namely values 34 and 35 respectively.
  • the stored window data in the EEPROM 12 for the true bimet coil differs substantially from the data produced for a fraudulent washer, permitting such frauds readily to be detected.
  • by selecting the ensemble A X much more fine detail can be resolved than hitherto.
  • the criterion used to select the ensemble A X may be when one of the coin parameter signals x equals or crosses a predetermined threshold value stored in the EEPROM 12.
  • the crossover between certain graphs in the output shown in Figure 6 is a suitable criterion.
  • Certain bimet coins may produce a trough in one of the graphs, which can be used as the criterion.
  • values of two of the coin parameter signals x may be taken from an ensemble A 1 produced at a first time and then again from an ensemble A 2 produced at a later time, and the values may be processed to obtain an indication of the gradient of each of the graphs.
  • the gradients adopt a predetermined relationship, the corresponding data ensemble A is selected and compared with stored data in the EEPROM 12.
  • a second embodiment of the invention will now be described with reference to Figures 10 to 15.
  • the second embodiment is similar to the first embodiment and corresponding parts are marked with the same reference numbers.
  • the second embodiment differs in the manner in which the coil units are disposed at the sensing station 4, and also the way in which the coin data are processed.
  • coil units C1-C5 are disposed in an array extending transversely of the coin path 9.
  • the coil units are arrayed in a staggered arrangement, with the axes of the coil units being disposed to be generally orthogonal of the major faces of the coin as its passes through the axes, along the coin rundown path.
  • the interaction between the coil units and the coin occurs primarily in the region of the core of each coil unit and the staggered coil arrangement shown in Figure 10 permits an additional coil unit C5 to be included within the circumference of the coin 8 as it passes along the path 9.
  • the configuration of coil units can be used to sense coins with a diameter range of 15-33 mm.
  • Figure 10 allows an additional region of the coin face to be analysed by the fifth coil unit.
  • the connection of the coil units to the microcontroller 11 is shown schematically in Figure 11 and generally corresponds to the arrangement previously described with reference to Figures 1 and 5, with the provision of additional circuits for the coil unit C5, which produces a coin parameter signal x 5 (a).
  • each of the coil units C1-C5 includes a pair of coil assemblies mounted on opposite sides of the coin path, on the coin door 16 and the wall 19 of the validator, in the same way as coil assemblies C1a, b shown in Figure 1.
  • the coin units C1-C5 together with the post acceptance coil unit CC are connected through coil drive and interface circuits 10 to microcontroller 11.
  • the operation of the circuit is similar to that described with reference to Figure 2.
  • a random access memory RAM 31 is shown connected to the microcontroller 11.
  • connection of the coil units C1-C5 is shown in more detail in Figure 12.
  • the coil assemblies of each coil unit are connected in series.
  • the coil assemblies of coil unit C2 are connected in an anti-phase such that the polarities of the assemblies mutually repel.
  • the other coin units have their assemblies connected in phase such that the coil polarities attract.
  • Each coil pair is connected in an oscillator circuit in the manner previously described with reference to Figure 5.
  • the natural resonant frequency of each oscillator circuit is different in order to reduce crosstalk.
  • the frequencies are, but not restricted to, between 60 and 100 KHz, and are high enough so as not to completely penetrate coins under test.
  • a multiplexer 32 is provided, which successively scans the outputs of the coil units and feeds them to a common envelope detector E1 and to A/D converter D1 such that samples of x1(a), x2(a), x3(a), x4(a) and x5(a) are sequentially produced on output line 33.
  • frequency detector F is provided to detect frequency changes in the output of coil units C2.
  • the output of detector F is fed to an A/D converter D2' in order to provide successive samples of coin signal x2(f).
  • the multiplexer 32 can also provide samples for the post acceptance sensor CC, although this is not shown in Figure 12 in order to simplify the description.
  • Figure 13 illustrates the outputs from the various coil units C1-C5 during passage of the coin through the coin sensing station 4 of Figure 10.
  • Figure 14 illustrates an enlarged view of three successive groups of samples taken during passage of the coin through the coin sensing station. It will be seen that the multiplexer 32 shown in Figure 12 strobes between successive ones of the outputs of the coil units C1-C5 to produce successive groups of samples x1(a) - x5(a), that are fed to the microcontroller 11 shown in Figure 11. Also, the frequency modulation detected by frequency detector F of Figure 12 gives rise to corresponding sample values of x2(f).
  • the microcontroller 11 is configured to operate as shown in Figure 15.
  • the successive groups of coin data samples are fed at step S5 to the microcontroller 11 where a number of different criteria in the sensor outputs are detected.
  • twelve different criteria are monitored as follows: Criterion Details 1 Maximum increase in x1(a) as coin passes 2 Maximum increase in x2(a) as coin passes 3 Maximum increase in x3(a) as coin passes 4 Maximum increase in x4(a) as coin passes 5 Maximum increase in x5(a) as coin passes 6 Maximum increase in frequency x2(f) as coin passes 7 Maximum reduction in frequency of x2(f) as coin passes 8 Maximum decrease in amplitude between two local maxima of amplitude x2(a) as coin passes 9 Maximum decrease in amplitude between two local maxima of amplitude x3(a) as coin passes 10
  • the value of amplitude x5(a) when the amplitude of x1(a) reaches a preset offset from its normal no-coin amplitude 11
  • step S6 these 12 criteria are detected at step S6. It will be understood that as the coin passes through the coin sensing station, successive groups of the coin data samples produced at step S5 are be fed to the microcontroller 11. Individual maxima and minima according to the criteria listed above, will be detected and temporarily stored in the RAM 31 connected to the microcontroller 11 shown in Figure 11. This temporary storage is shown at step S7 in Figure 15. As the coin passes, the individual maxima and minima will be updated as successive local maxima and minima are detected. As this occurs, the previously stored values thereof are compared with the newly produced values and an appropriate one of them is stored, depending on whether it should be the maximum or minimum.
  • the resulting stored values of the 12 criteria are then compared with window data held in EEPROM 12 shown in Figure 11, in the manner previously described with reference to step S3 for the first embodiment.
  • the window data stored in the EEPROM thus corresponds to values of the twelve criteria for true coins of different denominations, against which the criteria data from the coin under test can be checked for authenticity. This is carried out at step S8 in Figure 15.
  • the coin is then accepted or rejected according to the outcome of the comparison, at step S9, in the manner previously described.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Coins (AREA)

Claims (23)

  1. Münzenannahmevorrichtung (1) mit einem Pfad für Münzen (2), einer Vielzahl von Sensorspulen (C1a,b, C2, C3a,b, C4) zum Erfassen einer Münze (8), wenn sie sich entlang dem Pfad bewegt, einer Treiberschaltung (10), die mit den Sensorspulen gekoppelt ist, wobei die Sensorspulen in einem Feld angeordnet sind, das sich transversal vom Münzpfad erstreckt, um durch die Treiberschaltung (10) erregt zu werden, um mit unterschiedlichen Bereichen (21, 22) der Oberfläche einer Münze induktiv zu koppeln, wenn sie sich an ihnen vorbeibewegt, so dass die Sensorspulen sich mit der Zeit ändernde Sensorausgaben als Funktion der jeweiligen unterschiedlichen Bereiche erzeugen, Abtasteinrichtungen (D1-D4) zum jeweiligen Abtasten von Werten der einzelnen Sensorausgaben, die während des Laufens der Münze an den Sensoren vorbei erzeugt werden, um entsprechende Abtastwerte zu liefern, und einer Steuereinrichtung (11) zum Überwachen der Abtastwerte und zum Bestimmen, wenn ein abgetasteter Wert von wenigstens einer der Sensorausgaben mit einem vorbestimmten Kriterium übereinstimmt, und zum Vergleichen der Abtastwerte mit gespeicherten Referenzdatenwerten,
    dadurch gekennzeichnet, dass die gespeicherten Referenzdaten Gruppen von Münzenparameterdatenwerten für Münzen unterschiedlicher Wertigkeiten aufweisen und die Steuereinrichtung (11) angeordnet ist, um die Abtastwerte in Bezug auf jeden der Vielzahl von durch die Sensorspulen (11) erfassten Bereichen mit den gespeicherten Datengruppen in Reaktion auf das Kriterium, das gerade erfüllt wird, zu vergleichen, um die Annehmbarkeit der Münze zu bestimmen.
  2. Münzenannahmevorrichtung (1) nach Anspruch 1, wobei die Sensorspulen (C1-C4) bei unterschiedlichen Frequenzen erregt werden.
  3. Münzenannahmevorrichtung (1) nach Anspruch 1, wobei die Steuereinrichtung (11) ein Prozessor ist.
  4. Münzenannahmevorrichtung (1) nach einem der Ansprüche 1 bis 3, wobei die Sensorspulen (C1-C4) ein Feld von Sensorspuleneinheiten enthalten, die konfiguriert sind, um selektiv eine induktive Kopplung mit jeweiligen Bereichen der Münze zu bilden.
  5. Münzenannahmevorrichtung (1) nach Anspruch 4, wobei das Feld von Sensorspuleneinheiten (C1-C4) Spulenanordnungen enthält, die in einer Linie angeordnet sind, die sich transversal vom Münzpfad erstreckt.
  6. Münzenannahmevorrichtung (1) nach Anspruch 4 oder 5, wobei eine oder mehrere der Sensorspuleneinheiten (C1-C4) Spulenanordnungen (C1a,b) auf gegenüberliegenden Seiten des Münzpfads (2) enthalten.
  7. Münzenannahmevorrichtung (1) nach Anspruch 6, wobei eine der Spulenanordnungen (C1a) mit der Treiberschaltung (10) gekoppelt ist und die andere (C1b) mit der Abtasteinrichtung (D1-D4) gekoppelt ist.
  8. Münzenannahmevorrichtung (1) nach Anspruch 4 oder 5, wobei eine oder mehrere Sensorspuleneinheiten (C1-C4) Spulenanordnungen (C2, C4) nur auf einer Seite des Spulenpfads enthalten.
  9. Münzenannahmevorrichtung (1) nach Anspruch 8, wobei jede der Spulenanordnungen (C2, C4) der Sensorspuleneinheiten mit sowohl der Treiberschaltung (10) als auch den Abtasteinrichtungen (D1-D4) gekoppelt ist.
  10. Münzenannahmevorrichtung (1) nach einem der Ansprüche 2 bis 9, wobei die Spuleneinheiten (C1-C4) Spulenanordnungen mit einem Bereich, um der Münze gegenüberzuliegen, von kleiner als 72 mm2 enthalten.
  11. Münzenannahmevorrichtung (1) nach einem der Ansprüche 2 bis 10, wobei die Spuleneinheiten (C1-C4) Spulen enthalten, die um einen magnetisch permeablen Kern (26) konfiguriert sind, der dem Münzpfad gegenüberliegt.
  12. Münzenannahmevorrichtung (1) nach einem der Ansprüche 2 bis 11, wobei die Sensorsputeneinheiten (C1-C4) jeweils in einer Oszillatorschaltung gekoppelt sind und die Abtasteinrichtung (D1-D4) arbeitet, um einen Parameter der Oszillationseigenschaft der Schaltung abzutasten, wenn die Münze (8) die Einheit durchläuft.
  13. Münzenannahmevorrichtung (1) nach Anspruch 12, wobei die Eigenschaft eine Frequenz oder eine Amplitude oder beides umfaßt.
  14. Münzenannahmevorrichtung (1) nach einem der vorangehenden Ansprüche, wobei die Steuereinrichtung (11) konfiguriert ist, um ein Ensemble (A) von Abtastwerten der Sensorausgaben auszuwählen, die dann auftreten, wenn eine der Ausgaben mit dem vorbestimmten Kriterium übereinstimmt, und um die ausgewählten Abtastwerte mit den gespeicherten Daten (53) zu vergleichen.
  15. Münzenannahmevorrichtung (1) nach einem der Ansprüche 1 bis 13, wobei die Steuereinrichtung (11) konfiguriert ist, um zu bestimmen, wenn die abgetasteten Sensorausgaben einzeln mit einem jeweiligen vorbestimmten Kriterium übereinstimmen, und um ihre Werte mit den gespeicherten Daten (58) zu vergleichen.
  16. Münzenannahmevorrichtung (1) nach einem der vorangehenden Ansprüche, wobei das vorbestimmte Kriterium eine Diskontinuität bezüglich des Werts einer abgetasteten Sensorausgabe umfaßt.
  17. Münzenannahmevorrichtung (1) nach Anspruch 16, wobei die Diskontinuität ein Haupt- oder ein Lokalmaximum oder -minimum bezüglich des abgetasteten Werts der Sensorausgabe umfaßt, die während des Durchlaufens der Münze (8) auftritt.
  18. Münzenannahmevorrichtung (1) nach einem der vorangehenden Ansprüche, wobei das vorbestimmte Kriterium das Auftreten von wenigstens einem Abtastwert von einem der Sensoren (C1-C4) umfaßt, der eine vorbestimmte Wertebeziehung zu wenigstens einem Abtastwert von einem anderen der Sensoren bildet.
  19. Münzenannahmevorrichtung (1) nach Anspruch 18, wobei die Wertebeziehung eine Kreuzung der Werte der aufeinander folgenden Abtastungen von einem der Sensoren mit entsprechenden Abtastwerten von einem anderen der Sensoren umfaßt oder eine Funktion einer relativen Änderungsrate der Abtastwerte von den Sensoren (C1-C4) sein kann.
  20. Münzenannahmevorrichtung (1) nach Anspruch 18, wobei die Wertebeziehung eine vorbestimmte Funktion der relativen Änderungsrate der Abtastwerte von den Sensoren umfaßt.
  21. Münzenuntersuchungsverfahren mit einem Erfassen des Laufens einer Münze (8) entlang einem Pfad (2) mit einer Vielzahl von Sensorspulen (C1a,b, C2, C3a,b, C4), die in einem Feld voneinander beabstandet sind, das sich transversal vom Münzpfad (2) erstreckt, und die erregt werden, um mit unterschiedlichen Bereichen (21, 22) der Oberfläche der Münze (8) induktiv zu koppeln, wenn sie sich an ihnen vorbeibewegt, einem wiederholten Abtasten von Werten der Sensorausgaben während des Laufens der Münze (8) an den Sensorspulen (C1 - C4) vorbei, um entsprechende Abtastwerte zu liefern, einem Überwachen der Abtastwerte, einem Bestimmen, wenn ein abgetasteter Wert von wenigstens einer der Sensorausgaben mit einem vorbestimmten Kriterium übereinstimmt, und einem Vergleichen der Abtastwerte mit gespeicherten Referenzdatenwerten, dadurch gekennzeichnet, dass der Vergleich in Reaktion auf das Kriterium durchgeführt wird, das gerade erfüllt wird, wobei der Vergleich zwischen gespeicherten Referenzdaten mit Gruppen von individuellen Münzenparameterwerten für Münzen unterschiedlicher Wertigkeit und Abtastwerten in Bezug auf jeden der Vielzahl von durch die Sensorspulen (11) erfassten Bereichen mit den gespeicherten Datengruppen erfolgt, um die Annehmbarkeit der Münze zu bestimmen.
  22. Münzenuntersuchungsverfahren nach Anspruch 21, wobei die Sensorspulen (C1-C4) bei unterschiedlichen Frequenzen erregt werden.
  23. Verfahren nach Anspruch 21 oder 22, das ein kontinuierliches Suchen enthält, um zu bestimmen, wenn der abgetastete Werte von wenigstens einer der Sensorausgaben mit dem Kriterium übereinstimmt, während die Münze an den Sensorspulen vorbeiläuft, und ein Auswählen des Abtastwerts, der das Kriterium am besten erfüllt, wenn das Kriterium nicht mehr als einmal erfüllt wird.
EP98950225A 1997-11-03 1998-10-30 Münzprüfvorrichtung Expired - Lifetime EP1029309B1 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB9723223 1997-11-03
GBGB9723223.5A GB9723223D0 (en) 1997-11-03 1997-11-03 Coin validator
GB9804982 1998-03-09
GBGB9804982.8A GB9804982D0 (en) 1998-03-09 1998-03-09 Coin acceptor
PCT/GB1998/003242 WO1999023616A1 (en) 1997-11-03 1998-10-30 Coin acceptor

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Publication Number Publication Date
EP1029309A1 EP1029309A1 (de) 2000-08-23
EP1029309B1 true EP1029309B1 (de) 2004-12-29

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JP (1) JP2001522110A (de)
KR (1) KR20010031644A (de)
CN (1) CN1278352A (de)
AU (1) AU744618B2 (de)
CA (1) CA2306749A1 (de)
DE (1) DE69828437T2 (de)
ES (1) ES2230720T3 (de)
WO (1) WO1999023616A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6230870B1 (en) 2000-02-10 2001-05-15 Coin Acceptors, Inc. Coin detection device
EP1391851A1 (de) 2002-08-22 2004-02-25 Azkoyen Medios de Pago, S.A. Verfahren und Vorrichtung zum Prüfen von Münzen
JP5178243B2 (ja) * 2008-03-05 2013-04-10 ローレル精機株式会社 硬貨識別装置
KR100955745B1 (ko) * 2008-04-18 2010-04-30 인터내셔날 커런시 테크놀로지 코포레이션 코인 수납기의 도난 방지 장치
KR101010088B1 (ko) * 2008-06-05 2011-01-24 인터내셔날 커런시 테크놀로지 코포레이션 코인 수납기
CN101819693A (zh) * 2010-04-23 2010-09-01 南开大学 硬币币值智能检测系统
JP6425878B2 (ja) * 2013-10-18 2018-11-21 株式会社日本コンラックス 硬貨処理装置
US10391610B2 (en) * 2016-10-21 2019-08-27 Applied Materials, Inc. Core configuration for in-situ electromagnetic induction monitoring system
DE102020212238A1 (de) * 2020-09-29 2022-03-31 Pepperl+Fuchs Se Induktive Sensoreinrichtung

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8500220D0 (en) 1985-01-04 1985-02-13 Coin Controls Discriminating between metallic articles
JPS6327995A (ja) 1986-07-21 1988-02-05 株式会社田村電機製作所 硬貨選別装置
US5458225A (en) * 1991-09-28 1995-10-17 Anritsu Corporation Coin discriminating apparatus
GB2266804B (en) 1992-05-06 1996-03-27 Mars Inc Coin validator
JPH06231333A (ja) * 1993-02-02 1994-08-19 Toshiba Corp コイン識別装置
DE4339543C2 (de) * 1993-11-19 1998-07-23 Nat Rejectors Gmbh Verfahren zur Prüfung von Münzen

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AU9637898A (en) 1999-05-24
KR20010031644A (ko) 2001-04-16
DE69828437D1 (de) 2005-02-03
WO1999023616A1 (en) 1999-05-14
JP2001522110A (ja) 2001-11-13
CA2306749A1 (en) 1999-05-14
EP1029309A1 (de) 2000-08-23
DE69828437T2 (de) 2005-06-02
CN1278352A (zh) 2000-12-27
AU744618B2 (en) 2002-02-28
ES2230720T3 (es) 2005-05-01

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