EP1012871A1 - Chambre de pulverisation avec sechoir - Google Patents

Chambre de pulverisation avec sechoir

Info

Publication number
EP1012871A1
EP1012871A1 EP97951050A EP97951050A EP1012871A1 EP 1012871 A1 EP1012871 A1 EP 1012871A1 EP 97951050 A EP97951050 A EP 97951050A EP 97951050 A EP97951050 A EP 97951050A EP 1012871 A1 EP1012871 A1 EP 1012871A1
Authority
EP
European Patent Office
Prior art keywords
spray
gas
droplets
nebulizer
sheath gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP97951050A
Other languages
German (de)
English (en)
Inventor
John B. French
Bernard Etkin
Raymond Jong
Guy Legere
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nordion Inc
Original Assignee
MDS Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US08/974,957 external-priority patent/US5969352A/en
Application filed by MDS Inc filed Critical MDS Inc
Publication of EP1012871A1 publication Critical patent/EP1012871A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Abstract

L'invention concerne une chambre de pulvérisation permettant de produire un échantillon pour un analyseur susceptible de contenir une torche à plasma. Dans la chambre, un gaz de gainage chauffé est introduit dans la zone périphérique de pulvérisation entourant le jet de pulvérisation et au voisinage de la naissance du jet de pulvérisation, ce qui entraîne une réduction de la taille des gouttelettes qui sont recyclées, et a pour effet de réduire les phénomènes d'agglomération des gouttelettes et de favoriser un séchage rapide du produit de pulvérisation. De préférence, la totalité du solvant de pulvérisation s'évapore au niveau d'une chambre très courte, ce qui permet de réduire la quantité du produit de pulvérisation recyclée. L'ensemble du flux combiné des particules séchées issues de la pulvérisation, du gaz de nébulisation et du gaz de gainage est dirigé dans la torche. Dans un mode de réalisation, la partie centrale du flux combiné est dirigée vers la torche et la partie périphérique du flux combiné est évacuée de manière canalisé. Dans un autre mode de réalisation, le solvant aqueux de pulvérisation s'évapore totalement avant de quitter la chambre de pulvérisation, le flux combiné étant dirigé à travers un séchoir à membrane avant d'atteindre la torche, de façon à éliminer du flux la majeure partie de la vapeur d'eau et à réduire la vapeur d'eau venant charger la torche.
EP97951050A 1997-01-03 1997-12-22 Chambre de pulverisation avec sechoir Withdrawn EP1012871A1 (fr)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US778593 1991-10-17
US974957 1992-11-12
US77859397A 1997-01-03 1997-01-03
US08/974,957 US5969352A (en) 1997-01-03 1997-11-20 Spray chamber with dryer
PCT/CA1997/001007 WO1998029896A1 (fr) 1997-01-03 1997-12-22 Chambre de pulverisation avec sechoir

Publications (1)

Publication Number Publication Date
EP1012871A1 true EP1012871A1 (fr) 2000-06-28

Family

ID=27119475

Family Applications (1)

Application Number Title Priority Date Filing Date
EP97951050A Withdrawn EP1012871A1 (fr) 1997-01-03 1997-12-22 Chambre de pulverisation avec sechoir

Country Status (5)

Country Link
EP (1) EP1012871A1 (fr)
JP (1) JP3831415B2 (fr)
AU (1) AU5474598A (fr)
CA (1) CA2276018C (fr)
WO (1) WO1998029896A1 (fr)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
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US7045015B2 (en) 1998-09-30 2006-05-16 Optomec Design Company Apparatuses and method for maskless mesoscale material deposition
JP3902380B2 (ja) * 2000-05-19 2007-04-04 エスアイアイ・ナノテクノロジー株式会社 Ｉｃｐ分析装置
US6989529B2 (en) * 2001-07-03 2006-01-24 Varian Australia Pty Ltd. Plasma torch
US7479630B2 (en) * 2004-03-25 2009-01-20 Bandura Dmitry R Method and apparatus for flow cytometry linked with elemental analysis
DE102005004804B4 (de) * 2004-02-06 2010-06-10 Micromass Uk Ltd. Ionenquelle und Verfahren zur Ionisierung einer Probe
US7265362B2 (en) 2004-02-06 2007-09-04 Micromass Uk Limited Mass spectrometer
US7294841B2 (en) 2004-02-06 2007-11-13 Micromass Uk Limited Mass spectrometer
US7674671B2 (en) 2004-12-13 2010-03-09 Optomec Design Company Aerodynamic jetting of aerosolized fluids for fabrication of passive structures
US7938341B2 (en) * 2004-12-13 2011-05-10 Optomec Design Company Miniature aerosol jet and aerosol jet array
TWI482662B (zh) 2007-08-30 2015-05-01 Optomec Inc 機械上一體式及緊密式耦合之列印頭以及噴霧源
JP4982900B2 (ja) * 2008-07-02 2012-07-25 独立行政法人産業技術総合研究所 脱溶媒機能付き誘導結合プラズマトーチ
KR200457166Y1 (ko) 2008-12-16 2011-12-07 문무 주식회사 분말 건조 장치
JP5792203B2 (ja) 2010-02-26 2015-10-07 パーキンエルマー・ヘルス・サイエンシーズ・インコーポレイテッドＰｅｒｋｉｎｅｌｍｅｒ Ｈｅａｌｔｈ Ｓｃｉｅｎｃｅｓ， Ｉｎｃ． イオンを抑制させたプラズマ質量分析器
SG10201501031YA (en) 2010-02-26 2015-04-29 Perkinelmer Health Sci Inc Fluid chromatography injectors and injector inserts
US9190253B2 (en) 2010-02-26 2015-11-17 Perkinelmer Health Sciences, Inc. Systems and methods of suppressing unwanted ions
GB201216412D0 (en) * 2012-09-14 2012-10-31 Shimadzu Corp Apparatus for providing gaseous sample ions/molecules and a corresponding method
JP2014211377A (ja) * 2013-04-19 2014-11-13 株式会社堀場製作所 粒子分析装置
KR102444204B1 (ko) 2015-02-10 2022-09-19 옵토멕 인코포레이티드 에어로졸의 비행 중 경화에 의해 3차원 구조를 제조하는 방법
JP6048552B1 (ja) 2015-08-21 2016-12-21 株式会社 イアス オンライン移送した分析試料の分析システム
CA3024740A1 (fr) * 2016-05-18 2017-11-23 Perkinelmer Health Sciences Canada, Inc. Chambres de pulverisation et leurs procedes d'utilisation
WO2018207606A1 (fr) * 2017-05-12 2018-11-15 株式会社Sumco Chambre de pulvérisation, dispositif d'atomisation et d'introduction d'échantillon, dispositif d'analyse et procédé d'analyse de composants d'échantillon
US10632746B2 (en) 2017-11-13 2020-04-28 Optomec, Inc. Shuttering of aerosol streams
CN116726519A (zh) * 2023-06-14 2023-09-12 广东省麦思科学仪器创新研究院 雾化气细胞干燥装置和质谱流式细胞仪

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4990740A (en) * 1989-03-06 1991-02-05 The Dow Chemical Company Intra-microspray ICP torch
US4958529A (en) * 1989-11-22 1990-09-25 Vestec Corporation Interface for coupling liquid chromatography to solid or gas phase detectors
US5122670A (en) * 1991-05-17 1992-06-16 Finnigan Corporation Multilayer flow electrospray ion source using improved sheath liquid
EP0560537A1 (fr) * 1992-03-10 1993-09-15 Mds Health Group Limited Dispositif et méthode pour l'introduction d'échantillons liquides
CA2062629C (fr) * 1992-03-10 1999-06-15 John Barry French Appareil et methode d'introduction d'echantillon liquide

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO9829896A1 *

Also Published As

Publication number Publication date
CA2276018A1 (fr) 1998-07-09
JP3831415B2 (ja) 2006-10-11
CA2276018C (fr) 2004-11-23
WO1998029896A1 (fr) 1998-07-09
AU5474598A (en) 1998-07-31
JP2001507449A (ja) 2001-06-05

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