EP0980050A1 - Coin apparatus - Google Patents
Coin apparatus Download PDFInfo
- Publication number
- EP0980050A1 EP0980050A1 EP99114606A EP99114606A EP0980050A1 EP 0980050 A1 EP0980050 A1 EP 0980050A1 EP 99114606 A EP99114606 A EP 99114606A EP 99114606 A EP99114606 A EP 99114606A EP 0980050 A1 EP0980050 A1 EP 0980050A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- coin
- electromagnet
- signal
- switch
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
- G07D5/02—Testing the dimensions, e.g. thickness, diameter; Testing the deformation
Definitions
- the invention relates to a coin device according to the preamble of the claim 1.
- Coin operated machines of the type mentioned are in many forms known. What they have in common is that there are several along one coin path Test sensors are arranged, the coins on different criteria, such as B. Examine size, thickness, material, etc.
- an evaluation device which is usually is formed by a microprocessor, the measurement signals from the sensors compared with stored reference values.
- An acceptance switch made by an electromagnet is operated in accordance with the output signal Evaluation device switched so that they forward coins to be accepted and Put unacceptable coins into a return channel.
- a presence sensor arranged downstream of the acceptance switch determines if the coin has passed the switch
- a coin sorting of the acceptance gate is also common downstream, which stores the coins depending on their value in different memories (Coin tubes) conducts. It is known for this, also switches in the form of flaps or the like to use. Such flaps are also from an electromagnet actuated, which in turn are controlled by the microprocessor.
- the invention has for its object to provide a coin device in which the Path between a sensor for a coin and one downstream of the sensor Soft can be minimized.
- the evaluation device generates a bias signal for the electromagnet, which is before the generation of the control signal and is initiated by a signal from an upstream sensor.
- the invention is based on the knowledge that the magnetization can already be started before the switch or flap is to perform a movement. If e.g. B. the last test sensor generates a measurement signal, this can be used to set the magnetization of the magnet for the acceptance gate in motion, either immediately or at a predetermined interval after the occurrence of the measurement signal, this interval can be varied depending on Size of a coin. It is understood that a coin with a larger diameter faster "on the acceptance gate than a smaller coin. Therefore, the magnetization with a larger diameter coin should be done earlier than with a smaller coin.
- the electromagnet of the acceptance gate is magnetized independently whether the microprocessor generates an accept or return signal. At the start The pre-magnetization is therefore still open as to whether the detected coin is accepted or is rejected. It is therefore necessary to interrupt the magnetization process if the magnet should not be operated. Hence the magnetization interrupted when the evaluation device has no control signal for the electromagnet generated. This control signal can only be generated when the above described comparison between the measurement signals of the test sensors and the reference values has taken place.
- the invention has the advantage that the path of the coin from a test sensor to assigned switch can be interpreted relatively short. Another advantage is there in that the magnet can be dimensioned relatively small. It is understood that the distance to travel for the coin depending on the size of the magnet can be reduced. The more powerful a magnet is, the faster it can address and operate a switch. In the case of coin operated devices, however, the aim is To design electromagnets as small as possible, and not just for cost, but also to save space.
- a coin device 10 is shown in perspective, as is known per se. It its structure should not be described in detail either. You recognize one Coin insertion slot 12, which is adjoined by an area in which the coin is on a career (not shown) moved along sensors 14, which is a coin at 16 is shown, check for different properties. One in the last direction The sensor is labeled CP2. After leaving the coin career is the shown coin 16 above a coin switch 18 in the form of a horizontal Axis pivotable flap which is actuated by an electromagnet 20. Each after actuation of the acceptance switch 18, the coin passes vertically below arranged acceptance shaft 22 or over a career in an adjacent Return slot 24.
- FIG. 3 shows how the acceptance magnet 20 is actuated. It is because of one DC voltage source 26 and is switched on or in with the aid of an electronic switch 28. switched off.
- the electronic switch 28 is located above a PWM actuator 30 (Pulse width modulation), which in turn is controlled by a microprocessor CPU or 32 becomes.
- the microprocessor 32 is also the evaluation device for the 1, that of the individual sensors 14, CP2 and of a presence sensor CP3 contains signals, for example for controlling the acceptance magnets 20.
- the microprocessor compares the measurement signals from the test probes with stored reference values and generates an acceptance signal for a coin to be accepted and a return signal if the coin is not accepted.
- the acceptance gate is accordingly 18 actuated by the electromagnet 20.
- the acceptance magnet 20 is activated when the microprocessor Has carried out the target / actual value comparison and has generated a corresponding signal. in the In the present case, however, a bias signal is already generated when the Coin 16 has passed the last test sensor CP2. The acceptance magnet 20 is already powered so that its bias can begin. Will due of the comparison in the microprocessor, the coin 16 is found to be good Magnetization continued until the switch 18 is actuated, so that the Coin z. B. is directed into the acceptance shaft 12. In contrast, is in the microprocessor determined that the coin is to be rejected, a return signal is generated which then the magnetization of the acceptance magnet 20 interrupts.
- Fig. 2 On the timeline (a) is the Pulse of the last test sensor CP2 shown.
- the time axis (b) is solid Lines the magnetization signal for the acceptance magnet 20 shown without bias.
- the impulse for the premagnetization is in dashed lines shown.
- the pulse of the presence sensor CP3 is on the time axis (c) shown.
- On the time axis (d) the pre-magnetization time period is rejected Coin depicted. It is labeled x. From the illustration you can see that with the generation of a signal from the last test sensor CP2, the magnetization at the same time of the acceptance magnet begins. After the signal from CP2 has ended the comparison of the test signals with the reference values in the microprocessor.
- a further sensor 14.1 is shown, the diameter of the coins measures. In this way, the size of the diameter and the PWM actuator 30 control the magnetization of the magnet 20. With a larger one Diameter, it is necessary to achieve a faster response to the acceptance gate than with a smaller diameter.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Coins (AREA)
- Photoreceptors In Electrophotography (AREA)
- Particle Formation And Scattering Control In Inkjet Printers (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Die Erfindung bezieht sich auf ein Münzgerät nach dem Oberbegriff des Patentanspruchs 1.The invention relates to a coin device according to the preamble of the claim 1.
Münzgeräte der eingangs genannten Art sind in vielgestaltigen Ausführungsformen bekannt geworden. Ihnen ist gemeinsam, daß entlang einer Münzlaufbahn mehrere Prüfsensoren angeordnet sind, die die Münzen auf verschiedene Kriterien, wie z. B. Größe, Dicke, Werkstoff usw., untersuchen. In einer Auswertevorrichtung, die üblicherweise von einem Mikroprozessor gebildet wird, werden die Meßsignale der Sensoren mit gespeicherten Referenzwerten verglichen. Eine Annahmeweiche, die von einem Elektromagneten betätigt wird, wird nach Maßgabe des Ausgangssignals der Auswertevorrichtung so geschaltet, daß sie anzunehmende Münzen weiterleiten und nicht annehmbare Münzen in einen Rückgabekanal lenken.Coin operated machines of the type mentioned are in many forms known. What they have in common is that there are several along one coin path Test sensors are arranged, the coins on different criteria, such as B. Examine size, thickness, material, etc. In an evaluation device, which is usually is formed by a microprocessor, the measurement signals from the sensors compared with stored reference values. An acceptance switch made by an electromagnet is operated in accordance with the output signal Evaluation device switched so that they forward coins to be accepted and Put unacceptable coins into a return channel.
Bei einfachen Münzgeräten gelangt die annehmbare Münze unmittelbar in eine Kasse, wobei ein der Annahmeweiche nachgeordneter Anwesenheitssensor feststellt, wenn die Münze die Weiche passiert hat. Häufig wird auch eine Münzsortierung der Annahmeweiche nachgeschaltet, welche die Münzen je nach Wert in verschiedene Speicher (Münztuben) leitet. Hierfür ist bekannt, ebenfalls Weichen in Form von Klappen oder dergleichen zu verwenden. Derartige Klappen sind ebenfalls von einem Elektromagneten betätigt, die ihrerseits vom Mikroprozessor gesteuert werden.With simple coin-operated devices, the acceptable coin goes straight to a cash register, a presence sensor arranged downstream of the acceptance switch determines if the coin has passed the switch A coin sorting of the acceptance gate is also common downstream, which stores the coins depending on their value in different memories (Coin tubes) conducts. It is known for this, also switches in the form of flaps or the like to use. Such flaps are also from an electromagnet actuated, which in turn are controlled by the microprocessor.
Die Auswerteprozedur im Mikroprozessor, d. h. der Vergleich der Meßwerte mit den
Referenzwerten und der Erzeugung eines entsprechenden Annahme- oder Rückgabesignals
wird innerhalb kürzester Zeit durchgeführt und kann z. B. in weniger als 5 ms
ablaufen. Demgegenüber benötigt der Elektromagnet zur Betätigung z. B. der Annahmeweiche
etwa 15 bis 20 ms. Diese Dauer setzt sich aus folgenden Vorgängen zusammen,
die zeitlich ineinander verschoben sind:
aufgrund des größten Luftspaltes zu Beginn ist die Anfangskraft am Kleinsten und führt mithin noch nicht zu einer Bewegung der Ankers;
während der Anzugsbewegung verkleinert sich der Luftspalt, und die Kraft wird größer, bis die Klappe gegen den Anschlag trifft.
Due to the largest air gap at the beginning, the initial force is the smallest and therefore does not yet cause the armature to move;
the air gap narrows during the tightening movement and the force increases until the flap hits the stop.
Dies bedeutet, daß der Weg der Münze vom letzten Prüfsensor bis zur Annahmeweiche eine bestimmte Länge haben muß, damit die Weiche bereits in der entsprechenden Schaltstellung ist, wenn die Münze die Weiche erreicht. Dieser Weg bestimmt u. a. die geometrischen Abmessungen eines Münzgeräts. Das gleiche trifft zu auf andere Weichen oder Klappen, die von Elektromagneten im Münzgerät betätigt werden und deren Steuersignal von einem in Laufrichtung vorangehenden Sensor initiiert werden.This means that the path of the coin from the last test sensor to the acceptance gate must have a certain length so that the switch is already in the corresponding Switch position is when the coin reaches the switch. This path determines u. a. the geometrical dimensions of a coin operated device. The same applies to others Turnouts or flaps that are actuated by electromagnets in the coin operated device and whose control signal is initiated by a sensor preceding in the running direction.
Der Erfindung liegt die Aufgabe zugrunde, ein Münzgerät zu schaffen, bei dem der Laufweg zwischen einem Sensor für eine Münze und einer dem Sensor nachgeordneten Weiche minimiert werden kann.The invention has for its object to provide a coin device in which the Path between a sensor for a coin and one downstream of the sensor Soft can be minimized.
Diese Aufgabe wird durch die Merkmale des Patentanspruchs 1 gelöst.This object is achieved by the features of patent claim 1.
Bei der Erfindung wird von der Auswertevorrichtung ein Vormagnetisierungssignal für den Elektromagneten erzeugt, das zeitlich vor der Erzeugung des Steuersignals liegt und von einem Signal eines vorgeschalteten Sensors initiiert wird. Die Erfindung geht dabei von der Erkenntnis aus, daß die Magnetisierung bereits in Gang gesetzt werden kann, bevor die Weiche oder Klappe eine Bewegung ausführen soll. Wenn z. B. der letzte Prüfsensor ein Meßsignal erzeugt, kann dieses dazu verwendet werden, die Magnetisierung des Magneten für die Annahmeweiche in Gang zu setzen, und zwar entweder unmittelbar oder in einem vorgegebenen zeitlichen Abstand zum Auftreten des Meßsignals, wobei dieser Abstand variiert werden kann je nach Größe einer Münze. Es versteht sich, daß eine Münze mit größerem Durchmesser schneller" an der Annahmeweiche ist als eine kleinere Münze. Daher sollte die Vormagnetisierung mit einer im Durchmesser größeren Münze früher als mit einer kleineren Münze erfolgen.In the invention, the evaluation device generates a bias signal for the electromagnet, which is before the generation of the control signal and is initiated by a signal from an upstream sensor. The invention is based on the knowledge that the magnetization can already be started before the switch or flap is to perform a movement. If e.g. B. the last test sensor generates a measurement signal, this can be used to set the magnetization of the magnet for the acceptance gate in motion, either immediately or at a predetermined interval after the occurrence of the measurement signal, this interval can be varied depending on Size of a coin. It is understood that a coin with a larger diameter faster "on the acceptance gate than a smaller coin. Therefore, the magnetization with a larger diameter coin should be done earlier than with a smaller coin.
Die Vormagnetisierung des Elektromagneten der Annahmeweiche erfolgt unabhängig davon, ob der Mikroprozessor ein Annahme- oder Rückgabesignal erzeugt. Zu Beginn der Vormagnetisierung ist also noch offen, ob die erfaßte Münze angenommen oder abgewiesen wird. Es ist daher erforderlich, den Magnetisierungsvorgang zu unterbrechen, wenn der Magnet nicht betätigt werden soll. Daher wird die Magnetisierung unterbrochen, wenn die Auswertevorrichtung kein Steuersignal für den Elektromagneten erzeugt. Dieses Steuersignal kann erst dann erzeugt werden, wenn der oben beschriebene Vergleich zwischen den Meßsignalen der Prüfsensoren und den Referenzwerten stattgefunden hat.The electromagnet of the acceptance gate is magnetized independently whether the microprocessor generates an accept or return signal. At the start The pre-magnetization is therefore still open as to whether the detected coin is accepted or is rejected. It is therefore necessary to interrupt the magnetization process if the magnet should not be operated. Hence the magnetization interrupted when the evaluation device has no control signal for the electromagnet generated. This control signal can only be generated when the above described comparison between the measurement signals of the test sensors and the reference values has taken place.
Die Erfindung hat den Vorteil, daß der Weg der Münze von einem Prüfsensor bis zur zugeordneten Weiche relativ kurz ausgelegt werden kann. Ein weiterer Vorteil besteht darin, daß der Magnet relativ klein dimensioniert werden kann. Es versteht sich, daß der für die Münze zurückzulegende Weg in Abhängigkeit von der Größe des Magneten verringert werden kann. Je leistungsfähiger ein Magnet ist, um so rascher kann er ansprechen und eine Weiche betätigen. Bei Münzgeräten wird jedoch angestrebt, die Elektromagneten so klein wie möglich auszulegen, und zwar nicht nur aus Kosten-, sondern auch aus Raumspargründen.The invention has the advantage that the path of the coin from a test sensor to assigned switch can be interpreted relatively short. Another advantage is there in that the magnet can be dimensioned relatively small. It is understood that the distance to travel for the coin depending on the size of the magnet can be reduced. The more powerful a magnet is, the faster it can address and operate a switch. In the case of coin operated devices, however, the aim is To design electromagnets as small as possible, and not just for cost, but also to save space.
Ein Ausführungsbeispiel der Erfindung wird nachfolgend anhand von Zeichnungen näher erläutert.
- Fig. 1
- zeigt perspektivisch eine Ansicht eines Münzgeräts nach der Erfindung.
- Fig. 2
- zeigt ein Diagramm für einzelne Signalabläufe des Münzgeräts nach der Erfindung.
- Fig. 3
- zeigt ein Schaltschema für die Ansteuerung des Annahmemagneten des Münzgerätes nach Fig. 1.
- Fig. 1
- shows a perspective view of a coin device according to the invention.
- Fig. 2
- shows a diagram for individual signal sequences of the coin device according to the invention.
- Fig. 3
- shows a circuit diagram for the control of the acceptance magnet of the coin device of FIG. 1st
In Fig. 1 ist ein Münzgerät 10 perspektivisch dargestellt, wie es an sich bekannt ist. Es
soll in seinem Aufbau auch nicht im einzelnen beschrieben werden. Man erkennt einen
Münzeinwurfschlitz 12, dem sich ein Bereich anschließt, in dem die Münze auf einer
Laufbahn (nicht gezeigt) entlang von Sensoren 14 bewegt, die eine Münze, die bei 16
dargestellt ist, auf unterschiedliche Eigenschaften prüfen. Ein in Laufrichtung letzter
Sensor ist mit CP2 bezeichnet. Nach Verlassen der Münzlaufbahn befindet sich die
dargestellte Münze 16 oberhalb einer Münzweiche 18 in Form einer um eine horizontale
Achse schwenkbaren Klappe, die von einem Elektromagneten 20 betätigt ist. Je
nach Betätigung der Annahmeweiche 18 gelangt die Münze in einen senkrecht unterhalb
angeordneten Annahmeschacht 22 oder über eine Laufbahn in einen daneben liegenden
Rückgabeschacht 24.In Fig. 1, a
In Fig. 3 ist gezeigt, wie der Annahmemagnet 20 betätigt wird. Er liegt an einer
Gleichspannungsquelle 26 und wird mit Hilfe eines elektronischen Schalters 28 ein-bzw.
ausgeschaltet. Der elektronische Schalter 28 liegt über einem PWM-Steller 30
(Pulsbreitenmodulation), der seinerseits von einem Mikroprozessor CPU bzw. 32 angesteuert
wird. Der Mikroprozessor 32 ist auch die Auswertevorrichtung für das
Münzgerät nach Fig. 1, das von den einzelnen Sensoren 14, CP2 und von einem Anwesenheitssensor
CP3 Signale enthält, etwa zur Steuerung der Annahmemagneten 20.
Der Mikroprozessor vergleicht die Meßsignale der Prüfsonden mit gespeicherten Referenzwerten
und erzeugt bei einer anzunehmenden Münze ein Annahmesignal und
bei einer nicht akzeptierten Münze ein Rückgabesignal. Entsprechend wird die Annahmeweiche
18 vom Elektromagneten 20 betätigt.3 shows how the
Üblicherweise wird der Annahmemagnet 20 aktiviert, wenn der Mikroprozessor den
Soll-Ist-Wertvergleich durchgeführt und ein entsprechendes Signal erzeugt hat. Im
vorliegenden Fall wird jedoch bereits ein Vormagnetisierungssignal erzeugt, wenn die
Münze 16 den letzten Prüfsensor CP2 passiert hat. Der Annahmemagnet 20 wird bereits
mit Strom versorgt, so daß seine Vormagnetisierung beginnen kann. Wird aufgrund
des Vergleichs im Mikroprozessor die Münze 16 für gut befunden, wird die
Magnetisierung fortgesetzt, bis eine Betätigung der Weiche 18 erfolgt, so daß die
Münze z. B. in den Annahmeschacht 12 gelenkt wird. Wird hingegen im Mikroprozessor
festgestellt, daß die Münze abzuweisen ist, wird ein Rückgabesignal erzeugt, das
dann die Magnetisierung des Annahmemagneten 20 unterbricht.Usually the
Der beschriebene Vorgang ist in Fig. 2 näher dargestellt. Auf der Zeitachse (a) ist der
Impuls des letzten Prüfsensors CP2 dargestellt. Aufder Zeitachse (b) ist in durchgezogenen
Linien das Magnetisierungssignal für den Annahmemagneten 20 dargestellt
ohne Vormagnetisierung. In gestrichelten Linien ist der Impuls für die Vormagnetisierung
dargestellt. Auf der Zeitachse (c) ist der Impuls des Anwesenheitssensors CP3
dargestellt. Auf der Zeitachse (d) ist die Vormagnetisierungszeitdauer bei abgewiesener
Münze dargestellt. Sie ist mit x bezeichnet. Aus der Darstellung erkennt man, daß
mit der Erzeugung eines Signals vom letzten Prüfsensor CP2 zugleich die Magnetisierung
des Annahmemagneten beginnt. Nach Beendigung des Signals von CP2 erfolgt
im Mikroprozessor der Vergleich der Prüfsignale mit den Referenzwerten. Diese Zeit
ist in der Darstellung mit y angegeben. Nach Beendigung dieser Zeit erzeugt der
Mikroprozessor z. B. ein Annahmesignal zur Betätigung der Annahmeweiche 18 über
den Magneten 20. Die Magnetisierung des Magneten 20 wird daher fortgesetzt, bis der
Anwesenheitssensor CP3 feststellt, daß die Münze die Annahmeweiche 18 verlassen
hat. Zu diesem Zeitpunkt wird der Magnet 20 abgeschaltet. Erbringt der Vergleich im
Mikroprozessor jedoch, daß die Münze abzuweisen ist wird die Magnetisierung des
Magneten 20 gemäß Zeitachse (d) nach Ablauf der Vergleichszeit y abgebrochen. Die
Annahmeweiche 18 wird mithin gar nicht betätigt.The process described is shown in more detail in Fig. 2. On the timeline (a) is the
Pulse of the last test sensor CP2 shown. The time axis (b) is solid
Lines the magnetization signal for the
In Fig. 3 ist noch ein weiterer Sensor 14.1 dargestellt, der den Durchmesser der Münzen
mißt. Auf diese Weise läßt sich mit Hilfe der Größe des Durchmessers und des
PWM-Stellers 30 die Magnetisierung des Magneten 20 steuern. Bei einem größeren
Durchmesser ist es erforderlich, eine raschere Ansprache der Annahmeweiche zu erzielen
als bei einem kleineren Durchmesser.In Fig. 3 a further sensor 14.1 is shown, the diameter of the coins
measures. In this way, the size of the diameter and the
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19836468 | 1998-08-12 | ||
DE19836468A DE19836468C2 (en) | 1998-08-12 | 1998-08-12 | Coin operated device with acceptance gate operated by electromagnets |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0980050A1 true EP0980050A1 (en) | 2000-02-16 |
EP0980050B1 EP0980050B1 (en) | 2003-07-02 |
EP0980050B2 EP0980050B2 (en) | 2007-10-24 |
Family
ID=7877258
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP99114606A Expired - Lifetime EP0980050B2 (en) | 1998-08-12 | 1999-07-26 | Coin apparatus |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0980050B2 (en) |
AT (1) | ATE244429T1 (en) |
DE (2) | DE19836468C2 (en) |
ES (1) | ES2198822T5 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103839320A (en) * | 2012-11-23 | 2014-06-04 | 北京嘉岳同乐极电子有限公司 | Magnetic sensor used for financial counterfeit detection machine and manufacturing method thereof |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH486078A (en) * | 1968-02-15 | 1970-02-15 | Rega Gmbh & Co Kg | Device for the electrical testing of the authenticity of coins |
DE2444950A1 (en) * | 1974-09-20 | 1976-04-08 | Kabel Metallwerke Ghh | Testing for coins with magnetic properties - uses a continuous cycle to check for sound dimensions weight and quantity |
DE3522229A1 (en) * | 1985-06-21 | 1987-01-02 | Eps Elektronik Und Lichttechni | Electronic coin tester |
EP0470587A2 (en) * | 1990-08-10 | 1992-02-12 | National Rejectors Inc. GmbH | Electronic coin testing device |
WO1994004998A1 (en) * | 1992-08-13 | 1994-03-03 | Landis & Gyr Business Support Ag | Calibration of coin-checking devices |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS542195A (en) * | 1977-06-07 | 1979-01-09 | Fuji Electric Co Ltd | Tamperproofing device for coin screening devices |
DE4233193C2 (en) * | 1992-10-02 | 1995-07-13 | Nat Rejectors Gmbh | Coin diverters for a coin operated device |
DE29708666U1 (en) * | 1997-05-15 | 1997-07-10 | National Rejectors, Inc. Gmbh, 21614 Buxtehude | Magnet for operating a switch in coin operated devices |
-
1998
- 1998-08-12 DE DE19836468A patent/DE19836468C2/en not_active Expired - Fee Related
-
1999
- 1999-07-26 ES ES99114606T patent/ES2198822T5/en not_active Expired - Lifetime
- 1999-07-26 AT AT99114606T patent/ATE244429T1/en not_active IP Right Cessation
- 1999-07-26 EP EP99114606A patent/EP0980050B2/en not_active Expired - Lifetime
- 1999-07-26 DE DE59906165T patent/DE59906165D1/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH486078A (en) * | 1968-02-15 | 1970-02-15 | Rega Gmbh & Co Kg | Device for the electrical testing of the authenticity of coins |
DE2444950A1 (en) * | 1974-09-20 | 1976-04-08 | Kabel Metallwerke Ghh | Testing for coins with magnetic properties - uses a continuous cycle to check for sound dimensions weight and quantity |
DE3522229A1 (en) * | 1985-06-21 | 1987-01-02 | Eps Elektronik Und Lichttechni | Electronic coin tester |
EP0470587A2 (en) * | 1990-08-10 | 1992-02-12 | National Rejectors Inc. GmbH | Electronic coin testing device |
WO1994004998A1 (en) * | 1992-08-13 | 1994-03-03 | Landis & Gyr Business Support Ag | Calibration of coin-checking devices |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103839320A (en) * | 2012-11-23 | 2014-06-04 | 北京嘉岳同乐极电子有限公司 | Magnetic sensor used for financial counterfeit detection machine and manufacturing method thereof |
Also Published As
Publication number | Publication date |
---|---|
DE59906165D1 (en) | 2003-08-07 |
ES2198822T3 (en) | 2004-02-01 |
EP0980050B1 (en) | 2003-07-02 |
EP0980050B2 (en) | 2007-10-24 |
ES2198822T5 (en) | 2008-04-01 |
ATE244429T1 (en) | 2003-07-15 |
DE19836468C2 (en) | 2000-08-17 |
DE19836468A1 (en) | 2000-02-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE1774568C3 (en) | Testing device for coins or the like | |
DE19518056B4 (en) | Device for controlling the armature movement of an electromagnetic switching device and method for driving | |
DE2648183C2 (en) | Apparatus for preventing machine fraud | |
DE4315637C2 (en) | Method for recognizing the position and the direction of movement of a movably mounted part | |
EP0622763B2 (en) | Coin sorting apparatus | |
DE29703587U1 (en) | Electromagnetic actuator with proximity sensor | |
DE4431164A1 (en) | Semiconductor pulse generator | |
DE4318871A1 (en) | Coin acceptor | |
DE10108425C1 (en) | Electromagnetic valve monitoring unit, consists of switching circuit, differentiating units, comparator and monostable member | |
EP0980050B1 (en) | Coin apparatus | |
DE19836769C1 (en) | Electromagnetic actuator armature position determining method e.g. for IC engine gas-exchange valve | |
DE3643326C3 (en) | Method and device for controlling an automatic door system | |
DE2015058C2 (en) | Device for checking coins | |
DE2742317C3 (en) | Coin distribution device | |
DE3506713A1 (en) | Coin-testing apparatus | |
EP0470587B1 (en) | Electronic coin testing device | |
DE3207592A1 (en) | Method and device for checking coded coins | |
DE1541815C3 (en) | Circuit arrangement for testing metallic objects, in particular coins | |
DE1774999C2 (en) | Testing device for coins or the like | |
DE3522229A1 (en) | Electronic coin tester | |
DE3311987C2 (en) | ||
DE2660704C2 (en) | Electrical monitoring device for a device for separating metal parts | |
DE1474800C (en) | Electronic coin validator | |
DE1945018A1 (en) | Electronic coin validator | |
DE1951675A1 (en) | Electric coin validator |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
|
AX | Request for extension of the european patent |
Free format text: AL;LT;LV;MK;RO;SI |
|
17P | Request for examination filed |
Effective date: 20000714 |
|
AKX | Designation fees paid |
Free format text: AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
RIC1 | Information provided on ipc code assigned before grant |
Free format text: 7G 07D 5/02 A, 7G 07F 1/04 B |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
AK | Designated contracting states |
Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: NL Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20030702 Ref country code: IE Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20030702 Ref country code: FI Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20030702 |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: FG4D Free format text: NOT ENGLISH |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: EP |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: LU Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20030726 Ref country code: CY Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20030726 Ref country code: AT Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20030726 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: MC Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20030731 Ref country code: LI Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20030731 Ref country code: CH Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20030731 Ref country code: BE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20030731 |
|
REG | Reference to a national code |
Ref country code: IE Ref legal event code: FG4D Free format text: GERMAN |
|
REF | Corresponds to: |
Ref document number: 59906165 Country of ref document: DE Date of ref document: 20030807 Kind code of ref document: P |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: SE Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20031002 Ref country code: PT Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20031002 Ref country code: GR Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20031002 Ref country code: DK Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20031002 |
|
GBT | Gb: translation of ep patent filed (gb section 77(6)(a)/1977) |
Effective date: 20031029 |
|
NLV1 | Nl: lapsed or annulled due to failure to fulfill the requirements of art. 29p and 29m of the patents act | ||
BERE | Be: lapsed |
Owner name: *NATIONAL REJECTORS INC. G.M.B.H. Effective date: 20030731 |
|
REG | Reference to a national code |
Ref country code: ES Ref legal event code: FG2A Ref document number: 2198822 Country of ref document: ES Kind code of ref document: T3 |
|
REG | Reference to a national code |
Ref country code: IE Ref legal event code: FD4D |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: PL |
|
PLBQ | Unpublished change to opponent data |
Free format text: ORIGINAL CODE: EPIDOS OPPO |
|
PLBI | Opposition filed |
Free format text: ORIGINAL CODE: 0009260 |
|
ET | Fr: translation filed | ||
PLAX | Notice of opposition and request to file observation + time limit sent |
Free format text: ORIGINAL CODE: EPIDOSNOBS2 |
|
RIC2 | Information provided on ipc code assigned after grant |
Ipc: 7G 07D 5/02 A |
|
26 | Opposition filed |
Opponent name: MARS INCORPORATED Effective date: 20040402 |
|
PLBB | Reply of patent proprietor to notice(s) of opposition received |
Free format text: ORIGINAL CODE: EPIDOSNOBS3 |
|
PLAY | Examination report in opposition despatched + time limit |
Free format text: ORIGINAL CODE: EPIDOSNORE2 |
|
PLBC | Reply to examination report in opposition received |
Free format text: ORIGINAL CODE: EPIDOSNORE3 |
|
PLAY | Examination report in opposition despatched + time limit |
Free format text: ORIGINAL CODE: EPIDOSNORE2 |
|
PLBC | Reply to examination report in opposition received |
Free format text: ORIGINAL CODE: EPIDOSNORE3 |
|
PUAH | Patent maintained in amended form |
Free format text: ORIGINAL CODE: 0009272 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: PATENT MAINTAINED AS AMENDED |
|
27A | Patent maintained in amended form |
Effective date: 20071024 |
|
AK | Designated contracting states |
Kind code of ref document: B2 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
|
GBTA | Gb: translation of amended ep patent filed (gb section 77(6)(b)/1977) | ||
REG | Reference to a national code |
Ref country code: ES Ref legal event code: DC2A Date of ref document: 20071227 Kind code of ref document: T5 |
|
ET3 | Fr: translation filed ** decision concerning opposition | ||
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 20080528 Year of fee payment: 10 |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST Effective date: 20100331 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FR Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20090731 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 20100908 Year of fee payment: 12 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 20110721 Year of fee payment: 13 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: DE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20120201 |
|
REG | Reference to a national code |
Ref country code: DE Ref legal event code: R119 Ref document number: 59906165 Country of ref document: DE Effective date: 20120201 |
|
GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 20120726 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20120726 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: ES Payment date: 20140721 Year of fee payment: 16 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: IT Payment date: 20140724 Year of fee payment: 16 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: IT Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20150726 |
|
REG | Reference to a national code |
Ref country code: ES Ref legal event code: FD2A Effective date: 20170203 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: ES Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20150727 |