EP0772239A3 - Dispositif semi-conducteur et méthode de protection - Google Patents
Dispositif semi-conducteur et méthode de protection Download PDFInfo
- Publication number
- EP0772239A3 EP0772239A3 EP19960308062 EP96308062A EP0772239A3 EP 0772239 A3 EP0772239 A3 EP 0772239A3 EP 19960308062 EP19960308062 EP 19960308062 EP 96308062 A EP96308062 A EP 96308062A EP 0772239 A3 EP0772239 A3 EP 0772239A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- voltage
- switching element
- main
- semiconductor device
- electric field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 230000005684 electric field Effects 0.000 abstract 3
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP287208/95 | 1995-11-06 | ||
JP28720895 | 1995-11-06 | ||
JP28720895 | 1995-11-06 | ||
JP75632/96 | 1996-03-29 | ||
JP7563296 | 1996-03-29 | ||
JP7563296 | 1996-03-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0772239A2 EP0772239A2 (fr) | 1997-05-07 |
EP0772239A3 true EP0772239A3 (fr) | 2000-09-20 |
Family
ID=26416783
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP19960308062 Withdrawn EP0772239A3 (fr) | 1995-11-06 | 1996-11-06 | Dispositif semi-conducteur et méthode de protection |
Country Status (3)
Country | Link |
---|---|
US (1) | US5883402A (fr) |
EP (1) | EP0772239A3 (fr) |
CN (1) | CN1097854C (fr) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3911566B2 (ja) * | 1998-01-27 | 2007-05-09 | 富士電機デバイステクノロジー株式会社 | Mos型半導体装置 |
JP2982785B2 (ja) * | 1998-04-03 | 1999-11-29 | 富士電機株式会社 | デプレッション型mos半導体素子およびmosパワーic |
JP2000012780A (ja) | 1998-06-26 | 2000-01-14 | Toshiba Corp | 半導体スナバ装置及び半導体装置 |
JP4198251B2 (ja) * | 1999-01-07 | 2008-12-17 | 三菱電機株式会社 | 電力用半導体装置およびその製造方法 |
US7589007B2 (en) * | 1999-06-02 | 2009-09-15 | Arizona Board Of Regents For And On Behalf Of Arizona State University | MESFETs integrated with MOSFETs on common substrate and methods of forming the same |
JP2002134692A (ja) * | 2000-10-20 | 2002-05-10 | Sanyo Electric Co Ltd | 半導体装置及びその製造方法 |
JP4225711B2 (ja) * | 2001-06-29 | 2009-02-18 | 株式会社東芝 | 半導体素子及びその製造方法 |
US6700156B2 (en) * | 2002-04-26 | 2004-03-02 | Kabushiki Kaisha Toshiba | Insulated gate semiconductor device |
JP3964819B2 (ja) * | 2003-04-07 | 2007-08-22 | 株式会社東芝 | 絶縁ゲート型半導体装置 |
US7554173B2 (en) * | 2004-12-22 | 2009-06-30 | Mitsubishi Electric Corporation | Semiconductor device |
US8530904B2 (en) * | 2010-03-19 | 2013-09-10 | Infineon Technologies Austria Ag | Semiconductor device including a normally-on transistor and a normally-off transistor |
CN105556647B (zh) * | 2013-07-19 | 2017-06-13 | 日产自动车株式会社 | 半导体装置及其制造方法 |
JP6870240B2 (ja) * | 2016-08-31 | 2021-05-12 | 富士電機株式会社 | ゲート駆動装置 |
JP6820287B2 (ja) * | 2018-02-23 | 2021-01-27 | 株式会社 日立パワーデバイス | 半導体装置および電力変換装置 |
CN109087944B (zh) * | 2018-08-21 | 2021-07-02 | 电子科技大学 | 一种集成mos电流采样结构的rc-igbt |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4893158A (en) * | 1987-06-22 | 1990-01-09 | Nissan Motor Co., Ltd. | MOSFET device |
JPH0397269A (ja) * | 1989-09-11 | 1991-04-23 | Fuji Electric Co Ltd | 電流制限回路を内蔵する伝導度変調型mosfet |
US5097302A (en) * | 1990-03-20 | 1992-03-17 | Fuji Electric Co., Ltd. | Semiconductor device having current detection capability |
US5243211A (en) * | 1991-11-25 | 1993-09-07 | Harris Corporation | Power fet with shielded channels |
EP0583037A1 (fr) * | 1992-08-11 | 1994-02-16 | Philips Electronics Uk Limited | Composant de protection à semiconducteur |
US5341003A (en) * | 1991-06-10 | 1994-08-23 | Fuji Electric Co., Ltd. | MOS semiconductor device having a main unit element and a sense unit element for monitoring the current in the main unit element |
JPH0786587A (ja) * | 1993-09-17 | 1995-03-31 | Hitachi Ltd | 半導体装置 |
EP0670601A2 (fr) * | 1994-03-04 | 1995-09-06 | Fuji Electric Co. Ltd. | Transistor bipolaire à grille isolée |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS594075A (ja) * | 1982-06-30 | 1984-01-10 | Toshiba Corp | サイリスタ |
US5343067A (en) * | 1987-02-26 | 1994-08-30 | Kabushiki Kaisha Toshiba | High breakdown voltage semiconductor device |
-
1996
- 1996-11-05 US US08/744,245 patent/US5883402A/en not_active Expired - Fee Related
- 1996-11-06 EP EP19960308062 patent/EP0772239A3/fr not_active Withdrawn
- 1996-11-06 CN CN96112047A patent/CN1097854C/zh not_active Expired - Fee Related
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4893158A (en) * | 1987-06-22 | 1990-01-09 | Nissan Motor Co., Ltd. | MOSFET device |
JPH0397269A (ja) * | 1989-09-11 | 1991-04-23 | Fuji Electric Co Ltd | 電流制限回路を内蔵する伝導度変調型mosfet |
US5097302A (en) * | 1990-03-20 | 1992-03-17 | Fuji Electric Co., Ltd. | Semiconductor device having current detection capability |
US5341003A (en) * | 1991-06-10 | 1994-08-23 | Fuji Electric Co., Ltd. | MOS semiconductor device having a main unit element and a sense unit element for monitoring the current in the main unit element |
US5243211A (en) * | 1991-11-25 | 1993-09-07 | Harris Corporation | Power fet with shielded channels |
EP0583037A1 (fr) * | 1992-08-11 | 1994-02-16 | Philips Electronics Uk Limited | Composant de protection à semiconducteur |
JPH0786587A (ja) * | 1993-09-17 | 1995-03-31 | Hitachi Ltd | 半導体装置 |
US5631494A (en) * | 1993-09-17 | 1997-05-20 | Hitachi, Ltd. | Power semiconductor device with low on-state voltage |
EP0670601A2 (fr) * | 1994-03-04 | 1995-09-06 | Fuji Electric Co. Ltd. | Transistor bipolaire à grille isolée |
Non-Patent Citations (2)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 015, no. 280 (E - 1090) 16 July 1991 (1991-07-16) * |
PATENT ABSTRACTS OF JAPAN vol. 1995, no. 06 31 July 1995 (1995-07-31) * |
Also Published As
Publication number | Publication date |
---|---|
CN1155784A (zh) | 1997-07-30 |
CN1097854C (zh) | 2003-01-01 |
EP0772239A2 (fr) | 1997-05-07 |
US5883402A (en) | 1999-03-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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17P | Request for examination filed |
Effective date: 19961204 |
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17Q | First examination report despatched |
Effective date: 20011221 |
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17Q | First examination report despatched |
Effective date: 20011221 |
|
GRAP | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOSNIGR1 |
|
INTG | Intention to grant announced |
Effective date: 20150205 |
|
INTG | Intention to grant announced |
Effective date: 20150211 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20150623 |