EP0772171B1 - Détecteur passif d'intrusion et utilisation du détecteur - Google Patents

Détecteur passif d'intrusion et utilisation du détecteur Download PDF

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Publication number
EP0772171B1
EP0772171B1 EP19960116924 EP96116924A EP0772171B1 EP 0772171 B1 EP0772171 B1 EP 0772171B1 EP 19960116924 EP19960116924 EP 19960116924 EP 96116924 A EP96116924 A EP 96116924A EP 0772171 B1 EP0772171 B1 EP 0772171B1
Authority
EP
European Patent Office
Prior art keywords
detector
light source
radiation
sabotage
passive infrared
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP19960116924
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German (de)
English (en)
Other versions
EP0772171A1 (fr
Inventor
Dieter Wieser
Kurt Albert Dr. Müller
Martin Dr. Allemann
Michael Thomas Dr. Gale
Thomas Hessler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Building Technologies AG
Original Assignee
Siemens Building Technologies AG
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Filing date
Publication date
Application filed by Siemens Building Technologies AG filed Critical Siemens Building Technologies AG
Priority to EP19960116924 priority Critical patent/EP0772171B1/fr
Publication of EP0772171A1 publication Critical patent/EP0772171A1/fr
Application granted granted Critical
Publication of EP0772171B1 publication Critical patent/EP0772171B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • G—PHYSICS
    • G08—SIGNALLING
    • G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
    • G08B29/00—Checking or monitoring of signalling or alarm systems; Prevention or correction of operating errors, e.g. preventing unauthorised operation
    • G08B29/02—Monitoring continuously signalling or alarm systems
    • G08B29/04—Monitoring of the detection circuits
    • G08B29/046—Monitoring of the detection circuits prevention of tampering with detection circuits

Definitions

  • the following invention relates to a passive infrared intrusion detector, in particular with an anti-sabotage device and its use.
  • Such passive infrared intrusion detectors are used to monitor rooms such as Example in museums, bank buildings or industrial areas by using the body radiation from Detect unauthorized persons in the wavelength range from approx. 6 to 15 ⁇ m. They consist in essentially from a housing with a transparent in the infrared wavelength range Entry window, focusing optics, one or more infrared sensors and one electrical signal evaluation and alarm output circuit.
  • the entry window usually exists Made of infrared-transmissive polypropylene or polyethylene.
  • An unauthorized person enters the the area monitored by the detector passes its infrared body radiation through the Entry window into the interior of the intrusion detector and is focused on by the optics Infrared sensors steered.
  • the infrared sensors send a signal to the evaluation circuit which amplifies the signal and compares it with a predetermined threshold. Will the an alarm signal is emitted.
  • a burglar detector of this type is described, for example, in EP 0 499 177.
  • the one mentioned Sabotage security device has an active radiation source on one Side of the entrance window, the radiation of which is transmitted through the entrance window and from a detector is received on the other side of the window. That from the detector The electrical signal emitted is then evaluated by a circuit.
  • the radiation serves to measure the optical transmission of the entrance window as well as the immediate space monitor the presence of objects in front of the entrance window.
  • the properties of this radiation are chosen so that they ensure the normal function of the intrusion detector, the detection of infrared body radiation, does not interfere. Now the intrusion detector is through Covering or spraying sabotaged by a spray causes this to increase or decrease Reduction of radiation received by the detector.
  • the light source is typically formed by an LED that emits in the near infrared. On Spray that is used for sabotage is partially permeable in the near infrared, so that the signal change in the event of sabotage is only small and the fault message is not is clear.
  • Another intrusion detector of this type is described in EP 0 481 934 A.
  • EP 0 189 536 a similar intrusion detector is described in EP 0 189 536, in which for the Light source uses a resistor that simulates the heat radiation from people.
  • this solution has the disadvantage that the energy consumption of a resistor for this Purpose is relatively high.
  • a passive infrared intrusion detector create, which has a facility for sabotage security, the sabotage acts like that Spraying of the entrance window is detected by an infrared-opaque spray and signaled.
  • the device is said to have the disadvantages of the above-mentioned prior art avoid by changing the signal to monitor the entrance window large and the sabotage message is therefore clear.
  • the task is accomplished by a passive infrared intrusion detector with one device Sabotage security solved, which is an active light source in the near infrared and one of her associated detector and a diffraction-optical grating structure, which on the Outside of the entrance window is integrated and light emitted by the light source the detector that belongs to it.
  • the light source and the detector is arranged so that one component outside the entrance window and the others are within the entry window.
  • the light source is located and the detector both within the entry window of the infrared intrusion detector.
  • the Sabotage security device monitors the entrance window for changes such as Example spraying by spray or other contaminants.
  • the light from the light source is directed at the entrance window and monitors the condition of the surface of the Entry window by part of it from the diffraction-optical grating structure on the Entry window in the first or a higher diffraction order focused on the detector becomes.
  • the light source and detector are both located within the entry window are a diffraction order in reflection; in the case where they're inside or outside the entrance window, it is a diffraction order in Transmission.
  • the detector sends an electrical signal to one Evaluation circuit from the state of the entrance window according to this electrical signal indicates. In the normal state, the entrance window is intact and the lattice structure is focused some of the light on the detector.
  • the Lattice structure coated on the entrance window with the adhesive In the event of sabotage by spraying the Entry window with a spray, such as an adhesive spray, the Lattice structure coated on the entrance window with the adhesive. The lattice structure is changed by filling them in and the surface of the entrance window equal to that of one diffuse spreader. The focusing effect of the diffraction-optical grating structure becomes destroyed, and the light radiation received by the detector is greatly reduced. If the signal from the detector to the evaluation circuit falls below one predetermined threshold, it signals a sabotage alarm.
  • a spray such as an adhesive spray
  • the diffraction grating according to the invention on the entrance window brings the Sabotage monitoring has the advantage that the monitoring signal due to the focusing effect of the grating is enlarged and thus the signal change in the event of sabotage is also large. The sabotage is determined more clearly.
  • An additional advantage is the arrangement of the light source and detector on the Inside of the entrance window, making their assembly easier.
  • the two elements integrated on the circuit board, which the evaluation and alarm circuit of the Intrusion detector contains.
  • This allows simple and inexpensive installation, such as Example the use of elements as a surface mount device (SMD) or elements in which light source and detector and associated electrical driver or Amplifier circuits are integrated in one element
  • Fig. 1 shows an exterior view of the passive infrared intrusion detector in perspective with the Diffractive optical element integrated in its entrance window.
  • 2a), 2b), 2c) and 2d) show examples of the profile of the integrated in the entry window diffraction-optical grating structure.
  • Fig. 3 shows the passive infrared intrusion detector in the vertical and to the entrance window vertical cross section with a first arrangement of the device for sabotage security.
  • FIG. 4 shows the passive infrared intrusion detector in the same cross section as in FIG. 3 a second arrangement of the anti-sabotage device.
  • Fig. 5 shows the passive infrared intrusion detector in horizontal cross section, in which the Light source outside and the detector are arranged inside the entrance window.
  • FIG. 1 shows a passive infrared intrusion detector 1, the housing 2 of which has an entry window 3 has, which faces the room to be monitored. While the housing 2 for any radiation is opaque, infrared radiation occurs in the wavelength range of 6-15 ⁇ m through the entrance window 3 into the interior of the housing.
  • the entrance window 3 points to his Outside a diffraction-optical grating structure 4, which covers the entire surface of the Entry window 3 fills.
  • the lattice structure 4 consisting of fine grooves, the one form a phase-modulating relief structure, focuses part of the light emitted by the Light source falls on it, on a detector inside the housing 2.
  • the diffractive optical element consists of an elliptical Lattice structure 4, in which the local lattice constant, the distance between the individual Grooves, with increasing radius becomes smaller, which is the diffraction-optical Lattice structure that gives a focusing effect.
  • the lattice structure 4 can also consist of a circular or rectilinear lattice structure, whose lattice constant in turn increases with increasing distance from the center of the Grid structure becomes smaller in each case. The latter rectilinear lattice structure has the effect of a cylindrical focusing element.
  • the lattice structure is also designed so that it has the function of focusing the Light of the light source performs the detection of infrared radiation from the monitoring room but not affected.
  • a light source is used for this purpose Wavelength is different from that of infrared radiation.
  • a light source is suitable for this in the visible or near infrared.
  • the grating structure is for the wavelength of the light The light source determines and has an insignificant influence on the radiation in the infrared range.
  • Figures 2a), 2b), 2c) and 2d) schematically show examples of a profile of the diffractive optics Lattice structure. Since this is a phase-modulating lattice structure, the depth t of the grooves of the lattice structure 4 is dimensioned such that that through the lattice structure caused optical phase difference is 2 ⁇ or an integer multiple of 2 ⁇ . This is done, for example, in the case of the arrangement of the light source and the detector inside the entrance window and the use of the lattice structure in reflection takes into account that the diffraction occurs in the material of the entrance window and therefore the Refractive index of the window material is taken into account when determining the depth t.
  • the Depth t results from this for normal angles of incidence equal to ⁇ / 2n, where ⁇ is the wavelength of the Light and n is the refractive index of the window material.
  • ⁇ is the wavelength of the Light
  • n is the refractive index of the window material.
  • the depth t is 266 nm.
  • the beam path of the infrared radiation from the room to be monitored is determined by does not affect a grating of such a depth, since its shortest wavelength is 6 ⁇ m and for this wavelength the depth of 266 nm is a phase difference of much corresponds to less than 2 ⁇ .
  • the profile of the lattice structure 4 is either one Sine function as in Fig. 2a), a rectangular function as in Fig. 2b) or a triangular one Sawtooth function as shown in Fig. 2c).
  • a grid with a profile with a so-called "blaze” as in Fig. 2c) is also known under blazed grating.
  • Lattice structures with these profiles differ in that they have different diffraction efficiencies and on different ways are made.
  • Fig. 2d) does not show the profile of a grid linear blaze. It is similar to the profile of 2c), but has a slight one Surface curvature.
  • the local lattice constant should be significantly smaller than the shortest Wavelength of the infrared radiation, which is detected by the intrusion detector.
  • a small local grating constant relative to the wavelength of the infrared radiation causes the Grid structure the beam path of the infrared radiation from the room to be monitored the infrared sensors do not interfere and their detection does not affect the radiation of the
  • light source for monitoring the entrance window is focused on the detector.
  • the local lattice constant the manufacturability of these dimensions is also important and to consider the achievable diffraction efficiency.
  • Execution of the lattice structure 4 is the smallest local lattice constant 5 ⁇ m. This is greater than the recommended lattice constant, but the structure can lead to dimensional accuracy be produced, which causes a high diffraction efficiency.
  • the vertical cross section of the passive infrared intrusion detector 1 in FIG. 3 shows one in Focusing optics 5 arranged inside the intrusion detector in the form of a concave mirror which the body radiation falling from the room to be monitored onto the infrared sensors 6 focused. These are sensitive to radiation in the wavelength range from 6 to 15 ⁇ m. If they detect body radiation from this area, they send a signal to the evaluation and Alarm delivery circuit on the circuit board 7.
  • a light source 8 and its associated detector 9 arranged.
  • the light source 8 is a light emitting diode, the light in the near infrared wavelength range.
  • the for Detector 9 belonging to light source 8 has a sensitivity in the wavelength range of Light source 8. This is preferably a photodetector such as a silicon photodiode.
  • the beam path of the light source 8 for monitoring the entrance window 3 emitted light is marked with broken lines.
  • the light falls on that Entry window 3 and is focused by the grating structure 4 on the detector 9. It deals the first or a higher diffraction order in reflection. Will that Entry window 3 and the lattice structure 4 covered by adhesive spray, the lattice structure defaced and the light is no longer focused but diffusely scattered. As a result, the falls light intensity received by the detector 9. Falls below the signal it emits below a given threshold, a sabotage alarm is given.
  • the diffraction efficiency is optical diffraction Lattice structure also for a blazed lattice less than 100%, and it will only be part of that the grating structure 4 striking radiation as a monitoring signal of the entrance window on the Detector 9 focused. Another part of the radiation passes through the entrance window 3 in the free space and does nothing to monitor the entrance window. A final part the radiation is scattered at the entrance window 3.
  • the scattered radiation is from the housing 2 absorbs or arrives after multiple reflections inside the housing 2 and on the Focusing optics 5 on the detector 9.
  • the radiation caused by scattering and Multiple reflections reached the detector 9 forms the monitoring signal of the Entry window an underground signal that does not change in the event of sabotage by spray changed.
  • the focusing optics 5 can be designed to reduce this background signal that near-infrared radiation is absorbed by it, but body radiation by it is reflected.
  • a black lens for example, is suitable for such focusing optics light absorbing material covered with a layer of indium tin oxide (also under the English abbreviation known ITO) is coated.
  • the layer of indium tin oxide reflects radiation in the area of body radiation, but leaves the visible and near infrared Radiation so that it falls onto the black material and is absorbed by it.
  • the light source 8 is on the circuit board 7 next to the detector 9 and arranged in the plane parallel to that of the entry window.
  • the assembly on the Printed circuit board 7 is somewhat easier in this arrangement.
  • FIG. 1 Another embodiment of the infrared intrusion detector is shown in FIG.
  • the light source 8 and the associated detector 9 are inside the entrance window 3 and next to one another in an opening 10 in the focusing optics 5 opposite the entrance window 3.
  • This Arrangement opposite the entrance window 3 and the lattice structure 4 allows compared to Arrangement in Fig. 2 a smaller angle of incidence of the light of the light source 8 on the Lattice structure 4. The smaller angle of incidence enables a higher diffraction efficiency.
  • the light source 8 and the detector 9 can be close to each other an integrated element can be used here, the light source 8, the detector 9, the Control circuit for the light source 8 and the amplifier circuit for the detector 9 in contains an element. Although in this arrangement this element is not on the circuit board 7 comes to rest, the use of an integrated element of this type offers advantages assembly.
  • Figure 5 shows a further embodiment of the invention, in which the light source 8 outside the Entry window 3 with lattice structure 4 and on the side of the housing 2 and the detector 9 inside the intrusion detector 1 is arranged.
  • Light from the light source 8 onto the lattice structure 4 of the entrance window 3 falls in the first or a higher diffraction order in Transmission focused on the detector 9.
  • the lattice structure 4 is destroyed, and by the radiation from the light source, which normally falls on the detector 9, only a small fraction is received, and that Monitoring signal is significantly reduced.
  • the above-mentioned lattice structure is produced by an injection-stamping process, in which the entrance window is first injected and then the lattice structure 4 at an elevated temperature of the material is embossed into the window.
  • a master stamp is issued, which is the Contains lattice structure used.
  • Such a master stamp is made of metal, for example.
  • the structure is, for example, in a first step in a photoresist holographic method, a laser writing process or electron beam lithography manufactured.
  • the holographic method is used in particular if that Grid profile should have a sine function.
  • the laser writing method on the other hand, is suitable for the production of lattice profiles with a rectangular or sawtooth function. Consists the desired structure in the photoresist becomes one of them in a galvanic process negative copy made in metal such as nickel which is used as a master stamp for the Embossing the entrance window serves.

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  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Burglar Alarm Systems (AREA)

Claims (8)

  1. Détecteur (1) infrarouge passif d'intrusion constitué d'un boítier (2) ayant un hublot (3) d'entrée transparent au rayonnement du corps dans le domaine infrarouge des longueurs d'onde, d'une optique (3) de focalisation, de capteurs (6) d'infrarouge sensibles au rayonnement du corps, d'un circuit d'exploitation et d'émission d'alerte monté sur une plaquette (7) à circuit imprimé, d'un dispositif de sécurité vis-à-vis du sabotage comprenant une source (8) active de lumière et un détecteur (9) qui en fait partie, caractérisé en ce que le dispositif de sécurité vis-à-vis du sabotage a sur la face extérieure du hublot (3) d'entrée une structure (4) de réseau intégré de diffraction qui focalise sur le détecteur (9) la lumière émise par la source (8) de lumière.
  2. Détecteur (1) infrarouge passif d'intrusion suivant la revendication 1, caractérisé en ce que ou bien la source (8) de lumière est disposée à l'intérieur et le détecteur (9) à l'extérieur du hublot (3) d'entrée, ou bien la source de lumière est disposée à l'extérieur et le détecteur (9) à l'intérieur du hublot (3) d'entrée.
  3. Détecteur (1) infrarouge passif d'intrusion suivant la revendication 1, caractérisé en ce que la source (8) de lumière et le détecteur (9) sont disposés tous deux à l'intérieur du hublot (3) d'entrée.
  4. Détecteur (1) infrarouge passif d'intrusion suivant la revendication 3, caractérisé en ce que la source (8) de lumière et le détecteur (9) sont montés sur une plaquette (7) à circuit imprimé.
  5. Détecteur (1) infrarouge passif d'intrusion suivant la revendication 3, caractérisé en ce que la source (8) de lumière et le détecteur (9) sont montés dans une ouverture (10) de l'optique (5) de focalisation.
  6. Détecteur (1) infrarouge passif d'intrusion suivant l'une des revendications 1 à 5, caractérisé en ce que la source (8) de lumière émet de la lumière dans le domaine de longueur d'onde infrarouge proche de 780 à 950 nm, et le détecteur (9) est sensible à du rayonnement dans ce domaine de longueur d'onde.
  7. Détecteur (1) infrarouge passif d'intrusion suivant l'une des revendications 1 à 5, caractérisé en ce que la source (8) de lumière émet de la lumière dans le domaine de longueur d'onde visible, et le détecteur (9) est sensible au rayonnement dans ce domaine de longueur d'onde.
  8. Utilisation d'un détecteur (1) infrarouge passif d'intrusion suivant l'une des revendications 1 à 7 afin de signaler un sabotage, caractérisée en ce que, lors d'un sabotage du détecteur (1) infrarouge passif d'intrusion par projection sur le hublot (3) d'entrée d'une dispersion qui n'est pas transparente au rayonnement infrarouge, le rayonnement lumineux focalisé sur le détecteur (9) est diminué et une alerte de sabotage est déclenchée par le circuit d'émission d'alerte.
EP19960116924 1995-11-03 1996-10-22 Détecteur passif d'intrusion et utilisation du détecteur Expired - Lifetime EP0772171B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP19960116924 EP0772171B1 (fr) 1995-11-03 1996-10-22 Détecteur passif d'intrusion et utilisation du détecteur

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP95117323 1995-11-03
EP95117323 1995-11-03
EP19960116924 EP0772171B1 (fr) 1995-11-03 1996-10-22 Détecteur passif d'intrusion et utilisation du détecteur

Publications (2)

Publication Number Publication Date
EP0772171A1 EP0772171A1 (fr) 1997-05-07
EP0772171B1 true EP0772171B1 (fr) 2003-01-08

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Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19737166C2 (de) * 1997-08-26 2002-04-25 Esser Security Systems Gmbh PIR-Melder
GB2339614B (en) * 1998-07-14 2000-06-21 Infrared Integrated Syst Ltd Detector-array sensor with mask warning
GB9908073D0 (en) * 1999-04-09 1999-06-02 Texecom Limited Infrared detector lens
EP1061489B1 (fr) * 1999-06-07 2004-08-25 Siemens Building Technologies AG Détecteur d'intrusion avec dispositif de surveillance contre un sabotage
EP1079351B1 (fr) * 1999-08-27 2005-05-11 Siemens Building Technologies AG Dispositif de surveillance d'un espace
IT1318199B1 (it) * 2000-07-19 2003-07-28 Vimar S R L Ora Vimar S P A Dispositivo antimanomissione e relativo metodo per la rilevazionedella manomissione di un componente.
WO2007095992A1 (fr) 2006-02-20 2007-08-30 Robert Bosch Gmbh Dispositif de detection d'obstruction
US7414236B2 (en) * 2006-06-16 2008-08-19 Hong Kong Applied Science And Technology Research Institute Co., Ltd. Monitoring devices and intrusion surveillance devices
EP2498232A1 (fr) 2011-03-10 2012-09-12 Siemens Aktiengesellschaft Détecteur

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4405234A (en) * 1981-08-03 1983-09-20 Detector Electronics Corp. Radiation detection apparatus having refractive light checking feature
FR2520123A1 (fr) * 1982-01-15 1983-07-22 Thomson Csf Dispositif d'autotest pour equiper un systeme optronique
DE3573670D1 (en) 1985-01-08 1989-11-16 Cerberus Ag Infrared intrusion detector
JPH0241188U (fr) * 1988-09-10 1990-03-22
IT1241278B (it) * 1990-10-19 1993-12-29 Elkron Spa Dispositivo di antiaccecamento per componenti di sistemi di sicurezza.
IT1245405B (it) 1991-02-11 1994-09-20 Bitron Video Dispositivo anti-intrusione
GB9107062D0 (en) * 1991-04-04 1991-05-22 Racal Guardall Scotland Intruder detection arrangements and methods
JP2983423B2 (ja) * 1993-12-21 1999-11-29 オプテックス株式会社 赤外線式人体検知装置
IL110800A0 (en) * 1994-08-28 1995-07-31 Visonic Ltd Improved intrusion detector with obscuring detection apparatus

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EP0772171A1 (fr) 1997-05-07

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