EP0702240B1 - Betrieb einer Abtastverriegelungszelle zur Prüfung von Struktur und Leistung - Google Patents

Betrieb einer Abtastverriegelungszelle zur Prüfung von Struktur und Leistung Download PDF

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Publication number
EP0702240B1
EP0702240B1 EP95305860A EP95305860A EP0702240B1 EP 0702240 B1 EP0702240 B1 EP 0702240B1 EP 95305860 A EP95305860 A EP 95305860A EP 95305860 A EP95305860 A EP 95305860A EP 0702240 B1 EP0702240 B1 EP 0702240B1
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EP
European Patent Office
Prior art keywords
latch
scan
signal
clock
data
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Expired - Lifetime
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EP95305860A
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English (en)
French (fr)
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EP0702240A2 (de
EP0702240A3 (de
Inventor
Robert Warren
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STMicroelectronics Ltd
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SGS Thomson Microelectronics Ltd
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails

Definitions

  • US 4742293 of Koo discloses a circuit for testing for stuck open faults. It uses combinational logic networks utilizing a two-pattern test technique using an initialisation test pattern followed by a second detection test pattern.
  • the output multiplexor 18a has as one of its inputs the signal DATAIN on line 10a and as its other input the output of the latch 40a on line 24a.
  • the output multiplexor is controlled by a signal TAPCONTROL2 on line 22 and generates at its output the signal DATAOUT on line 8a.
  • the signals TAPCONTROL1, TAPCONTROL2, TAPCLOCK1 and TAPCLOCK2 are all generated under the control of the TAP controller 12 and are all common to all the boundary scan cells 6a to 6d, although these signals and connections are not shown in Figure 1 for reasons of clarity.
  • each of the boundary scan cells 6a to 6d contains a circuit similar to that shown in Figure 2, with the various components and signal lines suffixed b,c,d appropriately.
  • a shift state S4 is entered into.
  • the TAP controller produces a plurality of clock cycles constituting clock signal TAPCLOCK1 on line 36 whilst holding the signal TAPCONTROL1 on line 34 at a level such that the signal SCANIN on line 14a appears at the output 30a of the multiplexor 26a.
  • the test data is serially shifted into the test circuitry such that after a certain number n of clock cycles of TAPCLOCK1 (in this case four) the latches 28a,28b,28c,28d all have a known test bit on their respective outputs on nodes 31a to 31d.
  • n cycles of the master clock MCLOCK the shift state S4 is retained.
  • clock signals TAPCLOCK1 and NOTTAPCLOCK1 could be non-overlapping clock signals, or alternatively circuitry in the control nodes 48a and 52a could take account of any possible overlap of the two clocks.
  • the latch 40a of Figure 2 similarly comprises two half-latches. It can therefore be seen that the circuit of Figure 2 comprises four half-latches. To provide correct clock operation for both normal functional operation and for test purposes, the circuit of Figure 2 requires a complex clocking scheme as will be understood from the description provided hereinabove with reference to Figures 2 and 3.
  • the TAP controller 12 During normal functional operation of the IC 2 the TAP controller 12 is in the test-logic-reset state S0. In this state the test logic is idle and the signal DATAIN on line 10a is connected directly to the signal DATAOUT on line 8a by means of the output multiplexor 18a under control of the signal TAPCONTROL2 on line 22. Upon a test operation commencing, the TAP controller 12 will first move into the run-test/idle state S1 under the control of the master clock MCLOCK.
  • the TAP controller 12 will enter the select-scan state S2 and the control signal TAPCONTROL2 on line 22 will change state such that the output signal DATAOUT of the output multiplexor 18a on line 8a is connected directly to the signal on line 65a.
  • the TAP controller will enter the capture state S3. At this stage of the test the capture state is unimportant because no test data has yet been loaded into the scan test circuit.
  • the TAP controller causes the output of the half-latch 58a to be updated by generating a clock cycle to constitute clocking the clock signal UPDATECLK on line 74 once.
  • the test data bit on the output node 67a of the capture half latch 56a will therefore appear on the output of the update half-latch 58a on the line 65a and consequently as the DATAOUT signal on line 8a.
  • all the DATAOUT signals on lines 8a to 8d will have been updated.
  • the pin connections 8a to 8d are, as mentioned previously, connected to respective pin connections on one or more other ICs.
  • the TAP controller On the next cycle of the master clock the TAP controller will once again enter the select scan state S2 and then on the next cycle will enter the capture state S3. In the capture state the capture half-latch 56a will be clocked once by the signal CAPTURECLK on line 70 whilst the multiplexor 26a is controlled by the signal TAPCONTROL1 on line 34 such that the DATAIN signal on line 10a appears on its output on line 62a. Thus the result is captured on line 64a. The TAP controller then on the next master clock cycle enters the shift state S4 once more and the results captured on the outputs of the capture half-latches 56a to 56d are serially clocked out to the TAP controller.
  • the functional logic circuitry 4 of Figure 1 can be considered to consist of various blocks of combinational logic circuitry of various sizes either interconnected directly or interconnected via latches. It is possible to test the functional aspects of the combinational logic circuitry by placing known test bits on the inputs of the combinational logic circuitry in the functional logic circuitry and capturing the result on the output of the latches in the combinational logic circuitry. This can be achieved by placing boundary scan cells such as that shown in Figure 2 or Figure 5 at the various test points in the functional logic circuitry. However, the boundary scan chain will then have combinational logic and latches between successive boundary scan cells, and these additional latches will cause timing problems during test operations. This problem can be overcome, however, by replacing any functional latch within the functional logic circuitry with the scan latch (i.e.
  • the falling edge 201 of the capture clock signal CAPTURECLK at the beginning of clock cycle MCLOCK4 causes the data output bit DOB1 to be latched on the output node 67a of the half-latch 56a.
  • the multiplexor 26a is controlled by the control signal TAPCONTROL1 such that its output on line 62a is connected as the DATAIN signal on line 10a.
  • the TAP controller is in the shift state S4.
  • the latching of the test data bit TDB2 occurs on edge 210 during clock cycle MCLOCK8 after the TAP controller has entered the run-test-idle state S1 again. It can be seen that if the same sequence of operations is performed again, the next capture operation will capture the data outputted on the line 10a as the signal DATAIN, which is the logical result of the test data bit TDB2 (and similar test data bits from other scan latches) being inputted to the combinational logic circuitry 5.
  • the TAP controller 12 is assumed to be in the select scan state S2 prior to setting it to carry out a performance test, as opposed to a structural test.
  • MCLOCK denotes the TAP controller clock as before.
  • an exit0 state S3 is entered and then on the subsequent clock cycle MCLOCKN+1 of the master clock a shift state S4 is entered.
  • the multiplexor is connected to the scan in line 14a by changing the state of TAPCONTROL1 as illustrated by edge 221.
  • a shift operation is carried out by clocking the capture half-latch 56a and then the release half-latch 60a for as many clock cycles as is required to clock all the sensitise bits into the chain of scan latches.
  • sensitise bits are denoted as SB1,SB2.
  • the capture half-latch 56a and release half-latch 60a are clocked by clock signals CAPTURECLK on line 70 and RELEASECLK on line 72 respectively.
  • Clocking of the capture half-latch places the sensitise bit SB1 onto the internal node on line 67a.
  • Clocking the release half-latch places the sensitise bit SB1 on the scan out line 14b.
  • Bit SB2 is shifted in the same way. In the last shift clock cycle MCLOCKN+2 the sensitise bit SB2 is shifted from the signal line 14a as the SCANIN signal to the signal line 14b as the SCANOUT signal.
  • the only purpose of the reduced pulse width d is to provide the positive edge 230 of the CAPTURECLK signal on line 70 from the negative edge 226 of the reduced pulse.
  • the only requirement for the pulse width d is therefore that it must be less than the predetermined time t. Once the CAPTURECLK has gone high on edge 230 it can then be taken low on edge 232 under control of the advanced clock signal ADVANCECLK as discussed hereinabove.
  • the advanced clock signal ADVANCECLK may also be used to provide the early positive edge 234 of the RELEASECLK signal on line 72. After the RELEASECLK signal goes high on edge 234 the data output bit DOB retained on the internal node will appear on the line 14b as the SCANOUT signal. However, the timing of this release is not important.
  • the scan cell illustrated in Figure 6 can therefore perform either a structural test or a performance test. However it does have features which make it inefficient in certain aspects, particularly for carrying out a performance test. Firstly, three clocks are required which consume more power than would a single clock. Secondly, because the three clocks are independent, the clock trees (i.e. derived clocks) are separate, and the accuracy of performance testing is compromised. To overcome these disadvantages a new half-latch is provided which incorporates an enable function to effectively gate a clock signal supplied to it. This may be constructed in a number of ways using two transmission gates in series, inserting a gating function in the clock path, or using a complex gate which merges the clock gating function with the storage node. It is expected that other ways of implementing such a half-latch will be apparent to a person skilled in the art.
  • the edge 260 is not synchronised to a clock edge of the master clock MCLOCK, and consequently the update operation achieved by the edge 260 is asynchronous and there is no inherent shift operation associated with this update. This is referred to as "asynchronous update”.
  • asynchronous update During MCLOCK8 run-test idle state S1 is entered, and TAPCONTROL3 returns to a high state on edge 262. It can be seen that all critical operations are synchronous, taking place on the positive edge of the clock COMMONCLK, with the exception of the operation which occurs when the signal TAPCONTROL3 changes from high to low on edge 260 in MCLOCK7, this operation being asychronous.
  • the back to back inverters 116 comprise a strong inverter 116a and a weak inverter 116b.
  • the half-latch 84 comprises a pass gate comprising two complementary transistors 110 and 112, a pair of back to back inverters 114 and an inverter 120.
  • the back to back inverters 114 comprise a strong inverter 114a and a weak inverter 114b.
  • the half-latches 82 and 84 further share a pass gate comprising complementary transistors 102,104.
  • the output stage outputs the signal DATAOUT on line 8a and the signal SCANOUT on line 14b. Both the input and the output stages receive the signal NOTCOMMONCLK on line 86b via gate 322 and the signal COMMONCLK on line 86a via gates 322 and 324.
  • Figures 15a and 15b fully illustrate the input stage 320 and the output stage 330 respectively.

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Claims (19)

  1. Abfragelatchspeicher, aufweisend:
    einen Halte-Halblatchspeicher (56a) mit einem Eingabeanschluß, der angeschlossen ist, um ein Eingangssignal zu empfangen, einem Steuerungsanschluß, der angeschlossen ist, um ein Taktsignal (70) zu empfangen, und einem Zwischenausgabeanschluß (64a);
    einen Freigabe-Halblatchspeicher (60a) mit einem Eingabeanschluß, der mit dem Zwischenausgabeanschluß des Halte-Halblatchspeichers verbunden ist, einem Steuerungsanschluß, der angeschlossen ist, um ein Taktsignal (72) zu empfangen, und einem Abfrageausgabeanschluß (196); und
    einen Update-Halblatchspeicher (58a) mit einem Eingabeanschluß, der mit dem Zwischenausgabeanschluß des Halte-Halblatchspeichers verbunden ist, einem Steuerungsanschluß, der angeschlossen ist, um ein Taktsignal (74) zu empfangen, und einem Datenausgabeanschluß (65a).
  2. Abfragelatchspeicher nach Anspruch 1, bei welchem die Taktsignale (70, 72, 74), welche den Halte-Halblatchspeicher, Freigabe-Halblatchspeicher und Update-Halblatchspeicher bereitgestellt werden, unterschiedliche Taktsignale sind, deren Zeitsteuerung individuell gesteuert werden kann.
  3. Abfragelatchspeicher nach Anspruch 1, bei welchem die Taktsignale, welche den Halte-Halblatchspeicher, Freigabe-Halblatchspeicher und Update-Halblatchspeicher bereitgestellt werden, von einer gemeinsamen Taktquelle (86) stammen, wobei der Freigabe-Halblatchspeicher und der Update-Halblatchspeicher das Umkehrsignal des Taktsignals empfangen, welches am Halte-Halblatchspeicher anliegt.
  4. Abfragelatchspeicher nach Anspruch 3, bei welchem die Kombination des Halte-Halblatchspeichers und eines von Update-Halblatchspeicher und Freigabe-Halblatchspeichers als positiv flankengesteuerter Flip-Flop fungiert.
  5. Abfragelatchspeicher nach Anspruch 3 oder 4, bei welchem der Freigabe-Halblatchspeicher und der Update-Halblatchspeicher jeweils einen weiteren Steuerungsanschluß aufweisen, der angeschlossen ist, um ein Steuerungssignal zu empfangen, welches bestimmt, ob dieser Halblatchspeicher sich in einem Datenübertragungszustand oder einem Datenhaltezustand befindet.
  6. Abfragelatchspeicher nach einem der vorstehenden Ansprüche, welcher eine Auswahlschaltung (26a) aufweist, die mit dem Eingabeanschluß des Halte-Halblatchspeichers verbunden ist und in Reaktion auf ein Auswahlsignal eines von einem Normaldatensignal und einem Abfragedatensignal als das Eingangssignal an den Halte-Halblatchspeicher auswählt.
  7. Abfragelatchspeicher nach Anspruch 6, bei welchem die Auswahlschaltung einen Multiplexer (26a) aufweist.
  8. Abfragelatchspeicher nach einem der vorstehenden Ansprüche, der in einem funktionellem Modus betrieben wird, in welchem bewirkt wird, daß der Halte-Halblatchspeicher ein Normaldatensignal (10a) von seinem Eingabeanschluß zu seinem Zwischenausgabeanschluß überträgt, und sodann bewirkt wird, daß der Update-Halblatchspeicher das Normaldatensignal von seinem Eingabeanschluß zu dem Datenausgabeanschluß überträgt.
  9. Abfragelatchspeicher nach einem der Ansprüche 1 bis 7, welcher in einem Verschiebemodus betrieben wird, bei welchem bewirkt wird, daß der Halte-Halblatchspeicher ein Datensignal von seinem Eingabeanschluß zu seinem Zwischenausgabeanschluß überträgt, und sodann bewirkt wird, daß der Freigabe-Halblatchspeicher das Datensignal von seinem Eingabeanschluß zu dem Abfrageausgabeanschluß (14b) überträgt.
  10. Abfragelatchspeicher nach Anspruch 9, bei welchem das Datensignal ein Abfragedatensignal ist.
  11. Abfragelatchspeicher nach Anspruch 9, bei welchem das Datensignal ein Normaldatensignal ist.
  12. Abfragelatchspeicher nach einem der Ansprüche 1 bis 7, welcher in einem Aktualisierungsmodus betrieben wird, bei welchem bewirkt wird, daß der Update-Halblatchspeicher das an dem Zwischenausgabeanschluß gespeicherte Signal an den Datenausgabeanschluß überträgt.
  13. Verfahren zum Betreiben eines Abfragelatchspeichers nach einem der Ansprüche 1 bis 6, um einen Strukturtest einer Schaltung durchzuführen, mit den Schritten:
    a) Bereitstellen einer vorgegebenen Folge von Abfragetestbits (14a);
    b) Schieben der Folge von Abfragetestbits durch den Abfragelatchspeicher über den Eingabeanschluß des Halte-Halblatchspeichers (56a) und Herausschieben über den Abfrageausgabeanschluß;
    c) Aktualisieren des Datenausgabeanschlusses (8a) am Ende des Verschiebens der Folge, um das geeignete Abfragetestbit zu erhalten;
    d) Anschließen des Abfragelatchspeichers, um ein Ausgabedatenbit von der zu testenden Schaltung zu empfangen;
    e) Schieben des Ausgabedatenbits aus dem Abfragelatchspeicher über den Abfrageausgabeanschluß; und
    f) Vergleichen des Ausgabedatenbits mit einem erwarteten Ausgabedatenbit, welches der vorgegebenen Folge von Abfragetestbits und der zu testenden Schaltung zugeordnet ist.
  14. Verfahren nach Anspruch 13, bei welchem der Schritt b) ausgeführt wird durch:
    i) Auswählen eines Abfragedateneinganges, der mit dem Eingabeanschluß des Halte-Halblatchspeichers (56a) verbunden werden soll,
    ii) Bewirken, daß der Halte-Halblatchspeicher ein Abfragedatenbit an seinem Eingabeanschluß zu seinem Zwischenausgabeanschluß überträgt, und sodann
    iii) Bewirken, daß der Freigabe-Halblatchspeicher (60a) dieses Bit zu dem Abfrageausgabeanschluß überträgt, wobei die Schritte ii) und iii) an der Folge von Abfragedatenbits ausgeführt werden.
  15. Verfahren nach Anspruch 13 oder 14, bei welchem der Schritt c) ausgeführt wird, indem der Update-Halblatchspeicher in einen Datenübertragungsmodus versetzt wird.
  16. Verfahren nach Anspruch 13, 14 oder 15, bei welchem der Schritt e) durchgeführt wird, indem der Halte-Halblatchspeicher und sodann der Freigabe-Halblatchspeicher in einen Datenübertragungsmodus versetzt werden.
  17. Verfahren nach einem der Ansprüche 13 bis 16, bei welchem der Schritt b) unter Steuerung eines Taktsignals (70) ausgeführt wird, derart, daß in einem ersten Abschnitt einer Taktperiode des Taktsignals der Halte-Halblatchspeicher in einen Datenübertragungsmodus versetzt wird und in einem zweiten Abschnitt der Taktperiode der Freigabe-Halblatchspeicher in einen Datenübertragungsmodus versetzt wird.
  18. Verfahren nach Anspruch 17, bei welchem die Kombination des Halte-Halblatchspeichers und des Freigabe-Halblatchspeichers, welche durch einen gemeinsamen Takt (36) gesteuert werden, einen positiv flankengesteuerten Flip-Flop bilden.
  19. Verfahren nach Anspruch 18, bei welchem der Aktualisierungsschritt c) asynchron in Reaktion auf ein Verschiebesteuerungssignal ausgeführt wird, welches unabhängig von dem Taktsignal erzeugt wird.
EP95305860A 1994-09-01 1995-08-22 Betrieb einer Abtastverriegelungszelle zur Prüfung von Struktur und Leistung Expired - Lifetime EP0702240B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9417590A GB9417590D0 (en) 1994-09-01 1994-09-01 Scan latch
GB9417590 1994-09-01

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EP0702240A2 EP0702240A2 (de) 1996-03-20
EP0702240A3 EP0702240A3 (de) 1996-04-10
EP0702240B1 true EP0702240B1 (de) 2003-03-12

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US (1) US5719876A (de)
EP (1) EP0702240B1 (de)
JP (2) JPH08179015A (de)
DE (1) DE69529870D1 (de)
GB (1) GB9417590D0 (de)

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US6304987B1 (en) * 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
EP0358376B1 (de) * 1988-09-07 1995-02-22 Texas Instruments Incorporated Integrierte Prüfschaltung
US5969538A (en) 1996-10-31 1999-10-19 Texas Instruments Incorporated Semiconductor wafer with interconnect between dies for testing and a process of testing
JP3816560B2 (ja) * 1995-12-25 2006-08-30 株式会社ルネサステクノロジ 連想メモリ回路のテスト方法及び連想メモリ回路のテスト回路
JP3917734B2 (ja) * 1997-11-07 2007-05-23 富士通株式会社 半導体記憶装置
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
GB9810512D0 (en) 1998-05-15 1998-07-15 Sgs Thomson Microelectronics Detecting communication errors across a chip boundary
US7058862B2 (en) * 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
US20030188243A1 (en) * 2002-03-29 2003-10-02 Rajan Krishna B. Method and apparatus for delay fault testing
US6671860B2 (en) * 2002-04-16 2003-12-30 Lsi Logic Corporation Method and apparatus for fault injection using boundary scan for pins enabled as outputs
EP1544633B1 (de) 2003-12-17 2008-10-01 STMicroelectronics (Research & Development) Limited TAP Multiplexer
US7203876B2 (en) * 2004-11-30 2007-04-10 International Business Machines Corporation Method and apparatus for controlling AC power during scan operations in scannable latches
US7146551B2 (en) * 2005-01-20 2006-12-05 Hewlett-Packard Development Company, L.P. Method and system of modifying data in functional latches of a logic unit during scan chain testing thereof
US20130326451A1 (en) 2012-06-01 2013-12-05 International Business Machines Corporation Structured Latch and Local-Clock-Buffer Planning

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US4697279A (en) * 1985-11-04 1987-09-29 Hughes Aircraft Company Test/master/slave triple latch flip-flop
US4742293A (en) * 1987-04-06 1988-05-03 Hughes Aircraft Company Pseudo-memory circuit for testing for stuck open faults
US5015875A (en) * 1989-12-01 1991-05-14 Motorola, Inc. Toggle-free scan flip-flop
US5068881A (en) * 1990-08-10 1991-11-26 Hewlett-Packard Company Scannable register with delay test capability
US5130568A (en) * 1990-11-05 1992-07-14 Vertex Semiconductor Corporation Scannable latch system and method
GB9111179D0 (en) * 1991-05-23 1991-07-17 Motorola Gmbh An implementation of the ieee 1149.1 boundary-scan architecture
JPH05215820A (ja) * 1992-02-05 1993-08-27 Fujitsu Ltd スキャンパス回路

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Publication number Publication date
EP0702240A2 (de) 1996-03-20
JPH08179015A (ja) 1996-07-12
GB9417590D0 (en) 1994-10-19
US5719876A (en) 1998-02-17
EP0702240A3 (de) 1996-04-10
JP3070053U (ja) 2000-07-14
DE69529870D1 (de) 2003-04-17

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