EP0621490A3 - Testing of electrical circuits. - Google Patents
Testing of electrical circuits. Download PDFInfo
- Publication number
- EP0621490A3 EP0621490A3 EP94302175A EP94302175A EP0621490A3 EP 0621490 A3 EP0621490 A3 EP 0621490A3 EP 94302175 A EP94302175 A EP 94302175A EP 94302175 A EP94302175 A EP 94302175A EP 0621490 A3 EP0621490 A3 EP 0621490A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- asynchronous signal
- pulses
- range
- asserted
- asynchronous
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US49886 | 1993-04-20 | ||
US08/049,886 US5420874A (en) | 1993-04-20 | 1993-04-20 | Testing of electrical circuits |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0621490A2 EP0621490A2 (en) | 1994-10-26 |
EP0621490A3 true EP0621490A3 (en) | 1995-07-26 |
Family
ID=21962261
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP94302175A Withdrawn EP0621490A3 (en) | 1993-04-20 | 1994-03-25 | Testing of electrical circuits. |
Country Status (3)
Country | Link |
---|---|
US (1) | US5420874A (en) |
EP (1) | EP0621490A3 (en) |
JP (1) | JPH06324905A (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5656953A (en) * | 1995-05-31 | 1997-08-12 | Texas Instruments Incorporated | Low overhead memory designs for IC terminals |
US6405335B1 (en) | 1998-02-25 | 2002-06-11 | Texas Instruments Incorporated | Position independent testing of circuits |
US6728915B2 (en) | 2000-01-10 | 2004-04-27 | Texas Instruments Incorporated | IC with shared scan cells selectively connected in scan path |
US6769080B2 (en) | 2000-03-09 | 2004-07-27 | Texas Instruments Incorporated | Scan circuit low power adapter with counter |
US20110219266A1 (en) * | 2010-03-04 | 2011-09-08 | Qualcomm Incorporated | System and Method of Testing an Error Correction Module |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60124746A (en) * | 1983-12-09 | 1985-07-03 | Fujitsu Ltd | Data processing unit |
DE3725823A1 (en) * | 1986-08-04 | 1988-02-18 | Mitsubishi Electric Corp | INTEGRATED SEMICONDUCTOR SWITCHING DEVICE |
US5097468A (en) * | 1988-05-03 | 1992-03-17 | Digital Equipment Corporation | Testing asynchronous processes |
US5166604A (en) * | 1990-11-13 | 1992-11-24 | Altera Corporation | Methods and apparatus for facilitating scan testing of asynchronous logic circuitry |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3042811A (en) * | 1958-05-29 | 1962-07-03 | Ibm | Synchronized gated transistor trigger circuit |
US3225301A (en) * | 1963-06-04 | 1965-12-21 | Control Data Corp | Pulse resynchronizing system for converting asynchronous, random length data signal into data signal synchronous with clock signal |
US3304504A (en) * | 1964-12-14 | 1967-02-14 | Frank J Horlander | Gate generator synchronizer |
US3764920A (en) * | 1972-06-15 | 1973-10-09 | Honeywell Inf Systems | Apparatus for sampling an asynchronous signal by a synchronous signal |
US5047658A (en) * | 1990-06-01 | 1991-09-10 | Ncr Corporation | High frequency asynchronous data synchronizer |
US5128970A (en) * | 1990-12-20 | 1992-07-07 | Unisys Corporation | Non-return to zero synchronizer |
US5256912A (en) * | 1991-12-19 | 1993-10-26 | Sun Microsystems, Inc. | Synchronizer apparatus for system having at least two clock domains |
-
1993
- 1993-04-20 US US08/049,886 patent/US5420874A/en not_active Expired - Lifetime
-
1994
- 1994-03-25 EP EP94302175A patent/EP0621490A3/en not_active Withdrawn
- 1994-04-19 JP JP6080260A patent/JPH06324905A/en not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60124746A (en) * | 1983-12-09 | 1985-07-03 | Fujitsu Ltd | Data processing unit |
DE3725823A1 (en) * | 1986-08-04 | 1988-02-18 | Mitsubishi Electric Corp | INTEGRATED SEMICONDUCTOR SWITCHING DEVICE |
US5097468A (en) * | 1988-05-03 | 1992-03-17 | Digital Equipment Corporation | Testing asynchronous processes |
US5166604A (en) * | 1990-11-13 | 1992-11-24 | Altera Corporation | Methods and apparatus for facilitating scan testing of asynchronous logic circuitry |
Non-Patent Citations (1)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 9, no. 285 (P - 404) 12 November 1985 (1985-11-12) * |
Also Published As
Publication number | Publication date |
---|---|
EP0621490A2 (en) | 1994-10-26 |
US5420874A (en) | 1995-05-30 |
JPH06324905A (en) | 1994-11-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): BE DE DK ES FR GB GR IE IT LU NL PT SE |
|
PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
AK | Designated contracting states |
Kind code of ref document: A3 Designated state(s): BE DE DK ES FR GB GR IE IT LU NL PT SE |
|
17P | Request for examination filed |
Effective date: 19951227 |
|
17Q | First examination report despatched |
Effective date: 19991118 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20000329 |