EP0609009A2 - Dual gate JFET circuit to control threshold voltage - Google Patents

Dual gate JFET circuit to control threshold voltage Download PDF

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Publication number
EP0609009A2
EP0609009A2 EP94300383A EP94300383A EP0609009A2 EP 0609009 A2 EP0609009 A2 EP 0609009A2 EP 94300383 A EP94300383 A EP 94300383A EP 94300383 A EP94300383 A EP 94300383A EP 0609009 A2 EP0609009 A2 EP 0609009A2
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EP
European Patent Office
Prior art keywords
transistor
gate
transistors
current
gates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP94300383A
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German (de)
French (fr)
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EP0609009A3 (en
Inventor
Doug R. Farrenkopf
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National Semiconductor Corp
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National Semiconductor Corp
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Filing date
Publication date
Application filed by National Semiconductor Corp filed Critical National Semiconductor Corp
Publication of EP0609009A2 publication Critical patent/EP0609009A2/en
Publication of EP0609009A3 publication Critical patent/EP0609009A3/en
Withdrawn legal-status Critical Current

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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02Regulating voltage or current
    • G05F3/08Regulating voltage or current wherein the variable is dc
    • G05F3/10Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only

Definitions

  • JFET junction field effect transistor
  • op amps BIFET® operational amplifiers
  • V T threshold voltage
  • the amount of JFET conduction will also be a process related variable because the current flowing in a JFET is proportional to the square root of the difference between the gate bias and V T . Because of processing variations, V T varies, and so does the amount of conduction at a particular gate bias.
  • a JFET can have more than one gate and such devices are known as plural-gate devices.
  • a subsurface channel has a PN junction gate electrode facing it.
  • the gate itself acts to locate the channel below the semiconductor surface.
  • the opposite face of the channel encounters what is known as the "back gate”.
  • both the gate and the back gate connections can be made available at the IC surface so that a dual gate structure is present.
  • each gate electrode has its own V T and both of the individual JFET gates must be biased above V T for conduction to occur.
  • the first gate can be of either a top or front gate with respect to a second bottom or back gate, as in the BIFET® op amp IC construction, or it can be a more conventional JFET having a succession of individual gates facing a common channel, where there is a common backgate opposite to the individual gates.
  • a plurality of dual-gate JFETs are incorporated on an IC chip. These devices can be of the conventional side by side gate construction where the two gates together span the channel region. In the preferred embodiment, the devices can be of conventional gate construction wherein the gate forms a PN junction with the channel and spans the channel length. The reverse side of the channel faces the semiconductor material into which the JFET is fabricated and which forms a back gate electrode that is electrically isolated from the front gate.
  • One such dual-gate transistor is selected out of the plurality and it can be assumed that this selected transistor is representative of all of the JFETs on the IC chip. This is a reasonable assumption because the process variables, which give rise to altered electrical characteristics, will apply equally to all of the devices on the IC chip.
  • the source of the selected transistor is returned to a first terminal of a suitable operating power supply.
  • the selected transistor has a predetermined potential applied to the front, or the first, of the two gates. This potential is selected to produce a gate turn-on condition in the transistor.
  • the selected transistor drain is returned to the second operating power supply terminal by a first resistor.
  • a second resistor is connected between the second operating power supply terminal and a constant current supply that is coupled to the source potential.
  • the two resistors are connected to the inputs of an op-amp, the output of which is connected to the back or second gate of the selected transistor.
  • the selected transistor drain is connected to the op-amp inverting input so that a negative feedback loop is present. Thus, the op-amp output will drive the selected transistor second gate until the op-amp inputs are equal. If the two resistors are of equal value the selected transistor will be forced to conduct a channel current that equals the current in the constant current source connected to the second resistor.
  • Figure 1 is a block-schematic diagram of the circuit of the invention using dual gate P channel transistors.
  • Figure 2 is a partial schematic diagram showing of a dual-gate N channel transistor.
  • JFET 12 is a dual gate p channel transistor with its source connected to the +V DD rail. It has its first gate connected to terminal 13 which is typically supplied with a positive V BIAS potential. V BIAS is selected so that the first gate is biased below the gate threshold (V T ).
  • V T gate threshold
  • a p-channel JFET is shown. In this case, when V BIAS is below V T , there is conduction, while when V BIAS is above V T , the device is cut off.
  • a constant current source 16 which is connected to + V DD , is coupled to resistor 15, which acts as a ground return, and, therefore, I2 will flow in resistor 15.
  • Op-amp 17 has its input terminals connected to resistors 14 and 15 and its output connected to the back or second gate of JFET 12. Since the drain of JFET 12 is connected to the op-amp noninverting input, a negative feedback loop is present. Op-amp 17 will drive the second gate of JFET 12 until the potentials across resistors 14 and 15 are equal. If resistors 14 and 15 are matched I1 will be equal to I2. Thus, I2 can be selected to produce the desired value of I1.
  • a second p-channel JFET is shown in dashed outline at 18 and it passes I3.
  • This device is intended to represent one or a plurality of other JFETs on an IC chip.
  • V IN equals V BIAS
  • each of these devices will pass I3 which is determined by I2. Since all of the JFETs on a chip are subjected to the same fabrication conditions any fabrication-induced parameters, such as V T , will be substantially the same. As a result, all of the transistors on the chip will be forced to conduct a current proportional to I1 when their first gates are biased at the potential of V BIAS . Since a JFET current is proportional to the square root of the difference between the applied bias and V T , the V T values of the JFETs will be controlled to match.
  • op-amp 17 can produce a substantial output current and since the JFETs connected thereto draw essentially zero current, as many JFETs as desired can be controlled by a single op-amp. Accordingly, the circuit shown requires only a single op-amp on the IC chip.
  • resistors 14 and 15 are described as matched, this is convenience, not a necessity. These resistors can be ratioed, in which case I1 and I2 will have the same ratio.
  • Figure 2 is a partial schematic showing an N channel dual gate transistor 12'. Its source is connected to a negative supply potential. (The power supply has a reverse polarity from that of figure 1.)
  • the drain of transistor 12' is connected to a resistor 14 which acts as a ground return to the positive power supply terminal. Thus, electrons from the - V DD supply flow as I1 in resistor 14.
  • a circuit was constructed, as shown in figure 1, wherein resistors 14 and 15 were made to have values of 100K ohms and current source 16 operated at 10 micro-amperes.
  • V BIAS was set at a level of two volts below + V DD .
  • a 10 microampere current flowed in transistor 12. Therefore, a 10 microampere current would flow in any similar JFET (such as 18) that has its first gate biased at the V BIAS level.
  • JFET such as 18

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Nonlinear Science (AREA)
  • Electronic Switches (AREA)
  • Junction Field-Effect Transistors (AREA)

Abstract

A monolithic integrated circuit includes a plurality of dual gate junction field effect transistors. One is selected as a standard transistor and its current is passed through a first resistor. A reference current is passed through a second resistor. The two resistors are coupled to the inputs of an op-amp, the output of which is coupled to one gate of the standard transistor. The other gate of the standard transistor is supplied with a bias voltage selected to operate the transistor in the conducting mode. Thus, the standard transistor forms a negative feedback loop around the op-amp. As a result, the standard transistor will pass a current related to the reference current in a ratio determined by the ratio of the resistor values. The op-amp output can then be coupled to the other gates in all of the other transistors in the integrated circuit. Accordingly, all of the transistors will have their operating currents the same as that of the standard transistor at the same operating bias. This means that all of the transistors display the same effective threshold voltage.

Description

    Background of the Invention
  • The invention relates to junction field effect transistor (JFET) devices and, in particular, to dual gate devices. Such transistors have a pair of gate terminals along with the source and drain elements. JFET devices are common in integrated circuit (IC) structures where both field effect and bipolar transistors are fabricated into a single IC chip. One such series of devices has been trademarked as BIFET® operational amplifiers (op amps).
  • A JFET device has a property known as the threshold voltage (VT), which is the gate voltage at which source-drain conduction starts. This voltage is a function of the device geometry and the nature of the associated semiconductor regions. Thus, it is extremely process sensitive.
  • Clearly, when turned on, the amount of JFET conduction will also be a process related variable because the current flowing in a JFET is proportional to the square root of the difference between the gate bias and VT. Because of processing variations, VT varies, and so does the amount of conduction at a particular gate bias.
  • Thus, it would be desirable to control the conduction of a JFET at a particular gate bias thereby, in effect, to control VT.
  • A JFET can have more than one gate and such devices are known as plural-gate devices. In the well known BIFET® op-amps, a subsurface channel has a PN junction gate electrode facing it. The gate itself acts to locate the channel below the semiconductor surface. The opposite face of the channel encounters what is known as the "back gate". In IC fabrication, both the gate and the back gate connections can be made available at the IC surface so that a dual gate structure is present.
  • While BIFET® IC op-amp construction is preferred, it is to be understood that the gate itself can be fabricated as a two-element device. A pair of gates together span one face of the channel region and operate in concert to control the JFET conduction. This effectively produces a pair of series-connected JFET elements. The opposite side of the channel faces a semiconductor region to form a back gate that is typically connected to the transistor source. In operation each gate electrode has its own VT and both of the individual JFET gates must be biased above VT for conduction to occur.
  • In the discussion to follow, where a dual-gate JFET is described, the first gate can be of either a top or front gate with respect to a second bottom or back gate, as in the BIFET® op amp IC construction, or it can be a more conventional JFET having a succession of individual gates facing a common channel, where there is a common backgate opposite to the individual gates.
  • Summary of the Invention
  • It is an object of the invention to employ a plurality of dual gate JFETs in an IC and to connect one into a reference circuit which biases it into a controlled state of conduction and the reference circuit can be used to bias all of the other JFETs to control their threshold voltage.
  • It is a further object of the invention to employ a dual gate JFET, having a first gate biased above VT and the second gate biased by a diff-amp which is coupled to both a reference current and the JFET current so that the bias on the second gate is forced to a voltage which provides for the JFET current proportional to the reference current and the resultant voltage coupled to the equivalent gates on all of the other JFET devices in the IC.
  • These and other objects are achieved as follows. A plurality of dual-gate JFETs are incorporated on an IC chip. These devices can be of the conventional side by side gate construction where the two gates together span the channel region. In the preferred embodiment, the devices can be of conventional gate construction wherein the gate forms a PN junction with the channel and spans the channel length. The reverse side of the channel faces the semiconductor material into which the JFET is fabricated and which forms a back gate electrode that is electrically isolated from the front gate. One such dual-gate transistor is selected out of the plurality and it can be assumed that this selected transistor is representative of all of the JFETs on the IC chip. This is a reasonable assumption because the process variables, which give rise to altered electrical characteristics, will apply equally to all of the devices on the IC chip. The source of the selected transistor is returned to a first terminal of a suitable operating power supply. The selected transistor has a predetermined potential applied to the front, or the first, of the two gates. This potential is selected to produce a gate turn-on condition in the transistor.
  • The selected transistor drain is returned to the second operating power supply terminal by a first resistor. A second resistor is connected between the second operating power supply terminal and a constant current supply that is coupled to the source potential. The two resistors are connected to the inputs of an op-amp, the output of which is connected to the back or second gate of the selected transistor. The selected transistor drain is connected to the op-amp inverting input so that a negative feedback loop is present. Thus, the op-amp output will drive the selected transistor second gate until the op-amp inputs are equal. If the two resistors are of equal value the selected transistor will be forced to conduct a channel current that equals the current in the constant current source connected to the second resistor. If the second or back gates of all of the dual-gate JFETs on the IC chip are connected to the op-amp output all of the JFETs will have the same VT and will all conduct substantially the same current when turned on by an equal bias applied to their first gates. Since the JFET gates draw substantially zero current, a relatively large number of them can be simultaneously driven from a single op-amp.
  • Brief Description of the Drawing
  • Figure 1 is a block-schematic diagram of the circuit of the invention using dual gate P channel transistors.
  • Figure 2 is a partial schematic diagram showing of a dual-gate N channel transistor.
  • Description of the Invention
  • With reference to figure 1, a circuit is shown operated by a VDD power supply connected + to terminal 10 and - to ground terminal 11. JFET 12 is a dual gate p channel transistor with its source connected to the +VDD rail. It has its first gate connected to terminal 13 which is typically supplied with a positive VBIAS potential. VBIAS is selected so that the first gate is biased below the gate threshold (VT). In figure 1, a p-channel JFET is shown. In this case, when VBIAS is below VT, there is conduction, while when VBIAS is above VT, the device is cut off. A constant current source 16, which is connected to + VDD, is coupled to resistor 15, which acts as a ground return, and, therefore, I₂ will flow in resistor 15. Op-amp 17 has its input terminals connected to resistors 14 and 15 and its output connected to the back or second gate of JFET 12. Since the drain of JFET 12 is connected to the op-amp noninverting input, a negative feedback loop is present. Op-amp 17 will drive the second gate of JFET 12 until the potentials across resistors 14 and 15 are equal. If resistors 14 and 15 are matched I₁ will be equal to I₂. Thus, I₂ can be selected to produce the desired value of I₁.
  • A second p-channel JFET is shown in dashed outline at 18 and it passes I₃. This device is intended to represent one or a plurality of other JFETs on an IC chip. When VIN equals VBIAS, each of these devices will pass I₃ which is determined by I₂. Since all of the JFETs on a chip are subjected to the same fabrication conditions any fabrication-induced parameters, such as VT, will be substantially the same. As a result, all of the transistors on the chip will be forced to conduct a current proportional to I₁ when their first gates are biased at the potential of VBIAS. Since a JFET current is proportional to the square root of the difference between the applied bias and VT, the VT values of the JFETs will be controlled to match.
  • Since op-amp 17 can produce a substantial output current and since the JFETs connected thereto draw essentially zero current, as many JFETs as desired can be controlled by a single op-amp. Accordingly, the circuit shown requires only a single op-amp on the IC chip.
  • It is to be understood that while resistors 14 and 15 are described as matched, this is convenience, not a necessity. These resistors can be ratioed, in which case I₁ and I₂ will have the same ratio.
  • Figure 2 is a partial schematic showing an N channel dual gate transistor 12'. Its source is connected to a negative supply potential. (The power supply has a reverse polarity from that of figure 1.) The drain of transistor 12' is connected to a resistor 14 which acts as a ground return to the positive power supply terminal. Thus, electrons from the - VDD supply flow as I₁ in resistor 14.
  • Example
  • By way of example, a circuit was constructed, as shown in figure 1, wherein resistors 14 and 15 were made to have values of 100K ohms and current source 16 operated at 10 micro-amperes. VBIAS was set at a level of two volts below + VDD. A 10 microampere current flowed in transistor 12. Therefore, a 10 microampere current would flow in any similar JFET (such as 18) that has its first gate biased at the VBIAS level. The result is that all of the JFETs having their second gates connected to op-amp 17, as shown, have the same VT values for their first gates.
  • The invention has been described and a preferred embodiment detailed. Alternatives have also been described. When a person skilled in the art reads the foregoing description, other alternatives and equivalents, within the spirit and intent of the invention, will be apparent. Accordingly, it is intended that the scope of the invention be limited only by the claims that follow.

Claims (6)

  1. An integrated circuit that includes a first junction field effect transistor (12) and at least one other junction field effect transistor (18), each such transistor being constructed to have first and second gates which, in combination, determine the transistor's conduction, characterised by: means (17) for comparing current flow through the second gate of the first transistor with a reference to develop an error signal which is coupled to the first gate of the first transistor whereby to force the first transistor to conduct a current related in value to the reference and means for connecting the second gate of each other transistor to receive the said error signal so that the said transistors all conduct currents related to the reference.
  2. An integrated circuit that includes a plurality of junction field effect transistors are incorporated into a single chip and are constructed to have first and second gates which, in combination, determine the transistor conduction, characterised by:
    first and second resistors (14,15), a first of the said transistors (12) being connected to pass its current through said first resistor;
    means (13) for applying a bias to said first gate on said first transistor which produces a turn-on bias greater than the transistor threshold voltage on an N-channel JFET, or less than the transistor threshold voltage in the case of a P-channel JFET;
    means (16) for passing a reference current through said second resistor;
    an operational amplifier (17) having inverting and non-inverting inputs and an output coupled to said second gate of said standard transistor;
    means connecting one each of the inputs of the operational amplifier to the said resistors, whereby said first transistor is forced to conduct a current related to said reference current; and
    means for connecting the second gates of other transistors on said chip to said operational amplifier whereby said other transistors have their first gate threshold voltages the same as that of said first transistor.
  3. A circuit according to claim 1 or 2 wherein said junction field effect transistors are formed to have first and second gates spaced along one face of a channel and a common back gate spanning the opposite face of said channel.
  4. A circuit according to claim 1 or 2 said junction field effect transistors are formed to have said first gate spanning one face of a channel and said second gate spanning the opposite face of said channel.
  5. A circuit according to claim 2 wherein said first and second resistors are matched and said other transistors pass a current equal to said first transistor's current when their first gates are biased at the level of said first transistor's first gate.
  6. A circuit according to claim 2 wherein said first and second resistors are ratioed and said other transistors have their currents proportional to said first transistor's current multiplied by said ratio when said first gates are biased at the level of said first transistor's first gate.
EP9494300383A 1993-01-28 1994-01-19 Dual gate JFET circuit to control threshold voltage. Withdrawn EP0609009A3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10380 1987-02-03
US1038093A 1993-01-28 1993-01-28

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EP0609009A2 true EP0609009A2 (en) 1994-08-03
EP0609009A3 EP0609009A3 (en) 1994-11-02

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7808415B1 (en) 2009-03-25 2010-10-05 Acco Semiconductor, Inc. Sigma-delta modulator including truncation and applications thereof
US8008731B2 (en) 2005-10-12 2011-08-30 Acco IGFET device having a RF capability
US8334178B2 (en) 2008-02-13 2012-12-18 Acco Semiconductor, Inc. High breakdown voltage double-gate semiconductor device
US8928410B2 (en) 2008-02-13 2015-01-06 Acco Semiconductor, Inc. Electronic circuits including a MOSFET and a dual-gate JFET
US9240402B2 (en) 2008-02-13 2016-01-19 Acco Semiconductor, Inc. Electronic circuits including a MOSFET and a dual-gate JFET

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0375124A1 (en) * 1988-12-20 1990-06-27 Tektronix Inc. CMOS comparator bias voltage generator
EP0446595A2 (en) * 1990-03-12 1991-09-18 Texas Instruments Incorporated A buffer circuit
EP0531101A2 (en) * 1991-09-05 1993-03-10 TriQuint Semiconductor, Inc. Low-noise bias circuit for multiple current sources

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0375124A1 (en) * 1988-12-20 1990-06-27 Tektronix Inc. CMOS comparator bias voltage generator
EP0446595A2 (en) * 1990-03-12 1991-09-18 Texas Instruments Incorporated A buffer circuit
EP0531101A2 (en) * 1991-09-05 1993-03-10 TriQuint Semiconductor, Inc. Low-noise bias circuit for multiple current sources

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8008731B2 (en) 2005-10-12 2011-08-30 Acco IGFET device having a RF capability
US8334178B2 (en) 2008-02-13 2012-12-18 Acco Semiconductor, Inc. High breakdown voltage double-gate semiconductor device
US8928410B2 (en) 2008-02-13 2015-01-06 Acco Semiconductor, Inc. Electronic circuits including a MOSFET and a dual-gate JFET
US9240402B2 (en) 2008-02-13 2016-01-19 Acco Semiconductor, Inc. Electronic circuits including a MOSFET and a dual-gate JFET
US7808415B1 (en) 2009-03-25 2010-10-05 Acco Semiconductor, Inc. Sigma-delta modulator including truncation and applications thereof

Also Published As

Publication number Publication date
EP0609009A3 (en) 1994-11-02
JPH06303118A (en) 1994-10-28

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