EP0543808A1 - Banc de contacts a ressort pour un appareil de controle de supports de cables et de plaquettes de circuits imprimes - Google Patents

Banc de contacts a ressort pour un appareil de controle de supports de cables et de plaquettes de circuits imprimes

Info

Publication number
EP0543808A1
EP0543808A1 EP19900912005 EP90912005A EP0543808A1 EP 0543808 A1 EP0543808 A1 EP 0543808A1 EP 19900912005 EP19900912005 EP 19900912005 EP 90912005 A EP90912005 A EP 90912005A EP 0543808 A1 EP0543808 A1 EP 0543808A1
Authority
EP
European Patent Office
Prior art keywords
segments
spring
contact
bores
tubes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP19900912005
Other languages
German (de)
English (en)
Inventor
Paul Mang
Hubert Driller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mania GmbH and Co
Original Assignee
Mania GmbH and Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mania GmbH and Co filed Critical Mania GmbH and Co
Publication of EP0543808A1 publication Critical patent/EP0543808A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Definitions

  • the invention relates to a spring contact field body for a wiring carrier / circuit board tester according to the preamble of patent claim 1.
  • a printed circuit board test device emerges with a plurality of contact points arranged in the contact field level of the device, which are connected to an electronic control and measuring device and which are connected in the longitudinal direction to the contact points by rigid test pins testing wiring carriers or printed circuit boards are connectable.
  • the contact points mentioned are designed as electrically conductive compression springs which are arranged in bores of a spring contact field body made of an electrically insulating material.
  • the rigid test pins are supported on one end of the springs held in the bores of the spring contact field body.
  • the other ends of the springs held in the bores of the spring contact field body are supported on contact pins of contact field plugs.
  • the known spring contact field body is produced, for example, as a fully plastic body by an injection molding process in an injection mold.
  • the object of the present invention is therefore to provide a spring contact field body which can be produced comparatively easily without the use of a complicated injection mold.
  • the main advantage of the invention is that the manufacture of the spring contact field body is considerably simplified due to its special structure. This can be attributed to the subdivision of the spring contact field body into individual segments which are stacked vertically one above the other. Because these segments each only have a small thickness of, for example, about 3 mm, they can be produced in injection molds with relatively short inserts, and there is no risk of these inserts bending due to their short length of, for example, 3 mm.
  • the present spring contact field bodies can be assembled relatively simply in that the individual segments are arranged vertically one above the other and aligned with one another, and in the mutually aligned bores of these segments thin tubes, preferably made of metal, with a very thin wall thickness, preferably in a range of 50 ⁇ m can be inserted.
  • the tubes advantageously ensure that smooth transitions are created between the mutually aligned bores of adjacent segments.
  • the tubes mentioned cause the segments to be held together in the form of a compact block.
  • the smooth transitions between the bores of adjacent segments mentioned prevent damage to the springs inserted into the bores.
  • the present spring contact field body is designated by 1 in FIG. 1. It establishes a connection between test pins 2 and the contact pins 3 of a contact field which is preferably formed by contact field plugs 4.
  • At the lower end of each driver plate 5 there is a contact plug, not shown, which connects each of the up to 2000 driver plates 5 to an electronic control and measuring device, also not shown, which is located in the lower part of the test Device is arranged. Since neither the contact field plugs nor the driver plates are of essential importance for the invention, these are not explained in more detail.
  • the spring contact field body 1 consists of a plurality of disk-shaped segments 6 arranged vertically one above the other.
  • each segment 6 there are bores 7 corresponding to the grid of the contact pins 3, each hole having a diameter of approximately 0.8 mm and the distance from bore to bore corresponding to the pitch of the contact pins 3 is 1.27 mm.
  • the size of the individual segments 6 can be chosen as desired, so that a desired number of contact pins 3 is detected.
  • the dimensions of a segment are 20x20x3mm.
  • Such a segment has 256 bores 7.
  • the spring contact field body 1 is formed by stacking the segments 6 provided with the bores 7, the segments 6 and therefore also the bores 7 being aligned with one another during the stacking operations. For the sake of simplicity, many holes 7 are represented by dots. Tubes 8 are inserted into the mutually aligned bores 7. The tubes 8 ensure that there is a smooth transition between the mutually aligned bores 7 of adjacent segments 6. The tubes 8 - o -
  • a compression spring 9 is inserted into each tube 8, which in the manner already mentioned establishes contact between the end of a test pin 2 facing it and an associated contact pin 3.
  • the springs 9 are preassembled in the tube 8 according to FIG. 3, so that these two elements can be inserted as a unit into the bores 7 of the segments 6 stacked one above the other.
  • the springs 9 are preferably retained in the tubes 8 by providing them with constrictions or indentations 10 at their end regions, which form contact surfaces for the slightly compressed springs 9 located between them.
  • the lengths of the tubes 8 are matched to the lengths of the springs 9.
  • the number of segments 6 to be stacked is determined by the lengths of the tubes 8.
  • the number of segments 6 and their thicknesses are chosen so that the ends of the tubes 8 in the planes of the -? -
  • the spring 4 at both end regions 11, 12, i.e. thus outwards from the resilient region 13, which has turns spaced apart, can be wound with turns lying against one another in the longitudinal direction, which taper in diameter to form an inner cone in the winding direction of the spring and then widen again.
  • an inner cone 14 for receiving the tips of the test pins 2 and the contact pins 3 is formed on both ends of these springs 6.
  • These springs 4, which are wound from spring steel, can preferably be coated by galvanic deposition with a suitable contact material, the windings lying against one another being able to "grow together" at the front ends.
  • the spring can have an inner cone 1.4 at its upper end region 11, as has already been explained in connection with FIG. 4a.
  • the opposite end region 12 can be pin-like - -
  • This pin-like extension 15 projects into, for example, a conical or cup-shaped depression which is located in the contact field connector 4 or in a contact element 3. 4c, the upper end region 11 of the spring 9 can have the inner cone 14 already explained.
  • the lower end region 12 is provided with a contact tongue part 16 which extends directly to an associated contact point on the surface of a driver plate 5. This means that the contact field plug 4 only has to be provided with correspondingly positioned thin circumferential bores 17 through which these contact tongues 16 are introduced when the contact field is being set up.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

L'invention a pour objet un banc de contacts à ressorts pour un appareil de contrôle de circuits imprimés qui présente des orifices (7) mutuellement espacés qui traversent cet appareil depuis une face frontale jusqu'à la face frontale opposée, des ressorts de pression (9) pouvant être insérés dans les orifices (7), ressorts qui établissent des liaisons électriques entre des fiches de contrôle (2), dont l'une des extrémités est disposée contre l'une des extrémités du ressort, et des contacts (3) d'un réseau qui sont placés contre les autres extrémités des ressorts de pression (9). Pour simplifier la fabrication d'un tel banc, il est proposé que le banc (1) soit composé de plusieurs segments (6) superposés et que dans les orifices (7), placés dans le même alignement les uns par rapport aux autres, des segments (6) on insère de petits tubes (8) qui reçoivent les ressorts de pression (9). A cet effet, les segments (6) peuvent être fabriqués en céramique ou en matière plastique et les petits tubes constitués de métal, de céramique ou de matière plastique.
EP19900912005 1990-08-13 1990-08-13 Banc de contacts a ressort pour un appareil de controle de supports de cables et de plaquettes de circuits imprimes Withdrawn EP0543808A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP1990/001331 WO1992003741A1 (fr) 1990-08-13 1990-08-13 Banc de contacts a ressort pour un appareil de controle de supports de cables et de plaquettes de circuits imprimes

Publications (1)

Publication Number Publication Date
EP0543808A1 true EP0543808A1 (fr) 1993-06-02

Family

ID=8165512

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19900912005 Withdrawn EP0543808A1 (fr) 1990-08-13 1990-08-13 Banc de contacts a ressort pour un appareil de controle de supports de cables et de plaquettes de circuits imprimes

Country Status (3)

Country Link
EP (1) EP0543808A1 (fr)
DE (1) DE9017923U1 (fr)
WO (1) WO1992003741A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4420268A1 (de) * 1994-06-10 1995-12-14 Wee Electrotest Engineering Gm Vorrichtung zur Kontaktierung eines Steckkontaktes

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE7914951U1 (de) * 1979-05-23 1989-07-13 Feinmetall Gmbh, 7033 Herrenberg Federnde Kontakteinrichtung für Meß- und Prüfzwecke
US4289367A (en) * 1979-12-10 1981-09-15 John Fluke Mfg. Co., Inc. Spring loaded connector pin
DE3630548A1 (de) * 1986-09-08 1988-03-10 Mania Gmbh Vorrichtung zum elektronischen pruefen von leiterplatten mit kontaktpunkten im 1/20 zoll-raster
CH676898A5 (fr) * 1988-09-02 1991-03-15 Microcontact Ag

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO9203741A1 *

Also Published As

Publication number Publication date
WO1992003741A1 (fr) 1992-03-05
DE9017923U1 (de) 1993-02-18

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Legal Events

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PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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Effective date: 19921104

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Effective date: 19931027

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18D Application deemed to be withdrawn

Effective date: 19940301