EP0539075A1 - Halbleiteranordnung mit einem isolierenden Substrat - Google Patents
Halbleiteranordnung mit einem isolierenden Substrat Download PDFInfo
- Publication number
- EP0539075A1 EP0539075A1 EP92309278A EP92309278A EP0539075A1 EP 0539075 A1 EP0539075 A1 EP 0539075A1 EP 92309278 A EP92309278 A EP 92309278A EP 92309278 A EP92309278 A EP 92309278A EP 0539075 A1 EP0539075 A1 EP 0539075A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- resin substrate
- holes
- semiconductor element
- semiconductor device
- connection terminals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/16—Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
- H01L23/18—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
- H01L23/24—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device solid or gel at the normal operating temperature of the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/2919—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/73—Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01074—Tungsten [W]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/0665—Epoxy resin
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15153—Shape the die mounting substrate comprising a recess for hosting the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/15165—Monolayer substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1517—Multilayer substrate
- H01L2924/15172—Fan-out arrangement of the internal vias
- H01L2924/15173—Fan-out arrangement of the internal vias in a single layer of the multilayer substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1517—Multilayer substrate
- H01L2924/15182—Fan-in arrangement of the internal vias
- H01L2924/15183—Fan-in arrangement of the internal vias in a single layer of the multilayer substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15312—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a pin array, e.g. PGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Definitions
- the present invention relates to a semiconductor device.
- FIG. 1A An example of a conventional semiconductor device is shown in FIG. 1A.
- a semiconductor element 1 is placed in a hole 6 which is formed on the central portion of the upper surface of a resin substrate 8.
- its bottom surface is adhered to the bottom of the hole 6 by means of a bonding agent 5.
- the semiconductor element 1 is covered with an enclosure resin 2.
- a plurality of through-holes 10, each of which extends to the lower face of the resin substrate 8 through the resin substrate 8, are formed in two square circumferential rows along the outer periphery of the upper surface of the resin substrate 8 in such a manner as to surround the hole 6.
- Lead pins 9 for external connection are inserted one by one in the through-holes 10.
- a resin stopping frame 4 for preventing the enclosure resin 2 from flowing into the through-holes 10 is provided on the upper surface of the resin substrate 8 between the hole 6 and the lead pins 9 in such a manner as to surround the hole 6.
- a plurality of element connection terminals 7 are provided on the upper surface of the resin substrate 8 between the hole 6 and the lead pins 9 in such a manner as to surround the hole 6 as shown in FIG. 1B.
- connection between the signal input/output pads (not shown) of the semiconductor element 1 and the lead pins 9 is established by means of a plurality of connecting lines 3 and a plurality of wiring patterns 61.
- the connecting lines 3 electrically connect the signal input/output pads of the semiconductor element 1 and the element connection terminals 7 one by one to each other.
- the wiring patterns 61 which are formed on the upper surface of the resin substrate 8 electrically connect the element connection terminals 7 and the lead pins 9 one by one to each other.
- the conventional semiconductor device described above has the problem that special specifications are required in order to mount the semiconductor element 1 of a larger size.
- the size of the hole 6 must be increased in order to mount a larger semiconductor element 1. Since the through-holes 10 for receiving the lead pins 9 one by one therein are provided at the circumferential portion of the upper surface of the resin substrate 8, if the outer peripheral edge of the hole 6 comes to the outer side with respect to the positions of the through-holes 10 on the inner circumferential row shown in FIG.
- the through-holes 10 on the inner circumferential row must be displaced to positions on the outer side with respect to the through-holes 10 on the outer circumferential row shown in FIG. 1A.
- the size of the outer profile of the semiconductor device must be increased.
- semiconductor devices of the type mentioned since the outer profile sizes are standardized according to the number of lead pins for the external connection by the JEDEC (Joint Electron Device Engineering Council) or the EIAJ (Electronic Industries Association of Japan), there is a problem that, when the standardized outer profile sizes cannot be satisfied, special specifications must be employed.
- An object of the present invention is to provide a semiconductor device which allows mounting of a large semiconductor element while maintaining a standardized outer profile size.
- a semiconductor device which comprises: a semiconductor element, a resin substrate having the semiconductor element placed on its upper surface, a plurality of element connection terminals provided on the upper surface of the resin substrate, and a plurality of through-holes formed from the upper surface of the resin substrate, in which the element connection terminals are provided on the outer side with respect to all or some of the through-holes.
- FIG. 2A there is shown a semiconductor device of the first preferred embodiment of the present invention.
- a semiconductor element 11 having a plurality of signal input/output pads (not shown) is placed on an insulator sheet 16 which is provided between the bottom surface of the semiconductor element 11 and the upper surface of a resin substrate 18.
- the bottom surface of the element is adhered to the insulator sheet 16 by means of a bonding agent 15.
- the semiconductor element 11 is covered with an enclosure resin 12.
- a plurality of through-holes 20, each of which extends to the lower surface of the resin substrate 18 through the resin substrate 18, are formed in two square circumferential rows in the central portion of the upper surface of the resin substrate 18 along the side faces of the resin substrate 18 in an opposing relationship to (i.e. underneath) the bottom surface of the semiconductor element 11.
- Lead pins 19 for external connection are inserted one by one into the through-holes 20.
- a resin stopping frame 14 for preventing the enclosure resin 12 from flowing out of position is provided at the ends of the upper surface of the resin substrate 18 along the side faces of the resin substrate 18.
- a plurality of element connection terminals 17 are provided on the upper surface of the resin substrate 18 on the outside of the through-holes and between the through-holes 20 and the resin stopping frame 14 along the side faces of the resin substrate 18 as shown in FIG. 2B.
- Electric connection between the signal input/output pads of the semiconductor element 11 and the lead pins 19 is established by means of a plurality of connecting lines 13 and a plurality of wiring patterns 21.
- the connecting lines 13 electrically connect the signal input/output pads and the element connection terminals 17 one by one to each other.
- the wiring patterns 21 which are formed on the upper surface of the resin substrate 18 electrically connect the element connection terminals 17 and the lead pins 19 one by one to each other.
- the resin substrate 18 may be formed from a laminate of glass epoxy, glass triazine, or glass polyimide. Copper is provided on the upper and lower surfaces of the resin substrate 18, and the wiring patterns 21 are formed by etching the copper.
- Each through-hole 20 is plated with copper so that the copper on the upper surface of the resin substrate 18 and the copper on the lower surface of the resin substrate are electrically connected to each other by way of the plated copper of the through-hole 20.
- Each lead pin 19 is formed from phosphor bronze, covar, or 42-alloy (iron alloy containing 42 % of nickel) with solder plating applied to the surface of the pin.
- a semiconductor element 11 may be mounted even if the element is of somewhat larger outer profile size by suitably changing the positions at which the element connection terminals 17 are formed on the semiconductor device while maintaining its outer profile size as specified by existing standards.
- the semiconductor device of the present embodiment has through-holes 20 formed in two circumferential rows along the side faces of the resin substrate 18, the through-holes 20 may also be formed in any other suitable number of rows and need not necessarily be formed along the side faces of the resin substrate 18.
- FIG. 3A there is shown a semiconductor device of the second preferred embodiment of the present invention.
- a semiconductor element 31 having a plurality of signal input/output pads (not shown) is placed on an insulator sheet 36 which is provided between the bottom surface of the semiconductor element 31 and the upper surface of a resin substrate 38.
- the bottom surface of the semiconductor element 31 is adhered to the insulator sheet 36 by means of a bonding agent 35.
- the semiconductor element 31 is covered with an enclosure resin 32.
- a plurality of first through-holes 401 each of which extends to the lower surface of the resin substrate 38 through the resin substrate 38, are formed in a single square circumferential row in the central portion of the upper surface of the resin substrate 38 along the side faces of the resin substrate 38 in an opposing relationship to the bottom surface of the semiconductor element 31.
- Lead pins 39 for external connection are inserted one by one into the first and second through-holes 401 and 402.
- a resin stopping frame 34 for preventing the enclosure resin 32 from flowing out of position is provided at the ends of the upper surface of the resin substrate 38 along the side faces of the resin substrate 38.
- a plurality of element connection terminals 37 are provided on the upper surface of the resin substrate 38 between the first through-holes 401 and the second through-holes 402 along the side faces of the resin substrate 38 as shown in FIG. 3B.
- Electric connection between the signal input/output pads of the semiconductor element 31 and the lead pins 39 is established by means of a plurality of connecting lines 33 and a plurality of wiring patterns 41.
- the connecting lines 33 electrically connect the signal input/output pads and element connection terminals 37 one by one to each other.
- the wiring patterns 41 which are formed on the upper surface of the resin substrate 38 electrically connect the element connection terminals 37 and the lead pins 39 one by one to each other.
- a semiconductor element 31 of somewhat larger outer profile size can still be mounted by suitably changing the positions at which the element connection terminals 37 are formed on the semiconductor device while maintaining its outer profile size as specified by existing standards.
- the semiconductor device of the present embodiment has the first through-holes 401 formed in a single circumferential row along the side faces of the resin substrate 38 and the second through-holes 402 formed in a single circumferential row along the side faces of the resin substrate 38, the first and second through-holes 401 and 402 may also be formed in any other suitable number of rows and need not necessarily be formed along the side faces of the resin substrate 38.
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Lead Frames For Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3271629A JPH05109922A (ja) | 1991-10-21 | 1991-10-21 | 半導体装置 |
JP271629/91 | 1991-10-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
EP0539075A1 true EP0539075A1 (de) | 1993-04-28 |
Family
ID=17502739
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP92309278A Withdrawn EP0539075A1 (de) | 1991-10-21 | 1992-10-12 | Halbleiteranordnung mit einem isolierenden Substrat |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP0539075A1 (de) |
JP (1) | JPH05109922A (de) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0664562A1 (de) * | 1994-01-12 | 1995-07-26 | AT&T Corp. | Plastikgehäuse für Träger mit Kontaktgitter |
WO1996038860A1 (de) * | 1995-06-01 | 1996-12-05 | Siemens Aktiengesellschaft | Grundplatte für einen integrierten elektrischen schaltungsbaustein |
US5625944A (en) * | 1992-12-30 | 1997-05-06 | Interconnect Systems, Inc. | Methods for interconnecting integrated circuits |
EP0883173A1 (de) * | 1996-09-12 | 1998-12-09 | Ibiden Co., Ltd. | Leiterplatte zur montage elektronischer bauelemente |
US6384344B1 (en) | 1995-06-19 | 2002-05-07 | Ibiden Co., Ltd | Circuit board for mounting electronic parts |
EP1814153A2 (de) * | 1996-09-12 | 2007-08-01 | Ibiden Co., Ltd. | Leiterplatte zum Montieren von Elektronikteilen |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100437437B1 (ko) * | 1994-03-18 | 2004-06-25 | 히다치 가세고교 가부시끼가이샤 | 반도체 패키지의 제조법 및 반도체 패키지 |
JP4029910B2 (ja) * | 1994-03-18 | 2008-01-09 | 日立化成工業株式会社 | 半導体パッケ−ジの製造法及び半導体パッケ−ジ |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0351184A2 (de) * | 1988-07-15 | 1990-01-17 | Advanced Micro Devices, Inc. | Packungsstruktur mit einem Steckerstift-Gitter |
EP0351581A1 (de) * | 1988-07-22 | 1990-01-24 | Oerlikon-Contraves AG | Hochintegrierte Schaltung sowie Verfahren zu deren Herstellung |
WO1990013991A1 (en) * | 1989-05-01 | 1990-11-15 | Motorola, Inc. | Method of grounding an ultra high density pad array chip carrier |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61177759A (ja) * | 1985-02-04 | 1986-08-09 | Hitachi Micro Comput Eng Ltd | 半導体装置 |
JPH02168662A (ja) * | 1988-09-07 | 1990-06-28 | Hitachi Ltd | チップキャリア |
-
1991
- 1991-10-21 JP JP3271629A patent/JPH05109922A/ja active Pending
-
1992
- 1992-10-12 EP EP92309278A patent/EP0539075A1/de not_active Withdrawn
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0351184A2 (de) * | 1988-07-15 | 1990-01-17 | Advanced Micro Devices, Inc. | Packungsstruktur mit einem Steckerstift-Gitter |
EP0351581A1 (de) * | 1988-07-22 | 1990-01-24 | Oerlikon-Contraves AG | Hochintegrierte Schaltung sowie Verfahren zu deren Herstellung |
WO1990013991A1 (en) * | 1989-05-01 | 1990-11-15 | Motorola, Inc. | Method of grounding an ultra high density pad array chip carrier |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5625944A (en) * | 1992-12-30 | 1997-05-06 | Interconnect Systems, Inc. | Methods for interconnecting integrated circuits |
US5712768A (en) * | 1992-12-30 | 1998-01-27 | Interconnect Systems, Inc. | Space-saving assemblies for connecting integrated circuits to circuit boards |
EP0664562A1 (de) * | 1994-01-12 | 1995-07-26 | AT&T Corp. | Plastikgehäuse für Träger mit Kontaktgitter |
US5926696A (en) * | 1994-01-12 | 1999-07-20 | Lucent Technologies Inc. | Ball grid array plastic package |
WO1996038860A1 (de) * | 1995-06-01 | 1996-12-05 | Siemens Aktiengesellschaft | Grundplatte für einen integrierten elektrischen schaltungsbaustein |
US6384344B1 (en) | 1995-06-19 | 2002-05-07 | Ibiden Co., Ltd | Circuit board for mounting electronic parts |
EP0883173A1 (de) * | 1996-09-12 | 1998-12-09 | Ibiden Co., Ltd. | Leiterplatte zur montage elektronischer bauelemente |
EP0883173A4 (de) * | 1996-09-12 | 2001-05-09 | Ibiden Co Ltd | Leiterplatte zur montage elektronischer bauelemente |
EP1814153A2 (de) * | 1996-09-12 | 2007-08-01 | Ibiden Co., Ltd. | Leiterplatte zum Montieren von Elektronikteilen |
EP1814153A3 (de) * | 1996-09-12 | 2008-09-24 | Ibiden Co., Ltd. | Leiterplatte zum Montieren von Elektronikteilen |
USRE44251E1 (en) | 1996-09-12 | 2013-06-04 | Ibiden Co., Ltd. | Circuit board for mounting electronic parts |
Also Published As
Publication number | Publication date |
---|---|
JPH05109922A (ja) | 1993-04-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5841191A (en) | Ball grid array package employing raised metal contact rings | |
US5789811A (en) | Surface mount peripheral leaded and ball grid array package | |
US6617695B1 (en) | Semiconductor device and semiconductor module using the same | |
US4941033A (en) | Semiconductor integrated circuit device | |
US5684330A (en) | Chip-sized package having metal circuit substrate | |
US5247423A (en) | Stacking three dimensional leadless multi-chip module and method for making the same | |
US5404273A (en) | Semiconductor-device package and semiconductor device | |
US5600178A (en) | Semiconductor package having interdigitated leads | |
EP0638931B1 (de) | Mehrchipmodul | |
US5260601A (en) | Edge-mounted, surface-mount package for semiconductor integrated circuit devices | |
US5869889A (en) | Thin power tape ball grid array package | |
US6329708B1 (en) | Micro ball grid array semiconductor device and semiconductor module | |
EP0329317A2 (de) | Halbleiteranordnung mit einer isolierenden Folie | |
US5309020A (en) | Packaged semiconductor device assembly including two interconnected packaged semiconductor devices mounted on a common substrate | |
US5951804A (en) | Method for simultaneously manufacturing chip-scale package using lead frame strip with a plurality of lead frames | |
KR20010070229A (ko) | 얇은 프로파일의 상호 연결 구조 | |
KR100386018B1 (ko) | 스택형반도체디바이스패키지 | |
US5299097A (en) | Electronic part mounting board and semiconductor device using the same | |
EP0539075A1 (de) | Halbleiteranordnung mit einem isolierenden Substrat | |
US5410182A (en) | High density semiconductor device having inclined chip mounting | |
EP0221496A2 (de) | Integrierte Schaltungspackung | |
KR19990069438A (ko) | 칩 스택 패키지 | |
US5849609A (en) | Semiconductor package and a method of manufacturing thereof | |
US4661653A (en) | Package assembly for semiconductor device | |
US6747352B1 (en) | Integrated circuit having multiple power/ground connections to a single external terminal |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 19930212 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): DE FR GB |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN |
|
18W | Application withdrawn |
Withdrawal date: 19931130 |