EP0506178A2 - Appareil d'alimentation - Google Patents

Appareil d'alimentation Download PDF

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Publication number
EP0506178A2
EP0506178A2 EP92200760A EP92200760A EP0506178A2 EP 0506178 A2 EP0506178 A2 EP 0506178A2 EP 92200760 A EP92200760 A EP 92200760A EP 92200760 A EP92200760 A EP 92200760A EP 0506178 A2 EP0506178 A2 EP 0506178A2
Authority
EP
European Patent Office
Prior art keywords
power supply
supply apparatus
test
input
variables
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP92200760A
Other languages
German (de)
English (en)
Other versions
EP0506178B1 (fr
EP0506178A3 (en
Inventor
Henricus Johannes Maria Van Der Laar
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV, Koninklijke Philips Electronics NV filed Critical Philips Gloeilampenfabrieken NV
Priority to EP19920200760 priority Critical patent/EP0506178B1/fr
Publication of EP0506178A2 publication Critical patent/EP0506178A2/fr
Publication of EP0506178A3 publication Critical patent/EP0506178A3/en
Application granted granted Critical
Publication of EP0506178B1 publication Critical patent/EP0506178B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G05F1/569—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for protection
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/575—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices characterised by the feedback circuit

Definitions

  • the invention relates to a power supply apparatus for supplying a device with electric energy, comprising at least one test input for receiving a test signal which is dependent on a variable which itself is dependent on the power applied to the device, which test input is connected to a first input of a comparator circuit, a second input of which is connected to a generator which is adapted to generate a reference signal which is a measure of a desired value of said variable, an output of the comparator circuit being connected to a control member which is adapted to control the power applied to the device by the power supply apparatus so that said variable is essentially equal to the desired value.
  • the known power supply apparatus is intended to power a semiconductor laser, a photodiode which is accommodated in the same envelope as the laser generating a photocurrent which is proportional to the light flux of the laser and which constitutes the test signal.
  • the power applied to the laser in the known power supply apparatus can be controlled so that the current produced by the photodiode (monitor) remains constant at a desired value.
  • the control of only one variable involves the risk that the value of another laser variable is no longer within the desired range or, even worse, no longer within the safe range.
  • the power supply apparatus in accordance with the invention is characterized in that the power supply apparatus comprises at least two test inputs with associated comparator circuits, the generator being adapted to generate a number of reference signals which corresponds to the number of test inputs, the control member being adapted to control the power applied to the device by the power supply apparatus so that at least one of the variables corresponding to the test signals is essentially equal to the value desired for the relevant variable, the other variables corresponding to the test signals deviating from the associated desired values in a predetermined sense only.
  • a variable which can in principle be chosen at random can be maintained at the desired value, the other variables, for example all remaining below the desired value so that exceeding of said value and of a higher, dangerous value is precluded. If a deviation of a variable to a value below a given value is deemed risky, the control member should, of course, be adapted so that the relevant variable always remains above an adjusted value which is higher than the "risky" value.
  • the control member may comprise, for example a suitably programmed microprocessor which decides which variable is to be maintained at the desired value in order to keep the other variables below (or above) the desired value.
  • This microprocessor can also control the adjustment of the chosen variable and the monitoring of the other variables.
  • control member can be constructed without including a microprocessor
  • the control member comprises a number of semiconductor diodes which corresponds to the number of test inputs, each semiconductor diode comprising a first and a second connection, the first connections being connected to one another and to a current source circuit, each second connection being connected to the output of one of the comparator circuits.
  • a control member thus constructed satisfies the requirements imposed without requiring further control.
  • the first connection of each of the semiconductor diodes must be an anode connection.
  • test signals include an electric voltage applied to the device and an electric current taken up by the device.
  • An embodiment which is particularly suitable for supplying a semiconductor laser with electric energy is also characterized in that the variables represented by the test signals also include the radiant power of the laser and a signal produced by a monitor connected to the laser.
  • the power supply apparatus shown in the form of a block diagram in Fig. 1 serves to supply a device 1 with electric energy.
  • the device 1 may be, for example a semiconductor laser.
  • the power supply apparatus comprises a test circuit 3 which, in the present embodiment, comprises four test inputs 5a, 5b, 5c, 5d, which can receive test signals from the device 1. The value of each test signal is dependent on a variable which itself is dependent on the power applied to the device 1.
  • the test circuit 3 consists of four sections 3a to 3d, each of which is connected to one of the four test inputs 5a to 5d. The output of each section 3a ... 3d is connected to a first input 7a ... 7d of a comparator circuit 9a ... 9d, a second input 11a ...
  • each comparator circuit 9a ... 9d is connected to an input 15a ... 15d of a control member 17 which controls, via an output stage 19, the power applied to the device 1 so that at least one of the variables corresponding to the test signals is essentially equal to the value desired for the relevant variable, the other variables corresponding to the test signals not being greater than the relevant desired value.
  • Fig. 2 shows an elementary circuit diagram of an embodiment of the control member 17.
  • "Hard" voltages U1 ... U4 are applied to the inputs 15a ... 15d, i.e . voltages originating from voltage sources without internal impedance. This is symbolically represented by unit amplifiers 21a ... 21d preceding the inputs 15a ... 15d.
  • a unit amplifier 25 is also shown to be connected to the output 23 of the control member 17 so as to indicate that the circuit is not loaded by the impedance at the output.
  • the control member 17 comprises four semiconductor diodes 27a ... 27d, each of which comprises a first and a second connection.
  • the first connection is the anode connection and the second connection is the cathode connection.
  • the first connections are connected to one another and to a current source circuit 29.
  • Each of the second connections is connected to one of the inputs 15a ... 15d.
  • the restriction is imposed that there are only two input voltages U1 and U2.
  • the current source 29 applies a constant current I cc to the diodes 27a and 27b.
  • the current will be distributed between the two diodes so that a current I1 flows through the diode 27a and a current I2 flows through the diode 27b.
  • the output voltage U0 is thus defined.
  • I 1 I sat [exp( q kT ( U 0- U 1))-1] (1)
  • I 2 I sat [exp( q kT ( U 0- U 2))-1] (2)
  • Icc I 1+ I 2 (3)
  • I sat represents the saturation current of the diodes
  • q is the charge of the electron
  • k is Boltzmann's constant
  • T is the absolute temperature.
  • Fig. 3 graphically shows the transfer of the control member.
  • the input voltage U1 in the present case, is varied.
  • the other input voltage U2 is maintained constant at an arbitrary value.
  • three regions can be distinguished in the transfer function. 1.U1 ⁇ U2
  • the exponential term with U1 can be ignored relative to that with U2.
  • the constant term with I cc very well approximates the voltage across the diode U D if the diode carries the full current I cc.
  • the output voltage U0 will follow the lowest input voltage at a voltage distance equal to U D .
  • the described variation of the output voltage U0 as a function of the input voltages is graphically shown in Fig. 3. It will be evident that the output voltage is substantially always equal to the smaller one of the two input voltages, except for the diode voltage U D which, however, is constant and known and for which, therefore, correction can be readily made. It is only in the transition region that the output voltage is not exactly equal to one of the two input voltages, but it is never greater than the smaller one of these input voltages. Thus, the device 1 is not endangered and a major advantage of the transition region consists in that no voltage peaks occur upon transition, as would be the case in response to abrupt switching over.
  • the effect of the constant term U D can be eliminated by reducing, for example the input voltages by an amount U D before presentation to the inputs of the control member. Another possibility consists in the reduction of the output voltage U0 by this amount. However, because the control member 17 itself forms part of a closed feedback loop (see Fig. 1), the effect of U D will be reduced by division by the loop gain of the feedback loop.
  • Fig. 4 shows a circuit diagram of an embodiment of the reference signal generator 13.
  • a stabilized reference voltage U REF is formed from a supply voltage U B .
  • Four reference signals I s , U s , M5 and L s can be formed from U REF by means of four accurate potentiometers 35a, 35b, 35c and 35d. If the device 1 is a semiconductor laser, I s and U s may represent desired values of the current I through and the voltage U across the laser, respectively.
  • M s and L s then represent desired values of the output signals M and L of a photodiode which serves as a monitor and which is accommodated within the envelope of the laser, and a sensor measuring the light current of the laser, respectively.
  • the time constant of the combination formed by the capacitor 32 and the resistor 34 enables the reference voltage U REF and the reference signals derived therefrom, to be controlled at a predetermined rate from the value zero to the working point.
  • the parallel connection of the zener diode 31 and the capacitor 32 is connected to the positive input of the operational amplifier 33. When an external signal is superposed on this positive input, the reference signals can be modulated, if desired.
  • the reference signals may in principle have any arbitrary shape; they may also be alternating voltages.
  • Figs. 5A and B show a circuit diagram of an embodiment of a test circuit 3 for obtaining test signals I m , U m , M m and L m which represent the variables I, U, M and L.
  • This test circuit comprises four sections 3a ... 3d.
  • the sections 3a and 3b are shown, together with the semiconductor laser, in Fig. 5A, the sections 3c and 3d being shown in Fig. 5B, together with the semiconductor laser.
  • the semiconductor laser is denoted by the reference numeral 37 in both Figures.
  • the first section 3a comprises a measuring resistor 39 which is connected in series with the laser 37.
  • the voltage across this resistor being proportional to the laser current I, is converted into the test signal U m by means of an operational amplifier 41.
  • the second section 3b comprises two connections 43 and 45 which are connected to the anode and to the cathode, respectively, of the laser 37.
  • the laser voltage U can thus be measured in a currentless manner, so that the voltage drop across the supply leads of the laser is eliminated (four-point measurement).
  • the diode voltage U is converted into the test signal U m .
  • the semiconductor laser 37 is accommodated, together with a photodiode 49 serving as a monitor, in a common envelope 51 (see Fig. 5B).
  • This photodiode forms part of the third section 3c and detects a light current M emerging at the rear of the laser 37.
  • the current thus delivered by the photodiode 49 is converted into the test signal M m by means of an operational amplifier 53.
  • the fourth section 3d of the test circuit 3 comprises a photodiode 55 which is arranged outside the envelope 51 and which detects the light current L produced by the laser 37.
  • the current generated by the photodiode 55 is converted into the test signal L m by means of an operational amplifier 57.
  • Fig. 6 shows a circuit diagram of an embodiment of one of the comparator circuits 9a ... 9d. Only the first comparator circuit 9a is shown, because the other comparator circuits 9b ... 9d are identical thereto.
  • the comparator circuit 9a shown comprises two inputs 11a and 7a which receive the current reference signal I s and the current test signal I m , respectively. These inputs are connected to the positive and the negative input, respectively, of a differential amplifier 59 whose output produces an error signal U1 which represents the difference I s -I m .
  • the other comparator circuits 9b ... 9d produce output signals U2 ...
  • the output signals U1 ... U4 form the input signals for the control member 17 which supplies the control voltage U0 for the semiconductor laser 37.
  • the output signals U1 ... U4 of the differential amplifiers 59 are "hard" voltages, so that the unit amplifiers 21a ... 21d shown in Fig. 2 can actually be dispensed with.
  • the control voltage U0 is applied to the input of the output stage 19, a circuit diagram of an embodiment of which is shown in Fig. 7.
  • the output stage 19 is necessary to ensure that the control memory 17 (Fig. 2) is not loaded by the current to be applied to the semiconductor laser 37. Therefore, the output stage 19 comprises an output transistor 61 which is capable of supplying adequate current so that the unit amplifier 25 shown in Fig. 2 actually can also be dispensed with.
  • the output transistor 61 is controlled by an operational amplifier 63 where to the control voltage U0 is applied and which does not load the output 23 of the control member 17.
  • the output transistor 61 and the measuring resistor 39 see also Fig.
  • Fig. 8 shows an example of the characteristics of a semiconductor laser diode.
  • the curves 65, 67 and 69 represent the variation of the laser voltage U, the radiant power L and the monitor signal M, respectively, as a function of the laser current I.
  • the reference values I s , U s , L s and M s are also shown.
  • M m M s .
  • L the transition region L as well as M is approximately equal to the associated reference value and in any case none of the four variables exceeds the reference value.
  • the power supply apparatus in accordance with the invention is particularly suitable for the supply of energy to a semiconductor laser, notably in measuring and life test set-ups.
  • the apparatus can be used whenever two or more process variables are to be measured and controlled.
  • the invention is not restricted to the adjustment of a component, apparatus or process to a smallest value, given the values of a number of variables.
  • the function of the control member 17 is transformed to the highest setting, given the value of a number of variables, simply by reversing the polarity of the diodes 27a ... 27d (Fig. 2) and the direction of the current I cc .
  • a suitable field of application is the field of electric supply equipment in which generally the electric voltage and current are variables.
  • a four-quadrant power supply is a power supply capable of delivering as well as dissipating power.
  • capacitive, inductive or negative impedances can be driven without giving rise to stability problems, because the invention utilizes real, non-complex measured values of current and voltage.
  • the power supply apparatus can thus also be used as an adjustable load for other power supplies or other equipment.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Semiconductor Lasers (AREA)
EP19920200760 1991-03-25 1992-03-17 Appareil d'alimentation Expired - Lifetime EP0506178B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP19920200760 EP0506178B1 (fr) 1991-03-25 1992-03-17 Appareil d'alimentation

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP91200658 1991-03-25
EP91200658 1991-03-25
EP19920200760 EP0506178B1 (fr) 1991-03-25 1992-03-17 Appareil d'alimentation

Publications (3)

Publication Number Publication Date
EP0506178A2 true EP0506178A2 (fr) 1992-09-30
EP0506178A3 EP0506178A3 (en) 1993-06-09
EP0506178B1 EP0506178B1 (fr) 1996-10-16

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EP19920200760 Expired - Lifetime EP0506178B1 (fr) 1991-03-25 1992-03-17 Appareil d'alimentation

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007008655A1 (de) 2007-02-20 2008-08-21 Henkel Ag & Co. Kgaa Siderophor-Metall-Komplexe als Bleichkatalysatoren
DE102007010785A1 (de) 2007-03-02 2008-09-04 Henkel Ag & Co. Kgaa Verwendung von Superoxid-Dismutasen in Wasch- und Reinigungsmitteln
DE102007017654A1 (de) 2007-04-12 2008-10-16 Henkel Ag & Co. Kgaa Bis(hydroxychinolin)-Metallkomplexe als Bleichkatalysatoren
DE102007017656A1 (de) 2007-04-12 2008-10-16 Henkel Ag & Co. Kgaa Biheteroaryl-Metallkomplexe als Bleichkatalysatoren
DE102007017657A1 (de) 2007-04-12 2008-10-16 Henkel Ag & Co. Kgaa Tris/heterocyclyl)-Metallkomplexe als Bleichkatalysatoren
DE102007036392A1 (de) 2007-07-31 2009-02-05 Henkel Ag & Co. Kgaa Zusammensetzungen enthaltend Perhydrolasen und Alkylenglykoldiacetate
DE102007040326A1 (de) 2007-08-24 2009-02-26 Henkel Ag & Co. Kgaa Wäschevorbehandlungsmittel und -verfahren
DE102008027375A1 (de) 2008-06-09 2009-12-10 Henkel Ag & Co. Kgaa Bacitracin-Metall-Komplexe als Bleichkatalysatoren

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4019105A (en) * 1975-09-26 1977-04-19 General Electric Company Controlled current induction motor drive
JPS60187074A (ja) * 1984-03-07 1985-09-24 Toshiba Corp レ−ザダイオ−ドの自動光量調整回路
DE3726243A1 (de) * 1987-08-07 1989-02-16 Kabelmetal Electro Gmbh Schaltungsanordnung zur regelung der leistung einer laserdiode

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4019105A (en) * 1975-09-26 1977-04-19 General Electric Company Controlled current induction motor drive
JPS60187074A (ja) * 1984-03-07 1985-09-24 Toshiba Corp レ−ザダイオ−ドの自動光量調整回路
DE3726243A1 (de) * 1987-08-07 1989-02-16 Kabelmetal Electro Gmbh Schaltungsanordnung zur regelung der leistung einer laserdiode

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 10, no. 27 (E-378)(2084) 2 April 1986 & JP-A-60 187 074 ( TOSHIBA K.K. ) 24 September 1985 *
PHILIPS TECHNICAL REVIEW vol. 39, no. 2, 1980, EINDHOVEN, NL pages 37 - 47 J.C.J. FINCK ET AL. 'A Semiconductor Laser for Information Read-out' *

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007008655A1 (de) 2007-02-20 2008-08-21 Henkel Ag & Co. Kgaa Siderophor-Metall-Komplexe als Bleichkatalysatoren
DE102007010785A1 (de) 2007-03-02 2008-09-04 Henkel Ag & Co. Kgaa Verwendung von Superoxid-Dismutasen in Wasch- und Reinigungsmitteln
DE102007017654A1 (de) 2007-04-12 2008-10-16 Henkel Ag & Co. Kgaa Bis(hydroxychinolin)-Metallkomplexe als Bleichkatalysatoren
DE102007017656A1 (de) 2007-04-12 2008-10-16 Henkel Ag & Co. Kgaa Biheteroaryl-Metallkomplexe als Bleichkatalysatoren
DE102007017657A1 (de) 2007-04-12 2008-10-16 Henkel Ag & Co. Kgaa Tris/heterocyclyl)-Metallkomplexe als Bleichkatalysatoren
DE102007036392A1 (de) 2007-07-31 2009-02-05 Henkel Ag & Co. Kgaa Zusammensetzungen enthaltend Perhydrolasen und Alkylenglykoldiacetate
DE102007040326A1 (de) 2007-08-24 2009-02-26 Henkel Ag & Co. Kgaa Wäschevorbehandlungsmittel und -verfahren
DE102008027375A1 (de) 2008-06-09 2009-12-10 Henkel Ag & Co. Kgaa Bacitracin-Metall-Komplexe als Bleichkatalysatoren

Also Published As

Publication number Publication date
EP0506178B1 (fr) 1996-10-16
EP0506178A3 (en) 1993-06-09

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