EP0433658A2 - Inverse microscope with integrated photographic light path - Google Patents

Inverse microscope with integrated photographic light path Download PDF

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Publication number
EP0433658A2
EP0433658A2 EP90121866A EP90121866A EP0433658A2 EP 0433658 A2 EP0433658 A2 EP 0433658A2 EP 90121866 A EP90121866 A EP 90121866A EP 90121866 A EP90121866 A EP 90121866A EP 0433658 A2 EP0433658 A2 EP 0433658A2
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EP
European Patent Office
Prior art keywords
beam path
microscope according
prism
observation beam
inverse microscope
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EP90121866A
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German (de)
French (fr)
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EP0433658B1 (en
EP0433658A3 (en
Inventor
Manfred Meyer
Walter Dr. Geis
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Carl Zeiss SMT GmbH
Carl Zeiss AG
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Carl Zeiss SMT GmbH
Carl Zeiss AG
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0088—Inverse microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure

Definitions

  • the photo beam path which generally runs in a horizontal plane
  • the observation beam path which at least in sections also runs horizontally
  • the separation of the photo beam path and the observation beam path is carried out in the area of the vertical total beam path below the objective of the microscope.
  • Devices with this structure are described for example in DE-PS 26 40 974 and DE-OS 34 32 635.
  • the microscope table is relatively high, since a lot of space is required below the objective for the beam switch prisms, some of which can be switched.
  • the photo beam path must already have a certain minimum height above the bottom of the device so that e.g. a winch housing can be used. If the photo beam path runs in the lowest level of the device, the nosepiece and thus also the table of the microscope build very high accordingly.
  • the table of the microscope should be as low as possible so that the operator can manipulate the applied specimen with his arms supported. This is not easily possible with the known devices.
  • this known device also has a relatively large overall height in the area of the table, since here, as with the first two devices, the photo beam path runs in the plane below the prism which causes the beam splitting between the observation beam path and the photo beam path.
  • the only reflector deflecting the observation beam path forms the lowest point in the beam path of the device, which results in a particularly low overall height for the nosepiece and the table. Nevertheless, a sufficient minimum height for the photo beam path can be easily achieved without crossing with the observation beam path.
  • the beam splitter is relatively close to an intermediate image plane.
  • the spatial proximity of this generally switchable beam splitter to the intermediate image plane makes it easier to mechanically couple it to a format graduation plate or focusing aid arranged in the intermediate image plane.
  • the observation beam path expediently runs at a viewing angle of preferably 45 ° to the vertical. Apart from the fact that no further deflection of the observation beam path is required with this dimensioning, this angle has also proven to be expedient from an ergonomic point of view, since the specimen then lies on the threshing surface in the field of vision of the observer and does not require any head movements.
  • the optical element for reflecting the photo beam path is a beam splitter prism through which the observation beam path passes in a straight line. In this case it is possible to manage with a single deflection of the observation beam path.
  • This divider prism can at the same time deflect the photo beam path by repeated reflection, preferably in the desired horizontal direction. Insofar as this redirection by total internal reflection at the entrance surface of the If the prism is used, it is advisable to choose a glass with a refractive index of at least 1.55 for the prism. It is then possible to deflect the beam path at an angle of 45 ° without mirroring the relevant prism surface, even if the full beam angle of the beam path is up to 9 °.
  • inverse microscopes In addition to the integrated photo beam path, inverse microscopes often have a further image output for additional devices, e.g. a television camera.
  • additional devices e.g. a television camera.
  • the reflection into this exit is expediently carried out by a second beam splitter prism through which the observation beam path also passes in a straight line and which deflects the further partial beam path into the vertical by means of two reflections.
  • Vertical image outputs are particularly suitable for additional devices from the point of view of mechanical stability, since the weight of the additional devices can then be intercepted by the microscope housing itself.
  • the microscope shown in Figure 1 has a closed, substantially U-shaped housing (1) on which a preparation table (2) is attached so that it connects the two U-shaped legs of the housing.
  • the vertically displaceable carrier (3) for a focusable nosepiece (4) is mounted in the cutout between the U-shaped legs.
  • the lens (5) is in the working position.
  • a tube light lens (13) of the microscope follows a reflected-light reflector slide (27) (not shown in more detail) for reflecting the illumination beam path.
  • a first intermediate image follows generated. This intermediate image is created at the point at which the format graduation plate (18) described later is located.
  • the tube lens (13) is immediately followed by a reflector (14) which deflects the observation beam path diagonally upwards at an angle of approximately 45 ° towards the viewer.
  • a divider prism (16) is arranged in the observation beam path, which is already directed upwards, between the reflector (14) and the intermediate image plane separates. After reflection on the dividing surface (28) of the prism (16), the photo beam path is redirected again by total internal reflection at the light entry surface of the prism (16) and then runs horizontally.
  • the intermediate image (29) also created in the photo beam path is imaged into the image plane of the camera housing (7) by means of field optics (2) and a subsequent imaging optics (24).
  • the beam splitter prism (16) is laid in the upward beam path as far away from the reflector (14) as possible, that the photo beam path has enough ground clearance to place a winder housing (29) under the camera housing (7).
  • the prism (16) is attached to a slide (15) which has several switching positions. While the divider prism (16) has a beam splitting in the ratio of e.g. 50:50 between the observation beam path and the photo beam path, the beam splitter prism (16) is replaced in one of the switch positions by a correspondingly thick glass plate which allows all light to enter the observation beam path. Beam splitter prisms with other splitting factors or a mirror which reflects all the light into the photo beam path can be arranged on further switch positions of the slide (15).
  • the glass have a refractive index of at least 1.55.
  • the critical angle for total reflection is 39.6 °, so that for the described 45 ° deflection from the observation beam path into the photo beam path, the full aperture angle can even be more than 10 °.
  • This format reticle (18) is located in the intermediate image plane generated by the tube lens (1) in the observation beam path.
  • the reticle also carries a focusing aid (30), which can be used to ensure that the object plane is sharply imaged in the film plane of the camera (7).
  • the graticule (18) is coupled in terms of movement to the prism (16) via the connecting arm (17) and is therefore only visible in the observation beam path when the photo beam path is switched on.
  • a removable interchangeable tube (8) is placed on the end face of the housing (1) of the microscope, which is inclined in the upper part.
  • This interchangeable tube (8) is adapted to the housing (1) with a receiving swallow, carries the binocular tube (9) of the microscope and also has a further output (11) for additional devices such as the television camera (12) partially visible in FIG. 1.
  • the beam path designated P2 for this additional device is reflected from the observation beam path P1 into the vertical.
  • a further beam splitter prism (22) is arranged in the tube (8) behind the tube lens (21), which generates the intermediate image in the eyepieces (10) of the eyepiece tube.
  • the observation beam path passes through this prism (22) in a straight line, while the beam path leading to the camera (12) is reflected once on the divider surface and the base surface of the prism.
  • the prism (22) has the same structure as the prism (16) and is also received on a slide (25) with which free passage into the binocular tube (9) can be switched.
  • the material for the beam splitter prism (116) is then not restricted to glasses with higher refractive index, since the beam that enters and exits can be separated sufficiently from one another via the thickness of the prism (116).

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Camera Data Copying Or Recording (AREA)

Abstract

The microscope has an observation light path (B), which is deflected by a reflector and extends diagonally upwards in the direction towards the viewer, and a photographic light path (P1) extending horizontally in the housing of the microscope. The photographic light path (P1) is reflected out through an optical element (16; 116), which seen in the direction of the light is arranged behind the reflector (14) deflecting the observation light path in the diagonally extending part of the observation light path (B). The observation light path passes in a straight line through this element. This structure enables the stage height of the microscope to be greatly reduced. <IMAGE>

Description

In den bisher bekannten inversen Mikroskopen mit inte­griertem Photostrahlengang sind der in der Regel in einer waagerechten Ebene verlaufende Photostrahlengang und der zumindest abschnittsweise ebenfalls waagerecht verlaufende Beobachtungsstrahlengang in zwei übereinanderliegenden Ebenen geführt. Die Trennung von Photostrahlengang und Beobachtungs­strahlengang wird hierzu im Bereich des senkrecht ver­laufenden Gesamtstrahlenganges unterhalb des Objektivs des Mikroskops vorgenommen. Geräte mit diesem Aufbau sind bei­spielsweise in der DE-PS 26 40 974 und in der DE-OS 34 32 635 beschrieben.In the previously known inverse microscopes with integrated photo beam path, the photo beam path, which generally runs in a horizontal plane, and the observation beam path, which at least in sections also runs horizontally, are guided in two superimposed planes. For this purpose, the separation of the photo beam path and the observation beam path is carried out in the area of the vertical total beam path below the objective of the microscope. Devices with this structure are described for example in DE-PS 26 40 974 and DE-OS 34 32 635.

Dieser Aufbau hat zur Folge, daß der Tisch des Mikroskops relativ hoch liegt, da viel Platz unterhalb des Objektivs für die zum Teil schaltbaren Strahlteilerprismen benötigt wird. Außerdem muß bereits der Photostrahlengang eine bestimmte Mindesthöhe über dem Geräteboden besitzen, damit unter der Kamera z.B. ein Winde-Gehäuse eingesetzt werden kann. Wenn der Photostrahlengang in der untersten Ebene des Gerätes ver­läuft, baut der Objektivrevolver und damit auch der Tisch des Mikroskops entsprechend sehr hoch.The result of this structure is that the microscope table is relatively high, since a lot of space is required below the objective for the beam switch prisms, some of which can be switched. In addition, the photo beam path must already have a certain minimum height above the bottom of the device so that e.g. a winch housing can be used. If the photo beam path runs in the lowest level of the device, the nosepiece and thus also the table of the microscope build very high accordingly.

Unter ergonomischen Gesichtspunkten sollte der Tisch des Mikroskops jedoch möglichst so tief liegen, daß die Bedien­person das aufgelegte Präparat mit aufgestützten Armen mani­pulieren kann. Das ist bei den bekannten Geräten nicht ohne weiteres möglich.From an ergonomic point of view, however, the table of the microscope should be as low as possible so that the operator can manipulate the applied specimen with his arms supported. This is not easily possible with the known devices.

In der DE-OS 34 32 635 ist bereits vorgeschlagen worden, den Photostrahlengang in der Ebene oberhalb des Beobachtungs­strahlenganges zu führen. Dies bedingt jedoch, daß sich Be­obachtungsstrahlengang und Photostrahlengang nochmals kreuzen, wodurch sich andere, konstruktive Einschränkungen ergeben. Zudem ist der Beobachtungsstrahlengang in den be­kannten Geräten mehrfach, biz zu 5 x umgelenkt und diese vielen Strahlumlenkungen machen das Gerät relativ aufwendig und wirken sich außerdem negativ auf die Bildqualität aus.In DE-OS 34 32 635 it has already been proposed to guide the photo beam path in the plane above the observation beam path. However, this means that the observation beam path and the photo beam path change again cross, which results in other, constructive restrictions. In addition, the observation beam path in the known devices is deflected multiple times, up to 5 times, and these many beam deflections make the device relatively complex and also have a negative effect on the image quality.

Aus dem Firmenprospekt "Nikon Epiphot" der Nippon Kogaku KK ist ein inverses Mikroskop mit integriertem Photostrahlengang bekannt, dessen Beobachtungsstrahlengang durch einen einzigen Reflektor aus dem unterhalb des Objektivs senkrecht ver­laufenden Gesamtstahlengang schräg nach oben in Richtung auf den Betrachter umgelenkt wird. Der Winkel, unter dem der Beobachtungsstrahlengang verläuft, ist mit dem Einblickwinkel in die Okulare identisch.An inverted microscope with an integrated photo beam path is known from the company brochure "Nikon Epiphot" of the Nippon Kogaku KK, the observation beam path of which is deflected diagonally upwards towards the viewer by a single reflector from the total beam path running vertically below the lens. The angle at which the observation beam path runs is identical to the viewing angle into the eyepieces.

Aber auch dieses bekannte Gerät besitzt eine relativ große Bauhöhe im Bereich des Tisches, da hier wie bei den beiden erstgenannten Geräten der Photostrahlengang in der Ebene unterhalb des die Strahlaufteilung zwischen Beobachtungs­strahlengang und Photostrahlengang bewirkenden Prisma ver­läuft.But this known device also has a relatively large overall height in the area of the table, since here, as with the first two devices, the photo beam path runs in the plane below the prism which causes the beam splitting between the observation beam path and the photo beam path.

Es ist die Aufgabe der vorliegenden Erfindung ein inverses Mikroskop mit integriertem Photostahlengang zu schaffen, das sich durch einen einfachen und kompkaten Aufbau mit möglichst wenigen Stahlumlenkungen für den Beobachtungsstrahlengang auszeichnet und einen möglichst tiefliegenden Objekttisch besitzt.It is the object of the present invention to create an inverse microscope with an integrated photo beam path, which is characterized by a simple and compact structure with as few steel deflections as possible for the observation beam path and which has an object table that is as deep as possible.

Diese Aufgabe wird mit den im Anspruch 1 angegebenen Maßnahmen gelöst.This object is achieved with the measures specified in claim 1.

Da die Ausspiegelung des Photostrahlenganges aus dem bereits diagonal nach oben in Richtung auf den Betrachter ver­laufenden Beobachtungsstrahlengang heraus erfolgt, braucht unterhalb des Objektivs nur sehr wenig Optik angeordnet zu werden. Entsprechend bildet der einzige, den Beobachtungs­strahlengang umlenkende Reflektor den tiefsten Punkt im Strahlengang des Gerätes, was eine besonders niedrige Bauhöhe für den Objektivrevolver und den Tisch zur Folge hat. Dennoch läßt sich ohne weiteres eine ausreichende Mindesthöhe für den Photostrahlengang ohne Überkreuzung mit dem Beobachtungs­strahlengang erzielen.Since the reflection of the photo beam path takes place out of the observation beam path already running diagonally upwards in the direction of the viewer, only very little optics need be arranged below the objective will. Accordingly, the only reflector deflecting the observation beam path forms the lowest point in the beam path of the device, which results in a particularly low overall height for the nosepiece and the table. Nevertheless, a sufficient minimum height for the photo beam path can be easily achieved without crossing with the observation beam path.

Schließlich befindet sich das den Photostrahlengang aus­spiegelnde optische Element, d.h. der Strahlteiler relativ nahe an einer Zwischenbildebene. Die räumliche Mähe dieses in der Regel schaltbaren Strahlteilers zur Zwischenbildebene erleichtert es, ihn mit einer in der Zwischenbildebene ange­ordneten Formatstrichplatte oder Fokussierhilfe mechanisch zu koppeln.Finally, there is the optical element reflecting the photo beam path, i.e. the beam splitter is relatively close to an intermediate image plane. The spatial proximity of this generally switchable beam splitter to the intermediate image plane makes it easier to mechanically couple it to a format graduation plate or focusing aid arranged in the intermediate image plane.

Der Beobachtungsstrahlengang verläuft zweckmäßig unter dem Einblickwinkel von vorzugsweise 45° gegen die Vertikale. Abgesehen, daß bei dieser Dimensionierung keine weitere Um­lenkung des Beobachtungsstrahlenganges erforderlich ist, hat sich dieser Winkel auch unter ergonomischen Gesichtspunkten als zweckmäßig erwiesen, da dann das Präparat auf der Trisch­fläche im Blickfeld des Beobachters liegt und keine Kopfbe­wegungen erfordert.The observation beam path expediently runs at a viewing angle of preferably 45 ° to the vertical. Apart from the fact that no further deflection of the observation beam path is required with this dimensioning, this angle has also proven to be expedient from an ergonomic point of view, since the specimen then lies on the threshing surface in the field of vision of the observer and does not require any head movements.

Es ist vorteilhaft, wenn das optische Element zur Aus­spiegelung des Photostrahlenganges ein Strahlteilerprisma ist, durch das der Beobachtungsstrahlengang geradlinig hin­durchtritt. In diesem Falle ist es möglich, mit einer einzigen Umlenkung des Beobachtungsstrahlenganges auszu­kommen.It is advantageous if the optical element for reflecting the photo beam path is a beam splitter prism through which the observation beam path passes in a straight line. In this case it is possible to manage with a single deflection of the observation beam path.

Dieses Teilerprisma kann gleichzeitig den Photostrahlengang durch nochmalige Reflexion, vorzugsweise in die gewünschte horizontale Richtung, umlenken. Insoweit diese Umlenkung durch innere Totalreflexion an der Eintrittsfläche des Prismas erfolgt, ist es zweckmäßig, für das Prisma ein Glas mit einem Brechungsindex von wenigstens 1,55 zu wählen. Es ist dann nämlich möglich, ohne Verspiegeln der betreffenden Prismenfläche den Strahlengang im Winkel von 45° umzulenken, auch wenn der volle Öffnungswinkel des Strahlenganges bis zu 9° beträgt.This divider prism can at the same time deflect the photo beam path by repeated reflection, preferably in the desired horizontal direction. Insofar as this redirection by total internal reflection at the entrance surface of the If the prism is used, it is advisable to choose a glass with a refractive index of at least 1.55 for the prism. It is then possible to deflect the beam path at an angle of 45 ° without mirroring the relevant prism surface, even if the full beam angle of the beam path is up to 9 °.

Inverse Mikroskope besitzen neben dem integrierten Photo­strahlengang oft einen weiteren Bildausgang für Zusatzgeräte, wie z.B. eine Fernsehkamera. Die Ausspiegelung in diesen Ausgang erfolgt zweckmäßig durch ein zweites Strahlteiler­prisma, durch das der Beobachtungsstrahlengang ebenfalls geradlinig hindurchtritt und das den weiteren Teilstrahlen­gang durch zweimalige Reflexion in die Vertikale umlenkt. Vertikale Bildausgänge eignen sich insbesonders unter dem Gesichtspunkt mechanischer Stabilität gut für Zusatzgeräte, da sich dann das Gewicht der Zusatzgeräte durch das Mikros­kopgehäuse selbst abfangen läßt.In addition to the integrated photo beam path, inverse microscopes often have a further image output for additional devices, e.g. a television camera. The reflection into this exit is expediently carried out by a second beam splitter prism through which the observation beam path also passes in a straight line and which deflects the further partial beam path into the vertical by means of two reflections. Vertical image outputs are particularly suitable for additional devices from the point of view of mechanical stability, since the weight of the additional devices can then be intercepted by the microscope housing itself.

Weitere Vorteile der Erfindung ergeben sich aus der nachfolgenden Beschreibung eines Ausführungsbeispiels anhand der Figuren 1-3 der beigefügten Zeichnungen.

  • Figur 1 Ist eine Schnittzeichnung eines inversen Mikroskops in einer vertikalen Ebene und zeigt den optischen und mechanischen Aufbau des Gerätes;
  • Figur 2 zeigt die Formatstrichplatte (18) aus Figur 1 in Aufsicht in vergrößertem Maßstabe;
  • Figur 3 ist eine Skizze, die eine alternative Ausfüshrungs­form für den Strahlteiler (16) in Figur 1 dar­stellt.
Further advantages of the invention result from the following description of an exemplary embodiment with reference to FIGS. 1-3 of the accompanying drawings.
  • Figure 1 is a sectional drawing of an inverted microscope in a vertical plane and shows the optical and mechanical structure of the device;
  • Figure 2 shows the format graduation plate (18) of Figure 1 in supervision on an enlarged scale;
  • Figure 3 is a sketch illustrating an alternative embodiment for the beam splitter (16) in Figure 1.

Das in Figur 1 dargestellte Mikroskop besitzt ein ge­schlossenes, im wesentlichen U-förmiges Gehäuse (1), auf dem ein Präparattisch (2) so befestigt ist, daß er die beiden U-­förmigen Schenkel des Gehäuses verbindet. Im Ausbruch zwischen den U-förmigen Schenkeln ist der vertikal verschieb­bare Träger (3) für einen fokussierbaren Objektivrevolver (4) gelagert. In der Darstellung nach Figur 1 befindet sich das Objektiv (5) in Arbeitstellung.The microscope shown in Figure 1 has a closed, substantially U-shaped housing (1) on which a preparation table (2) is attached so that it connects the two U-shaped legs of the housing. The vertically displaceable carrier (3) for a focusable nosepiece (4) is mounted in the cutout between the U-shaped legs. In the illustration according to FIG. 1, the lens (5) is in the working position.

In dem vertikal nach unten verlaufenden Strahlengang in Lichtrichtung hinter dem Objektiv (5) folgt auf einen nicht näher dargestellten Auflichtreflektorschieber (27) zur Ein­spiegelung des Beleuchtungsstrahlenganges die Tubuslinse (13) des Mikroskops, die in Verbindung mit den auf Schnittweite unendlich korrigierten Objektiven ein erstes Zwischenbild erzeugt. Dieses Zwischenbild entsteht an der Stelle, an der sich die nachher noch beschriebene Formatstrichplatte (18) befindet.In the beam path running vertically downwards in the direction of light behind the lens (5), a tube light lens (13) of the microscope follows a reflected-light reflector slide (27) (not shown in more detail) for reflecting the illumination beam path. In conjunction with the lenses, which are infinitely corrected for the focal length, a first intermediate image follows generated. This intermediate image is created at the point at which the format graduation plate (18) described later is located.

Auf die Tubuslinse (13) folgt unmittelbar ein Reflektor (14), der den Beobachtungsstrahlengang unter einem Winkel von ca. 45° diagonal nach oben in Richtung auf den Betrachter um­lenkt. Im bereits aufwärts gerichteten Beobachtungsstrahlen­gang zwischen dem Reflektor (14) und der Zwischenbildebene ist ein Teilerprisma (16) angeordnet, das den zu einer Kamera (7) am Photoausgang (6) an der Frontseite des Gerätes ver­laufenden, mit P1 bezeichneten Photostrahlengang von dem Beobachtungsstrahlengang B trennt. Hierbei wird der Photo­strahlengang nach Reflexion an der Teilerfläche (28) des Prismas (16) nochmals an der Lichteintrittsfläche des Prismas (16) durch innere Totalreflexion umgelenkt und verläuft danach waagerecht. Das auch im Photostrahlengang entstehende Zwischenbild (29) wird mittels einer Feldoptik (2) und einer darauffolgenden Abbildungsoptik (24) in die Bildebene des Kameragehäuses (7) abgebildet.The tube lens (13) is immediately followed by a reflector (14) which deflects the observation beam path diagonally upwards at an angle of approximately 45 ° towards the viewer. A divider prism (16) is arranged in the observation beam path, which is already directed upwards, between the reflector (14) and the intermediate image plane separates. After reflection on the dividing surface (28) of the prism (16), the photo beam path is redirected again by total internal reflection at the light entry surface of the prism (16) and then runs horizontally. The intermediate image (29) also created in the photo beam path is imaged into the image plane of the camera housing (7) by means of field optics (2) and a subsequent imaging optics (24).

Das Strahlteilerprisma (16) ist im aufwärts verlaufenden Strahlengang soweit vom Reflektor (14) weg nach oben verlegt, daß der Photostrahlengang genügend Bodenfreiheit besitzt, um unter das Kameragehäuse (7) auch noch ein Winder-Gehäuse (29) anzusetzen.The beam splitter prism (16) is laid in the upward beam path as far away from the reflector (14) as possible, that the photo beam path has enough ground clearance to place a winder housing (29) under the camera housing (7).

Das Prisma (16) ist auf einem Schieber (15) befestigt, der mehrere Schaltstellungen besitzt. Während das Teilerprisma (16) eine Strahlteilung im Verhältnis von z.B. 50:50 zwischen Beobachtungsstrahlengang und Photostrahlengang bewirkt, ist in einer der Schaltstellungen das Strahlteilerprisma (16) durch eine entsprechend dicke Glasplatte ersetzt, die alles Licht in den Beobachtungsstralengang gelangen läßt. Auf weiteren Schaltplätzen des Schiebers (15) können Strahlteilerprismen mit anderen Teilerfaktoren oder ein Spiegel angeordnet werden, der alles Licht in den Photostrahlengang reflektiert.The prism (16) is attached to a slide (15) which has several switching positions. While the divider prism (16) has a beam splitting in the ratio of e.g. 50:50 between the observation beam path and the photo beam path, the beam splitter prism (16) is replaced in one of the switch positions by a correspondingly thick glass plate which allows all light to enter the observation beam path. Beam splitter prisms with other splitting factors or a mirror which reflects all the light into the photo beam path can be arranged on further switch positions of the slide (15).

Da die Basisfläche des Prisma (16), die den Photostrahlengang umlenkt, gleichzeitig als Lichteintrittsfläche dient und somit eine Verspiegelung nicht erfolgen kann, ist durch eine geeignete Auswahl des Prismenmaterials gewährleistet, daß auch für Öffnungswinkel von 9° der Grenzwinkel für Totalreflexion an der Prismenfläche nicht unterschritten wird. Hierfür ist erforderlich, daß das Glas mindestens eine Brechzahl von 1,55 besitzt. Im konkreten Ausführungsbeispiel wurde für das Prisma das Glas BAK4 mit einer Brechzahl von n (d) = 1,57 gewählt. Dort ergibt sich der Grenzwinkel für die Totalreflexion zu 39,6°, so daß für die beschriebene 45°-­Umlenkung aus dem Beobachtungsstrahlengang in den Photo­strahlengang der volle Öffnungswinkel sogar mehr als 10° betragen kann.Since the base surface of the prism (16), which deflects the photo beam path, also serves as a light entry surface and thus cannot be mirrored, a suitable selection of the prism material ensures that the critical angle for total reflection at the prism surface is not even for an aperture angle of 9 ° is undercut. This requires that the glass have a refractive index of at least 1.55. In the specific exemplary embodiment, the glass BAK4 with a refractive index of n (d) = 1.57 was chosen for the prism. There, the critical angle for total reflection is 39.6 °, so that for the described 45 ° deflection from the observation beam path into the photo beam path, the full aperture angle can even be more than 10 °.

Am Schieber (15) ist über einen Verbindungsarm (17) gleichzeitig die Fassung für eine Formatstrichplatte (18) befestigt. Diese Formatstrichplatte (18) befindet sich in der von der Tubuslinse (1) erzeugten Zwischenbildebene im Be­obachtungsstrahlengang. Die Strichplatte trägt außerdem noch ein Fokussierhilfe (30), mit deren Hilfe sichergestellt werden kann, daß die Objektebene scharf in die Filmebene der Kamera (7) abgebildet wird. Die Strichtplatte (18) ist über den Verbindungsarm (17) bewegungsmäßig mit dem Prisma (16) gekoppelt und deshalb nur bei eingeschaltetem Photostrahlengang im Beobachtungsstrahlengang sichtbar.At the slide (15) via a connecting arm (17) at the same time the socket for a format plate (18) is attached. This format reticle (18) is located in the intermediate image plane generated by the tube lens (1) in the observation beam path. The reticle also carries a focusing aid (30), which can be used to ensure that the object plane is sharply imaged in the film plane of the camera (7). The graticule (18) is coupled in terms of movement to the prism (16) via the connecting arm (17) and is therefore only visible in the observation beam path when the photo beam path is switched on.

Im Strahlengang hinter der Strichplatte (18) folgt in Lichtrichtung gesehen wider eine Feldoptik (19) sowie eine weitere Optik (20), die einen telezentrischen Strahlengang erzeugt.In the beam path behind the graticule (18), seen in the direction of light, is followed by field optics (19) and another optic (20) that generates a telecentric beam path.

Auf die im oberen Teil geneigte Stirnfläche des Gehäuses (1) des Mikroskops ist ein abnehmbarer Wechseltubus (8) gesetzt. Dieser Wechseltubus (8) ist mit einer Aufnahmeschwalbe an das Gehäuse (1) adaptiert, trägt den Binokulartubus (9) des Mikroskops und besitzt außerdem einen weiteren Ausgang (11) für Zusatzgeräte wie die in Figur 1 teilweise sichtbare Fern­sehkamera (12). Der mit P2 bezeichnete Strahlengang für dieses Zusatzgerät ist aus dem Beobachtungsstrahlengang P1 in die Vertikale ausgespiegelt. Hierzu ist in Tubus (8) hinter der Tubuslinse (21), die das Zwischenbild in den Okularen (10) des Okulartubus erzeugt, ein weiteres Strahlteilerprisma (22) angeordnet. Durch dieses Prisma (22) tritt der Be­obachtungsstrahlengang geradlinig hindurch, während der zur Kamera (12) führende Strahlengang an der Teilerfläche und der Basisfläche des Prismas je einmal reflektiert wird. Das Prisma (22) besitzt den gleichen Aufbau wie das Prisma (16) und ist ebenfalls auf einem Schieber (25) aufgenommen, mit dem auf freien Durchgang in den Binokulartubus (9) geschaltet werden kann.A removable interchangeable tube (8) is placed on the end face of the housing (1) of the microscope, which is inclined in the upper part. This interchangeable tube (8) is adapted to the housing (1) with a receiving swallow, carries the binocular tube (9) of the microscope and also has a further output (11) for additional devices such as the television camera (12) partially visible in FIG. 1. The beam path designated P2 for this additional device is reflected from the observation beam path P1 into the vertical. For this purpose, a further beam splitter prism (22) is arranged in the tube (8) behind the tube lens (21), which generates the intermediate image in the eyepieces (10) of the eyepiece tube. The observation beam path passes through this prism (22) in a straight line, while the beam path leading to the camera (12) is reflected once on the divider surface and the base surface of the prism. The prism (22) has the same structure as the prism (16) and is also received on a slide (25) with which free passage into the binocular tube (9) can be switched.

Es ist nicht unbedingt erforderlich, die Ausspiegelung in den Photostrahlengang P1 bzw. in den zusätzlichen Bildausgang (11) und die Strahlumlenkung in die Horizontale bzw. die Vertikale durch die dargestellten einteiligen Spiegelprismen (16) bzw. (22) vorzunehmen. Vielmehr ist es auch möglich, für die auf die Teilerfläche folgende Strahlumlenkung einen separaten Spiegel (119) vorzusehen, wie das in dem alter­nativen Ausführungsbeispiel nach Figur dargestellt ist. Das Prisma (116) besitzt dann allein die Funktion eines Strahl­teilers.It is not absolutely necessary that the reflection into the photo beam path P1 or into the additional image output (11) and the beam deflection into the horizontal or the vertical through the one-piece mirror prisms shown (16) or (22). Rather, it is also possible to provide a separate mirror (119) for the beam deflection following the divider surface, as is shown in the alternative exemplary embodiment according to the figure. The prism (116) then functions solely as a beam splitter.

Diese Lösung bietet sich an, wenn an der Stelle, an der der Photostrahlengang aus dem Beobachtungsstrahlengang ausge­spiegelt wird, genügend Platz vorhanden ist. Im Material für das Strahlteilerprisma (116) ist man dann nicht auf höher­brechende Gläser eingeschränkt, da über die Dicke des Prisma (116) der eintretende und austretende Strahl ausreichend voneinander separiert werden können.This solution is appropriate if there is enough space at the point at which the photo beam path is reflected out of the observation beam path. The material for the beam splitter prism (116) is then not restricted to glasses with higher refractive index, since the beam that enters and exits can be separated sufficiently from one another via the thickness of the prism (116).

Claims (10)

1. Inverses Mikroskop mit einem durch einen Reflektor umge­lenkten, diagonal nach oben in Richtung auf den Be­trachter verlaufenden Beobachtungsstrahlengang (B) und mindestens einem in das Gehäuse des Mikroskop inte­grierten Photostrahlengang (P1), dadurch gekennzeichnet, daß die Ausspiegelung des Photostrahlenganges (P1) durch ein optisches Element (16; 116) erfolgt, das in Licht­richtung gesehen hinter dem den Beobachtungsstrahlgengang umlenkenden Reflektor (14) im diagonal verlaufenden Teil des Beobachtungsstrahlenganges (B) angeordnet ist.1. Inverse microscope with a deflected by a reflector, running diagonally upwards in the direction of the viewer observation beam path (B) and at least one integrated into the housing of the microscope photo beam path (P1), characterized in that the reflection of the photo beam path (P1) by an optical element (16; 116) takes place, which, viewed in the direction of light, is arranged behind the reflector (14) deflecting the observation beam path in the diagonally extending part of the observation beam path (B). 2. Inverses Mikroskop nach Anspruch 1, dadurch ge­kennzeichnet, daß das optische Element (16; 116) ein Teilerprisma ist, durch das der Beobachtungsstrahlengang geradlinig hindurchtritt.2. Inverse microscope according to claim 1, characterized in that the optical element (16; 116) is a divider prism through which the observation beam path passes in a straight line. 3. Inverses Mikroskop nach Anspruch 2, dadurch ge­kennzeichnet, daß das Teilerprisma (16) den ausge­spiegelten Photostrahlengang (P1) durch nochmalige Re­flexion vorzugsweise in eine horizontale Richtung um­lenkt.3. Inverse microscope according to claim 2, characterized in that the divider prism (16) deflects the mirrored photo beam path (P1) by repeated reflection, preferably in a horizontal direction. 4. Inverses Mikroskop nach Anspruch 2, dadurch ge­kennzeichnet, daß das Teilerprisma (16; 116) auf einem Schieber (15; 115) bzw. Revolver mit mindestens zwei Schaltstellungen angeordnet ist und in einer Schalt­stellung des Schiebers bzw. Revolvers alles Licht allein in den Beobachtungsstrahlengang (B) durchgelassen ist.4. Inverse microscope according to claim 2, characterized in that the divider prism (16; 116) is arranged on a slide (15; 115) or turret with at least two switching positions and in a switching position of the slide or turret all light alone in the Observation beam path (B) is passed. 5. Inverses Mikroskop nach Anspruch 4, dadurch ge­kennzeichnet, daß das Teilerprisma (16; 116) in der Nähe einer Zwischenbildebene angeordnet ist und der Schieber (15; 115) bzw. Revolver mit einer in die Zwischenbild­ebene einschaltbaren Formatstrichplatte (18; 118) bzw. Fokussierhilfe gekoppelt ist.5. Inverted microscope according to claim 4, characterized in that the divider prism (16; 116) is arranged in the vicinity of an intermediate image plane and the slide (15; 115) or turret with a format graduation plate (18; 118) or switchable into the intermediate image plane . Focusing aid is coupled. 6. Inverses Mikroskop nach Anspruch 2, dadurch ge­kennzeichnet, daß das Teilerprisma (16) aus Glas mit einem Brechungsindex von wenigstens 1,55 besteht.6. Inverse microscope according to claim 2, characterized in that the divider prism (16) consists of glass with a refractive index of at least 1.55. 7. Inverses Mikroskop nach Anspruch 1, dadurch ge­kennzeichnet, daß der Beobachtungsstrahlengang (B) unter einem Winkel von vorzugsweise 45° gegen die Vertikale verläuft.7. Inverse microscope according to claim 1, characterized in that the observation beam path (B) extends at an angle of preferably 45 ° to the vertical. 8. Inverses Mikroskop nach Anspruch 2, dadurch ge­kennzeichnet, daß im Beobachtungsstrahlengang vor dem Binokulartubus (9) ein zweites, zur Ausppiegelung in Richtung auf einen weiteren Bildausgang dienendes optisches Element (22) angeordnet ist.8. Inverse microscope according to claim 2, characterized in that in the observation beam path in front of the binocular tube (9), a second optical element (22) is used for mirroring in the direction of a further image output. 9. Inverses Mikroskop nach Anspruch 8, dadurch ge­kennzeichnet, daß das zweite optische Element ein Strahl­teilerprisma (22) ist, durch das der Beobachtungs­strahlengang (B) geradlinig hindurchtritt.9. Inverse microscope according to claim 8, characterized in that the second optical element is a beam splitter prism (22) through which the observation beam path (B) passes in a straight line. 10. Inverses Mikroskop nach Anspruch 9, dadurch ge­kennzeichnet, daß das zweite Strahlteilerprisma (22) den ausgespiegelten Teilstrahlengang (P2) durch nochmalige Reflexion in die vertikale Richtung umlenkt.10. Inverse microscope according to claim 9, characterized in that the second beam splitter prism (22) deflects the reflected partial beam path (P2) by repeated reflection in the vertical direction.
EP90121866A 1989-11-18 1990-11-15 Inverse microscope with integrated photographic light path Expired - Lifetime EP0433658B1 (en)

Applications Claiming Priority (2)

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DE3938413 1989-11-18
DE3938413A DE3938413A1 (en) 1989-11-18 1989-11-18 INVERSE MICROSCOPE WITH INTEGRATED PHOTO BEAM

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EP0433658A2 true EP0433658A2 (en) 1991-06-26
EP0433658A3 EP0433658A3 (en) 1992-04-15
EP0433658B1 EP0433658B1 (en) 1998-04-15

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BE1008287A6 (en) * 1994-05-17 1996-03-05 Ceti Nv CAMERA DEVICE FOR A MICROSALE AND MICROSHIPS EQUIPPED WITH THIS.
JP5371694B2 (en) 2009-10-26 2013-12-18 オリンパス株式会社 Microscope connection unit and microscope system

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4440475A (en) * 1981-01-23 1984-04-03 Compagnie D'applications Mecaniques A L'electronique, Au Cinema Et A L'atomistique (C.A.M.E.C.A.) Electron probe microanalyzer comprising an observation system having double magnification
DE3432635A1 (en) * 1983-09-05 1985-04-04 Olympus Optical Co., Ltd., Tokio/Tokyo MICROSCOPE
US4770520A (en) * 1987-04-08 1988-09-13 Cambridge Instruments Inc. Protective cover for turret assembly of an optical instrument
DE3744156A1 (en) * 1987-12-24 1989-07-13 Reichert Optische Werke Ag Inverse microscope for transmitted illumination (transillumination)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE721942C (en) * 1938-05-28 1942-06-24 Zeiss Carl Fa microscope
US3437395A (en) * 1965-09-03 1969-04-08 Bausch & Lomb Optical system for inverted microscope

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4440475A (en) * 1981-01-23 1984-04-03 Compagnie D'applications Mecaniques A L'electronique, Au Cinema Et A L'atomistique (C.A.M.E.C.A.) Electron probe microanalyzer comprising an observation system having double magnification
DE3432635A1 (en) * 1983-09-05 1985-04-04 Olympus Optical Co., Ltd., Tokio/Tokyo MICROSCOPE
US4770520A (en) * 1987-04-08 1988-09-13 Cambridge Instruments Inc. Protective cover for turret assembly of an optical instrument
DE3744156A1 (en) * 1987-12-24 1989-07-13 Reichert Optische Werke Ag Inverse microscope for transmitted illumination (transillumination)

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DE3938413A1 (en) 1991-05-23
JPH03172817A (en) 1991-07-26
DE59010819D1 (en) 1998-05-20
EP0433658B1 (en) 1998-04-15
EP0433658A3 (en) 1992-04-15
ATE165171T1 (en) 1998-05-15
JP3069911B2 (en) 2000-07-24

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