EP0341454B1 - Broche de contact pour tester la fonction des circuits imprimés - Google Patents

Broche de contact pour tester la fonction des circuits imprimés Download PDF

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Publication number
EP0341454B1
EP0341454B1 EP89106910A EP89106910A EP0341454B1 EP 0341454 B1 EP0341454 B1 EP 0341454B1 EP 89106910 A EP89106910 A EP 89106910A EP 89106910 A EP89106910 A EP 89106910A EP 0341454 B1 EP0341454 B1 EP 0341454B1
Authority
EP
European Patent Office
Prior art keywords
contact
contact pin
contact head
tip
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP89106910A
Other languages
German (de)
English (en)
Other versions
EP0341454A3 (en
EP0341454A2 (fr
Inventor
Daniel Dr.-Ing. Bethge
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wincor Nixdorf International GmbH
Original Assignee
Wincor Nixdorf International GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wincor Nixdorf International GmbH filed Critical Wincor Nixdorf International GmbH
Publication of EP0341454A2 publication Critical patent/EP0341454A2/fr
Publication of EP0341454A3 publication Critical patent/EP0341454A3/de
Application granted granted Critical
Publication of EP0341454B1 publication Critical patent/EP0341454B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe

Definitions

  • the invention relates to a contact pin of the type mentioned in the preamble of the claim.
  • Such contact pins are used, for example, for the creation of so-called test adapters. These consist of a plate that is equipped with numerous contact pins; the circuit board to be tested is placed in precise alignment on the test adapter, the contact pins coming into contact with certain test points on the underside of the circuit board. The contact pins are in turn connected to a test circuit. In order to ensure a largely identical pressure of all contact pins on the assigned test points, the contact pins are generally resiliently mounted in sleeves, which in turn are inserted into the plate of the test adapter. The contact pressure is determined by the design of the springs and the contact pins the compression of these springs determines.
  • the test points of the printed circuit board can be formed, for example, by soldering eyes, plated-through holes or also pins of electronic components protruding beyond the underside of the printed circuit board.
  • soldering eyes In order to do justice to the different designs of the soldering points, numerous different contact head shapes have been developed (brochure from INGUN-System, in particular pages 4 to 7).
  • tapered contact heads with different angles are provided for contacting soldering eyes (e.g. Form 01, Form 15, Form 31).
  • Contact heads with a relatively small cone angle must be used so that flux medium residues, oxide layers or other residues on the soldering eye can be safely penetrated and a perfect contact is made.
  • the slender tips thus formed are very susceptible to wear, so that the number of test procedures with such contact pins is limited.
  • the contact heads may have to be made of expensive, high-strength material.
  • Another way to reduce the wear of the cone tip is to make it less slim.
  • this requires a higher pressure force for the contact pin, which generally also requires stronger contact pins and larger sleeves and pressure springs.
  • Special contact heads e.g. Form 07, Form 17
  • These contact heads are triangular or hexagonal so that existing oxide or contamination layers are reliably penetrated at the leading edges of the plated-through holes formed (CH-A-589947) so that they have several sharp cutting edges.
  • Such contact heads are very complex and expensive to manufacture.
  • it must be regarded as a disadvantage that different contact pins have to be used for the two frequently occurring configurations of the contact points, namely soldering eyes or through-bores, which considerably increases the effort, for example, in warehousing or equipping the test adapter.
  • the basic shape of the contact head is tapered; In its simplest and cheapest version, it is circular-conical. In the area of the contact head tip, it is provided with a ground plane parallel to the contact pin axis and running through the contact head tip. This creates a wedge-shaped cutting edge in the area of the tip. It has been shown that with a contact head designed in this way, a foreign layer covering a soldering eye is penetrated much more easily than with conventional contact heads. It is therefore possible, compared to known contact heads intended for the same task, to have obtuse tip angles and lower pressing forces to use. This also results in a reduction in wear. But even if the outermost tip of the contact head already shows wear, the cutting edges emanating from this tip still remain effective, so that the service life of a contact pin designed according to the invention is considerably longer than that of conventional, known contact pins.
  • the cutting edges delimiting the ground plane also allow the contact pin according to the invention to be used in so-called via bores, since these cutting edges can cut through an oxide or contamination layer which may be present on the leading edge of the via bore.
  • the contact pin according to the invention is therefore suitable for the two very frequently occurring contacting tasks, namely the contacting of soldering eyes and of plated-through holes.
  • the circular cone has a tip angle of between 50 ° and 70 °, preferably about 60 °. As already described further above, such a relatively obtuse tip angle is less prone to wear, so that a long service life for the contact pin is ensured.
  • Essentially funnel-shaped contact heads are used for contacting component legs, wire-wrap posts or the like, which catch the component legs even with certain lateral deviations and center them at the bottom of the funnel (INGUN system brochure, form 03, form 04) .
  • the invention is in a further embodiment It is provided that at the foot of the convergingly tapered contact head a groove is formed that extends over the entire circumference of the foot and is open towards the tip of the contact head. If the contact pin according to the invention comes into contact with a component leg or the like, this will generally slide off on the convergingly tapered surface of the contact head until it is caught by the groove.
  • the contact head according to the invention manages with a lower pressure force, it can be made slimmer overall, so that the grid density on the test adapter can be increased when using the contact pins according to the invention.
  • the contact pin 2 shown in Figure 1 consists of a shaft 4 and a contact head 6 formed at the free end of the shaft 4.
  • the contact head 6 is essentially designed as a circular cone 8.
  • the apex angle ⁇ of the circular cone 8 is approximately 60 °.
  • the circular cone 8 is provided in the region of the contact head tip 12 with a ground plane 14 running parallel to the contact pin axis 10 and running through the contact head tip 12.
  • a channel 18 is formed which extends over the entire circumference of the foot and is open towards the contact head tip 12. This serves to catch and pick up component feet sliding on the contact head 6 in order to also make it possible to contact such component feet, as will be explained further below.
  • FIG. 2 shows a plan view of the tip of the contact head 6 and in particular also shows the grinding surface 14 and the groove 18 running around the entire circumference of the foot of the contact head 6.
  • FIG. 3 shows an enlarged representation of the contact head 6 according to FIGS. 1 and 2 in contact engagement with a pad 20.
  • the pad 20 consists in a known manner of the actual solder layer 22 and an impurity layer 24 covering it. This can be caused by flux residues, an oxidation layer or others Impurities are formed.
  • the contaminant layer 24 may be unsuitable Contact pin heads are often not or only insufficiently penetrated, so that no or only insufficient contact is made.
  • the contact head 6 according to the invention forms a relatively blunt wedge with a wedge angle of 60 ° (corresponding to the apex angle of the circular cone 8) in the plane of this grinding surface in the plane of this grinding surface, which is hemmed laterally by the boundary edges of the grinding surface 14 which act as cutting edges.
  • FIG. 4 again shows the contact head 6 with the channel 18 provided in the foot area 16 and extending over the entire circumference of the foot.
  • component feet 26 When contacting component feet 26, they slide along the surface of the circular cone 8 until they are caught and held by the channel 18, as is the case Figure 4 shows.
  • the component feet 26 and / or the contact pin 2 are each slightly deflected laterally in the elastic region, as FIG. 4 also shows.
  • the contact head 6 When contacting via bores, the contact head 6 is centered in the bore, the cutting edges delimiting the ground plane 14 cutting into the input edge of the via bore and possibly penetrating impurity layers present on this input edge.
  • this can be provided with a noble metal coating in a known manner.

Landscapes

  • Measuring Leads Or Probes (AREA)

Claims (6)

  1. Tige de contact pour contrôler le fonctionnement de plaquettes à circuits imprimés ou analogues, comportant une tête de contact de forme convergente pointue qui est formée sur son extrémité libre et qui comporte un plan d'affûtage (14) qui passe par la pointe (12) de la tête de contact, caractérisée par le fait que le plan d'affûtage est parallèle à l'axe (10) de la tige de contact.
  2. Tige de contact suivant la revendication 1, caractérisée par le fait que la tête de contact (6) est réalisée sous la forme d'un cône de révolution (8).
  3. Tige de contact suivant la revendication 2, caractérisée par le fait que l'axe du cône de révolution (8) est confondu avec l'axe (10) de la tige de contact.
  4. Tige de contact suivant la revendication 2 ou 3, caractérisée par le fait que le cône de révolution (8) a un angle au sommet (α) compris entre 50° et 70°, et égal de préférence à environ 60°.
  5. Tige de contact suivant l'une des revendications 1 à 4, caractérisée par le fait que, dans la zone de base (16) de la tête de contact (6) de forme convergente pointue, est ménagée une rainure (18) qui s'étend sur l'ensemble de la circonférence de la base et qui est ouverte en direction de la pointe (12) de la tête de contact.
  6. Tige de contact suivant l'une des revendications 1 à 5, caractérisée par le fait qu'elle est montée de manière à être déplaçable longitudinalement dans une douille et qu'elle est supportée élastiquement.
EP89106910A 1988-05-09 1989-04-18 Broche de contact pour tester la fonction des circuits imprimés Expired - Lifetime EP0341454B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE8806162U DE8806162U1 (de) 1988-05-09 1988-05-09 Kontaktstift für die Funktionsprüfung von Leiterplatten
DE8806162U 1988-05-09

Publications (3)

Publication Number Publication Date
EP0341454A2 EP0341454A2 (fr) 1989-11-15
EP0341454A3 EP0341454A3 (en) 1990-06-13
EP0341454B1 true EP0341454B1 (fr) 1993-12-15

Family

ID=6823887

Family Applications (1)

Application Number Title Priority Date Filing Date
EP89106910A Expired - Lifetime EP0341454B1 (fr) 1988-05-09 1989-04-18 Broche de contact pour tester la fonction des circuits imprimés

Country Status (2)

Country Link
EP (1) EP0341454B1 (fr)
DE (2) DE8806162U1 (fr)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2292236A (en) * 1941-01-14 1942-08-04 Carl P Martin Prod
DE2030707B2 (de) * 1970-06-22 1971-11-25 Siemens AG, 1000 Berlin u. 8000 München Kontaktierungseinrichtung fuer die loesbare elektrische kontaktierung mit den kontaktstellen einer schaltungsanordnung
DE2041280B2 (de) * 1970-08-19 1972-12-21 Kontaktierungseinrichtung fuer die loesbare elektrische kontaktierung mit den kontaktstellen einer schaltungsanordnung
CH589947A5 (en) * 1974-02-13 1977-07-29 Ingun Ag Test pin for printed circuit boards - with spring loaded shank in barrel and test end with conical hollow for boards test point
DE2852886A1 (de) * 1978-12-07 1980-06-19 Feinmetall Gmbh Kontaktbaustein
FR2479643A1 (fr) * 1980-03-26 1981-10-02 Sodeteg Tai Palpeur pour dispositif de test de circuits imprimes et dispositifs de test incorporant un tel palpeur
DE3441480A1 (de) * 1984-11-13 1986-05-15 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH, 6384 Schmitten Kontaktstift
DE3500227A1 (de) * 1985-01-05 1986-07-10 Riba-Prüftechnik GmbH, 7801 Schallstadt Tastnadel
DE8706546U1 (de) * 1986-05-12 1987-09-17 Feinmetall Gmbh, 7033 Herrenberg Federkontaktstift

Also Published As

Publication number Publication date
DE8806162U1 (de) 1989-09-07
DE58906395D1 (de) 1994-01-27
EP0341454A3 (en) 1990-06-13
EP0341454A2 (fr) 1989-11-15

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