EP0312850B1 - Röntgendiagnostikanlage - Google Patents

Röntgendiagnostikanlage Download PDF

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Publication number
EP0312850B1
EP0312850B1 EP88116591A EP88116591A EP0312850B1 EP 0312850 B1 EP0312850 B1 EP 0312850B1 EP 88116591 A EP88116591 A EP 88116591A EP 88116591 A EP88116591 A EP 88116591A EP 0312850 B1 EP0312850 B1 EP 0312850B1
Authority
EP
European Patent Office
Prior art keywords
detector
semiconductor detector
ray
image intensifier
ray image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP88116591A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP0312850A1 (de
Inventor
Horst Dr. Aichinger
Karlheinz Dipl.-ing.(FH) Köhler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of EP0312850A1 publication Critical patent/EP0312850A1/de
Application granted granted Critical
Publication of EP0312850B1 publication Critical patent/EP0312850B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/64—Circuit arrangements for X-ray apparatus incorporating image intensifiers
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/36—Temperature of anode; Brightness of image power
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/38—Exposure time
    • H05G1/42—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube
    • H05G1/44—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube in which the switching instant is determined by measuring the amount of radiation directly

Definitions

  • the invention relates to an X-ray diagnostic system with an image intensifier television chain and a detector for the average image brightness on the output fluorescent screen of the X-ray image intensifier in a predetermined range, in which the detector is a semiconductor detector with an area on which the entire output image of the X-ray image intensifier can be imaged, and at the means for selecting a predetermined area of the semiconductor detector for signal generation are present.
  • An X-ray diagnostic system of this type is described in EP-A-0 217 456.
  • An array of individual detectors is provided as the detector, which permits the formation of a brightness signal for a measuring field in the output image of the X-ray image intensifier.
  • a downstream amplifier must be provided for each detector element, which means a considerable outlay in terms of circuitry.
  • the invention is based on the object of designing an X-ray diagnostic system of the type mentioned at the outset in such a way that a lower circuit complexity than that of the prior art is provided for forming a large number of measuring fields with a variable shape.
  • the detector is a single, large-area semiconductor detector, in front of which there is an aperture made of a liquid crystal matrix, which can be controlled by a control device for selecting a predetermined area on the semiconductor detector that is hit by the light.
  • This solution results in a particularly low outlay for signal processing.
  • the measuring field is selected electronically using the liquid crystal matrix.
  • the formation of the measurement signal is not like that of a matrix photosensitive elements a variety of amplifiers, but only a single amplifier required.
  • FIG. 1 shows an X-ray tube 1, which is fed by an X-ray generator 2.
  • a patient 3 is irradiated by the X-rays.
  • the x-ray image is amplified by an x-ray image intensifier 4.
  • the amplified x-ray image appearing on the output screen of the x-ray image intensifier 4 is recorded by a television camera 5 and displayed on a display unit 7 via a television center 6.
  • a semiconductor detector 8 is provided as an actual value transmitter, which feeds a corresponding signal to the actual value input of a comparator 9 via a measuring transducer 10.
  • the comparator 9 has a setpoint input 11, at which there is a signal corresponding to the setpoint of the average image brightness in the measuring field of the output screen of the X-ray image intensifier 4.
  • the x-ray generator 2 is influenced by a brightness control device 13 in the sense of an adjustment of the actual value to the target value.
  • a setpoint generator 12 is provided for setting the setpoint.
  • the semiconductor detector 8 has an area on which the entire output image of the X-ray image intensifier 4 can be reproduced, with the aid of a partially transparent mirror 14 in the beam path between the exit fluorescent screen of the X-ray image intensifier 4 and the television camera 5.
  • a control device 15 selects electronically a predetermined area of the semiconductor detector 8 corresponding to the desired measuring field.
  • the semiconductor detector 8 allows the selection of a large number of measuring fields, both with regard to their position and their shape and size.
  • Fig. 2 shows an embodiment of a semiconductor detector 8 as a large-area detector, which is composed of a single detector element, e.g. is formed by a single photodiode.
  • a semiconductor detector 8 is composed of a single detector element, e.g. is formed by a single photodiode.
  • an aperture made of a liquid crystal matrix with liquid crystals 17 is arranged in front of the semiconductor detector 8.
  • the light transmission of the individual liquid crystals 17 can be controlled by the control device 15 to select a predetermined area hit by the light on the semiconductor detector 8. 2 shows, for example, the choice of three measuring fields, a central measuring field and two lateral measuring fields.
  • a signal evaluation within the measuring field is possible by not controlling all liquid crystals 17 of the liquid crystal matrix within the measuring surface for light transmission.
  • By varying the liquid crystals controlled for permeability per unit area in the area of the measuring field an adaptation to the object to be examined is possible.
  • peak value regulation can also take place, in that the signals of the individual matrix elements of the selected measuring field are read out serially and only the maximum value of the determined signal distribution is used for the actual value formation becomes.
  • methods of pattern recognition can also be used when selecting the matrix elements that contribute to the actual value signal formation.
  • the technique of measuring field formation shown here for a television camera can also be used in the indirect technique with a sheet film camera.
  • the semiconductor detector is also used for direct recording instead of an ionization chamber, the advantages mentioned (flexible measurement field formation, signal evaluation, mean value / peak value control) can also be used here.
  • exposure corrections are necessary for all hardening effects which occur when the radiation passes through the cassette, e.g. can be stored in tabular form in the memory of the exposure machine. If the patient transparency is determined by a previous fluoroscopy before the direct exposure is triggered and the selected display is also reported by the device to the automatic exposure device, the appropriate exposure correction can be found in the table.

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • X-Ray Techniques (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Closed-Circuit Television Systems (AREA)
EP88116591A 1987-10-19 1988-10-06 Röntgendiagnostikanlage Expired - Lifetime EP0312850B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE8714009U DE8714009U1 (de) 1987-10-19 1987-10-19 Röntgendiagnostikvorrichtung
DE8714009U 1987-10-19

Publications (2)

Publication Number Publication Date
EP0312850A1 EP0312850A1 (de) 1989-04-26
EP0312850B1 true EP0312850B1 (de) 1992-08-12

Family

ID=6813240

Family Applications (1)

Application Number Title Priority Date Filing Date
EP88116591A Expired - Lifetime EP0312850B1 (de) 1987-10-19 1988-10-06 Röntgendiagnostikanlage

Country Status (4)

Country Link
US (1) US5029338A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
EP (1) EP0312850B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPH0163269U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (2) DE8714009U1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2548018Y2 (ja) * 1990-01-24 1997-09-17 興和 株式会社 Ｘ線撮像装置
DE59006446D1 (de) * 1990-10-12 1994-08-18 Siemens Ag Röntgendiagnostikanlage mit einem Röntgenbildverstärker und einem Detektor für die Bildhelligkeit auf dessen Ausgangsschirm.
DE4102445C1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1991-01-28 1992-03-05 Siemens Ag, 8000 Muenchen, De
DE9107256U1 (de) * 1991-06-12 1991-08-08 Siemens AG, 80333 München Röntgen-Belichtungsautomat
US5311568A (en) * 1992-05-01 1994-05-10 Picker International, Inc. Optical alignment means utilizing inverse projection of a test pattern/target
DE4232901A1 (de) * 1992-10-01 1994-04-07 Siemens Ag Medizinisches Diagnostikgerät mit optimierter Signalerfassung zur Belichtungssteuerung
US5651047A (en) * 1993-01-25 1997-07-22 Cardiac Mariners, Incorporated Maneuverable and locateable catheters
US5682412A (en) * 1993-04-05 1997-10-28 Cardiac Mariners, Incorporated X-ray source
US5550378A (en) * 1993-04-05 1996-08-27 Cardiac Mariners, Incorporated X-ray detector
WO1996020579A1 (en) * 1994-12-23 1996-07-04 Philips Electronics N.V. X-ray examination apparatus comprising an exposure control circuit
US5617462A (en) * 1995-08-07 1997-04-01 Oec Medical Systems, Inc. Automatic X-ray exposure control system and method of use
DE19842474A1 (de) * 1998-09-16 2000-03-30 Siemens Ag Strahlungswandler, insbesondere eines Röntgendiagnostikgerätes
JP2002528851A (ja) * 1998-10-19 2002-09-03 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 照射量制御を備えたｘ線検査装置
US6275335B1 (en) 1999-07-16 2001-08-14 Sl3D, Inc. Single-lens 3D method, microscope, and video adapter
WO2001039558A1 (en) * 1999-11-23 2001-05-31 Koninklijke Philips Electronics N.V. X-ray examination apparatus with exposure control
FR2803394B1 (fr) 1999-12-30 2003-04-25 Thomson Tubes Electroniques Systeme de detection d'image radiologique pour generateur de rayons x a balayage
US20020131170A1 (en) * 2001-01-12 2002-09-19 Bryan Costales Stereoscopic aperture valves
DE102004015326A1 (de) * 2004-03-30 2005-10-20 Leica Microsystems Vorrichtung und Verfahren zur Inspektion eines Halbleiterbauteils

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS536593A (en) * 1976-07-08 1978-01-21 Toshiba Corp X-ray apparatus for diagnosis
DE2803913C2 (de) * 1978-01-30 1986-01-30 Siemens AG, 1000 Berlin und 8000 München Röntgendiagnostikanlage mit einer Bildverstärker-Fernsehkette
US4335307A (en) * 1980-04-21 1982-06-15 Technicare Corporation Radiographic apparatus and method with automatic exposure control
DE3141987A1 (de) * 1981-10-22 1983-05-05 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikeinrichtung
NL8200852A (nl) * 1982-03-03 1983-10-03 Philips Nv Roentgenonderzoekinrichting.
DE3225061A1 (de) * 1982-07-05 1984-01-05 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikeinrichtung
JPS60209879A (ja) * 1984-04-02 1985-10-22 Matsushita Electric Ind Co Ltd 画像処理装置
FR2577374A1 (fr) * 1985-02-08 1986-08-14 Thomson Cgr Procede de reglage automatique d'exposition dans une installation de radiologie, et installation de radiologie mettant en oeuvre un tel procede
FR2580827B1 (fr) * 1985-04-19 1987-05-22 Thomson Cgr Installation de radiologie
FR2582502A1 (fr) * 1985-06-04 1986-12-05 Thomson Cgr Installation de radiologie a compensateur global place dans un trajet optique de l'image
NL8502569A (nl) * 1985-09-20 1987-04-16 Philips Nv Roentgenonderzoekapparaat met een locaal opgedeelde hulpdetector.
JPS6293975A (ja) * 1985-10-21 1987-04-30 Sumitomo Electric Ind Ltd 撮像装置

Also Published As

Publication number Publication date
EP0312850A1 (de) 1989-04-26
JPH0163269U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1989-04-24
DE3873680D1 (de) 1992-09-17
DE8714009U1 (de) 1989-02-16
US5029338A (en) 1991-07-02

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