EP0271346B1 - Transistor mit Zusammensetzung aus Halbleitermaterial und aus leitendem Material - Google Patents

Transistor mit Zusammensetzung aus Halbleitermaterial und aus leitendem Material Download PDF

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Publication number
EP0271346B1
EP0271346B1 EP87310889A EP87310889A EP0271346B1 EP 0271346 B1 EP0271346 B1 EP 0271346B1 EP 87310889 A EP87310889 A EP 87310889A EP 87310889 A EP87310889 A EP 87310889A EP 0271346 B1 EP0271346 B1 EP 0271346B1
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Prior art keywords
rods
semiconductor material
matrix
contact member
field effect
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EP87310889A
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English (en)
French (fr)
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EP0271346A3 (en
EP0271346A2 (de
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Brian M. Ditchek
Enid K. Sichel
Adrian I. Cogan
Walter L. Bloss Iii
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Verizon Laboratories Inc
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GTE Laboratories Inc
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Priority claimed from US06/941,478 external-priority patent/US4984037A/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409—Unipolar field-effect transistors
    • H01L29/66416—Static induction transistors [SIT]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/24—Alloying of impurity materials, e.g. doping materials, electrode materials, with a semiconductor body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
    • H01L21/28537—Deposition of Schottky electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • H01L21/28575—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising AIIIBV compounds
    • H01L21/28581—Deposition of Schottky electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
    • H01L29/42312—Gate electrodes for field effect devices
    • H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/47—Schottky barrier electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861—Diodes
    • H01L29/872—Schottky diodes

Definitions

  • This invention relates to semiconductor devices. More particularly, it is concerned with devices employing composites of semiconductor material and conductive materials that form a eutectic with the semiconductor material.
  • the flow of current between the source and drain electrodes of a field effect transistor is controlled by applying a gate voltage to its gate electrode.
  • the gate voltage increases or decreases the width of the depletion layer of the gate region between the source and the drain, and thus alters the effective resistance of the device.
  • an FET is basically a voltage-controlled resistor.
  • the gate voltage should be able to increase the width of the depletion layer to a dimension comparable to the total width of the current path.
  • the current channel of an FET fabricated by conventional planar technology is limited to about 1 to 10 micrometers.
  • a transistor comprising: a body including a matrix of single crystal semiconductor material having disposed therein an array of rods of conductive material forming rectifying barriers at the interfaces of the rods and the matrix of semiconductor material, said rods being generally parallel to each other.
  • a source contact member and a drain contact member respectively in ohmic contact with the matrix of semiconductor material at opposite surfaces thereof extending parallel to said rods; and a control contact member in ohmic contact with said array of rods at one end thereof, whereby, in use, current flows from the source contact member to the drain contact member between the rods and depletion zones established around the rods by biasing potential applied to said control contact.
  • This known device is a so-called 'permeable base transistor' wherein the array of rods forms a two dimensional grating extending in a single plane so that the rods and the control contact form the permeable base.
  • Two such gratings formed in the semiconductor matrix are each separately connected to a corresponding base contact to form a dual grating structure.
  • Such a device is a development of the permeable base transistor discussed in more detail in IEEE TRANSACTIONS ON ELECTRON DEVICES Vol. ED-27, No. 6, June 1980 pages 1128-1141, which also describes the distinctions between this device and an FET.
  • US-A-4371406 describes a semiconductor device having a body including a matrix of single crystal semiconductor material having disposed therein a three dimensional array of individual rods of conductive material.
  • this object is achieved in a transistor device as outlined above, in that said rods extend individually in a three dimensional array from a first major surface of said body perpendicular to the longitudinal axes of said rods to a second major surface opposite to the first and that said control contact member is applied to said first major surface to make ohmic contact with ends of the three aimensional array of rods that are exposed at said first major surface, whereby said control contact member and the three dimensional array of rods form the single gate of a field effect transistor and the said matrix of semiconductor material forms a three dimensional channel thereof.
  • a charge containing the constituents of a eutectic composition of a semiconductor material and a conductive material is prepared.
  • Any of several eutectic systems may be utilized in which the semiconductor phase is the matrix phase and the conductive material is the minor phase. These systems may be, for example, of the form Ge-MGe2, Si-MSi2, and GaAs-MAs, where M is a metal.
  • a charge containing the constituents in proper proportions to the eutectic composition of the semiconductor material and the conductive compound is melted in a suitable crucible and solidified unidirectionally.
  • a Czochralski crystal growth technique is employed in which a single crystal seed of the semiconductor material is lowered into contact with the molten surface of the charge, and the seed is pulled upward.
  • a boule consisting of a composite of the semiconductor material and the conductive material that forms a eutectic with the semiconductor material is produced in which the semiconductor material is in the form of a single crystal matrix with rods of the conductive material disposed in the matrix.
  • the matrix of semiconductor material is of the same crystal orientation as the seed crystal and the rods extend generally parallel to the direction of pulling.
  • Fig. 1 illustrates a fragment of a section or a body 10 cut from a boule grown as above.
  • the body consists essentially of a matrix of semiconductor material 11 and an array of rods 12 of the conductive material which forms the eutectic composition with the semiconductor material.
  • the upper and lower major surfaces of the body 10 are a result of cutting the boule transverse to the direction of pulling of the seed crystal.
  • the side surfaces are formed by cuts parallel to the rods 12.
  • Each rod 12 extends perpendicularly from the upper major surfaces to the lower major surface.
  • the rods 12 are not necessarily of perfect circular cross-section nor are they necessarily perfectly parallel.
  • the rods 12 are, however, each individual elements and do not interconnect, and the semiconductor matrix 11 is entirely interconnected and surrounds each of the individual rods.
  • the semiconductor material of the melt is appropriately doped with conductivity type imparting material of either N or P-type so that Schottky barriers are formed between the conductive rods 12 and the semiconductor matrix 11.
  • the carrier concentration in the semiconductor material is from 1014 to 1016 cm ⁇ 3.
  • the volume fraction of the rods 12 in the body 10 should be between 0.5% and 35%.
  • the rod diameter (d) is related to the inter-rod spacing ( ⁇ ) by the volume fraction of the rods as determined by the eutectic phase diagram of the particular eutectic system. For suitable device structures the inter-rod spacing ( ⁇ ) should be between 1 and 50 micrometers, and the rod diameter (d) should be between 0.1 and 15 micrometers.
  • Figs. 2A - 2E illustrate stages in the fabrication of a device from a body 10 as illustrated in Fig. 1 of a matrix 11 of semiconductor material having disposed therein an array of conductive rods 12.
  • the semiconductor matrix 11 is of single crystal silicon with conductive rods 12 of tantalum silicide (TaSi2) grown from a Si-TaSi2 eutectic composition.
  • TaSi2 tantalum silicide
  • Examples of other suitable Si-silicide eutectic systems are Si-tungsten silicide, Si-niobium silicide, Si-zirconium silicide, and Si-chromium silicide.
  • the body is treated in wet oxygen to form an adherent layer of silicon oxide 15 on the upper major surface as illustrated in Fig. 2A.
  • a standard photoresist material 16 is deposited on the silicon oxide coating 15. By employing known photolithographic masking and etching techniques an opening is formed in the photoresist layer 16 and then an opening 17 is etched in the oxide layer 15. The photoresist material is then removed. As illustrated in Fig. 2B the end surfaces of several of the conductive rods 12 encircled by the silicon matrix 11 are exposed at the uncovered area of the upper major surface.
  • a film 19 of a suitable metal which forms a conductive compound with silicon, specifically cobalt, is deposited over the layer of silicon oxide 15 and also over the surface of the body at the opening 17 as illustrated in Fig. 2C.
  • the body is then subjected to a rapid thermal annealing treatment by heating at a temperature of about 800°C for about 12 seconds to cause the cobalt in contact with silicon to react and form a conductive member 20 of cobalt disilicide as illustrated in Fig. 2D.
  • the cobalt over the silicon oxide does not react and remains as cobalt. This unreacted cobalt is removed by a suitable chemical etch which attacks the cobalt but does not significantly affect the cobalt disilicide.
  • the cobalt disilicide contact member 20 forms an ohmic contact with the ends of several of the TaSi2 rods 12.
  • the interface of the cobalt disilicide contact member 20 with the silicon of the matrix 11 is a Schottky rectifying barrier.
  • the rectifying barrier formed between the contact member 20 and the semiconductor matrix 11 should have a barrier potential which is equal to or higher than the barrier potential of the rectifying barrier between the conductive rods 12 and the semiconductor matrix 11.
  • Platinum silicide has a high potential barrier with N-type silicon and yttrium silicide has a high potential barrier with P-type silicide.
  • Other silicide-forming metals which may be used include nickel, titanium, tantalum, tungsten, and molybdenum.
  • Fig. 3 illustrates an FET fabricated from the structure as illustrated in Fig. 2E.
  • the contact member 20 in ohmic contact with several rods serves as the gate contact member.
  • Ohmic contacts 30 and 31 are made to opposite side surfaces of the body 10 to serve as source and drain contact members, respectively.
  • Current from the source contact 30 to the drain contact 31 flows through the channel region of the silicon matrix which underlies the gate contact member 20.
  • the channel region is interspersed with the conductive rods which contact the gate contact 20. Since the interfaces between the rods and the silicon matrix are Schottky rectifying junctions, a depletion zone is produced in the silicon adjacent to each of the rods by biasing potential applied to the gate contact 20.
  • Each depletion zone extends from the interface of the rod with the matrix laterally outward into the matrix. Due to the lack of mobile current carriers in these zones, they have a very high resistance relative to the resistance of the normally-doped silicon of the matrix. Thus, the effective channel for current flow is determined by the spacing between the depletion zones.
  • the size of the depletion zones is determined primarily by the carrier concentration in the silicon and the magnitude of the bias voltage applied to the gate contact 20.
  • the carrier concentration of the silicon of the matrix is designed such that without a bias voltage applied to the conductive rods, the depletion zones are small, consuming a sufficiently small volume of the channel region so as to have little or no effect on the resistivity of the composite and thus of current flow from the source to the drain.
  • the growth rate (v) at which the composite is pulled from the molten charge is chosen to produce inter-rod spacing ( ⁇ ) such that the application of a suitable reverse bias voltage to the rods is sufficient to enlarge the depletion zones around the rods such that the depletion zones extend across the channel. The channel is thereby closed, effectively "pinching off” current flow between the source and drain and switching the device off.
  • the rods are continuous from the top surface to the bottom surface of the body.
  • the rectifying junctions extend through the entire thickness of the body producing a three-dimensional volume of semiconductor material to be controlled, which is significantly greater than the volume of the channel in a conventional planar FET. Since the thickness of the composite body may be orders of magnitude greater than the channel of a conventional planar FET, it is capable of switching currents which are orders of magnitude greater.
  • Si-TaSi2 eutectic composites were grown directly from a melt in a Czochralski crystal growth furnace in accordance with Czochralski crystal growth techniques, A charge of silicon and tantalum was placed in a quartz crucible with a graphite susceptor. The tantalum was 5.5 % by weight of the charge, providing the mole ratio of silicon to tantalum in the Si-TaSi2 eutectic composition. The charge was doped with phosphorus. After rf heating the charge to above the eutectic temperature and obtaining charge homogenization, a (111) orientation silicon seed was lowered onto the melt surface.
  • Composite boules were pulled from the melt at a growth rate (v) of 20cm/h in a flowing argon atmosphere.
  • the resulting boule was approximately 2.5 cm in diameter and 12 cm in length.
  • the silicon matrix phase was of single crystal (111) orientation and was free of grain boundaries.
  • the boule was 2% by volume of conductive, metallic, TaSi2 rods.
  • the composite contained 1.6 x 106 TaSi2 rods/cm2 with an average rod diameter (d) of 1.2 micrometers.
  • the average inter-rod spacing ( ⁇ ) was 7.9 micrometers.
  • the carrier concentration in the silicon matrix as determined by Hall measurements varied from 1.1 x 1015 cm ⁇ 3 at one end of the boule to 1.8 x 1015 cm ⁇ 3 at the opposite end.
  • the electron mobility in the matrix was approximately 925 cm2/V-sec.
  • diodes were fabricated from 500 micrometer thick slices of the boule.
  • the slices were polished using colloidal silica to remove damaged surface material.
  • a 0.2 micrometer thick silicon oxide coating was grown on the surfaces.
  • the silicon oxide coating was covered with a photoresist layer, and using standard photolithographic and etching techniques 127 micrometer diameter openings were made in the oxide coating.
  • the photoresist was removed, and a layer of cobalt 70 nanometres (700 angstroms) thick was deposited over the silicon oxide layer and the exposed surfaces of the slice at the openings in the silicon oxide layer.
  • the slice was treated by rapid thermal annealing at a temperature of 800°C for 12 seconds.
  • the cobalt reacted with the exposed silicon at the openings in the silicon oxide coating to form cobalt disilicide contacts.
  • the unreacted cobalt overlying the silicon oxide was removed by etchings in an HNO3 solution.
  • the cobalt disilicide provided ohmic metallic contacts to the exposed ends of the TaSi2 rods while forming Schottky barriers with the silicon of the matrix.
  • the Schottky barriers between the cobalt disilicide and the silicon have a higher barrier potential than the Schottky barriers between the TaSi2 rods and silicon.
  • An ohmic contact was formed adjacent to the edge of the body of each device by etching away silicon oxide and then depositing and alloying a gold-antimony film.
  • the effective region of a diode device contains 190 rods.
  • the total junction area is 3.6 x 10 ⁇ 3 cm2. This area is approximately thirty times the area of contact of the cobalt disilicide member to the silicon matrix. Since cobalt disilicide provides a slightly higher Schottky barrier to silicon than does tantalum disilicide (0.64eV versus 0.59eV) the contribution of the cobalt disilicide-silicon junction to the current-voltage and capacitance-voltage characteristics is negligible.
  • the current-voltage and capacitance-voltage characteristics of the diodes were analyzed.
  • the diodes were ideally low in leakage and the breakdown voltage exceeded 10 volt. Breakdown was "soft" and occurred at about 30 volts.
  • Analysis of the current-voltage characteristics based on the Si-TaSi2 junction area indicated a Schottky barrier potential of 0.62 eV.
  • the ideality factor of the device was nearly ideal and comparable to conventional planar diodes.
  • the capacitance-voltage analysis indicated that the junctions operated like cylindrical junctions, as opposed to planar junctions. The capacitance values verify that the entire junction area was contributing to the capacitance.
  • Electron beam induced current (EBIC) techniques were also used to study the junctions and the eutectic composite. The results indicated that with a 10 volt reverse bias gate voltage, a value much less than the breakdown voltage, the depletion zone around each rod can be enlarged from 0.8 micrometers to 2.5 micrometers. At 2.5 micrometers the depletion zone volume fraction of the composite is 45%, nearly enough to cause "pinch off.” Resistivity measurements indicate that increasing the volume fraction of depleted material from 5% to 10% is sufficient to increase the resistivity of the device by a factor of 7. The EBIC measurement technique also verified that the rods extend completely through slices 1270 micrometers thick.
  • devices can be fabricated from eutectic composites produced by employing Czochralski techniques to directionally solidify a semiconductor material and a conductive compound of the semiconductor material and a metal which form a suitable eutectic composition.
  • a three-dimensional or bulk structure is thus provided for the fabrication of an FET in which the gate structure is an array of Schottky barriers with the bulk semiconductor material.
  • Such a device is capable of controlling large amounts of current.

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Claims (9)

  1. Transistor, welcher umfaßt:
    einen Körper, der eine Matrix (11) aus einkristallinem Halbleitermaterial enthält, in dem eine Anordnung aus Stabchen (12) von leittähigem Material angeordnet sind, die gleichrichtende Sperrschichten an der Zwischenfläche der Stäbchen (12) mit der Matrix (11) aus Halbleitermaterial bilden, wobei die Stäbchen (12) allgemein parallel zueinander sind;
    ein Source-Kontaktglied (30) und ein Drain-Kontaktglied (31), die jeweils in ohm'schem Kontakt mit der Matrix (11) aus Halbleitermaterial stehen, an einander entgegengesetzt liegenden Flächen der Matrix, die sich parallel zu den Stäbchen erstrecken; und
    ein Steuerkontaktglied (20) in ohm'schem Kontakt mit der Anordnung von Stäbchen (12) an einem Ende derselben, wodurch im Gebrauch Strom von dem Source-Kontaktglied (30) zu dem Drain-Kontaktglied (31) zwischen den Stäbchen (12) fließt und Verarmungszonen um die Stäbchen (12) durch an den Steuerkontakt angelegtes Vorspannungspotential eingerichtet werden,
    dadurch gekennzeichnet, daß die Stäbchen (12) sich in einer dreidimensionalen Anordnung einzeln von einer ersten zur Längsachse der Stäbchen senkrechten Hauptfläche des Körpers zu einer zweiten der ersten Hauptfläche gegenüberliegenden Hauptfläche erstrecken, und daß das Steuerkontaktglied (20) an die erste Hauptfläche angelegt ist, um einen ohm'schen Kontakt mit den an der ersten Hauptfläche freigelegten Enden der dreidimensionalen Stabchen-Anordnung herzustellen, wodurch das Steuer-Kontaktglied (20) und die dreidimensionale Anordnung von Stäbchen (12) das einzige Gate eines Feldeffekt-Transistors bilden und die Matrix des Halbleitermaterials einen dreidimensionalen Kanal desselben bildet.
  2. Feldeffekt-Transistor nach Anspruch 1, dadurch gekennzeich net, daß das Steuerkontaktglied (20) sich an der ersten Hauptfläche des Körpers in gleichrichtendem Kontakt mit dem Halbleitermaterial der Matrix (11) befindet.
  3. Feldeffekt-Transistor nach Anspruch 1 oder 2, dadurch gekennzeichnet, daß das leitende Material der Stäbchen (12) eine leitende Verbindung aus einem ersten Metall und dem Halbleitermaterial der Matrix (11) oder aus einem ersten Metall und einem konstituierenden Element des Halbleitermaterials ist.
  4. Feldeffekt-Transistor nach Anspruch 3, dadurch gekennzeich net, daß die leitende Verbindung und das Halbleitermaterial die Bestandteile einer eutektischen Masse sind; und daß das Molverhältnis des Halbleitermaterials zum ersten Metall in der Matrix und in der Anordnung von Stäbchen annähernd gleich dem Molverhältnis des Halbleitermaterials zu dem ersten Metall in der eutektischen Masse aus Halbleitermaterial und der leitenden Verbindung sind.
  5. Feldeffekt-Transistor nach Anspruch 3 oder 4, dadurch gekennzeichnet, daß das Halbleitermaterial Silizium, Germanium oder ein III/V-Verbindungs-Halbleitermaterial ist, und daß das erste Metall Tantal, Wolfram, Niob, Zirkon oder Chrom ist.
  6. Feldeffekt-Transistor nach Anspruch 2 oder einem der Ansprüche 3 - 5 in Abhängigkeit von diesem, dadurch gekenn zeichnet, daß das Steuerkontaktglied (20) an einem Abschnitt der ersten Hauptfläche anhängt und in einem ohm'schen Kontakt mit niedrigem Übergangs-Widerstand mit der Vielzahl von Stäbchen an deren Enden steht, und daß das Source-Kontaktglied (30) sich in Kontakt mit der Matrix des Halbleitermaterials an einer ersten Fläche des Körpers befindet, die senkrecht zu der ersten und der zweiten Hauptfläche und parallel zu den Stäbchen (12) liegt; und daß das Drain-Kontaktglied (31) sich in Kontakt mit der Matrix (11) aus Halbleitermaterial befindet an einer zweiten Seitenfläche des Körpers, die parallel zur ersten Seitenfläche liegt.
  7. Feldeffekt-Transistor nach einem der Ansprüche 3-6, dadurch gekennzeichnet, daß der Volumenanteil der Anordnung von Stäbchen (12) aus der leitenden Verbindung in dem Körper von 0,5 bis 35% liegt.
  8. Feldeffekt-Transistor nach einem der Ansprüche 5-7, dadurch gekennzeichnet, daß das Steuer-Kontaktglied (20) eine leitende Verbindung von Kobalt, Platin, Yttrium, Nickel, Titan, Tantal, Wolfram oder Molybdän mit dem Halbleitermaterial der Matrix ist.
  9. Feldeffekt-Transistor nach einem der Ansprüche 1-8, dadurch gekennzeichnet, daß der Durchmesser jedes Stäbchens zwischen 0,1 bis 15 »m liegt und daß der Abstand zwischen benachbarten Stäbchen von 1 bis 50 »m beträgt.
EP87310889A 1986-12-11 1987-12-10 Transistor mit Zusammensetzung aus Halbleitermaterial und aus leitendem Material Expired - Lifetime EP0271346B1 (de)

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Application Number Priority Date Filing Date Title
US94037186A 1986-12-11 1986-12-11
US941478 1986-12-11
US06/941,478 US4984037A (en) 1986-12-11 1986-12-11 Semiconductor device with conductive rectifying rods
US940371 1986-12-11

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EP0271346A2 EP0271346A2 (de) 1988-06-15
EP0271346A3 EP0271346A3 (en) 1989-11-02
EP0271346B1 true EP0271346B1 (de) 1995-05-03

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US5292689A (en) * 1992-09-04 1994-03-08 International Business Machines Corporation Method for planarizing semiconductor structure using subminimum features
US20050121691A1 (en) 2003-12-05 2005-06-09 Jean-Luc Morand Active semiconductor component with a reduced surface area
FR2880193A1 (fr) * 2004-12-23 2006-06-30 St Microelectronics Sa Diode schottky a barriere verticale
CN109728077B (zh) * 2017-10-31 2021-12-14 联华电子股份有限公司 一种半导体元件

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US4371406A (en) * 1965-09-28 1983-02-01 Li Chou H Solid-state device
FR2501913A1 (fr) * 1981-03-10 1982-09-17 Thomson Csf Transistor a effet de champ de type planar comportant des electrodes a puits metallises et procede de fabrication de ce transistor
JPS57180184A (en) * 1981-04-30 1982-11-06 Fujitsu Ltd Manufacturing method for fet
JPS58148463A (ja) * 1982-02-26 1983-09-03 Mitsubishi Electric Corp Ｍｅｓ型電界効果トランジスタ
JPS622666A (ja) * 1985-06-28 1987-01-08 Matsushita Electric Ind Co Ltd 電界効果トランジスタ

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IEEE TRANSACTIONS ON ELECTRON DEVICES,VOL. ED-27,NO. 6,JUNE 1980, PAGES 1128-1141 *

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DE3751278T2 (de) 1996-01-25
EP0271346A3 (en) 1989-11-02
JPS63160375A (ja) 1988-07-04
JP2665752B2 (ja) 1997-10-22
DE3751278D1 (de) 1995-06-08
EP0271346A2 (de) 1988-06-15

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