DK634586D0 - Fremgangsmaade ved tredimensional maaling af genstande - Google Patents

Fremgangsmaade ved tredimensional maaling af genstande

Info

Publication number
DK634586D0
DK634586D0 DK634586A DK634586A DK634586D0 DK 634586 D0 DK634586 D0 DK 634586D0 DK 634586 A DK634586 A DK 634586A DK 634586 A DK634586 A DK 634586A DK 634586 D0 DK634586 D0 DK 634586D0
Authority
DK
Denmark
Prior art keywords
receiver
measurement frame
transmitter
pct
calculation
Prior art date
Application number
DK634586A
Other languages
English (en)
Other versions
DK165763C (da
DK165763B (da
DK634586A (da
Inventor
Jon Claesson
Jack Roald Hoeifodt
Einar Soerensen
Original Assignee
Jon Claesson
Jack Roald Hoeifodt
Einar Soerensen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jon Claesson, Jack Roald Hoeifodt, Einar Soerensen filed Critical Jon Claesson
Publication of DK634586A publication Critical patent/DK634586A/da
Publication of DK634586D0 publication Critical patent/DK634586D0/da
Publication of DK165763B publication Critical patent/DK165763B/da
Application granted granted Critical
Publication of DK165763C publication Critical patent/DK165763C/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Radiation (AREA)
  • Endoscopes (AREA)
  • Golf Clubs (AREA)
  • Stringed Musical Instruments (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Image Processing (AREA)
DK634586A 1985-04-30 1986-12-30 Fremgangsmaade ved tredimensional maaling af genstande DK165763C (da)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
NO851718 1985-04-30
NO851718 1985-04-30
PCT/NO1986/000034 WO1986006473A1 (en) 1985-04-30 1986-04-30 A method relating to three dimensional measurement of objects
NO8600034 1986-04-30

Publications (4)

Publication Number Publication Date
DK634586A DK634586A (da) 1986-12-30
DK634586D0 true DK634586D0 (da) 1986-12-30
DK165763B DK165763B (da) 1993-01-11
DK165763C DK165763C (da) 1993-06-14

Family

ID=19888259

Family Applications (1)

Application Number Title Priority Date Filing Date
DK634586A DK165763C (da) 1985-04-30 1986-12-30 Fremgangsmaade ved tredimensional maaling af genstande

Country Status (11)

Country Link
US (1) US4773029A (da)
EP (1) EP0220264B1 (da)
JP (1) JPS62502707A (da)
AT (1) ATE92617T1 (da)
AU (1) AU593030B2 (da)
CA (1) CA1253620A (da)
DE (2) DE220264T1 (da)
DK (1) DK165763C (da)
FI (1) FI82984C (da)
NO (1) NO168851C (da)
WO (1) WO1986006473A1 (da)

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US9423693B1 (en) 2005-05-10 2016-08-23 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate
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US7784107B2 (en) * 2006-06-02 2010-08-24 Victor B. Kley High speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer
JP5138268B2 (ja) * 2006-06-14 2013-02-06 株式会社タニタ 寸法測定装置
US7576871B2 (en) * 2006-10-03 2009-08-18 Storm Thomas W Apparatus and method for measuring volumes
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US9778572B1 (en) 2013-03-15 2017-10-03 Victor B. Kley In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate
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JP6299267B2 (ja) * 2014-02-20 2018-03-28 新日鐵住金株式会社 タブ板切断装置及びタブ板切断方法
CN104501717B (zh) * 2014-12-17 2017-03-22 上海邮政科学研究院 泡货物体体积的动态自适应测量方法
KR102042467B1 (ko) * 2016-03-04 2019-11-08 주식회사 엘지화학 레이저 센서를 포함하는 전지셀 두께 측정장치 및 이를 사용하여 전지셀의 두께를 측정하는 방법
DE102016114477B4 (de) * 2016-08-04 2018-03-22 Sick Ag Fördervorrichtung
JP2019015553A (ja) * 2017-07-05 2019-01-31 ソニーセミコンダクタソリューションズ株式会社 情報処理装置、情報処理方法および個体撮像装置
JP7074400B2 (ja) * 2018-07-09 2022-05-24 株式会社ミツトヨ 光学測定装置
EP3879226B1 (en) 2018-11-08 2023-01-04 Chengdu Pin Tai Ding Feng Business Administration Three-dimensional measurement device
CN111504230A (zh) * 2020-04-22 2020-08-07 海尔智家股份有限公司 冰箱的三维尺寸测量系统及测量方法
CN114192412A (zh) * 2021-12-09 2022-03-18 中邮科技股份有限公司 一种物流流水线及物品信息与分拣车绑定的方法

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Also Published As

Publication number Publication date
DK165763C (da) 1993-06-14
DK165763B (da) 1993-01-11
DE220264T1 (de) 1992-04-09
DE3688823T2 (de) 1994-01-20
DK634586A (da) 1986-12-30
FI865322A0 (fi) 1986-12-29
AU593030B2 (en) 1990-02-01
FI865322A (fi) 1986-12-29
WO1986006473A1 (en) 1986-11-06
AU6454786A (en) 1987-11-05
NO865009L (no) 1986-12-11
CA1253620A (en) 1989-05-02
NO168851C (no) 1992-04-08
US4773029A (en) 1988-09-20
ATE92617T1 (de) 1993-08-15
EP0220264A1 (en) 1987-05-06
NO168851B (no) 1991-12-30
EP0220264B1 (en) 1993-08-04
FI82984B (fi) 1991-01-31
FI82984C (fi) 1991-05-10
DE3688823D1 (de) 1993-09-09
JPS62502707A (ja) 1987-10-15

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