DK576484A - Ikke-destruktiv testmetode med hvirvelstroem og system med frekvens-sweep - Google Patents

Ikke-destruktiv testmetode med hvirvelstroem og system med frekvens-sweep Download PDF

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Publication number
DK576484A
DK576484A DK576484A DK576484A DK576484A DK 576484 A DK576484 A DK 576484A DK 576484 A DK576484 A DK 576484A DK 576484 A DK576484 A DK 576484A DK 576484 A DK576484 A DK 576484A
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DK
Denmark
Prior art keywords
measurement
frequency
measuring
signal
probe
Prior art date
Application number
DK576484A
Other languages
Danish (da)
English (en)
Other versions
DK576484D0 (da
Inventor
Gerard Durou
Rock Samson
Original Assignee
Electromec Division Maritime
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electromec Division Maritime filed Critical Electromec Division Maritime
Publication of DK576484D0 publication Critical patent/DK576484D0/da
Publication of DK576484A publication Critical patent/DK576484A/da

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

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  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Electrochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
DK576484A 1983-12-16 1984-12-04 Ikke-destruktiv testmetode med hvirvelstroem og system med frekvens-sweep DK576484A (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA000443558A CA1212997A (fr) 1983-12-16 1983-12-16 Methode et systeme de test non destructif a courants de foucault utilisant un balayage en frequences

Publications (2)

Publication Number Publication Date
DK576484D0 DK576484D0 (da) 1984-12-04
DK576484A true DK576484A (da) 1985-06-17

Family

ID=4126768

Family Applications (1)

Application Number Title Priority Date Filing Date
DK576484A DK576484A (da) 1983-12-16 1984-12-04 Ikke-destruktiv testmetode med hvirvelstroem og system med frekvens-sweep

Country Status (8)

Country Link
EP (1) EP0146091B1 (de)
JP (1) JPS60152950A (de)
AT (1) ATE51708T1 (de)
AU (1) AU3646284A (de)
CA (1) CA1212997A (de)
DE (1) DE3481859D1 (de)
DK (1) DK576484A (de)
ES (1) ES8606645A1 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07500666A (ja) * 1991-10-29 1995-01-19 シーメンス アクチエンゲゼルシヤフト 渦電流検査のための回路装置および方法
EP0543648A1 (de) * 1991-11-21 1993-05-26 Kaisei Engineer Co., Ltd. Inspektionsvorrichtung und Methode unter Verwendung elektromagnetischer Induktion
DE4333830C2 (de) * 1993-09-30 1997-11-27 Inst Maschinen Antriebe Und El Verfahren zur selektiven Bestimmung von Größen zur kontinuierlichen ortsauflösenden Überprüfung von oberflächennahen Materialparametern für die Fertigungskontrolle sowie Anordnung zur Durchführung des Verfahrens
JP2003050233A (ja) * 2001-08-07 2003-02-21 Marktec Corp 渦流探傷試験方法及び渦流探傷試験装置
JP4809039B2 (ja) * 2005-11-07 2011-11-02 偕成エンジニア株式会社 電磁誘導型検査装置および電磁誘導型検査方法
ES2294924B1 (es) * 2006-04-07 2009-02-16 Universidad De Salamanca Metodo y aparato para medir la conductividad electrica asi como para efectuar una caracterizacion estructural y dimensional de muestras metalicas cilindricas por tecnicas inductivas.
US9817078B2 (en) 2012-05-10 2017-11-14 Allegro Microsystems Llc Methods and apparatus for magnetic sensor having integrated coil
US10495699B2 (en) 2013-07-19 2019-12-03 Allegro Microsystems, Llc Methods and apparatus for magnetic sensor having an integrated coil or magnet to detect a non-ferromagnetic target
US10145908B2 (en) 2013-07-19 2018-12-04 Allegro Microsystems, Llc Method and apparatus for magnetic sensor producing a changing magnetic field
US9823092B2 (en) 2014-10-31 2017-11-21 Allegro Microsystems, Llc Magnetic field sensor providing a movement detector
US10012518B2 (en) 2016-06-08 2018-07-03 Allegro Microsystems, Llc Magnetic field sensor for sensing a proximity of an object
US10996289B2 (en) 2017-05-26 2021-05-04 Allegro Microsystems, Llc Coil actuated position sensor with reflected magnetic field
US10837943B2 (en) 2017-05-26 2020-11-17 Allegro Microsystems, Llc Magnetic field sensor with error calculation
US11428755B2 (en) 2017-05-26 2022-08-30 Allegro Microsystems, Llc Coil actuated sensor with sensitivity detection
US10823586B2 (en) 2018-12-26 2020-11-03 Allegro Microsystems, Llc Magnetic field sensor having unequally spaced magnetic field sensing elements
US11280637B2 (en) 2019-11-14 2022-03-22 Allegro Microsystems, Llc High performance magnetic angle sensor
US11237020B2 (en) 2019-11-14 2022-02-01 Allegro Microsystems, Llc Magnetic field sensor having two rows of magnetic field sensing elements for measuring an angle of rotation of a magnet
US11262422B2 (en) 2020-05-08 2022-03-01 Allegro Microsystems, Llc Stray-field-immune coil-activated position sensor
US11493361B2 (en) 2021-02-26 2022-11-08 Allegro Microsystems, Llc Stray field immune coil-activated sensor
US11578997B1 (en) 2021-08-24 2023-02-14 Allegro Microsystems, Llc Angle sensor using eddy currents
US12523717B2 (en) 2024-02-15 2026-01-13 Allegro Microsystems, Llc Closed loop magnetic field sensor with current control

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR95394E (fr) * 1966-01-11 1970-09-11 Commissariat Energie Atomique Procédé de controle non destructif par courants de foucault de tubes conducteurs de l'électricité et appareil correspondant.
FR2324003A1 (fr) * 1975-09-09 1977-04-08 Commissariat Energie Atomique Procede de controle non destructif par courants de foucault et dispositif correspondant, utilisant une excitation multifrequence et permettant l'elimination de certains parametres
DE2641798C3 (de) * 1976-09-17 1980-12-11 Friedrich Dr. 7410 Reutlingen Foerster Verfahren und Einrichtung zum berührungslosen Ermitteln physikalischer oder geometrischer Eigenschaften

Also Published As

Publication number Publication date
JPS60152950A (ja) 1985-08-12
EP0146091A2 (de) 1985-06-26
ES538619A0 (es) 1986-04-16
EP0146091B1 (de) 1990-04-04
ES8606645A1 (es) 1986-04-16
DK576484D0 (da) 1984-12-04
CA1212997A (fr) 1986-10-21
DE3481859D1 (de) 1990-05-10
ATE51708T1 (de) 1990-04-15
EP0146091A3 (en) 1985-07-31
AU3646284A (en) 1985-06-20

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