DK576484A - NON-DESTRUCTIVE TEST METHOD WITH ANIMALS AND FREQUENCY SWEEP SYSTEM - Google Patents
NON-DESTRUCTIVE TEST METHOD WITH ANIMALS AND FREQUENCY SWEEP SYSTEM Download PDFInfo
- Publication number
- DK576484A DK576484A DK576484A DK576484A DK576484A DK 576484 A DK576484 A DK 576484A DK 576484 A DK576484 A DK 576484A DK 576484 A DK576484 A DK 576484A DK 576484 A DK576484 A DK 576484A
- Authority
- DK
- Denmark
- Prior art keywords
- measurement
- frequency
- measuring
- signal
- probe
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
Landscapes
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Electrochemistry (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Geophysics And Detection Of Objects (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
1. Non-destructive test device using eddy currents comprising : a sinusoidal generator (4, 5, 8) supplying an excitation signal at a certain adjustable frequency, a probe (11) comprising a winding (43, 46) capable of receiving a part to be tested, this winding receiving the said excitation signal, this probe supplying a measurement signal at the said frequency, means (12, 13, 14) for measuring the phase difference between the excitation signal and the measurement signal, means (17) for measuring the amplitude of the measurement signal, characterized in that it furthermore comprises : an analog/digital converter (2) having an input connected to the phase detector (12, 13, 14) and to the amplitude measuring means (17), a microcomputer (1) connected to the converter (2) and to the sinusoidal generator (5) and associated with means of display control (33, 34, 35, 36), this microcomputer being capable, with an appropriate operating software, of : modifying the frequency of the signal generated by the sinusoidal generator (5) in order to scan a certain frequency range, sampling the signals delivered by the means (12, 13, 14) of measuring the phase difference and the means (12) of measuring the amplitude of the signal, this sampling being carried out at different values of the frequency of the signal generated by the generator, storing all of these samples for the entire scanned range both for a first measurement, called the reference measurement, carried out by placing a reference part in the probe, and for a second measurement, called the test measurement, carried out by placing a test piece in the probe, this test piece having a certain parameter to be evaluated, determining the frequency in the scanned range at which the reference measurement and the test measurement exhibit the greatest difference, possibly repeating this determination for other test pieces having other types of parameters to be evaluated and determining, each time, the value of the frequency most appropriate for measuring each parameter, then adjusting the generator (4, 5, 8) to one of the frequencies thus determined in order to perform subsequent tests on other parts considered to exhibit one of the said parameters.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA000443558A CA1212997A (en) | 1983-12-16 | 1983-12-16 | Frequency scanning eddy current non destructive testing method and system |
Publications (2)
Publication Number | Publication Date |
---|---|
DK576484D0 DK576484D0 (en) | 1984-12-04 |
DK576484A true DK576484A (en) | 1985-06-17 |
Family
ID=4126768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK576484A DK576484A (en) | 1983-12-16 | 1984-12-04 | NON-DESTRUCTIVE TEST METHOD WITH ANIMALS AND FREQUENCY SWEEP SYSTEM |
Country Status (8)
Country | Link |
---|---|
EP (1) | EP0146091B1 (en) |
JP (1) | JPS60152950A (en) |
AT (1) | ATE51708T1 (en) |
AU (1) | AU3646284A (en) |
CA (1) | CA1212997A (en) |
DE (1) | DE3481859D1 (en) |
DK (1) | DK576484A (en) |
ES (1) | ES8606645A1 (en) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1993009428A1 (en) * | 1991-10-29 | 1993-05-13 | Siemens Aktiengesellschaft | Circuit assembly and method for electrical eddy-current testing |
EP0543648A1 (en) * | 1991-11-21 | 1993-05-26 | Kaisei Engineer Co., Ltd. | Inspection device using electromagnetic induction and method therefor |
DE4333830C2 (en) * | 1993-09-30 | 1997-11-27 | Inst Maschinen Antriebe Und El | Method for the selective determination of quantities for the continuous, spatially resolving examination of material parameters close to the surface for the production control as well as arrangement for the implementation of the method |
JP2003050233A (en) * | 2001-08-07 | 2003-02-21 | Marktec Corp | Eddy-current flaw detection testing method and eddy- current flaw detection testing device |
JP4809039B2 (en) | 2005-11-07 | 2011-11-02 | 偕成エンジニア株式会社 | Electromagnetic induction type inspection apparatus and electromagnetic induction type inspection method |
ES2294924B1 (en) * | 2006-04-07 | 2009-02-16 | Universidad De Salamanca | METHOD AND APPARATUS FOR MEASURING ELECTRICAL CONDUCTIVITY AS WELL AS TO PERFORM A STRUCTURAL AND DIMENSIONAL CHARACTERIZATION OF CYLINDRICAL METAL SAMPLES BY INDUCTIVE TECHNIQUES. |
US9817078B2 (en) | 2012-05-10 | 2017-11-14 | Allegro Microsystems Llc | Methods and apparatus for magnetic sensor having integrated coil |
US10495699B2 (en) | 2013-07-19 | 2019-12-03 | Allegro Microsystems, Llc | Methods and apparatus for magnetic sensor having an integrated coil or magnet to detect a non-ferromagnetic target |
US10145908B2 (en) | 2013-07-19 | 2018-12-04 | Allegro Microsystems, Llc | Method and apparatus for magnetic sensor producing a changing magnetic field |
US9823092B2 (en) | 2014-10-31 | 2017-11-21 | Allegro Microsystems, Llc | Magnetic field sensor providing a movement detector |
US10012518B2 (en) | 2016-06-08 | 2018-07-03 | Allegro Microsystems, Llc | Magnetic field sensor for sensing a proximity of an object |
US10837943B2 (en) | 2017-05-26 | 2020-11-17 | Allegro Microsystems, Llc | Magnetic field sensor with error calculation |
US10996289B2 (en) | 2017-05-26 | 2021-05-04 | Allegro Microsystems, Llc | Coil actuated position sensor with reflected magnetic field |
US11428755B2 (en) | 2017-05-26 | 2022-08-30 | Allegro Microsystems, Llc | Coil actuated sensor with sensitivity detection |
US10823586B2 (en) | 2018-12-26 | 2020-11-03 | Allegro Microsystems, Llc | Magnetic field sensor having unequally spaced magnetic field sensing elements |
US11237020B2 (en) | 2019-11-14 | 2022-02-01 | Allegro Microsystems, Llc | Magnetic field sensor having two rows of magnetic field sensing elements for measuring an angle of rotation of a magnet |
US11280637B2 (en) | 2019-11-14 | 2022-03-22 | Allegro Microsystems, Llc | High performance magnetic angle sensor |
US11262422B2 (en) | 2020-05-08 | 2022-03-01 | Allegro Microsystems, Llc | Stray-field-immune coil-activated position sensor |
US11493361B2 (en) | 2021-02-26 | 2022-11-08 | Allegro Microsystems, Llc | Stray field immune coil-activated sensor |
US11578997B1 (en) | 2021-08-24 | 2023-02-14 | Allegro Microsystems, Llc | Angle sensor using eddy currents |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR95394E (en) * | 1966-01-11 | 1970-09-11 | Commissariat Energie Atomique | Method of non-destructive testing by eddy currents of electrically conductive tubes and corresponding apparatus. |
FR2324003A1 (en) * | 1975-09-09 | 1977-04-08 | Commissariat Energie Atomique | NON DESTRUCTIVE EDD CURRENT CONTROL PROCESS AND CORRESPONDING DEVICE, USING MULTI-FREQUENCY EXCITATION AND ALLOWING THE ELIMINATION OF CERTAIN PARAMETERS |
DE2641798C3 (en) * | 1976-09-17 | 1980-12-11 | Friedrich Dr. 7410 Reutlingen Foerster | Method and device for the contactless determination of physical or geometric properties |
-
1983
- 1983-12-16 CA CA000443558A patent/CA1212997A/en not_active Expired
-
1984
- 1984-12-04 DK DK576484A patent/DK576484A/en not_active Application Discontinuation
- 1984-12-07 AT AT84114926T patent/ATE51708T1/en not_active IP Right Cessation
- 1984-12-07 EP EP84114926A patent/EP0146091B1/en not_active Expired - Lifetime
- 1984-12-07 DE DE8484114926T patent/DE3481859D1/en not_active Expired - Fee Related
- 1984-12-10 AU AU36462/84A patent/AU3646284A/en not_active Abandoned
- 1984-12-14 ES ES84538619A patent/ES8606645A1/en not_active Expired
- 1984-12-17 JP JP59266079A patent/JPS60152950A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0146091A2 (en) | 1985-06-26 |
DE3481859D1 (en) | 1990-05-10 |
DK576484D0 (en) | 1984-12-04 |
JPS60152950A (en) | 1985-08-12 |
CA1212997A (en) | 1986-10-21 |
AU3646284A (en) | 1985-06-20 |
ATE51708T1 (en) | 1990-04-15 |
ES538619A0 (en) | 1986-04-16 |
EP0146091A3 (en) | 1985-07-31 |
EP0146091B1 (en) | 1990-04-04 |
ES8606645A1 (en) | 1986-04-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AHS | Application shelved for other reasons than non-payment |