DK550784D0 - Fremgangsmaade og apparat til detektering af revner i halvledende eller ledende materiale - Google Patents

Fremgangsmaade og apparat til detektering af revner i halvledende eller ledende materiale

Info

Publication number
DK550784D0
DK550784D0 DK550784A DK550784A DK550784D0 DK 550784 D0 DK550784 D0 DK 550784D0 DK 550784 A DK550784 A DK 550784A DK 550784 A DK550784 A DK 550784A DK 550784 D0 DK550784 D0 DK 550784D0
Authority
DK
Denmark
Prior art keywords
semi
conductive
detecting cracks
leading material
leading
Prior art date
Application number
DK550784A
Other languages
English (en)
Other versions
DK550784A (da
Inventor
John Ruediger Mader Viertl
Mederic Edmond Auger
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of DK550784D0 publication Critical patent/DK550784D0/da
Publication of DK550784A publication Critical patent/DK550784A/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
DK550784A 1983-12-12 1984-11-20 Fremgangsmaade og apparat til detektering af revner i halvledende eller ledende materiale DK550784A (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/560,214 US4593245A (en) 1983-12-12 1983-12-12 Eddy current method for detecting a flaw in semi-conductive material

Publications (2)

Publication Number Publication Date
DK550784D0 true DK550784D0 (da) 1984-11-20
DK550784A DK550784A (da) 1985-06-13

Family

ID=24236838

Family Applications (1)

Application Number Title Priority Date Filing Date
DK550784A DK550784A (da) 1983-12-12 1984-11-20 Fremgangsmaade og apparat til detektering af revner i halvledende eller ledende materiale

Country Status (4)

Country Link
US (1) US4593245A (da)
EP (1) EP0147630A1 (da)
JP (1) JPS60142246A (da)
DK (1) DK550784A (da)

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JPH0648261B2 (ja) * 1986-11-18 1994-06-22 大同ほくさん株式会社 励磁型薄膜ピツクアツプコイル
CH677152A5 (da) * 1989-02-08 1991-04-15 Asea Brown Boveri
DE3920081A1 (de) * 1989-06-20 1991-01-03 Foerster Inst Dr Friedrich Suchspulenanordnung
US5038104A (en) * 1990-02-05 1991-08-06 Vanderbilt University Magnetometer flux pick-up coil with non-uniform interturn spacing optimized for spatial resolution
US5047719A (en) * 1990-05-25 1991-09-10 The Failure Group, Inc. Flexible coil assembly for reflectance-mode nondestructive eddy-current examination
US5402098A (en) * 1991-03-25 1995-03-28 Satosen Co., Ltd. Coil
US5389876A (en) * 1991-05-06 1995-02-14 General Electric Company Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part
US5315234A (en) * 1992-04-03 1994-05-24 General Electric Company Eddy current device for inspecting a component having a flexible support with a plural sensor array
US5262722A (en) * 1992-04-03 1993-11-16 General Electric Company Apparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array
DE4316671C1 (de) * 1993-05-13 1994-06-23 Mannesmann Ag Vorrichtung zur Magnetpulverprüfung mit berührungsloser Magnetisierung
JPH0783884A (ja) * 1993-09-14 1995-03-31 Kenzo Miya 探傷検査方法、探傷検査装置、及び探傷検査用センサ
US5442286A (en) * 1993-09-22 1995-08-15 General Electric Company Eddy current array inspection device
WO1995023343A1 (en) * 1994-02-28 1995-08-31 Philips Electronics N.V. Device for measuring magnetic fields
US6249234B1 (en) 1994-05-14 2001-06-19 Absolute Sensors Limited Position detector
US20030062889A1 (en) * 1996-12-12 2003-04-03 Synaptics (Uk) Limited Position detector
WO2000033244A2 (en) * 1998-11-27 2000-06-08 Synaptics (Uk) Limited Position sensor
US6788221B1 (en) 1996-06-28 2004-09-07 Synaptics (Uk) Limited Signal processing apparatus and method
JP2913600B2 (ja) * 1996-09-03 1999-06-28 神鋼特殊鋼管株式会社 原子燃料被覆管の表面探傷法
DE19704596C1 (de) * 1997-02-07 1998-07-23 Helling Ind Prod Vorrichtung zur berührungslosen Magnetpulverprüfung der inneren Endbereiche von Rohren
JP3800565B2 (ja) 1997-02-26 2006-07-26 株式会社日本コンラックス カード払出し装置
DE69832274T2 (de) 1997-05-28 2006-08-03 Synaptics (Uk) Ltd., Harston Verfahren und drahtbond-vorrichtung zur herstellung eines wandlers
GB9720954D0 (en) 1997-10-02 1997-12-03 Scient Generics Ltd Commutators for motors
GB9721891D0 (en) 1997-10-15 1997-12-17 Scient Generics Ltd Symmetrically connected spiral transducer
JP2001522046A (ja) * 1997-11-04 2001-11-13 シーメンス アクチエンゲゼルシヤフト 渦電流検査ヘッド、渦電流検査ヘッドの製造方法および渦電流検査方法
GB9811151D0 (en) 1998-05-22 1998-07-22 Scient Generics Ltd Rotary encoder
SE515544C2 (sv) 1998-11-26 2001-08-27 Westinghouse Atom Ab Förfarande och anordning för bestämning av hydridinnehåll
SE515190C2 (sv) * 1998-11-26 2001-06-25 Westinghouse Atom Ab Användning av en elektrisk spole som mäter materialparametrar medelst en induktiv virvelströmsmetod
US7019672B2 (en) * 1998-12-24 2006-03-28 Synaptics (Uk) Limited Position sensor
US6288537B1 (en) 1999-12-22 2001-09-11 General Electric Company Eddy current probe with foil sensor mounted on flexible probe tip and method of use
RU2189585C2 (ru) * 2000-06-28 2002-09-20 Московский государственный университет леса Вихретоковый датчик
DE60227174D1 (de) * 2001-05-21 2008-07-31 Synaptics Uk Ltd Positionssensor
EP1248076A1 (de) * 2001-07-30 2002-10-09 Esec Trading S.A. Induktiver Sensor für die Positionserfassung eines metallischen Werkstücks
GB2403017A (en) * 2002-03-05 2004-12-22 Synaptics Position sensor
AU2003232360A1 (en) * 2002-06-05 2003-12-22 Synaptics (Uk) Limited Signal transfer method and apparatus
GB0317370D0 (en) * 2003-07-24 2003-08-27 Synaptics Uk Ltd Magnetic calibration array
GB0319945D0 (en) * 2003-08-26 2003-09-24 Synaptics Uk Ltd Inductive sensing system
US6973838B2 (en) * 2004-04-12 2005-12-13 Xenotrancorp. Non-contacting crack sensor
US7755351B2 (en) * 2007-01-23 2010-07-13 The Boeing Company Method and apparatus for detecting inconsistencies in fiber reinforced resin parts using eddy currents
WO2008139216A2 (en) 2007-05-10 2008-11-20 Cambridge Integrated Circuits Limited Transducer
US7994780B2 (en) * 2007-09-14 2011-08-09 General Electric Company System and method for inspection of parts with an eddy current probe
GB2488389C (en) 2010-12-24 2018-08-22 Cambridge Integrated Circuits Ltd Position sensing transducer
US20120249281A1 (en) * 2011-04-04 2012-10-04 General Electric Company Inductor and eddy current sensor including an inductor
US9932852B2 (en) 2011-08-08 2018-04-03 General Electric Company Sensor assembly for rotating devices and methods for fabricating
GB2503006B (en) 2012-06-13 2017-08-09 Cambridge Integrated Circuits Ltd Position sensing transducer
MX2018006570A (es) * 2015-12-08 2018-08-01 Eaton Intelligent Power Ltd Sensor de corrosion de corriente parasita.
JP6992445B2 (ja) * 2017-11-27 2022-01-13 富士電機株式会社 硬貨検知用アンテナおよび硬貨処理装置
CN112730603B (zh) * 2020-10-13 2024-07-12 爱德森（厦门）电子有限公司 一种提高涡流检测裂纹深度检测范围的方法及其系统装置

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US3132299A (en) * 1960-10-17 1964-05-05 Budd Co Electromagnetic-testing bridge-net-work with digital programming control for operation under a plurality of initial unbalance conditions
US3568049A (en) * 1968-12-30 1971-03-02 Amf Inc Adjustable search shoe for use in nondestructive testing of tubular members
US3901368A (en) * 1974-03-11 1975-08-26 Lance T Klinger Coin acceptor/rejector
DE2426270C3 (de) * 1974-05-29 1978-04-27 Institut Dr. Friedrich Foerster Pruefgeraetebau, 7410 Reutlingen WirbelstromprUfspulenanordnung
GB1567600A (en) * 1975-10-15 1980-05-21 British Gas Corp Lipe line inspection equipment
FR2339170A1 (fr) * 1976-01-22 1977-08-19 Commissariat Energie Atomique Pont de mesure pour dispositif de controle par courants de foucault
SU700830A1 (ru) * 1978-06-08 1979-11-30 Кубанский Ордена Трудового Красного Знамени Сельскохозяйственный Институт Токовихревой накладной преобразователь
SU824020A1 (ru) * 1979-07-24 1981-04-23 Кубанский Ордена Трудового Красногознамени Сельскохозяйственный Институт Вихретоковый преобразователь дл НЕРАзРушАющЕгО КОНТРОл
DE3068908D1 (en) * 1979-12-07 1984-09-13 Thorburn Technics Int Eddy current inspection apparatus and probe
SU987508A1 (ru) * 1980-07-31 1983-01-07 Московский Ордена Ленина И Ордена Октябрьской Революции Энергетический Институт Вихретоковый датчик дл неразрушающих испытаний и способ его изготовлени
DE3137222A1 (de) * 1980-09-18 1983-04-14 Robert Bosch Gmbh, 7000 Stuttgart Flaechenhafte spiralspule

Also Published As

Publication number Publication date
JPS60142246A (ja) 1985-07-27
US4593245A (en) 1986-06-03
EP0147630A1 (en) 1985-07-10
DK550784A (da) 1985-06-13

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Legal Events

Date Code Title Description
AHB Application shelved due to non-payment