DK3136151T3 - Apparat til at observere lysemissionen fra en prøve ved dynamisk optisk mikroskopi - Google Patents
Apparat til at observere lysemissionen fra en prøve ved dynamisk optisk mikroskopi Download PDFInfo
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- DK3136151T3 DK3136151T3 DK16194311.3T DK16194311T DK3136151T3 DK 3136151 T3 DK3136151 T3 DK 3136151T3 DK 16194311 T DK16194311 T DK 16194311T DK 3136151 T3 DK3136151 T3 DK 3136151T3
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Classifications
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
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- G—PHYSICS
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- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0088—Inverse microscopes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
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- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
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- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
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- G02B21/365—Control or image processing arrangements for digital or video microscopes
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- H—ELECTRICITY
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
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- Optics & Photonics (AREA)
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- Oil, Petroleum & Natural Gas (AREA)
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- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Computing Systems (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Microscoopes, Condenser (AREA)
Claims (10)
1. Observationsapparat (100) til at observere en lysemission (14, 15) fra en prøve (10) i et medium (11) med brydningsindeks ni., hvor prøven er anbragt mod en overflade (20a) afen transparent bærer (20) med brydningsindeks ns, som er større end ni., idet lysemissionen omfatter lyskomponenter, som hver især har en amplitude og en fase, er orienterede mod bæreren og danner en vinkel Θ med en retning (20b) vinkelret på overfladen (20a), blandt hvilke på den ene side superkritiske lyskomponenter, for hvilke vinklen Θ netop er større end en kritisk vinkel 0c = arcsin(nL/ns), og på den anden side kritiske eller subkritiske lyskomponenter, for hvilke vinklen θ er mindre end eller lig med den kritiske vinkel 0c, idet observationsindretningen (100) er i stand til: - at fange mindst en del af lysemissionen fra et interesseområde af prøven og opnå et fanget lyssignal omfattende lyskomponenter, der stammer fra de superkritiske lyskomponenter af lysemissionen; - at anvende filtre (170) på det fangede lyssignal for selektivt at mindske amplituden og/eller at ændre fasen af nogle af lyskomponenterne af det fangede lyssignal for at opnå et filtreret lyssignal; og - at omdanne det filtrerede lyssignal til et billedområde af interesseområdet af prøven; idet opservationsapparatet (100) er kendetegnet ved, at: - det tillader at udføre en modulation af det filtrerede lyssignal, idet det tillades lyskomponenter, der stammer fra de kritiske eller subkritiske lyskomponenter af lysemissionen at passere igennem for at opnå billedområder (6a, 6b) af et og samme interesseområde af prøven, hvor modulationen anvendes på alle eller nogle af lyskomponenterne af det fangede lyssignal, der stammer fra de superkritiske lyskomponenter af lysemissionen; og - det tillader at frembringe mindst et brugbart billedområde (6c) af prøven ved at kombinere billedområderne (6a, 6b), hvor kombinationen fremhæver forskelle mellem de med modulationen associerede billedområder (6a, 6b).
2. Observationsapparat (100) ifølge krav 1, kendetegnet ved, at lyskomponenterne af det fangede lyssignal, der er genstand for modulationen, stammer fra de superkritiske lyskomponenter af lysemissionen.
3. Observationsapparat (100) ifølge et hvilket som helst af kravene 1 eller 2, kendetegnet ved, at det tillader successivt at anvende filtre (170) på det fangede lyssignal for successivt at opnå billedområder (6a, 6b), som i kombination giver det brugbare billedområde (6c) af prøven.
4. Observationsapparat (100) ifølge et hvilket som helst af kravene 1 til 3, kendetegnet ved, at det omfatter en flerhed af filtre (170), hvor flerheden af filtre er således at: - i det filtrerede lyssignal tillader et filter blandt flerheden af filtre passage af lyskomponenter, der stammer fra de superkritiske lyskomponenter af lysemissionen; - alle filtrene blandt flerheden af filtre tillader lyskomponenterne af det fangede lyssignal, der stammer fra de kritiske eller subkritiske lyskomponenter af lysemissionen, at passere igennem, og virker indbyrdes i alt væsentligt på en samme måde på lyskomponenterne af det fangede lyssignal, der stammer fra de kritiske eller subkritiske lyskomponenter af lysemissionen; og - der er mindst to filtre af flerheden, der virker indbyrdes i alt væsentligt på forskellige måder på amplituden eller fasen af mindst nogle af lyskomponenterne af det fangede lyssignal, der stammer fra de superkritiske lyskomponenter af lysemissionen; og observationsapparatet (100) tillader at tage en flerhed af billedområder af et og samme interesseområde af prøven ved hjælp af flerheden af filtre, idet hvert filter tjener til at tage et billedområde blandt flerheden af billedområder og tillader at frembringe et brugbart billedområde af prøven ved en beregning, der kombinerer flerheden af billedområder for at påvise forskelle mellem billedområderne blandt flerheden af billedområder af prøven.
5. Observationsapparat (100) ifølge et hvilket som helst af kravene 1 til 4, kendetegnet ved, at det omfatter to filtre, hvor de to filtre er således at: - i det filtrerede lyssignal tillader det ene af de to filtre passage af de lyskomponenter, der stammer fra de superkritiske lyskomponenter af lysemissionen; og - det andet filter virker i alt væsentligt på samme måde som nævnte ene af de to filtre på lyskomponenterne af det fangede lyssignal, der stammer fra de kritiske eller subkritiske lyskomponenter af lysemissionen, og det mindsker i alt væsentligt stærkere end det nævnte ene af de to filtre amplituden af mindst nogle af lyskomponenterne af det fangede lyssignal, der stammer fra de superkritiske lyskomponenter af lysemissionen; og observationsapparatet (100) tillader at tage mindst to billedområder af et og samme interesseområde af prøven ved hjælp af to filtre, idet hvert filter tjener til at tage et af de to billedområder og tillader at frembringe et brugbart billedområde af prøven ved en beregning, idet beregningen omfatter en algebraisk differens mellem begge billedområder af prøven.
6. Observationsapparat (100) ifølge et hvilket som helst af kravene 1 til 5, kendetegnet ved, at de filtrene også delvist reducerer amplituden af alle eller nogle af lyskomponenterne af det fangede lyssignal, der stammer fra de kritiske og subkritiske lyskomponenter af lysemissionen.
7. Observationsapparat (100) ifølge et hvilket som helst af kravene 1 til 6, kendetegnet ved, at lyskomponenter af det fangede lyssignal, der stammer fra lyskomponenter af lysemissionen, som danner den samme vinkel Θ, behandles i alt væsentligt på en samme måde med et og samme filter til at mindske amplituden eller ændre fasen.
8. Observationsapparat (100) ifølge et hvilket som helst af kravene 1 til 7, kendetegnet ved, at det omfatter: - et neutralt filter, der i det filtrerede lyssignal tillader alle lyskomponenterne af det fangede lyssignal, der stammer fra de superkritiske lyskomponenter af lysemissionen, at passere uden nogen mindskelse af amplitude for at tilvejebringe et af billedområderne af prøven; og - et totalt filter, der i det filtrerede lyssignal totalt ophæver alle de lyskomponenter, der stammer fra de superkritiske lyskomponenter af lysemissionen, for at tilvejebringe et andet billedområde af prøven.
9. Observationsapparat (100) ifølge et hvilket som helst af kravene 1 til 8, kendetegnet ved, at det omfatter et fuldfelt-immersionsobjektiv (110), og filtrene (170) er lokaliseret i et bageste fokusplan (400) af immersionsobjektivet (110) og/eller i et med det bageste fokusplan konjugeret plan (420).
10. Observationsapparat (100) ifølge krav 9, kendetegnet ved, at filtrene (170) omfatter en blænde (176), der i en åben position tillader passage af lyskomponenter af det fangede lyssignal, der stammer fra de superkritiske lyskomponenter af lysemissionen, og afhængigt af blænderens (176) lukningsgrad tillader at skjule lyskomponenterne af det fangede lyssignal, der stammer fra de superkritiske lyskomponenter af lysemissionen med en vinkel Θ større end en grænseværdi relateret til lukningsgraden.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1058913A FR2966937B1 (fr) | 2010-10-28 | 2010-10-28 | Methode d'observation de l'emission de lumiere d'un echantillon par microscopie optique dynamique |
| EP11785747.4A EP2633357B1 (fr) | 2010-10-28 | 2011-10-25 | Methode d'observation de l'emission de lumiere d'un echantillon par microscopie optique dynamique |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DK3136151T3 true DK3136151T3 (da) | 2019-04-01 |
Family
ID=43926905
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK16194311.3T DK3136151T3 (da) | 2010-10-28 | 2011-10-25 | Apparat til at observere lysemissionen fra en prøve ved dynamisk optisk mikroskopi |
| DK11785747.4T DK2633357T3 (da) | 2010-10-28 | 2011-10-25 | Fremgangsmåde til at observere emissionen af lys fra en prøve med dynamisk optisk mikroskopi |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK11785747.4T DK2633357T3 (da) | 2010-10-28 | 2011-10-25 | Fremgangsmåde til at observere emissionen af lys fra en prøve med dynamisk optisk mikroskopi |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US9541751B2 (da) |
| EP (2) | EP3136151B1 (da) |
| JP (1) | JP5992913B2 (da) |
| DK (2) | DK3136151T3 (da) |
| ES (2) | ES2617449T3 (da) |
| FR (1) | FR2966937B1 (da) |
| PL (1) | PL2633357T3 (da) |
| PT (1) | PT2633357T (da) |
| WO (1) | WO2012056160A1 (da) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014013720A1 (ja) * | 2012-07-19 | 2014-01-23 | 株式会社ニコン | 構造化照明顕微鏡装置 |
| JP2016105126A (ja) * | 2014-12-01 | 2016-06-09 | 横河電機株式会社 | 顕微鏡装置 |
| FR3051921B1 (fr) * | 2016-05-31 | 2018-06-01 | Centre National De La Recherche Scientifique | Dispositif et procede d'eclairage pour microscopie de fluorescence a onde evanescente |
| GB2589327B (en) * | 2019-11-26 | 2023-09-13 | Andor Tech Limited | Differential phase contrast microscope |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6819484B2 (en) * | 2001-11-06 | 2004-11-16 | Olympus Optical Co., Ltd. | Total internal reflection illumination apparatus and microscope using this total internal reflection illumination apparatus |
| DE10231667A1 (de) * | 2002-07-12 | 2004-01-22 | Olympus Biosystems Gmbh | Beleuchtungsvorrichtung und optische Objektuntersuchungseinrichtung |
| DE102004031049A1 (de) * | 2004-06-25 | 2006-01-12 | Leica Microsystems Cms Gmbh | Optische Anordnung zum spektralselektiven Nachweis von Licht eines Lichtstrahls |
| US7046359B2 (en) * | 2004-06-30 | 2006-05-16 | Chemimage Corporation | System and method for dynamic chemical imaging |
| EP2016393A2 (en) * | 2006-05-05 | 2009-01-21 | Dublin City University | Optical probe |
| AU2007249399A1 (en) * | 2006-05-09 | 2007-11-22 | Braincells, Inc. | Neurogenesis by modulating angiotensin |
| US7460248B2 (en) * | 2006-05-15 | 2008-12-02 | Carestream Health, Inc. | Tissue imaging system |
| JP5021254B2 (ja) * | 2006-09-06 | 2012-09-05 | オリンパス株式会社 | 顕微鏡装置の制御方法、顕微鏡装置 |
| FR2943428B1 (fr) * | 2009-03-20 | 2011-05-13 | Univ Paris Diderot Paris 7 | Dispositif de microscopie de fluorescence et methode d'observation associe |
| US8228602B2 (en) * | 2009-03-25 | 2012-07-24 | Dublin City University Of Collins Avenue | Super critical angle fluorescence scanning system |
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2010
- 2010-10-28 FR FR1058913A patent/FR2966937B1/fr not_active Expired - Fee Related
-
2011
- 2011-10-25 EP EP16194311.3A patent/EP3136151B1/fr active Active
- 2011-10-25 WO PCT/FR2011/052482 patent/WO2012056160A1/fr not_active Ceased
- 2011-10-25 JP JP2013535491A patent/JP5992913B2/ja not_active Expired - Fee Related
- 2011-10-25 DK DK16194311.3T patent/DK3136151T3/da active
- 2011-10-25 DK DK11785747.4T patent/DK2633357T3/da active
- 2011-10-25 PT PT117857474T patent/PT2633357T/pt unknown
- 2011-10-25 US US13/881,707 patent/US9541751B2/en not_active Expired - Fee Related
- 2011-10-25 EP EP11785747.4A patent/EP2633357B1/fr active Active
- 2011-10-25 ES ES11785747.4T patent/ES2617449T3/es active Active
- 2011-10-25 PL PL11785747T patent/PL2633357T3/pl unknown
- 2011-10-25 ES ES16194311T patent/ES2714361T3/es active Active
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2016
- 2016-11-29 US US15/363,909 patent/US10345241B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| FR2966937B1 (fr) | 2012-12-28 |
| ES2617449T3 (es) | 2017-06-19 |
| PT2633357T (pt) | 2017-03-10 |
| WO2012056160A1 (fr) | 2012-05-03 |
| JP5992913B2 (ja) | 2016-09-14 |
| EP3136151A1 (fr) | 2017-03-01 |
| US20170082547A1 (en) | 2017-03-23 |
| US20130278742A1 (en) | 2013-10-24 |
| PL2633357T3 (pl) | 2017-06-30 |
| EP2633357A1 (fr) | 2013-09-04 |
| US10345241B2 (en) | 2019-07-09 |
| EP3136151B1 (fr) | 2018-12-12 |
| DK2633357T3 (da) | 2017-03-13 |
| JP2013542466A (ja) | 2013-11-21 |
| EP2633357B1 (fr) | 2016-12-07 |
| US9541751B2 (en) | 2017-01-10 |
| FR2966937A1 (fr) | 2012-05-04 |
| ES2714361T3 (es) | 2019-05-28 |
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