DK2835653T3 - Prøveholder til en AFM - Google Patents

Prøveholder til en AFM Download PDF

Info

Publication number
DK2835653T3
DK2835653T3 DK13179454.7T DK13179454T DK2835653T3 DK 2835653 T3 DK2835653 T3 DK 2835653T3 DK 13179454 T DK13179454 T DK 13179454T DK 2835653 T3 DK2835653 T3 DK 2835653T3
Authority
DK
Denmark
Prior art keywords
afm
sample holder
holder
sample
Prior art date
Application number
DK13179454.7T
Other languages
English (en)
Inventor
Marko Loparic
Original Assignee
Univ Basel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Basel filed Critical Univ Basel
Application granted granted Critical
Publication of DK2835653T3 publication Critical patent/DK2835653T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/20—Sample handling devices or methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Amplifiers (AREA)
  • Optical Measuring Cells (AREA)
  • Slide Fasteners, Snap Fasteners, And Hook Fasteners (AREA)
DK13179454.7T 2013-08-06 2013-08-06 Prøveholder til en AFM DK2835653T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP13179454.7A EP2835653B1 (en) 2013-08-06 2013-08-06 Sample holder for an AFM

Publications (1)

Publication Number Publication Date
DK2835653T3 true DK2835653T3 (da) 2023-01-09

Family

ID=48948280

Family Applications (1)

Application Number Title Priority Date Filing Date
DK13179454.7T DK2835653T3 (da) 2013-08-06 2013-08-06 Prøveholder til en AFM

Country Status (13)

Country Link
US (1) US10823756B2 (da)
EP (2) EP2835653B1 (da)
JP (1) JP6553603B2 (da)
CN (1) CN105593689B (da)
DK (1) DK2835653T3 (da)
ES (1) ES2933928T3 (da)
FI (1) FI2835653T3 (da)
HR (1) HRP20221526T1 (da)
HU (1) HUE060535T2 (da)
PL (1) PL2835653T3 (da)
PT (1) PT2835653T (da)
RS (1) RS63843B1 (da)
WO (1) WO2015018865A1 (da)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
HRP20240597T1 (hr) 2014-10-03 2024-07-19 Universität Basel Postupak za predviđanje napredovanja raka nanomehaničkim profiliranjem
EP3159690A1 (en) 2015-10-22 2017-04-26 Universität Basel Nanomechanical profiling of breast cancer molecular subtypes
AT519344B1 (de) * 2016-10-18 2019-11-15 Anton Paar Gmbh Definiert schaltbare magnetische Haltevorrichtung

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4020846A (en) * 1975-09-26 1977-05-03 Stokes Henry W Splinter puller
US4672797A (en) * 1985-06-21 1987-06-16 Gatan, Inc. Method and apparatus for securing and transferring grid specimens
US5041783A (en) * 1989-02-13 1991-08-20 Olympus Optical Co., Ltd. Probe unit for an atomic probe microscope
JP3039562B2 (ja) * 1990-11-28 2000-05-08 株式会社日立製作所 走査型電子顕微手段を内蔵した複合化装置
US5229607A (en) * 1990-04-19 1993-07-20 Hitachi, Ltd. Combination apparatus having a scanning electron microscope therein
DE9418094U1 (de) * 1994-11-15 1995-01-12 Tontarra Medizintechnik GmbH, 78573 Wurmlingen Chirurgisches Rohrschaftinstrument
JP3753196B2 (ja) * 1996-04-09 2006-03-08 カヤバ工業株式会社 ロッドガイドの成形方法
US5854487A (en) * 1997-02-28 1998-12-29 Park Scientific Instruments Scanning probe microscope providing unobstructed top down and bottom up views
JP2000214064A (ja) * 1999-01-26 2000-08-04 Japan Aviation Electronics Industry Ltd 走査トンネル顕微鏡用試料ホルダ
JP2002543440A (ja) * 1999-04-29 2002-12-17 シファーゲン バイオシステムズ， インコーポレイテッド 気相質量分析計のための疎水性コーティングを有するサンプルホルダー
US20020131167A1 (en) * 2000-11-09 2002-09-19 Nguyen Francis T. Sample holder for an imaging system
ATE520970T1 (de) * 2002-04-08 2011-09-15 E A Fischione Instr Inc Präparathaltevorrichtung
KR100537070B1 (ko) * 2004-03-06 2005-12-16 이용진 현미경용 챔버형 시료 장착기
JP4601000B2 (ja) * 2006-02-03 2010-12-22 セイコーインスツル株式会社 特定物質観察装置及び特定物質観察方法
WO2008089950A1 (en) * 2007-01-22 2008-07-31 Nanofactory Instruments Ab Mems sensor for in situ tem atomic force microscopy
US7641248B2 (en) * 2007-10-22 2010-01-05 Yong-Hoon Cho Compact double tweezers
US20110121592A1 (en) * 2009-11-20 2011-05-26 Yong Hoon Cho Double tipped head tweezers
US8602782B2 (en) * 2009-11-24 2013-12-10 Zimmer Dental, Inc. Porous implant device with improved core
TWI421490B (zh) * 2010-03-17 2014-01-01 Univ Nat Sun Yat Sen 偵測與顯像磁性金屬蛋白之方法
CN201814628U (zh) * 2010-10-26 2011-05-04 胡桂成 一种换药用镊子
DE102011015617B3 (de) * 2011-03-30 2012-06-14 Olympus Winter & Ibe Gmbh Handgriff
CN202495417U (zh) * 2012-03-31 2012-10-17 上海华力微电子有限公司 应用于扫描电子显微镜的样品座
GB201208783D0 (en) * 2012-05-18 2012-07-04 Trelleborg Offshore U K Ltd Clamp

Also Published As

Publication number Publication date
EP2835653A1 (en) 2015-02-11
FI2835653T3 (fi) 2023-01-13
JP2016531292A (ja) 2016-10-06
EP3030912C0 (en) 2024-05-15
EP3030912B1 (en) 2024-05-15
RS63843B1 (sr) 2023-01-31
EP2835653B1 (en) 2022-09-28
US10823756B2 (en) 2020-11-03
JP6553603B2 (ja) 2019-07-31
CN105593689A (zh) 2016-05-18
EP3030912A1 (en) 2016-06-15
HUE060535T2 (hu) 2023-03-28
US20160178658A1 (en) 2016-06-23
WO2015018865A1 (en) 2015-02-12
HRP20221526T1 (hr) 2023-02-17
PL2835653T3 (pl) 2023-04-17
ES2933928T3 (es) 2023-02-14
PT2835653T (pt) 2023-01-04
CN105593689B (zh) 2022-02-08

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