DK2467702T3 - Fremgangsmåde og indretning til detektering af blyholdige glasstykker - Google Patents
Fremgangsmåde og indretning til detektering af blyholdige glasstykker Download PDFInfo
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- DK2467702T3 DK2467702T3 DK10709457.5T DK10709457T DK2467702T3 DK 2467702 T3 DK2467702 T3 DK 2467702T3 DK 10709457 T DK10709457 T DK 10709457T DK 2467702 T3 DK2467702 T3 DK 2467702T3
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- 238000000034 method Methods 0.000 title claims description 35
- 239000000463 material Substances 0.000 claims description 28
- 230000005540 biological transmission Effects 0.000 claims description 24
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- 239000002356 single layer Substances 0.000 claims description 6
- 230000002452 interceptive effect Effects 0.000 claims 2
- 239000010410 layer Substances 0.000 claims 1
- 239000012535 impurity Substances 0.000 description 22
- 239000005355 lead glass Substances 0.000 description 17
- 230000005855 radiation Effects 0.000 description 15
- HTUMBQDCCIXGCV-UHFFFAOYSA-N lead oxide Chemical compound [O-2].[Pb+2] HTUMBQDCCIXGCV-UHFFFAOYSA-N 0.000 description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 239000000919 ceramic Substances 0.000 description 6
- 229910000464 lead oxide Inorganic materials 0.000 description 5
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- 239000011248 coating agent Substances 0.000 description 2
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- 238000012360 testing method Methods 0.000 description 2
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- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
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- 230000031700 light absorption Effects 0.000 description 1
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- 230000008018 melting Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000010812 mixed waste Substances 0.000 description 1
- 239000005284 oxidic glass Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
- B07C5/3425—Sorting according to other particular properties according to optical properties, e.g. colour of granular material, e.g. ore particles, grain
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0026—Etching of the substrate by chemical or physical means by laser ablation
- H05K3/0032—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material
- H05K3/0035—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material of blind holes, i.e. having a metal layer at the bottom
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4688—Composite multilayer circuits, i.e. comprising insulating layers having different properties
- H05K3/4691—Rigid-flexible multilayer circuits comprising rigid and flexible layers, e.g. having in the bending regions only flexible layers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C2501/00—Sorting according to a characteristic or feature of the articles or material to be sorted
- B07C2501/0072—Sorting of glass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06146—Multisources for homogeneisation, as well sequential as simultaneous operation
- G01N2201/06153—Multisources for homogeneisation, as well sequential as simultaneous operation the sources being LED's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0634—Diffuse illumination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0636—Reflectors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
- H05K1/097—Inks comprising nanoparticles and specially adapted for being sintered at low temperature
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0104—Properties and characteristics in general
- H05K2201/0112—Absorbing light, e.g. dielectric layer with carbon filler for laser processing
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/02—Fillers; Particles; Fibers; Reinforcement materials
- H05K2201/0203—Fillers and particles
- H05K2201/0206—Materials
- H05K2201/0209—Inorganic, non-metallic particles
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09009—Substrate related
- H05K2201/09127—PCB or component having an integral separable or breakable part
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09654—Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
- H05K2201/09781—Dummy conductors, i.e. not used for normal transport of current; Dummy electrodes of components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/20—Details of printed circuits not provided for in H05K2201/01 - H05K2201/10
- H05K2201/2054—Light-reflecting surface, e.g. conductors, substrates, coatings, dielectrics
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4611—Manufacturing multilayer circuits by laminating two or more circuit boards
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- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Manufacturing & Machinery (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Sorting Of Articles (AREA)
Claims (18)
1. Fremgangsmåde til detektering af blyholdige glasstykker i en etlags-mate-rialestrøm af objekter af fortrinsvis affaldsglas, hvor objekterne bestråles med i det væsentlige monokromatisk UV-lys (3), og det deraf resulterende fluorescenslys detekteres, kendetegnet ved, at - objekterne yderligere bestråles med synligt lys eller IR-lys (4, 14) uden for fluorescenslysets bølgelængdeområde, - transmissionslyset fra det synlige lys eller IR-lyset (4, 14) detekteres, efter at det er gået igennem objektet, - og et objekt defineres som blyholdigt i det tilfælde, hvor både fluorescenslys for mindst et på forhånd angivet bølgelængdeområde, der svarer til fluorescensen hos blyholdige glas, foreligger i et på forhånd angivet intensitetsområde og transmissionslys i et på forhånd angivet intensitetsområde med en intensitet større end nul.
2. Fremgangsmåde ifølge krav 1, kendetegnet ved, at UV-lyset (3) har en bølgelængde i området fra 100 til 300 nm, især mellem 250 og 275 nm, og fluorescenslyset detekteres i bølgelængdeområdet fra 380-500 nm.
3. Fremgangsmåde ifølge krav 2, kendetegnet ved, at UV-lyset (3) har en bølgelængde på ca. 270 nm og fluorescenslyset detekteres i bølgelængdeområdet fra 380-450 nm.
4. Fremgangsmåde ifølge krav 2, kendetegnet ved, at UV-lyset (3) har en bølgelængde på ca. 254 nm og fluorescenslyset detekteres i bølgelængdeområdet fra 420-500 nm.
5. Fremgangsmåde ifølge et af kravene 1 til 4, kendetegnet ved, at fluorescenslyset måles i modlysprocessen.
6. Fremgangsmåde ifølge et af kravene 1 til 5, kendetegnet ved, at der på grund af fluorescenslysets intensitet i det på forhånd angivne intensitetsområde for blyholdige glasstykker foretages en yderligere underinddeling af de blyholdige glasstykker med hensyn til blyindhold.
7. Fremgangsmåde ifølge et af kravene 1 til 6, kendetegnet ved, at der for hvert undersøgte objekt på grund af bestrålingen med synligt lys eller IR-lys (4, 14) bestemmes et delområde, såsom kantområdet eller inderområdet, af objektet, og kun intensiteten af fluorescenslyset i delområdet inddrages til at definere blyindholdet.
8. Fremgangsmåde ifølge et af kravene 1 til 7, kendetegnet ved, at et objekt defineres som lidt eller ikke transparent forstyrrelsesmateriale, hvis dettes transmissionslys ligger i et intensitetsområde, som ligger under intensitetsområdet for blyholdige glasstykker.
9. Fremgangsmåde ifølge et af kravene 1 til 8, kendetegnet ved, at et objekt, som defineres som blyholdigt og/eller som forstyrrelsesmateriale, fjernes fra materialestrømmen.
10. Fremgangsmåde ifølge et af kravene 1 til 9, kendetegnet ved, at lyset fra UV-lyskilden (3) afbøjes via mindst et spejlfilter (16) og filtreres.
11. Indretning til udførelse afen fremgangsmåde ifølge et af kravene 1 til 10, kendetegnet ved, at denne i det mindste omfatter: - en i det væsentlige monokromatisk UV-lyskilde (3), med hvilken der kan belyses en etlags-materialestrøm af objekter af fortrinsvis affaldsglas, - en første detektor (11) til detektering af det fluorescenslys, der er genereret af UV-lyskilden (3) i objektet, - en anden lyskilde (4, 14), som kan udsende lys i det synlige område eller IR-lys uden for fluorescenslysets bølgelængdeområde, - en anden detektor (10) til detektering af transmissionslyset fra det synlige lys eller IR-lyset, efter at det er gået igennem objektet, - en indretning (9) til fremstilling af en etlags-materialestrøm af affaldsglas, med hvilken materialestrømmen kan føres forbi UV-lyskilden (3) og forbi den anden lyskilde (4, 14), - samt en indretning til frasortering af blyholdige glasstykker, som frasorterer et objekt i det tilfælde, hvor både fluorescenslys for mindst et på forhånd angivet bølgelængdeområde, der svarer til fluorescensen hos blyholdige glas, foreligger i et på forhånd angivet intensitetsområde og transmissionslys i et på forhånd angivet intensitetsområde med en intensitet større end nul.
12. Indretning ifølge krav 11, kendetegnet ved, at UV-lyskilden (3) kan udsende UV-lys med en bølgelængde i området fra 100 til 300 nm, især mellem 250 og 275 nm, og den første detektor (11) kun kan detektere fluorescenslys i bølgelængdeområdet fra 380-500 nm.
13. Indretning ifølge krav 12, kendetegnet ved, at UV-lyset har en bølgelængde på ca. 270 nm, og fluorescenslyset detekteres i bølgelængdeområdet fra 380-450 nm.
14. Indretning ifølge krav 12, kendetegnet ved, at UV-lyset har en bølgelængde på ca. 254 nm, og fluorescenslyset detekteres i bølgelængdeområdet fra 420-500 nm.
15. Indretning ifølge et af kravene 11 til 14, kendetegnet ved, at UV-lyskil-den (3) og den første detektor (11) befinder sig på forskellige sider af materialestrømmen.
16. Indretning ifølge et af kravene 11 til 15, kendetegnet ved, at UV-lyskil-den (3) og den anden lyskilde (4, 14) befinder sig i et fælles hus.
17. Indretning ifølge et af kravene 11 til 16, kendetegnet ved, at første (11) og anden (10) detektor befinder sig i et fælles hus.
18. Indretning ifølge et af kravene 11 til 17, kendetegnet ved, at UV-lyskil-den (3) er indbygget i et hus med mindst et spejlfilter (16) på en sådan måde, at lyset fra UV-lyskilden (3) afbøjes via mindst et spejlfilter (16) og filtreres, især ved hjælp af to spejlfiltre (16), der er anbragt normalt på hinanden, med 180°.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AT0052009U AT11769U1 (de) | 2009-08-19 | 2009-08-19 | Verfahren und vorrichtung zum detektieren von bleihältigen glasstücken |
| PCT/EP2010/052457 WO2011020628A1 (de) | 2009-08-19 | 2010-02-26 | Verfahren und vorrichtung zum detektieren von bleihältigen glasstücken |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DK2467702T3 true DK2467702T3 (da) | 2014-12-15 |
Family
ID=43568420
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK10709457.5T DK2467702T3 (da) | 2009-08-19 | 2010-02-26 | Fremgangsmåde og indretning til detektering af blyholdige glasstykker |
| DK14176570.1T DK2808672T3 (da) | 2009-08-19 | 2010-02-26 | Hus til en UV-lyskilde |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK14176570.1T DK2808672T3 (da) | 2009-08-19 | 2010-02-26 | Hus til en UV-lyskilde |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US8803020B2 (da) |
| EP (2) | EP2808672B1 (da) |
| AT (1) | AT11769U1 (da) |
| AU (1) | AU2010285188C1 (da) |
| DK (2) | DK2467702T3 (da) |
| ES (2) | ES2526557T3 (da) |
| PL (2) | PL2808672T3 (da) |
| PT (2) | PT2467702E (da) |
| WO (1) | WO2011020628A1 (da) |
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| CN103934222A (zh) * | 2014-04-28 | 2014-07-23 | 安徽捷迅光电技术有限公司 | 一种多角度色选的色选机色选光源结构 |
| AT15295U1 (de) | 2015-03-09 | 2017-05-15 | Binder + Co Ag | Aussortieren von mineralienhaltigen Objekten oder Kunststoff-Objekten |
| AT15419U1 (de) * | 2015-05-19 | 2017-08-15 | Binder + Co Ag | Verfahren und vorrichtung zur einstellung der in einen optischen detektor gelangenden strahlungsleistung |
| AT15723U1 (de) * | 2016-08-30 | 2018-04-15 | Binder Co Ag | Vorrichtung zum Detektieren von Objekten in einem Materialstrom |
| JP6892249B2 (ja) * | 2016-11-24 | 2021-06-23 | 東洋ガラス株式会社 | カレット分別装置およびカレット分別方法 |
| CN109732765B (zh) * | 2018-12-27 | 2021-05-18 | 佛山欧神诺陶瓷有限公司 | 一种用于瓷砖识别、记录、跟踪和分选的方法 |
| CN111451176A (zh) * | 2019-01-21 | 2020-07-28 | 合肥泰禾光电科技股份有限公司 | 一种用于物料分选设备的探测装置、物料分选设备及方法 |
| FR3095273B1 (fr) * | 2019-04-19 | 2021-05-07 | Saint Gobain Isover | Système de détection automatisé de matériaux de type vitrocéramique |
| DE102019114033A1 (de) * | 2019-05-26 | 2020-11-26 | Dieffenbacher GmbH Maschinen- und Anlagenbau | Überwachungsvorrichtung zur Erfassung wenigstens einer Stoffkomponente in zerkleinerten Werkstoffen, Förderanlage für zerkleinerte Werkstoffe und Verfahren zur Überwachung von zerkleinerten Werkstoffen |
| IT202000007345A1 (it) * | 2020-04-07 | 2021-10-07 | Stazione Sperimentale Del Vetro Soc Consortile Per Azioni In Sigla Stazione Sperimentale Del Vetro S | Attrezzatura per la rilevazione di elementi inquinanti in rottami di vetro |
| US12105053B2 (en) | 2021-04-21 | 2024-10-01 | Hong Kong Applied Science and Technology Research Institute Company Limited | Apparatus and method for classifying glass object using acoustic analysis |
| CN113976480B (zh) * | 2021-12-27 | 2022-04-01 | 北京霍里思特科技有限公司 | 一种双光谱融合智能选矿系统 |
| EP4520448A1 (de) * | 2023-09-07 | 2025-03-12 | Binder + Co AG | Aussortieren von altglasscherben mit einem höheren gehalt an eisenoxid |
| CN119456426B (zh) * | 2024-11-11 | 2025-11-18 | 佛山华兴玻璃有限公司 | 检测缺陷显示方法、系统、装置及介质 |
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|---|---|---|---|---|
| DE3504793A1 (de) * | 1985-02-13 | 1986-08-14 | W.C. Heraeus Gmbh, 6450 Hanau | Beleuchtungsanordnung, insbesondere fuer licht- und wetterechtheitspruefgeraete |
| DE3618173A1 (de) * | 1986-05-30 | 1987-12-03 | Mab Marlis Kellermann | Glas-sortieranlage |
| FR2604377B1 (fr) * | 1986-09-29 | 1990-04-20 | Boussois Souchon Neuvesel Sa | Dispositif de tri optique du groisil |
| US5314071A (en) * | 1992-12-10 | 1994-05-24 | Fmc Corporation | Glass sorter |
| DE4339822C1 (de) * | 1993-11-23 | 1995-05-24 | Noell Gmbh | Verfahren und Vorrichtung zur Sortierung von anorganischen nichtmetallischen Werkstoffen |
| US5663997A (en) * | 1995-01-27 | 1997-09-02 | Asoma Instruments, Inc. | Glass composition determination method and apparatus |
| US7355140B1 (en) * | 2002-08-12 | 2008-04-08 | Ecullet | Method of and apparatus for multi-stage sorting of glass cullets |
| ATE417264T1 (de) | 2003-01-10 | 2008-12-15 | Schott Ag | Verfahren und vorrichtung zur selektion von recyclingglas |
| US7757863B2 (en) * | 2003-11-17 | 2010-07-20 | Casella Waste Systems, Inc. | Systems and methods for glass recycling at a beneficiator and/or a material recovery facility |
| US7918343B2 (en) * | 2003-11-17 | 2011-04-05 | Casella Waste Systems, Inc. | Systems and methods for glass recycling at a beneficiator |
| US7264124B2 (en) * | 2003-11-17 | 2007-09-04 | Casella Waste Systems, Inc. | Systems and methods for sorting recyclables at a material recovery facility |
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| US7216997B2 (en) * | 2004-10-26 | 2007-05-15 | Federal-Mogul World Wide, Inc. | Phosphor reactive instrument panel and gauges |
| DE202004017833U1 (de) * | 2004-11-17 | 2005-01-05 | Atlas Material Testing Technology Gmbh | Strahlungsquellen-Aufnahmeeinheit für ein Bewitterungsgerät |
| AT8647U1 (de) * | 2005-08-08 | 2006-10-15 | Binder Co Ag | Verfahren zur detektion und sortierung von glas |
| US7659486B2 (en) * | 2005-10-20 | 2010-02-09 | Valerio Thomas A | Method and apparatus for sorting contaminated glass |
| WO2007143047A1 (en) | 2006-06-01 | 2007-12-13 | Ecolab Inc. | Uv fluorometric sensor and method for using the same |
| AT10184U1 (de) | 2008-01-24 | 2008-10-15 | Binder Co Ag | Vorrichtung zum erfassen und erkennen von objekten |
-
2009
- 2009-08-19 AT AT0052009U patent/AT11769U1/de not_active IP Right Cessation
-
2010
- 2010-02-26 AU AU2010285188A patent/AU2010285188C1/en active Active
- 2010-02-26 PT PT107094575T patent/PT2467702E/pt unknown
- 2010-02-26 PT PT14176570T patent/PT2808672T/pt unknown
- 2010-02-26 EP EP14176570.1A patent/EP2808672B1/de active Active
- 2010-02-26 DK DK10709457.5T patent/DK2467702T3/da active
- 2010-02-26 ES ES10709457.5T patent/ES2526557T3/es active Active
- 2010-02-26 US US13/390,970 patent/US8803020B2/en active Active
- 2010-02-26 PL PL14176570T patent/PL2808672T3/pl unknown
- 2010-02-26 DK DK14176570.1T patent/DK2808672T3/da active
- 2010-02-26 ES ES14176570T patent/ES2705857T3/es active Active
- 2010-02-26 PL PL10709457T patent/PL2467702T3/pl unknown
- 2010-02-26 EP EP10709457.5A patent/EP2467702B1/de active Active
- 2010-02-26 WO PCT/EP2010/052457 patent/WO2011020628A1/de not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| PT2808672T (pt) | 2019-01-10 |
| PT2467702E (pt) | 2015-01-02 |
| PL2808672T3 (pl) | 2019-04-30 |
| EP2808672A1 (de) | 2014-12-03 |
| AU2010285188A1 (en) | 2012-02-23 |
| AU2010285188C1 (en) | 2014-11-20 |
| WO2011020628A1 (de) | 2011-02-24 |
| ES2526557T3 (es) | 2015-01-13 |
| US20120145607A1 (en) | 2012-06-14 |
| EP2467702B1 (de) | 2014-09-17 |
| DK2808672T3 (da) | 2019-01-28 |
| AU2010285188B2 (en) | 2014-08-07 |
| US8803020B2 (en) | 2014-08-12 |
| ES2705857T3 (es) | 2019-03-26 |
| PL2467702T3 (pl) | 2015-03-31 |
| EP2467702A1 (de) | 2012-06-27 |
| AT11769U1 (de) | 2011-04-15 |
| EP2808672B1 (de) | 2018-10-31 |
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