DK168969B1 - Anordning til måling af ekscentricitet og diameter af kabelisolation - Google Patents

Anordning til måling af ekscentricitet og diameter af kabelisolation Download PDF

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Publication number
DK168969B1
DK168969B1 DK438089A DK438089A DK168969B1 DK 168969 B1 DK168969 B1 DK 168969B1 DK 438089 A DK438089 A DK 438089A DK 438089 A DK438089 A DK 438089A DK 168969 B1 DK168969 B1 DK 168969B1
Authority
DK
Denmark
Prior art keywords
cable
detector
source
particles
gamma
Prior art date
Application number
DK438089A
Other languages
Danish (da)
English (en)
Other versions
DK438089D0 (da
DK438089A (da
Inventor
Frank W Hintze
John M Lucas
Original Assignee
Alcatel Canada Wire Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel Canada Wire Inc filed Critical Alcatel Canada Wire Inc
Publication of DK438089D0 publication Critical patent/DK438089D0/da
Publication of DK438089A publication Critical patent/DK438089A/da
Application granted granted Critical
Publication of DK168969B1 publication Critical patent/DK168969B1/da

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
DK438089A 1988-09-09 1989-09-05 Anordning til måling af ekscentricitet og diameter af kabelisolation DK168969B1 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CA576977 1988-09-09
CA000576977A CA1286425C (en) 1988-09-09 1988-09-09 Cable insulation eccentricity and diameter monitor

Publications (3)

Publication Number Publication Date
DK438089D0 DK438089D0 (da) 1989-09-05
DK438089A DK438089A (da) 1990-03-10
DK168969B1 true DK168969B1 (da) 1994-07-18

Family

ID=4138704

Family Applications (1)

Application Number Title Priority Date Filing Date
DK438089A DK168969B1 (da) 1988-09-09 1989-09-05 Anordning til måling af ekscentricitet og diameter af kabelisolation

Country Status (9)

Country Link
US (1) US5054043A (ja)
EP (1) EP0359434B1 (ja)
JP (1) JPH0291506A (ja)
KR (1) KR900005153A (ja)
CA (1) CA1286425C (ja)
DE (1) DE68903320T2 (ja)
DK (1) DK168969B1 (ja)
FI (1) FI894249A (ja)
NO (1) NO892516L (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9411468D0 (en) * 1994-06-08 1994-07-27 Beta Instr Co Scanning apparatus
US6721393B1 (en) 1999-03-31 2004-04-13 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
JP4786798B2 (ja) * 1999-03-31 2011-10-05 プロト マニュファクチャリング リミテッド Ｘ線回折装置
AU2003233600A1 (en) * 2002-05-17 2003-12-02 Niton Corporation A calibration source for x-ray detectors
US7960687B1 (en) * 2010-09-30 2011-06-14 Schlumberger Technology Corporation Sourceless downhole X-ray tool
JP6634292B2 (ja) * 2016-01-08 2020-01-22 富士電機株式会社 配管検査方法、及び、配管検査装置
CN111678444B (zh) * 2020-06-15 2024-07-09 浙江万马天屹通信线缆有限公司 一种电缆直径测量装置
CN113865526A (zh) * 2021-09-28 2021-12-31 广东电网有限责任公司 复合绝缘子芯棒偏心检测方法、装置、终端设备及介质
CN117804401A (zh) * 2023-12-28 2024-04-02 河北华伦线缆有限公司 电缆用绝缘层偏心度校对方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2525292A (en) * 1944-10-16 1950-10-10 Standard Electronic Res Corp Measuring and testing method and apparatus employing x rays
US3148279A (en) * 1961-05-04 1964-09-08 Western Electric Co Radiation method of measuring sheath thickness and eccentricity
JPS57197410A (en) * 1981-05-29 1982-12-03 Rigaku Denki Kogyo Kk Measuring method of adhered amount of high polymer film on metallic plate
ATE24353T1 (de) * 1981-08-04 1987-01-15 Oesterr Forsch Seibersdorf Verfahren zur messung der beschichtungsdicke von ummantelten draehten oder rohren.

Also Published As

Publication number Publication date
DE68903320D1 (de) 1992-12-03
NO892516D0 (no) 1989-06-16
EP0359434A2 (en) 1990-03-21
KR900005153A (ko) 1990-04-13
FI894249A (fi) 1990-03-10
EP0359434B1 (en) 1992-10-28
DE68903320T2 (de) 1993-05-19
JPH0291506A (ja) 1990-03-30
US5054043A (en) 1991-10-01
NO892516L (no) 1990-03-12
DK438089D0 (da) 1989-09-05
CA1286425C (en) 1991-07-16
EP0359434A3 (en) 1990-09-19
DK438089A (da) 1990-03-10
FI894249A0 (fi) 1989-09-08

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Legal Events

Date Code Title Description
B1 Patent granted (law 1993)
PBP Patent lapsed