DK1366352T3 - Fremgangsmåde til undersögelse af kemiske og/eller biologiske pröver - Google Patents

Fremgangsmåde til undersögelse af kemiske og/eller biologiske pröver

Info

Publication number
DK1366352T3
DK1366352T3 DK02748330T DK02748330T DK1366352T3 DK 1366352 T3 DK1366352 T3 DK 1366352T3 DK 02748330 T DK02748330 T DK 02748330T DK 02748330 T DK02748330 T DK 02748330T DK 1366352 T3 DK1366352 T3 DK 1366352T3
Authority
DK
Denmark
Prior art keywords
biological samples
sample
observation
chemical
examining chemical
Prior art date
Application number
DK02748330T
Other languages
English (en)
Inventor
Juergen Mueller
Stefan Hummel
Original Assignee
Evotec Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Evotec Ag filed Critical Evotec Ag
Application granted granted Critical
Publication of DK1366352T3 publication Critical patent/DK1366352T3/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458Fluorescence microscopy
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6452Individual samples arranged in a regular 2D-array, e.g. multiwell plates
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036Scanning details, e.g. scanning stages
    • G02B21/0048Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0076Optical details of the image generation arrangements using fluorescence or luminescence

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Steroid Compounds (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK02748330T 2001-03-06 2002-03-05 Fremgangsmåde til undersögelse af kemiske og/eller biologiske pröver DK1366352T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10110594 2001-03-06
PCT/EP2002/002372 WO2002071043A1 (de) 2001-03-06 2002-03-05 Verfahren zur untersuchung chemischer und/oder biologischer proben

Publications (1)

Publication Number Publication Date
DK1366352T3 true DK1366352T3 (da) 2007-10-01

Family

ID=7676388

Family Applications (1)

Application Number Title Priority Date Filing Date
DK02748330T DK1366352T3 (da) 2001-03-06 2002-03-05 Fremgangsmåde til undersögelse af kemiske og/eller biologiske pröver

Country Status (7)

Country Link
US (1) US7186988B2 (da)
EP (1) EP1366352B1 (da)
JP (1) JP4391746B2 (da)
AT (1) ATE363653T1 (da)
DE (1) DE50210236D1 (da)
DK (1) DK1366352T3 (da)
WO (1) WO2002071043A1 (da)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4812393B2 (ja) * 2005-03-04 2011-11-09 株式会社日立ハイテクノロジーズ 蛍光分子計測システム
JP5576195B2 (ja) * 2010-06-30 2014-08-20 株式会社ミツトヨ オートフォーカス装置
JP5721406B2 (ja) * 2010-11-24 2015-05-20 Hoya株式会社 走査型共焦点内視鏡システム
JP6813567B2 (ja) * 2016-03-09 2021-01-13 浜松ホトニクス株式会社 測定装置、観察装置および測定方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4328410A (en) * 1978-08-24 1982-05-04 Slivinsky Sandra H Laser skiving system
DE8904152U1 (de) 1989-04-04 1989-08-03 Schönbuch Electronic Hanesch GmbH & Co KG, 7031 Nufringen Vorrichtung zum Abtasten und/oder Prüfen von Körperoberflächen
JPH03248793A (ja) 1990-02-26 1991-11-06 Mitsubishi Electric Corp レーザ加工ヘッド
DE69227902T3 (de) 1991-04-29 2010-04-22 Massachusetts Institute Of Technology, Cambridge Vorrichtung für optische abbildung und messung
US5293265A (en) * 1992-08-24 1994-03-08 General Electric Company Real time variable laser beam spinner
AUPO551197A0 (en) * 1997-03-07 1997-03-27 Varian Australia Pty Ltd Spectroscopic analysis method and apparatus
FI982005A (fi) * 1998-09-17 2000-03-18 Wallac Oy Näytteiden kuvantamislaite
DE19950225A1 (de) 1998-10-24 2000-05-18 Leica Microsystems Anordnung zur optischen Abtastung eines Objekts
AU6075100A (en) * 1999-07-07 2001-01-30 Ljl Biosystems, Inc. Light detection device
US6563581B1 (en) * 2000-07-14 2003-05-13 Applera Corporation Scanning system and method for scanning a plurality of samples
US6813050B2 (en) * 2002-01-18 2004-11-02 Nanguang Chen Rotary mirror array for fast optical tomography

Also Published As

Publication number Publication date
WO2002071043A1 (de) 2002-09-12
US7186988B2 (en) 2007-03-06
EP1366352A1 (de) 2003-12-03
JP4391746B2 (ja) 2009-12-24
JP2004528543A (ja) 2004-09-16
DE50210236D1 (de) 2007-07-12
EP1366352B1 (de) 2007-05-30
ATE363653T1 (de) 2007-06-15
US20040238729A1 (en) 2004-12-02

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