DK1012587T3 - Analyse af ladede partikler - Google Patents

Analyse af ladede partikler

Info

Publication number
DK1012587T3
DK1012587T3 DK98903130T DK98903130T DK1012587T3 DK 1012587 T3 DK1012587 T3 DK 1012587T3 DK 98903130 T DK98903130 T DK 98903130T DK 98903130 T DK98903130 T DK 98903130T DK 1012587 T3 DK1012587 T3 DK 1012587T3
Authority
DK
Denmark
Prior art keywords
source
electrodes
charged particles
pair
detector
Prior art date
Application number
DK98903130T
Other languages
Danish (da)
English (en)
Inventor
Gareth E Derbyshire
Edmond J Bateman
Original Assignee
Council Cent Lab Res Councils
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Council Cent Lab Res Councils filed Critical Council Cent Lab Res Councils
Application granted granted Critical
Publication of DK1012587T3 publication Critical patent/DK1012587T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/06—Proportional counter tubes
    • H01J47/062—Multiwire proportional counter tubes

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DK98903130T 1997-02-14 1998-02-03 Analyse af ladede partikler DK1012587T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB9703024.1A GB9703024D0 (en) 1997-02-14 1997-02-14 Charged particle analysis
PCT/GB1998/000348 WO1998036268A1 (en) 1997-02-14 1998-02-03 Charged particle analysis

Publications (1)

Publication Number Publication Date
DK1012587T3 true DK1012587T3 (da) 2003-05-05

Family

ID=10807621

Family Applications (1)

Application Number Title Priority Date Filing Date
DK98903130T DK1012587T3 (da) 1997-02-14 1998-02-03 Analyse af ladede partikler

Country Status (10)

Country Link
US (1) US6452401B1 (de)
EP (1) EP1012587B1 (de)
JP (1) JP3830978B2 (de)
AT (1) ATE231239T1 (de)
AU (1) AU5995898A (de)
DE (1) DE69810785T2 (de)
DK (1) DK1012587T3 (de)
ES (1) ES2190061T3 (de)
GB (1) GB9703024D0 (de)
WO (1) WO1998036268A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6255126B1 (en) * 1998-12-02 2001-07-03 Formfactor, Inc. Lithographic contact elements
JP3741006B2 (ja) * 2001-08-08 2006-02-01 株式会社日立製作所 荷電粒子測定装置およびその測定方法
GB0321039D0 (en) 2003-09-09 2003-10-08 Council Cent Lab Res Councils Ionising particle analyser
GB0506203D0 (en) * 2005-03-29 2005-05-04 Council Cent Lab Res Councils Radiation detector
DE102015004458B4 (de) 2014-06-26 2016-05-12 Elmos Semiconductor Aktiengesellschaft Vorrichtung und Verfahren für einen klassifizierenden, rauchkammerlosen Luftzustandssensor zur Prognostizierung eines folgenden Betriebszustands
DE102014019172B4 (de) 2014-12-17 2023-12-07 Elmos Semiconductor Se Vorrichtung und Verfahren zur Unterscheidung von festen Objekten, Kochdunst und Rauch mit einem kompensierenden optischen Messsystem
DE102014019773B4 (de) 2014-12-17 2023-12-07 Elmos Semiconductor Se Vorrichtung und Verfahren zur Unterscheidung von festen Objekten, Kochdunst und Rauch mittels des Displays eines Mobiltelefons
EP3261110A1 (de) * 2016-06-21 2017-12-27 Excillum AB Röntgenstrahlenquelle mit ionisierungswerkzeug

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH666135A5 (de) * 1982-12-03 1988-06-30 Slm Investissements S A Brandmelder.
JPH0225737A (ja) 1988-07-15 1990-01-29 Hitachi Ltd 表面分析方法および装置
FR2639436B1 (fr) 1988-10-28 1994-07-01 Schlumberger Ind Sa Procede et dispositif de localisation de particules neutres, a haute resolution
US5254861A (en) * 1992-09-29 1993-10-19 The United States Of America As Represented By The Secretary Of The Air Force Biological aerosol particle detector and method having an electronic pulse detection means
US5584938A (en) * 1993-12-10 1996-12-17 Texas Instruments Incorporated Electrostatic particle removal and characterization

Also Published As

Publication number Publication date
JP2001512571A (ja) 2001-08-21
EP1012587A1 (de) 2000-06-28
DE69810785T2 (de) 2003-10-23
WO1998036268A1 (en) 1998-08-20
US6452401B1 (en) 2002-09-17
AU5995898A (en) 1998-09-08
ATE231239T1 (de) 2003-02-15
DE69810785D1 (de) 2003-02-20
EP1012587B1 (de) 2003-01-15
JP3830978B2 (ja) 2006-10-11
GB9703024D0 (en) 1997-04-02
ES2190061T3 (es) 2003-07-16

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