DK0612410T3 - Fremgangsmåde til aftastning af et jitterbehæftet signal - Google Patents

Fremgangsmåde til aftastning af et jitterbehæftet signal

Info

Publication number
DK0612410T3
DK0612410T3 DK93918982T DK93918982T DK0612410T3 DK 0612410 T3 DK0612410 T3 DK 0612410T3 DK 93918982 T DK93918982 T DK 93918982T DK 93918982 T DK93918982 T DK 93918982T DK 0612410 T3 DK0612410 T3 DK 0612410T3
Authority
DK
Denmark
Prior art keywords
sensing
jittered signal
jittered
signal
Prior art date
Application number
DK93918982T
Other languages
Danish (da)
English (en)
Inventor
Thomas Vorwerk
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Application granted granted Critical
Publication of DK0612410T3 publication Critical patent/DK0612410T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/342—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying periodic H.F. signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
    • H04Q2213/1316—Service observation, testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
    • H04Q2213/13209—ISDN
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
    • H04Q2213/1332—Logic circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
    • H04Q2213/13322—Integrated circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Dc Digital Transmission (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Measuring Phase Differences (AREA)
DK93918982T 1992-09-15 1993-09-09 Fremgangsmåde til aftastning af et jitterbehæftet signal DK0612410T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4230853A DE4230853C2 (de) 1992-09-15 1992-09-15 Abtastverfahren für verjitterte Signale
PCT/DE1993/000845 WO1994007148A1 (de) 1992-09-15 1993-09-09 Abtastverfahren für verjitterte signale

Publications (1)

Publication Number Publication Date
DK0612410T3 true DK0612410T3 (da) 1999-10-11

Family

ID=6468008

Family Applications (1)

Application Number Title Priority Date Filing Date
DK93918982T DK0612410T3 (da) 1992-09-15 1993-09-09 Fremgangsmåde til aftastning af et jitterbehæftet signal

Country Status (6)

Country Link
US (1) US5506635A (ja)
EP (1) EP0612410B1 (ja)
JP (1) JP3303098B2 (ja)
DE (2) DE4230853C2 (ja)
DK (1) DK0612410T3 (ja)
WO (1) WO1994007148A1 (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19540218A1 (de) * 1995-10-18 1997-04-24 Hartmann & Braun Ag Einbau-Mehrkanalschreiber
DE19650833C1 (de) * 1996-11-29 1998-03-26 Siemens Communications Test Eq Meßeinrichtung für die Schnittstelle einer Übertragungsstrecke mit einer Vollduplex-Übertragung im Zweidrahtgleichlageverfahren
JP4445114B2 (ja) * 2000-01-31 2010-04-07 株式会社アドバンテスト ジッタ測定装置及びその方法
US8147472B2 (en) * 2003-11-24 2012-04-03 Kimberly-Clark Worldwide, Inc. Folded absorbent product
DE102006037221B4 (de) * 2006-08-09 2018-07-19 Rohde & Schwarz Gmbh & Co. Kg Vorrichtung und Verfahren zur Verarbeitung und Darstellung eines abgetasteten Signals
EP2651034B1 (en) * 2012-04-12 2014-08-06 Siemens Aktiengesellschaft Method for determining a trigger level
CN117871920A (zh) * 2024-03-13 2024-04-12 上海知白智能科技有限公司 眼图采集方法、装置、系统及存储介质

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4555765A (en) * 1982-09-14 1985-11-26 Analogic Corporation Multi-mode oscilloscope trigger with compensating trigger delay
JPS5975156A (ja) * 1982-10-21 1984-04-27 テクトロニクス・インコ−ポレイテツド デジタル・ストレ−ジ・オシロスコ−プ
US4694244A (en) * 1986-02-21 1987-09-15 Hewlett Packard Company Apparatus for random repetitive sampling

Also Published As

Publication number Publication date
DE4230853A1 (de) 1994-03-17
JP3303098B2 (ja) 2002-07-15
JPH07501405A (ja) 1995-02-09
WO1994007148A1 (de) 1994-03-31
DE59309484D1 (de) 1999-05-06
EP0612410B1 (de) 1999-03-31
DE4230853C2 (de) 1999-07-01
EP0612410A1 (de) 1994-08-31
US5506635A (en) 1996-04-09

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