DE9313266U1 - Magnetoresistiver Sensor zur Suche von Unterbrechungen an bestückten elektronischen Baugruppen - Google Patents

Magnetoresistiver Sensor zur Suche von Unterbrechungen an bestückten elektronischen Baugruppen

Info

Publication number
DE9313266U1
DE9313266U1 DE9313266U DE9313266U DE9313266U1 DE 9313266 U1 DE9313266 U1 DE 9313266U1 DE 9313266 U DE9313266 U DE 9313266U DE 9313266 U DE9313266 U DE 9313266U DE 9313266 U1 DE9313266 U1 DE 9313266U1
Authority
DE
Germany
Prior art keywords
interruptions
finding
magnetoresistive sensor
electronic assemblies
assembled electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE9313266U
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TESTLAB GES fur AUTOMATISCHES
Original Assignee
TESTLAB GES fur AUTOMATISCHES
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TESTLAB GES fur AUTOMATISCHES filed Critical TESTLAB GES fur AUTOMATISCHES
Priority to DE9313266U priority Critical patent/DE9313266U1/de
Publication of DE9313266U1 publication Critical patent/DE9313266U1/de
Priority to DE4430243A priority patent/DE4430243A1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods
DE9313266U 1993-09-03 1993-09-03 Magnetoresistiver Sensor zur Suche von Unterbrechungen an bestückten elektronischen Baugruppen Expired - Lifetime DE9313266U1 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE9313266U DE9313266U1 (de) 1993-09-03 1993-09-03 Magnetoresistiver Sensor zur Suche von Unterbrechungen an bestückten elektronischen Baugruppen
DE4430243A DE4430243A1 (de) 1993-09-03 1994-08-25 Magneto-resistiver Sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE9313266U DE9313266U1 (de) 1993-09-03 1993-09-03 Magnetoresistiver Sensor zur Suche von Unterbrechungen an bestückten elektronischen Baugruppen

Publications (1)

Publication Number Publication Date
DE9313266U1 true DE9313266U1 (de) 1993-12-09

Family

ID=6897614

Family Applications (2)

Application Number Title Priority Date Filing Date
DE9313266U Expired - Lifetime DE9313266U1 (de) 1993-09-03 1993-09-03 Magnetoresistiver Sensor zur Suche von Unterbrechungen an bestückten elektronischen Baugruppen
DE4430243A Ceased DE4430243A1 (de) 1993-09-03 1994-08-25 Magneto-resistiver Sensor

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE4430243A Ceased DE4430243A1 (de) 1993-09-03 1994-08-25 Magneto-resistiver Sensor

Country Status (1)

Country Link
DE (2) DE9313266U1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4402230C1 (de) * 1994-01-26 1995-01-19 Gfp Ges Fuer Prueftechnik Mbh Verfahren zum Testen, ob Anschlußstifte einer integrierten Schaltung in eine gedruckte Schaltung elektrisch leitend eingelötet sind und Schaltungsanordnung zur Durchführung des Verfahrens

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5894224A (en) * 1996-06-06 1999-04-13 U.S. Philips Corporation Method of testing a connection which includes a conductor in an integrated circuit
US5963038A (en) * 1996-06-06 1999-10-05 U.S. Philips Corporation Method of testing a connection which includes a conductor in an integrated circuit
DE19804171A1 (de) * 1998-02-03 1999-09-16 Siemens Ag Verfahren zur Prüfung von mit elektronischen Bauelementen bestückten Flachbaugruppen
AU2002211110A1 (en) * 2000-09-29 2002-04-08 Sales & Promotions (Nz) Limited An apparatus for testing an electrical device
KR100967727B1 (ko) 2001-04-09 2010-07-05 엔엑스피 비 브이 전류 공급 테스트 인터페이스를 구비하는 집적 회로 어셈블리

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3729712A1 (de) * 1987-09-04 1989-03-23 Siemens Ag Pruefanordnung fuer elektronische schaltungen
DE4003161A1 (de) * 1990-02-03 1991-08-08 Standard Elektrik Lorenz Ag Magnetfeldsensor
DE4016639A1 (de) * 1990-05-23 1991-11-28 Siemens Ag Verfahren zur ueberpruefung von verdeckten strompfaden in einem koerper sowie vorrichtung zur durchfuehrung dieses verfahrens

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4402230C1 (de) * 1994-01-26 1995-01-19 Gfp Ges Fuer Prueftechnik Mbh Verfahren zum Testen, ob Anschlußstifte einer integrierten Schaltung in eine gedruckte Schaltung elektrisch leitend eingelötet sind und Schaltungsanordnung zur Durchführung des Verfahrens

Also Published As

Publication number Publication date
DE4430243A1 (de) 1995-03-09

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