DE8714018U1 - - Google Patents

Info

Publication number
DE8714018U1
DE8714018U1 DE8714018U DE8714018U DE8714018U1 DE 8714018 U1 DE8714018 U1 DE 8714018U1 DE 8714018 U DE8714018 U DE 8714018U DE 8714018 U DE8714018 U DE 8714018U DE 8714018 U1 DE8714018 U1 DE 8714018U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8714018U
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE8714018U priority Critical patent/DE8714018U1/de
Publication of DE8714018U1 publication Critical patent/DE8714018U1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
DE8714018U 1987-10-19 1987-10-19 Expired DE8714018U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8714018U DE8714018U1 (de) 1987-10-19 1987-10-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE8714018U DE8714018U1 (de) 1987-10-19 1987-10-19

Publications (1)

Publication Number Publication Date
DE8714018U1 true DE8714018U1 (de) 1988-12-01

Family

ID=6813246

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8714018U Expired DE8714018U1 (de) 1987-10-19 1987-10-19

Country Status (1)

Country Link
DE (1) DE8714018U1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0866337A2 (de) * 1997-03-19 1998-09-23 Circuit Line S.P.A. Starre Tastnadel zur elektrischen Prüfung von Leiterplatten

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3142817A1 (de) * 1980-10-30 1982-07-08 Everett/Charles, Inc., 91730 Rancho Cucamonga, Calif. Uebertragungseinrichtung, test-spannvorrichtung mit uebertragungseinrichtung und verfahren zur bildung einer uebertragungseinrichtung
DE3337915A1 (de) * 1982-10-21 1984-05-24 Feinmetall Gmbh, 7033 Herrenberg Kontaktiervorrichtung
DE3343274A1 (de) * 1983-11-30 1985-06-05 Feinmetall Gmbh, 7033 Herrenberg Kontaktiervorrichtung

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3142817A1 (de) * 1980-10-30 1982-07-08 Everett/Charles, Inc., 91730 Rancho Cucamonga, Calif. Uebertragungseinrichtung, test-spannvorrichtung mit uebertragungseinrichtung und verfahren zur bildung einer uebertragungseinrichtung
DE3337915A1 (de) * 1982-10-21 1984-05-24 Feinmetall Gmbh, 7033 Herrenberg Kontaktiervorrichtung
DE3343274A1 (de) * 1983-11-30 1985-06-05 Feinmetall Gmbh, 7033 Herrenberg Kontaktiervorrichtung

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0866337A2 (de) * 1997-03-19 1998-09-23 Circuit Line S.P.A. Starre Tastnadel zur elektrischen Prüfung von Leiterplatten
EP0866337A3 (de) * 1997-03-19 1999-08-18 Circuit Line S.P.A. Starre Tastnadel zur elektrischen Prüfung von Leiterplatten

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