DE8530818U1 - - Google Patents

Info

Publication number
DE8530818U1
DE8530818U1 DE8530818U DE8530818U DE8530818U1 DE 8530818 U1 DE8530818 U1 DE 8530818U1 DE 8530818 U DE8530818 U DE 8530818U DE 8530818 U DE8530818 U DE 8530818U DE 8530818 U1 DE8530818 U1 DE 8530818U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8530818U
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Grundig EMV Elektromechanische Versuchsanstalt Max Grundig GmbH
Original Assignee
Grundig EMV Elektromechanische Versuchsanstalt Max Grundig GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Grundig EMV Elektromechanische Versuchsanstalt Max Grundig GmbH filed Critical Grundig EMV Elektromechanische Versuchsanstalt Max Grundig GmbH
Priority to DE8530818U priority Critical patent/DE8530818U1/de
Publication of DE8530818U1 publication Critical patent/DE8530818U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/082—Integration of non-optical monitoring devices, i.e. using non-optical inspection means, e.g. electrical means, mechanical means or X-rays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
DE8530818U 1985-10-31 1985-10-31 Expired - Lifetime DE8530818U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8530818U DE8530818U1 (de) 1985-10-31 1985-10-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE8530818U DE8530818U1 (de) 1985-10-31 1985-10-31

Publications (1)

Publication Number Publication Date
DE8530818U1 true DE8530818U1 (de) 1990-11-08

Family

ID=6786803

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8530818U Expired - Lifetime DE8530818U1 (de) 1985-10-31 1985-10-31

Country Status (1)

Country Link
DE (1) DE8530818U1 (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19924245C1 (de) * 1999-05-27 2001-01-25 Siemens Ag Meßvorrichtung zum Messen der Höhenlage eines in einer Basisplatte angeordneten Bauelements, insbesondere eines Niets
DE10314639A1 (de) * 2003-04-01 2004-10-14 Michael Baxmeier Prüflehre für Meßstücke
DE19508213B4 (de) * 1995-03-08 2005-10-27 Grundig Multimedia B.V. Fügeüberprüfung

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19508213B4 (de) * 1995-03-08 2005-10-27 Grundig Multimedia B.V. Fügeüberprüfung
DE19924245C1 (de) * 1999-05-27 2001-01-25 Siemens Ag Meßvorrichtung zum Messen der Höhenlage eines in einer Basisplatte angeordneten Bauelements, insbesondere eines Niets
DE10314639A1 (de) * 2003-04-01 2004-10-14 Michael Baxmeier Prüflehre für Meßstücke

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