DE745777C - Electric light meter - Google Patents

Electric light meter

Info

Publication number
DE745777C
DE745777C DEL98601D DEL0098601D DE745777C DE 745777 C DE745777 C DE 745777C DE L98601 D DEL98601 D DE L98601D DE L0098601 D DEL0098601 D DE L0098601D DE 745777 C DE745777 C DE 745777C
Authority
DE
Germany
Prior art keywords
rays
reflective surface
angle
prism
light meter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DEL98601D
Other languages
German (de)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to DEL98601D priority Critical patent/DE745777C/en
Application granted granted Critical
Publication of DE745777C publication Critical patent/DE745777C/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0414Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using plane or convex mirrors, parallel phase plates, or plane beam-splitters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0477Prisms, wedges

Description

Zur Abgrenzung des Anmel dungsgcgenstandes vom Stand der Technik sind im Erteilungsverfahren folgende Druckschriften in Betracht gezogen worden: britische Patentschriften .... Xr. 5o5 195, 451 530. To distinguish the subject of the registration from the state of the art the following publications have been considered in the granting procedure: British patents .... Xr. 5o5 195, 451 530.

Claims (2)

Elektrischer Belichtungsmesser Zusatz zum Patent t, 373 Die Erfindung geht aus von einem elelutrischen Belichtungsmesser, bei welchem dem Lichtelement der zu messende Lichtstrom mittels einer reflektierenden Fläche mittelbar zugeführt wird. Diese reflektierende Fläche ist unterhalb des in dem Gehäuse eingebauten Lichtelements angeordnet und hildet mit demselben einen nach vorn geöffneten spitzen Winkel. Eine derartige Ausbildung ist Gegenstand des Patents 692 373.Electric light meter Addendum to patent t, 373 The invention is based on an electric light meter, in which the light element the luminous flux to be measured is supplied indirectly by means of a reflecting surface will. This reflective surface is below the light element built into the housing arranged and forms with it an acute angle open to the front. One such training is the subject of patent 692,373. Ein solcher Belichtungsmesser wird nach der vorliegenden Erfindung dadurch weiter verbessert, daß die reflektierende Fläche mindestens einem Prisma angehört. das so angeordnet ist, daß die für die Belichtungsmessung erwünschten Strahlen auf die reflektierende Fläche des Prismas unter einem Winkel auftreffen. der mindestens so groß ist wie der Grenzwinkel der Totalreflexion, während die Strahlen unerwünschter Richtung diese Fläche durchsetzen. Eine zweckmäßige Ausführung erhält man dadurch, daß man mehrere rippenartig hintereinanderliegende Prismen die reílelitierende Fläche bilden läßt. Such a light meter is made in accordance with the present invention further improved in that the reflective surface has at least one prism listened to. which is arranged so that those desired for exposure measurement Rays strike the reflective surface of the prism at an angle. which is at least as large as the critical angle of total reflection, while the rays unwanted direction enforce this area. An expedient execution is given one by having several prisms lying one behind the other in the manner of ribs, the reílelitierende Can form surface. Es ist zwar bekannt, die Totalreflexion bei Belichtungsmessern zu verwenden, um die für die Messung unerwünschten Strahlen aus dem Strahlengang herauszuwerfen und die die Totalreflexion bewirkende Fläche durchsetzenden Strahlern zur Zelle gelangen zu lassen. Diese Anordnung kann nun bei einem Belichtungsmesser nach dem Gattungsbegriff nicht Verwendung finden, da dies zu einer baulich sehr umständlichen Maßnahme führen würde.It is known to have total internal reflection in light meters to throw the beams out of the beam path that are undesired for the measurement and radiators to the cell which penetrate the surface causing the total reflection to get there. This arrangement can now be used in a light meter after Generic term does not find use, as this becomes structurally very cumbersome Measure would result. In der Zeichnung ist die Erfindung in einem Ausführungsbeispiel dargestellt. Die Photozelle 1 ist in dem Gehäuse 2 so gelagert, daß ihre wirksame Fläche waagerecht zum Boden gekehrt liegt. Als Ahschluß der Öffnung vor der Zelle ist die Klappe 3 um das Gelenk 4 schwenkbar angeordnet. Dieselbe trägt die Glasplatte 5, in welche mehrere Prismen6 eingearbeitet sind. Zwischen der Glasplatte 5 und der Klappe 3 ist der Hohlraum 7 frei gelassen. Wie die eingezeichneten Strahlen 8 zeigen, werden die Strahlen, die unter einem Winkel auf die Prismen 6 treffen, der wesentlich oberhalb der Horizontalen liegt, zunächst in die Glasplatte hineingebrochen und durchsetzen dann die Rückseite 9 9 derselben. um jn dem Zwischenraum 7 im wesentlichen absorbiert zu werden. Von den für die Belichtungsmessung erwünschten Strahlen ist der Einfachheit halber nur der Horizontalstrahl 10 dargestellt, und man sieht, daß dieselben an der Fläche 9 unter Totalreflexion nach der Zelle 1 hin reflektiert werden. In the drawing, the invention is shown in one embodiment. The photocell 1 is mounted in the housing 2 so that its effective area is horizontal turned to the ground. The flap 3 closes the opening in front of the cell arranged pivotably about the joint 4. The same carries the glass plate 5, in which several prisms6 are incorporated. Between the glass plate 5 and the flap 3 the cavity 7 is left free. As the drawn rays 8 show, are the rays that strike the prisms 6 at an angle that is substantially above the horizontal, first broken into the glass plate and enforced then the back 9 9 of the same. substantially absorbed by the interspace 7 to become. One of the rays desired for exposure metering is simplicity sake only the horizontal beam 10 shown, and it can be seen that the same the surface 9 are reflected with total reflection towards the cell 1 out. PATENTANSPRÜCHE: 1. Elektrischer Belichtungsmesser, bei welchem dem Lichtelement der zu messende Lichtstrom mittels eincr reflektierenden Fläche mittelbar zugeführt wird ull<l die reflektierende Fläche unterhalb des in denl Gehäuse eingebauten Lichtelements angeordnet ist und mit diesem einen nach vorn geöffneten spitzen Winkel bildet, nach deutschem Reichspatent 692 373, dadurch gekennzeichnet, daß die reflektierende Fläche mindestens einem Prisma angehört, das so angeordnet ist, daß die für die Belichtungsmessung erwünschten Strahlen auf die reflektierende Fläche des Prismas unter einem Winkel auftreffen, der mindestens so groß ist wie der Grenzwinkel der Totalreflexion während die Strahlen unerwünschter Richtung diese Fläche durchsetzen. PATENT CLAIMS: 1. Electric light meter, in which the Light element the luminous flux to be measured indirectly by means of a reflecting surface supplied is ull <l the reflective surface below the in thel housing built-in light element is arranged and with this one open to the front forms an acute angle, according to German imperial patent 692 373, characterized in that that the reflective surface belongs to at least one prism which is so arranged is that the rays desired for the exposure measurement are incident on the reflecting Strike the surface of the prism at an angle that is at least as large as the critical angle of total reflection while the rays of undesired direction this Enforce area. 2. Elektrischer Belichtungsmesser nach Anspruch 1, dadurch gekennzeichnet, daß die reflektierende Fläche durch mehrere rippenartig hintereinanderliegende Prismen gebildet wird. 2. Electrical exposure meter according to claim 1, characterized in that that the reflective surface is formed by several prisms lying one behind the other like ribs is formed.
DEL98601D 1939-07-25 1939-07-25 Electric light meter Expired DE745777C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DEL98601D DE745777C (en) 1939-07-25 1939-07-25 Electric light meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DEL98601D DE745777C (en) 1939-07-25 1939-07-25 Electric light meter

Publications (1)

Publication Number Publication Date
DE745777C true DE745777C (en) 1944-11-30

Family

ID=7288902

Family Applications (1)

Application Number Title Priority Date Filing Date
DEL98601D Expired DE745777C (en) 1939-07-25 1939-07-25 Electric light meter

Country Status (1)

Country Link
DE (1) DE745777C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3134021A (en) * 1959-08-01 1964-05-19 Zeiss Ikon Ag Photoelectric exposure meters with light ray limiters

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB451530A (en) * 1934-06-02 1936-08-07 Zeiss Ikon Ag Improvements in or relating to photo-electric exposure meters
GB505195A (en) * 1937-11-05 1939-05-05 Metrawatt Ag Improvements in or relating to photo-electric exposure meters

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB451530A (en) * 1934-06-02 1936-08-07 Zeiss Ikon Ag Improvements in or relating to photo-electric exposure meters
GB505195A (en) * 1937-11-05 1939-05-05 Metrawatt Ag Improvements in or relating to photo-electric exposure meters

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3134021A (en) * 1959-08-01 1964-05-19 Zeiss Ikon Ag Photoelectric exposure meters with light ray limiters

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