DE69942585D1 - Messungen zwischen langgestreckten leitern unter verwendung des tunnelstroms - Google Patents

Messungen zwischen langgestreckten leitern unter verwendung des tunnelstroms

Info

Publication number
DE69942585D1
DE69942585D1 DE69942585T DE69942585T DE69942585D1 DE 69942585 D1 DE69942585 D1 DE 69942585D1 DE 69942585 T DE69942585 T DE 69942585T DE 69942585 T DE69942585 T DE 69942585T DE 69942585 D1 DE69942585 D1 DE 69942585D1
Authority
DE
Germany
Prior art keywords
ladders
measurements
running
long
conductors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69942585T
Other languages
English (en)
Inventor
Mark Tadeusz Michalewicz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Quantum Precision Instruments Asia Pte Ltd
Original Assignee
Quantum Precision Instruments Asia Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AUPP5702A external-priority patent/AUPP570298A0/en
Priority claimed from AUPP7709A external-priority patent/AUPP770998A0/en
Application filed by Quantum Precision Instruments Asia Pte Ltd filed Critical Quantum Precision Instruments Asia Pte Ltd
Application granted granted Critical
Publication of DE69942585D1 publication Critical patent/DE69942585D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/14—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring distance or clearance between spaced objects or spaced apertures
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors

Landscapes

  • Nanotechnology (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Carbon And Carbon Compounds (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
DE69942585T 1998-09-07 1999-09-07 Messungen zwischen langgestreckten leitern unter verwendung des tunnelstroms Expired - Lifetime DE69942585D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AUPP5702A AUPP570298A0 (en) 1998-09-07 1998-09-07 Device for measuring angles, angles of rotation, rotational velocity and alignment at microscopic and macroscopic level
AUPP7709A AUPP770998A0 (en) 1998-12-14 1998-12-14 Measurement of fine angles
PCT/AU1999/000733 WO2000014476A1 (en) 1998-09-07 1999-09-07 Measurements using tunnelling current between elongate conductors

Publications (1)

Publication Number Publication Date
DE69942585D1 true DE69942585D1 (de) 2010-08-26

Family

ID=25645861

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69942585T Expired - Lifetime DE69942585D1 (de) 1998-09-07 1999-09-07 Messungen zwischen langgestreckten leitern unter verwendung des tunnelstroms

Country Status (12)

Country Link
US (1) US6707308B1 (de)
EP (1) EP1135665B1 (de)
JP (2) JP2002524725A (de)
KR (1) KR20010073134A (de)
CN (2) CN1249398C (de)
AT (1) ATE473942T1 (de)
BR (1) BR9913502A (de)
CA (1) CA2343261C (de)
DE (1) DE69942585D1 (de)
IL (2) IL141890A0 (de)
RU (1) RU2224978C2 (de)
WO (1) WO2000014476A1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010073134A (ko) * 1998-09-07 2001-07-31 추후제출 연장 콘덕터간의 터널링 전류를 이용하는 측정
JP3522261B2 (ja) * 2002-04-18 2004-04-26 日本電気株式会社 ナノチューブ、近接場光検出装置および近接場光検出方法
JP3969228B2 (ja) * 2002-07-19 2007-09-05 松下電工株式会社 機械的変形量検出センサ及びそれを用いた加速度センサ、圧力センサ
JP2006521212A (ja) * 2003-01-23 2006-09-21 ウィリアム・マーシュ・ライス・ユニバーシティ スマート材料：ナノチューブ検知システム、ナノチューブ検知複合材料、およびナノチューブ検知デバイスによる歪みの検知と応力の測定
AU2003901914A0 (en) * 2003-04-22 2003-05-08 Quantum Precision Instruments Pty Ltd Quantum tunnelling transducer device
EP1789973A2 (de) 2004-09-14 2007-05-30 Quantum Precision Instruments Asia Pte Ltd Teilchenoptik- und wellenleitervorrichtung
DE102006004922B4 (de) * 2006-02-01 2008-04-30 Nanoscale Systems Nanoss Gmbh Miniaturisiertes Federelement und Verfahren zu dessen Herstellung, Balkensonde, Rasterkraftmikroskop sowie Verfahren zu dessen Betrieb
WO2009029043A1 (en) 2007-08-24 2009-03-05 Quantum Precision Instruments Asia Private Limited Quantum tunnelling sensor device and method
US8091437B2 (en) * 2008-05-05 2012-01-10 John Stumpf Transducer matrix film
US8381601B2 (en) * 2008-05-05 2013-02-26 John F. Stumpf Transducer matrix film
CN101776434B (zh) * 2010-03-10 2011-12-14 南开大学 基于隧道电流反馈瞄准的小盲孔测量方法及测量装置
KR20150112018A (ko) 2013-01-28 2015-10-06 메사추세츠 인스티튜트 오브 테크놀로지 전기기계 디바이스
CN105891547A (zh) * 2014-09-18 2016-08-24 扬州思必得仪器设备有限公司 一种隧穿纤维
IT202100027005A1 (it) 2021-10-21 2023-04-21 Milano Politecnico Supporto antivibrazione con sensore integrato e sistema di monitoraggio di sollecitazioni meccaniche comprendente detto supporto

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0262253A1 (de) * 1986-10-03 1988-04-06 International Business Machines Corporation Mikromechanische Fühlervorrichtung für atomare Kräfte
DE3856296T2 (de) * 1987-08-25 1999-07-15 Canon Kk Tunnelstromkodierer
JPS6486002A (en) * 1987-09-29 1989-03-30 Fujitsu Ltd Fine displacement meter
US5210714A (en) * 1988-10-14 1993-05-11 International Business Machines Corporation Distance-controlled tunneling transducer and direct access storage unit employing the transducer
JP2996748B2 (ja) * 1990-02-09 2000-01-11 キヤノン株式会社 位置ずれ検出装置および方法
US5216631A (en) * 1990-11-02 1993-06-01 Sliwa Jr John W Microvibratory memory device
US5418771A (en) * 1993-02-25 1995-05-23 Canon Kabushiki Kaisha Information processing apparatus provided with surface aligning mechanism between probe head substrate and recording medium substrate
US5432356A (en) * 1993-04-02 1995-07-11 Fujitsu Limited Semiconductor heterojunction floating layer memory device and method for storing information in the same
US6021065A (en) * 1996-09-06 2000-02-01 Nonvolatile Electronics Incorporated Spin dependent tunneling memory
JPH07118270B2 (ja) * 1993-10-25 1995-12-18 日本電気株式会社 カーボンナノチューブトランジスタ
US5679888A (en) * 1994-10-05 1997-10-21 Matsushita Electric Industrial Co., Ltd. Dynamic quantity sensor and method for producing the same, distortion resistance element and method for producing the same, and angular velocity sensor
GB9426363D0 (en) * 1994-12-29 1995-03-01 Lynxvale Ltd A micromechanical accelerometer
US5703382A (en) * 1995-11-20 1997-12-30 Xerox Corporation Array having multiple channel structures with continuously doped interchannel regions
US5751156A (en) * 1995-06-07 1998-05-12 Yale University Mechanically controllable break transducer
US5756895A (en) 1995-09-01 1998-05-26 Hughes Aircraft Company Tunneling-based rate gyros with simple drive and sense axis coupling
GB9524241D0 (en) * 1995-11-28 1996-01-31 Smiths Industries Plc Rate sensors
JPH10321482A (ja) * 1997-05-22 1998-12-04 Casio Comput Co Ltd 電気二重層コンデンサ
KR20010073134A (ko) * 1998-09-07 2001-07-31 추후제출 연장 콘덕터간의 터널링 전류를 이용하는 측정

Also Published As

Publication number Publication date
CA2343261C (en) 2007-11-27
CN1317083A (zh) 2001-10-10
IL141890A0 (en) 2002-03-10
EP1135665A4 (de) 2002-06-19
BR9913502A (pt) 2001-12-04
IL141890A (en) 2006-08-20
EP1135665A1 (de) 2001-09-26
EP1135665B1 (de) 2010-07-14
CN100437017C (zh) 2008-11-26
ATE473942T1 (de) 2010-07-15
JP2010060562A (ja) 2010-03-18
JP2002524725A (ja) 2002-08-06
KR20010073134A (ko) 2001-07-31
JP4757937B2 (ja) 2011-08-24
US6707308B1 (en) 2004-03-16
CN1673665A (zh) 2005-09-28
WO2000014476A1 (en) 2000-03-16
CA2343261A1 (en) 2000-03-16
RU2224978C2 (ru) 2004-02-27
CN1249398C (zh) 2006-04-05

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