DE69921277D1 - System und Verfahren zur Fehlererkennung in einer elektrischen Schaltung durch Ruhestromanalyse - Google Patents

System und Verfahren zur Fehlererkennung in einer elektrischen Schaltung durch Ruhestromanalyse

Info

Publication number
DE69921277D1
DE69921277D1 DE69921277T DE69921277T DE69921277D1 DE 69921277 D1 DE69921277 D1 DE 69921277D1 DE 69921277 T DE69921277 T DE 69921277T DE 69921277 T DE69921277 T DE 69921277T DE 69921277 D1 DE69921277 D1 DE 69921277D1
Authority
DE
Germany
Prior art keywords
electrical circuit
fault detection
quiescent current
current analysis
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69921277T
Other languages
English (en)
Other versions
DE69921277T2 (de
Inventor
Peter M O'neill
Peter Maxwell
Victor Johansen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Avago Technologies International Sales Pte Ltd
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of DE69921277D1 publication Critical patent/DE69921277D1/de
Publication of DE69921277T2 publication Critical patent/DE69921277T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/81—Threshold

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE69921277T 1998-12-01 1999-08-25 System und Verfahren zur Fehlererkennung in einer elektrischen Schaltung durch Ruhestromanalyse Expired - Fee Related DE69921277T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/203,295 US6366108B2 (en) 1998-12-01 1998-12-01 System and method for detecting defects within an electrical circuit by analyzing quiescent current
US203295 1998-12-01

Publications (2)

Publication Number Publication Date
DE69921277D1 true DE69921277D1 (de) 2004-11-25
DE69921277T2 DE69921277T2 (de) 2005-10-27

Family

ID=22753355

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69921277T Expired - Fee Related DE69921277T2 (de) 1998-12-01 1999-08-25 System und Verfahren zur Fehlererkennung in einer elektrischen Schaltung durch Ruhestromanalyse

Country Status (4)

Country Link
US (1) US6366108B2 (de)
EP (1) EP1008857B1 (de)
JP (1) JP2000171529A (de)
DE (1) DE69921277T2 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6366108B2 (en) 1998-12-01 2002-04-02 Agilent Technologies, Inc. System and method for detecting defects within an electrical circuit by analyzing quiescent current
JP2001021609A (ja) * 1999-07-07 2001-01-26 Mitsubishi Electric Corp 半導体集積回路の検査方法
JP4507379B2 (ja) 2000-10-02 2010-07-21 ソニー株式会社 Ｃｍｏｓ集積回路の良品判定方法
JP3720271B2 (ja) * 2001-03-22 2005-11-24 株式会社ルネサステクノロジ 半導体集積回路装置
US6807507B2 (en) * 2001-11-27 2004-10-19 Vasudevan Seshadhri Kumar Electrical over stress (EOS) monitor
FR2835957B1 (fr) * 2002-02-08 2004-04-23 Cogema Procede de controle de crayon de combustible nucleaire
US6922822B2 (en) * 2002-07-19 2005-07-26 Hewlett-Packard Development Company, L.P. Verifying proximity of ground vias to signal vias in an integrated circuit
US6807657B2 (en) * 2002-07-19 2004-10-19 Hewlett-Packard Development Company, L.P. Inter-signal proximity verification in an integrated circuit
US6769102B2 (en) * 2002-07-19 2004-07-27 Hewlett-Packard Development Company Verifying proximity of ground metal to signal traces in an integrated circuit
US6941235B2 (en) * 2003-10-28 2005-09-06 International Business Machines Corporation Method and system for analyzing quiescent power plane current (IDDQ) test data in very-large scale integrated (VLSI) circuits
US7352170B2 (en) * 2006-06-13 2008-04-01 International Business Machines Corporation Exhaustive diagnosis of bridging defects in an integrated circuit including multiple nodes using test vectors and IDDQ measurements
EP1873537B1 (de) * 2006-06-29 2011-02-16 St Microelectronics S.A. Ermittlung des Typs eines Detektors von Störungspeaks für die Stromzufuhr zu einem integrierten Schaltkreis
US7948256B2 (en) * 2008-09-12 2011-05-24 Advantest Corporation Measurement apparatus, test system, and measurement method for measuring a characteristic of a device
US20100079163A1 (en) * 2008-09-26 2010-04-01 Advantest Corporation Measurement equipment, test system, and measurement method
US7859288B2 (en) * 2008-09-12 2010-12-28 Advantest Corporation Test apparatus and test method for testing a device based on quiescent current
US8643539B2 (en) * 2008-11-19 2014-02-04 Nokomis, Inc. Advance manufacturing monitoring and diagnostic tool
US8526252B2 (en) * 2009-03-17 2013-09-03 Seagate Technology Llc Quiescent testing of non-volatile memory array
US8280726B2 (en) * 2009-12-23 2012-10-02 Qualcomm Incorporated Gender detection in mobile phones
US20170245361A1 (en) * 2016-01-06 2017-08-24 Nokomis, Inc. Electronic device and methods to customize electronic device electromagnetic emissions
US10605842B2 (en) 2016-06-21 2020-03-31 International Business Machines Corporation Noise spectrum analysis for electronic device
US10448864B1 (en) 2017-02-24 2019-10-22 Nokomis, Inc. Apparatus and method to identify and measure gas concentrations
US11489847B1 (en) 2018-02-14 2022-11-01 Nokomis, Inc. System and method for physically detecting, identifying, and diagnosing medical electronic devices connectable to a network
KR20210019784A (ko) * 2019-08-13 2021-02-23 삼성전자주식회사 신뢰성 향상을 위한 스토리지 장치의 구동 방법 및 이를 수행하는 스토리지 장치

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5675253A (en) 1991-11-20 1997-10-07 Auburn International, Inc. Partial least square regression techniques in obtaining measurements of one or more polymer properties with an on-line nmr system
JP2718370B2 (ja) 1994-07-29 1998-02-25 日本電気株式会社 配線ショート箇所検出方法および配線ショート箇所検出装置
US5670892A (en) * 1995-10-20 1997-09-23 Lsi Logic Corporation Apparatus and method for measuring quiescent current utilizing timeset switching
US5784166A (en) 1996-04-03 1998-07-21 Nikon Corporation Position resolution of an interferometrially controlled moving stage by regression analysis
US5789933A (en) 1996-10-30 1998-08-04 Hewlett-Packard Co. Method and apparatus for determining IDDQ
US5914615A (en) * 1997-04-29 1999-06-22 Hewlett-Packard Company Method of improving the quality and efficiency of Iddq testing
US6366108B2 (en) 1998-12-01 2002-04-02 Agilent Technologies, Inc. System and method for detecting defects within an electrical circuit by analyzing quiescent current

Also Published As

Publication number Publication date
JP2000171529A (ja) 2000-06-23
DE69921277T2 (de) 2005-10-27
EP1008857A1 (de) 2000-06-14
US6366108B2 (en) 2002-04-02
US20010011903A1 (en) 2001-08-09
EP1008857B1 (de) 2004-10-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AVAGO TECHNOLOGIES GENERAL IP ( SINGAPORE) PTE. LT

8328 Change in the person/name/address of the agent

Representative=s name: DILG HAEUSLER SCHINDELMANN PATENTANWALTSGESELLSCHA

8339 Ceased/non-payment of the annual fee