PT102669A - Metodo de inspeccao de equipamento electrico, aparelho de inspeccao de caixa de juncao electrica e aparelho de inspeccao de elementos de terminais - Google Patents

Metodo de inspeccao de equipamento electrico, aparelho de inspeccao de caixa de juncao electrica e aparelho de inspeccao de elementos de terminais

Info

Publication number
PT102669A
PT102669A PT102669A PT10266901A PT102669A PT 102669 A PT102669 A PT 102669A PT 102669 A PT102669 A PT 102669A PT 10266901 A PT10266901 A PT 10266901A PT 102669 A PT102669 A PT 102669A
Authority
PT
Portugal
Prior art keywords
electrical equipment
junction box
electric junction
terminal elements
inspecting electrical
Prior art date
Application number
PT102669A
Other languages
English (en)
Other versions
PT102669B (pt
Inventor
Tatsuya Maeda
Original Assignee
Yazaki Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yazaki Corp filed Critical Yazaki Corp
Publication of PT102669A publication Critical patent/PT102669A/pt
Publication of PT102669B publication Critical patent/PT102669B/pt

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Connections By Means Of Piercing Elements, Nuts, Or Screws (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Electric Cable Installation (AREA)
  • Connection Or Junction Boxes (AREA)
  • Image Analysis (AREA)
PT102669A 2000-09-28 2001-09-28 Metodo de inspeccao de equipamento electrico, aparelho de inspeccao de caixa de juncao electrica e aparelho de inspeccao de elementos de terminais PT102669B (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000296334 2000-09-28
JP2001253350A JP4176977B2 (ja) 2000-09-28 2001-08-23 端子金具の検査装置

Publications (2)

Publication Number Publication Date
PT102669A true PT102669A (pt) 2002-03-28
PT102669B PT102669B (pt) 2004-06-30

Family

ID=26600940

Family Applications (1)

Application Number Title Priority Date Filing Date
PT102669A PT102669B (pt) 2000-09-28 2001-09-28 Metodo de inspeccao de equipamento electrico, aparelho de inspeccao de caixa de juncao electrica e aparelho de inspeccao de elementos de terminais

Country Status (5)

Country Link
US (2) US7006681B2 (pt)
JP (1) JP4176977B2 (pt)
MX (1) MXPA01009686A (pt)
PT (1) PT102669B (pt)
TR (1) TR200102637A2 (pt)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2002237553A1 (en) * 2002-03-07 2003-09-16 Advantest Corporation Electronic component testing apparatus
US7692105B2 (en) * 2007-02-23 2010-04-06 Continental Automotive Systems Us, Inc. Mounting assembly for a vehicle power junction box
US8073239B1 (en) * 2008-09-24 2011-12-06 Valco Cincinnati, Inc. Error detection system for verifying the construction of paper boxes
JP5051094B2 (ja) * 2008-10-15 2012-10-17 住友電装株式会社 端子挿入不良判定方法
JP5147740B2 (ja) * 2009-01-13 2013-02-20 三菱電機株式会社 太陽電池モジュール用端子ボックス装置及びその整流素子の誤搭載検出方法
JP5550455B2 (ja) * 2010-05-28 2014-07-16 矢崎総業株式会社 ワイヤハーネス導通検査方法およびワイヤハーネス導通検査プログラム
CN102435891B (zh) * 2011-10-24 2014-05-14 同致电子科技（厦门）有限公司 一种车用中央电气接线盒的自动测试装置
US20130155305A1 (en) * 2011-12-19 2013-06-20 Sony Corporation Orientation of illustration in electronic display device according to image of actual object being illustrated
CN103605303B (zh) * 2013-10-31 2016-06-01 杭州电子科技大学 一种带冗余检测的注塑机数字io转接线盒
KR101389701B1 (ko) * 2013-12-24 2014-04-29 미래산업 주식회사 자동차용 정션박스 검사장치
CN104793066A (zh) * 2014-01-20 2015-07-22 鸿富锦精密电子(天津)有限公司 测试装置
JP6615835B2 (ja) * 2017-06-26 2019-12-04 矢崎総業株式会社 画像検査における二値化処理プログラム及び二値化処理方法
CN107255996B (zh) * 2017-07-04 2019-07-26 上海应用技术大学 一种自动线束包覆控制装置及其自动控制方法
US11978992B2 (en) 2021-03-01 2024-05-07 Te Connectivity Solutions Gmbh Crimp machine having terminal pre-check
JP2024007290A (ja) * 2022-07-05 2024-01-18 ルネサスエレクトロニクス株式会社 外観検査装置および外観検査方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2553914B1 (fr) 1983-10-25 1986-01-03 Sumitomo Electric Industries Procede d'inspection de bornes connectees par sertissage
US4809308A (en) * 1986-02-20 1989-02-28 Irt Corporation Method and apparatus for performing automated circuit board solder quality inspections
US5495424A (en) 1990-04-18 1996-02-27 Matsushita Electric Industrial Co., Ltd. Method and apparatus for inspecting solder portions
EP0500315B1 (en) 1991-02-18 1999-07-21 Sumitomo Cement Co. Ltd. Method of optical recognition and classification of pattern
JPH05137047A (ja) * 1991-11-14 1993-06-01 Nikon Corp 焦点検出方法及び焦点検出装置
JPH06325181A (ja) * 1993-05-17 1994-11-25 Mitsubishi Electric Corp パターン認識方法
US6577757B1 (en) * 1999-07-28 2003-06-10 Intelligent Reasoning Systems, Inc. System and method for dynamic image recognition
US6748104B1 (en) * 2000-03-24 2004-06-08 Cognex Corporation Methods and apparatus for machine vision inspection using single and multiple templates or patterns

Also Published As

Publication number Publication date
MXPA01009686A (es) 2002-04-15
JP4176977B2 (ja) 2008-11-05
US7006681B2 (en) 2006-02-28
TR200102637A2 (tr) 2002-04-22
US20020036512A1 (en) 2002-03-28
US20060013467A1 (en) 2006-01-19
PT102669B (pt) 2004-06-30
US7409080B2 (en) 2008-08-05
JP2002175519A (ja) 2002-06-21

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Effective date: 20030704

FG3A Patent granted, date of granting

Effective date: 20040416

MM4A Annulment/lapse due to non-payment of fees, searched and examined patent

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Effective date: 20100329