DE69910319T2 - Tastkopf und elektrisches Instrument mit gespeicherter Kalibrierungsinformation bezüglich Kombinationen von Tastkopf und Kanälen des Instruments - Google Patents

Tastkopf und elektrisches Instrument mit gespeicherter Kalibrierungsinformation bezüglich Kombinationen von Tastkopf und Kanälen des Instruments Download PDF

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Publication number
DE69910319T2
DE69910319T2 DE69910319T DE69910319T DE69910319T2 DE 69910319 T2 DE69910319 T2 DE 69910319T2 DE 69910319 T DE69910319 T DE 69910319T DE 69910319 T DE69910319 T DE 69910319T DE 69910319 T2 DE69910319 T2 DE 69910319T2
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DE
Germany
Prior art keywords
probe
electrical
information
instrument
calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69910319T
Other languages
German (de)
English (en)
Other versions
DE69910319D1 (de
Inventor
Jimmie D. Colorado Springs Felps
Brian L. Richardson
Gerald R. Colorado Springs Kinsley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE69910319D1 publication Critical patent/DE69910319D1/de
Application granted granted Critical
Publication of DE69910319T2 publication Critical patent/DE69910319T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/002—Testing or calibrating of apparatus covered by the other groups of this subclass of cathode ray oscilloscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69910319T 1998-08-31 1999-03-30 Tastkopf und elektrisches Instrument mit gespeicherter Kalibrierungsinformation bezüglich Kombinationen von Tastkopf und Kanälen des Instruments Expired - Fee Related DE69910319T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/143,590 US6351112B1 (en) 1998-08-31 1998-08-31 Calibrating combinations of probes and channels in an oscilloscope
US143590 2002-05-08

Publications (2)

Publication Number Publication Date
DE69910319D1 DE69910319D1 (de) 2003-09-18
DE69910319T2 true DE69910319T2 (de) 2004-06-09

Family

ID=22504729

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69910319T Expired - Fee Related DE69910319T2 (de) 1998-08-31 1999-03-30 Tastkopf und elektrisches Instrument mit gespeicherter Kalibrierungsinformation bezüglich Kombinationen von Tastkopf und Kanälen des Instruments

Country Status (4)

Country Link
US (1) US6351112B1 (enExample)
EP (1) EP0984287B1 (enExample)
JP (1) JP2000074947A (enExample)
DE (1) DE69910319T2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011080481A1 (de) * 2011-08-05 2013-02-07 Rohde & Schwarz Gmbh & Co. Kg System und Verfahren zur automatischen Kodierung einesTastkopfs

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US6560554B1 (en) * 1999-10-11 2003-05-06 Tektronix, Inc. Automatic testing
US6629048B1 (en) * 2000-11-20 2003-09-30 Tektronix, Inc. Measurement test instrument and associated voltage management system for accessory device
US6725170B1 (en) * 2000-11-22 2004-04-20 Tektronix, Inc. Smart probe apparatus and method for automatic self-adjustment of an oscilloscope's bandwidth
US6870359B1 (en) 2001-12-14 2005-03-22 Le Croy Corporation Self-calibrating electrical test probe
US7180314B1 (en) 2001-12-14 2007-02-20 Lecroy Corporation Self-calibrating electrical test probe calibratable while connected to an electrical component under test
US6919728B2 (en) * 2002-02-27 2005-07-19 Lecroy Corporation Calibration cache and database
US6829547B2 (en) * 2002-04-29 2004-12-07 Tektronix, Inc. Measurement test instrument and associated voltage management system for accessory device
US7109728B2 (en) * 2003-02-25 2006-09-19 Agilent Technologies, Inc. Probe based information storage for probes used for opens detection in in-circuit testing
US20050185769A1 (en) * 2004-02-25 2005-08-25 Pickerd John J. Calibration method and apparatus
DE102005007103A1 (de) * 2005-02-16 2006-08-24 Infineon Technologies Ag Verfahren zum Testen einer zu testenden Schaltungseinheit mit Auskopplung von Verifikationssignalen und Testvorrichtung zur Durchführung des Verfahrens
US20070135983A1 (en) * 2005-12-12 2007-06-14 Automotive Systems Laboratory, Inc. Initialization process for an occupant classification initialization
US7532492B2 (en) * 2005-12-20 2009-05-12 Tektronix, Inc. Host controlled voltage input system for an accessory device
US7460983B2 (en) * 2006-08-23 2008-12-02 Tektronix, Inc. Signal analysis system and calibration method
US7660685B2 (en) * 2006-08-02 2010-02-09 Lecroy Corporation Virtual probing
US7405575B2 (en) * 2006-08-23 2008-07-29 Tektronix, Inc. Signal analysis system and calibration method for measuring the impedance of a device under test
US7408363B2 (en) * 2006-08-23 2008-08-05 Tektronix, Inc. Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load
US7414411B2 (en) * 2006-08-23 2008-08-19 Tektronix, Inc. Signal analysis system and calibration method for multiple signal probes
US12061218B2 (en) * 2008-03-13 2024-08-13 Ei Electronics Llc System and method for multi-rate concurrent waveform capture and storage for power quality metering
US8446143B2 (en) * 2008-06-27 2013-05-21 National Instruments Corporation Self-calibration circuit with gyrated output impedance
US9194888B2 (en) 2012-10-11 2015-11-24 Tektronix, Inc. Automatic probe ground connection checking techniques
KR102015499B1 (ko) * 2015-07-16 2019-08-28 엘에스산전 주식회사 오차보정시스템
US10724878B2 (en) * 2015-10-30 2020-07-28 Fisher Controls International Llc Methods and apparatus to correct remote sensor signals
EP3404426B1 (en) 2017-05-18 2022-06-29 Rohde & Schwarz GmbH & Co. KG Oscilloscope, test and measurement system as well as method
US10768211B2 (en) 2017-08-25 2020-09-08 Oracle International Corporation System and method for current sense resistor compensation
US11287445B2 (en) 2018-10-29 2022-03-29 Keysight Technologies, Inc. Oscilloscope probe identification
CN113625032B (zh) * 2021-07-01 2024-11-29 普源精电科技股份有限公司 一种探头测量系统和方法
CN116539939A (zh) * 2023-04-07 2023-08-04 深圳市知用电子有限公司 示波器的设置方法、设置装置、设备及存储介质

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US3944921A (en) * 1970-12-11 1976-03-16 Canon Kabushiki Kaisha Logic level test probe with grated oscillator
US3903471A (en) * 1972-03-10 1975-09-02 Canon Kk Electronic circuit test equipment including a cathode ray tube detachably connected thereto using a plurality of information signals
US4042881A (en) * 1975-06-23 1977-08-16 Unitec, Inc. Voltage measuring device having an amplifier in the probe
US4139817A (en) * 1976-09-13 1979-02-13 Tektronix, Inc. Impedance-switching connector
US4403183A (en) * 1981-04-10 1983-09-06 Tektronix, Inc. Active voltage probe
US4634971A (en) * 1982-09-30 1987-01-06 Ford Motor Company Portable hand-held voltage sensor with manually adjustable reference voltage for comparison with sensed voltage
US4672306A (en) * 1985-04-08 1987-06-09 Tektronix, Inc. Electronic probe having automatic readout of identification and status
US4758779A (en) * 1986-04-07 1988-07-19 Tektronix, Inc. Probe body for an electrical measurement system
US4764879A (en) * 1987-06-25 1988-08-16 The Yellow Springs Instrument Company, Inc. Fast/accurate calibration for a physical property sensor
US5162725A (en) * 1989-08-21 1992-11-10 Alnor Instrument Company Modular metering instrument including multiple sensing probes
US5629617A (en) * 1995-01-06 1997-05-13 Hewlett-Packard Company Multiplexing electronic test probe
US5691635A (en) * 1996-01-29 1997-11-25 Fluke Corporation Probe identification system for a measurement instrument
US6305963B1 (en) 1996-08-16 2001-10-23 Agilent Technologies, Inc. Push-lock BNC connector
US5939875A (en) * 1997-03-17 1999-08-17 Hewlett-Packard Company Universal probe interface
GB2323488B (en) 1997-03-20 2000-12-27 Sony Uk Ltd Signal processors

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011080481A1 (de) * 2011-08-05 2013-02-07 Rohde & Schwarz Gmbh & Co. Kg System und Verfahren zur automatischen Kodierung einesTastkopfs
DE102011080481B4 (de) * 2011-08-05 2016-04-07 Rohde & Schwarz Gmbh & Co. Kg System und Verfahren zur automatischen Kodierung einesTastkopfs

Also Published As

Publication number Publication date
EP0984287B1 (en) 2003-08-13
DE69910319D1 (de) 2003-09-18
JP2000074947A (ja) 2000-03-14
US6351112B1 (en) 2002-02-26
EP0984287A1 (en) 2000-03-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee