JP2000074947A - プロ―ブ識別情報を記憶しているオシロスコ―プのプロ―ブ - Google Patents

プロ―ブ識別情報を記憶しているオシロスコ―プのプロ―ブ

Info

Publication number
JP2000074947A
JP2000074947A JP11244302A JP24430299A JP2000074947A JP 2000074947 A JP2000074947 A JP 2000074947A JP 11244302 A JP11244302 A JP 11244302A JP 24430299 A JP24430299 A JP 24430299A JP 2000074947 A JP2000074947 A JP 2000074947A
Authority
JP
Japan
Prior art keywords
probe
oscilloscope
information
calibration
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11244302A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000074947A5 (enExample
Inventor
Jimmie D Felps
ジミー・ディー・フェルプス
Brian L Richardson
ブライアン・エル・リチャードソン
Gerald R Kinsley
ジェラルド・アール・キンスレイ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JP2000074947A publication Critical patent/JP2000074947A/ja
Publication of JP2000074947A5 publication Critical patent/JP2000074947A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/002—Testing or calibrating of apparatus covered by the other groups of this subclass of cathode ray oscilloscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP11244302A 1998-08-31 1999-08-31 プロ―ブ識別情報を記憶しているオシロスコ―プのプロ―ブ Pending JP2000074947A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/143,590 US6351112B1 (en) 1998-08-31 1998-08-31 Calibrating combinations of probes and channels in an oscilloscope
US143590 2002-05-08

Publications (2)

Publication Number Publication Date
JP2000074947A true JP2000074947A (ja) 2000-03-14
JP2000074947A5 JP2000074947A5 (enExample) 2006-10-12

Family

ID=22504729

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11244302A Pending JP2000074947A (ja) 1998-08-31 1999-08-31 プロ―ブ識別情報を記憶しているオシロスコ―プのプロ―ブ

Country Status (4)

Country Link
US (1) US6351112B1 (enExample)
EP (1) EP0984287B1 (enExample)
JP (1) JP2000074947A (enExample)
DE (1) DE69910319T2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002228496A (ja) * 2000-11-20 2002-08-14 Tektronix Inc 測定試験機器用電圧管理装置
JP2003344452A (ja) * 2002-04-29 2003-12-03 Tektronix Inc 測定機器用電圧管理装置

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* Cited by examiner, † Cited by third party
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US6560554B1 (en) * 1999-10-11 2003-05-06 Tektronix, Inc. Automatic testing
US6725170B1 (en) * 2000-11-22 2004-04-20 Tektronix, Inc. Smart probe apparatus and method for automatic self-adjustment of an oscilloscope's bandwidth
US6870359B1 (en) 2001-12-14 2005-03-22 Le Croy Corporation Self-calibrating electrical test probe
US7180314B1 (en) 2001-12-14 2007-02-20 Lecroy Corporation Self-calibrating electrical test probe calibratable while connected to an electrical component under test
US6919728B2 (en) * 2002-02-27 2005-07-19 Lecroy Corporation Calibration cache and database
US7109728B2 (en) * 2003-02-25 2006-09-19 Agilent Technologies, Inc. Probe based information storage for probes used for opens detection in in-circuit testing
US20050185769A1 (en) * 2004-02-25 2005-08-25 Pickerd John J. Calibration method and apparatus
DE102005007103A1 (de) * 2005-02-16 2006-08-24 Infineon Technologies Ag Verfahren zum Testen einer zu testenden Schaltungseinheit mit Auskopplung von Verifikationssignalen und Testvorrichtung zur Durchführung des Verfahrens
US20070135983A1 (en) * 2005-12-12 2007-06-14 Automotive Systems Laboratory, Inc. Initialization process for an occupant classification initialization
US7532492B2 (en) * 2005-12-20 2009-05-12 Tektronix, Inc. Host controlled voltage input system for an accessory device
US7460983B2 (en) * 2006-08-23 2008-12-02 Tektronix, Inc. Signal analysis system and calibration method
US7660685B2 (en) * 2006-08-02 2010-02-09 Lecroy Corporation Virtual probing
US7405575B2 (en) * 2006-08-23 2008-07-29 Tektronix, Inc. Signal analysis system and calibration method for measuring the impedance of a device under test
US7408363B2 (en) * 2006-08-23 2008-08-05 Tektronix, Inc. Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load
US7414411B2 (en) * 2006-08-23 2008-08-19 Tektronix, Inc. Signal analysis system and calibration method for multiple signal probes
US12061218B2 (en) * 2008-03-13 2024-08-13 Ei Electronics Llc System and method for multi-rate concurrent waveform capture and storage for power quality metering
US8446143B2 (en) * 2008-06-27 2013-05-21 National Instruments Corporation Self-calibration circuit with gyrated output impedance
DE102011080481B4 (de) * 2011-08-05 2016-04-07 Rohde & Schwarz Gmbh & Co. Kg System und Verfahren zur automatischen Kodierung einesTastkopfs
US9194888B2 (en) 2012-10-11 2015-11-24 Tektronix, Inc. Automatic probe ground connection checking techniques
KR102015499B1 (ko) * 2015-07-16 2019-08-28 엘에스산전 주식회사 오차보정시스템
US10724878B2 (en) * 2015-10-30 2020-07-28 Fisher Controls International Llc Methods and apparatus to correct remote sensor signals
EP3404426B1 (en) 2017-05-18 2022-06-29 Rohde & Schwarz GmbH & Co. KG Oscilloscope, test and measurement system as well as method
US10768211B2 (en) 2017-08-25 2020-09-08 Oracle International Corporation System and method for current sense resistor compensation
US11287445B2 (en) 2018-10-29 2022-03-29 Keysight Technologies, Inc. Oscilloscope probe identification
CN113625032B (zh) * 2021-07-01 2024-11-29 普源精电科技股份有限公司 一种探头测量系统和方法
CN116539939A (zh) * 2023-04-07 2023-08-04 深圳市知用电子有限公司 示波器的设置方法、设置装置、设备及存储介质

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Publication number Priority date Publication date Assignee Title
US3944921A (en) * 1970-12-11 1976-03-16 Canon Kabushiki Kaisha Logic level test probe with grated oscillator
US3903471A (en) * 1972-03-10 1975-09-02 Canon Kk Electronic circuit test equipment including a cathode ray tube detachably connected thereto using a plurality of information signals
US4042881A (en) * 1975-06-23 1977-08-16 Unitec, Inc. Voltage measuring device having an amplifier in the probe
US4139817A (en) * 1976-09-13 1979-02-13 Tektronix, Inc. Impedance-switching connector
US4403183A (en) * 1981-04-10 1983-09-06 Tektronix, Inc. Active voltage probe
US4634971A (en) * 1982-09-30 1987-01-06 Ford Motor Company Portable hand-held voltage sensor with manually adjustable reference voltage for comparison with sensed voltage
US4672306A (en) * 1985-04-08 1987-06-09 Tektronix, Inc. Electronic probe having automatic readout of identification and status
US4758779A (en) * 1986-04-07 1988-07-19 Tektronix, Inc. Probe body for an electrical measurement system
US4764879A (en) * 1987-06-25 1988-08-16 The Yellow Springs Instrument Company, Inc. Fast/accurate calibration for a physical property sensor
US5162725A (en) * 1989-08-21 1992-11-10 Alnor Instrument Company Modular metering instrument including multiple sensing probes
US5629617A (en) * 1995-01-06 1997-05-13 Hewlett-Packard Company Multiplexing electronic test probe
US5691635A (en) * 1996-01-29 1997-11-25 Fluke Corporation Probe identification system for a measurement instrument
US6305963B1 (en) 1996-08-16 2001-10-23 Agilent Technologies, Inc. Push-lock BNC connector
US5939875A (en) * 1997-03-17 1999-08-17 Hewlett-Packard Company Universal probe interface
GB2323488B (en) 1997-03-20 2000-12-27 Sony Uk Ltd Signal processors

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002228496A (ja) * 2000-11-20 2002-08-14 Tektronix Inc 測定試験機器用電圧管理装置
JP2003344452A (ja) * 2002-04-29 2003-12-03 Tektronix Inc 測定機器用電圧管理装置

Also Published As

Publication number Publication date
EP0984287B1 (en) 2003-08-13
DE69910319D1 (de) 2003-09-18
US6351112B1 (en) 2002-02-26
EP0984287A1 (en) 2000-03-08
DE69910319T2 (de) 2004-06-09

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