JP2000074947A5 - - Google Patents

Download PDF

Info

Publication number
JP2000074947A5
JP2000074947A5 JP1999244302A JP24430299A JP2000074947A5 JP 2000074947 A5 JP2000074947 A5 JP 2000074947A5 JP 1999244302 A JP1999244302 A JP 1999244302A JP 24430299 A JP24430299 A JP 24430299A JP 2000074947 A5 JP2000074947 A5 JP 2000074947A5
Authority
JP
Japan
Prior art keywords
probe
electrical
electric
measuring instrument
storage device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1999244302A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000074947A (ja
Filing date
Publication date
Priority claimed from US09/143,590 external-priority patent/US6351112B1/en
Application filed filed Critical
Publication of JP2000074947A publication Critical patent/JP2000074947A/ja
Publication of JP2000074947A5 publication Critical patent/JP2000074947A5/ja
Pending legal-status Critical Current

Links

JP11244302A 1998-08-31 1999-08-31 プロ―ブ識別情報を記憶しているオシロスコ―プのプロ―ブ Pending JP2000074947A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/143,590 US6351112B1 (en) 1998-08-31 1998-08-31 Calibrating combinations of probes and channels in an oscilloscope
US143590 1998-08-31

Publications (2)

Publication Number Publication Date
JP2000074947A JP2000074947A (ja) 2000-03-14
JP2000074947A5 true JP2000074947A5 (enExample) 2006-10-12

Family

ID=22504729

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11244302A Pending JP2000074947A (ja) 1998-08-31 1999-08-31 プロ―ブ識別情報を記憶しているオシロスコ―プのプロ―ブ

Country Status (4)

Country Link
US (1) US6351112B1 (enExample)
EP (1) EP0984287B1 (enExample)
JP (1) JP2000074947A (enExample)
DE (1) DE69910319T2 (enExample)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6560554B1 (en) * 1999-10-11 2003-05-06 Tektronix, Inc. Automatic testing
US6629048B1 (en) * 2000-11-20 2003-09-30 Tektronix, Inc. Measurement test instrument and associated voltage management system for accessory device
US6725170B1 (en) * 2000-11-22 2004-04-20 Tektronix, Inc. Smart probe apparatus and method for automatic self-adjustment of an oscilloscope's bandwidth
US7180314B1 (en) 2001-12-14 2007-02-20 Lecroy Corporation Self-calibrating electrical test probe calibratable while connected to an electrical component under test
US6870359B1 (en) 2001-12-14 2005-03-22 Le Croy Corporation Self-calibrating electrical test probe
US6919728B2 (en) * 2002-02-27 2005-07-19 Lecroy Corporation Calibration cache and database
US6829547B2 (en) * 2002-04-29 2004-12-07 Tektronix, Inc. Measurement test instrument and associated voltage management system for accessory device
US7109728B2 (en) * 2003-02-25 2006-09-19 Agilent Technologies, Inc. Probe based information storage for probes used for opens detection in in-circuit testing
US20050185769A1 (en) 2004-02-25 2005-08-25 Pickerd John J. Calibration method and apparatus
DE102005007103A1 (de) * 2005-02-16 2006-08-24 Infineon Technologies Ag Verfahren zum Testen einer zu testenden Schaltungseinheit mit Auskopplung von Verifikationssignalen und Testvorrichtung zur Durchführung des Verfahrens
US20070135983A1 (en) * 2005-12-12 2007-06-14 Automotive Systems Laboratory, Inc. Initialization process for an occupant classification initialization
US7532492B2 (en) * 2005-12-20 2009-05-12 Tektronix, Inc. Host controlled voltage input system for an accessory device
US7460983B2 (en) * 2006-08-23 2008-12-02 Tektronix, Inc. Signal analysis system and calibration method
US7660685B2 (en) * 2006-08-02 2010-02-09 Lecroy Corporation Virtual probing
US7414411B2 (en) * 2006-08-23 2008-08-19 Tektronix, Inc. Signal analysis system and calibration method for multiple signal probes
US7408363B2 (en) * 2006-08-23 2008-08-05 Tektronix, Inc. Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load
US7405575B2 (en) * 2006-08-23 2008-07-29 Tektronix, Inc. Signal analysis system and calibration method for measuring the impedance of a device under test
US12061218B2 (en) * 2008-03-13 2024-08-13 Ei Electronics Llc System and method for multi-rate concurrent waveform capture and storage for power quality metering
US8446143B2 (en) * 2008-06-27 2013-05-21 National Instruments Corporation Self-calibration circuit with gyrated output impedance
DE102011080481B4 (de) * 2011-08-05 2016-04-07 Rohde & Schwarz Gmbh & Co. Kg System und Verfahren zur automatischen Kodierung einesTastkopfs
US9194888B2 (en) 2012-10-11 2015-11-24 Tektronix, Inc. Automatic probe ground connection checking techniques
KR102015499B1 (ko) * 2015-07-16 2019-08-28 엘에스산전 주식회사 오차보정시스템
US10724878B2 (en) * 2015-10-30 2020-07-28 Fisher Controls International Llc Methods and apparatus to correct remote sensor signals
EP3404426B1 (en) * 2017-05-18 2022-06-29 Rohde & Schwarz GmbH & Co. KG Oscilloscope, test and measurement system as well as method
US10768211B2 (en) 2017-08-25 2020-09-08 Oracle International Corporation System and method for current sense resistor compensation
US11287445B2 (en) 2018-10-29 2022-03-29 Keysight Technologies, Inc. Oscilloscope probe identification
CN113625032B (zh) * 2021-07-01 2024-11-29 普源精电科技股份有限公司 一种探头测量系统和方法
CN116539939A (zh) * 2023-04-07 2023-08-04 深圳市知用电子有限公司 示波器的设置方法、设置装置、设备及存储介质

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3944921A (en) * 1970-12-11 1976-03-16 Canon Kabushiki Kaisha Logic level test probe with grated oscillator
US3903471A (en) * 1972-03-10 1975-09-02 Canon Kk Electronic circuit test equipment including a cathode ray tube detachably connected thereto using a plurality of information signals
US4042881A (en) * 1975-06-23 1977-08-16 Unitec, Inc. Voltage measuring device having an amplifier in the probe
US4139817A (en) * 1976-09-13 1979-02-13 Tektronix, Inc. Impedance-switching connector
US4403183A (en) * 1981-04-10 1983-09-06 Tektronix, Inc. Active voltage probe
US4634971A (en) * 1982-09-30 1987-01-06 Ford Motor Company Portable hand-held voltage sensor with manually adjustable reference voltage for comparison with sensed voltage
US4672306A (en) * 1985-04-08 1987-06-09 Tektronix, Inc. Electronic probe having automatic readout of identification and status
US4758779A (en) * 1986-04-07 1988-07-19 Tektronix, Inc. Probe body for an electrical measurement system
US4764879A (en) * 1987-06-25 1988-08-16 The Yellow Springs Instrument Company, Inc. Fast/accurate calibration for a physical property sensor
US5162725A (en) * 1989-08-21 1992-11-10 Alnor Instrument Company Modular metering instrument including multiple sensing probes
US5629617A (en) * 1995-01-06 1997-05-13 Hewlett-Packard Company Multiplexing electronic test probe
US5691635A (en) 1996-01-29 1997-11-25 Fluke Corporation Probe identification system for a measurement instrument
US6305963B1 (en) 1996-08-16 2001-10-23 Agilent Technologies, Inc. Push-lock BNC connector
US5939875A (en) * 1997-03-17 1999-08-17 Hewlett-Packard Company Universal probe interface
GB2323488B (en) 1997-03-20 2000-12-27 Sony Uk Ltd Signal processors

Similar Documents

Publication Publication Date Title
JP2000074947A5 (enExample)
EP0984287B1 (en) Probe and electrical instrument having stored calibration information about combinations of probes and instrument channels
CA2217312A1 (en) Method and apparatus for calibrating a sensor element
CA2264343A1 (en) Method and apparatus for data management authentication in a clinical analyzer
US4819657A (en) Automatic allergy detection system
EP0764469A3 (en) Method and apparatus for marking predetermined events with a biosensor
JP5002115B2 (ja) 生産物、データ取得システムおよびセンサシステム
JPH07500986A (ja) 体液の導電率の測定方法及びその際使用される測定ヘツド
WO2004033032A3 (en) Connection verification apparatus, system, and method
MY116991A (en) Calibration apparatus and methods for a thermal proximity sensor
CN108382729A (zh) 具备nfc芯片的包装盒及其控制方法
US20050260760A1 (en) Measuring device for monitoring sterilization conditions
CN101896805A (zh) 用于家用电器的改进的压力传感器及相关方法
CN104622436A (zh) 电子体温计及其夹持状态的检测方法
CN106805942A (zh) 人体生理信息采集组件、人体生理参数测量设备和系统
JP2002143108A5 (enExample)
JP4160683B2 (ja) ひずみ測定システム
JP2002541640A (ja) 消費者用レコーダ
JPS5987630U (ja) ポ−タブル型測定器
CN215985839U (zh) 一种土壤环境检测装置
CN217424595U (zh) 测温器
JPS61221641A (ja) 含水率測定装置
JP2008058255A (ja) 検電器
CN220490232U (zh) 一种体表探头传感器
CN206974561U (zh) 一种水温测量用温度传感器