DE69907618D1 - Störunanfälliges Lasersystem - Google Patents

Störunanfälliges Lasersystem

Info

Publication number
DE69907618D1
DE69907618D1 DE69907618T DE69907618T DE69907618D1 DE 69907618 D1 DE69907618 D1 DE 69907618D1 DE 69907618 T DE69907618 T DE 69907618T DE 69907618 T DE69907618 T DE 69907618T DE 69907618 D1 DE69907618 D1 DE 69907618D1
Authority
DE
Germany
Prior art keywords
prone
interference
laser system
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69907618T
Other languages
English (en)
Other versions
DE69907618T2 (de
Inventor
Richard Pittaro
David A King
Martin Wunderling
Jens-Peter Seher
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of DE69907618D1 publication Critical patent/DE69907618D1/de
Publication of DE69907618T2 publication Critical patent/DE69907618T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/105—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
    • H01S3/08—Construction or shape of optical resonators or components thereof
    • H01S3/08018—Mode suppression
    • H01S3/08022—Longitudinal modes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
    • H01S3/08—Construction or shape of optical resonators or components thereof
    • H01S3/081—Construction or shape of optical resonators or components thereof comprising three or more reflectors
    • H01S3/082—Construction or shape of optical resonators or components thereof comprising three or more reflectors defining a plurality of resonators, e.g. for mode selection or suppression
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/09—Processes or apparatus for excitation, e.g. pumping
    • H01S3/091—Processes or apparatus for excitation, e.g. pumping using optical pumping
    • H01S3/094—Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light
    • H01S3/0941—Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a laser diode
    • H01S3/09415—Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a laser diode the pumping beam being parallel to the lasing mode of the pumped medium, e.g. end-pumping

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Plasma & Fusion (AREA)
  • Lasers (AREA)
  • Semiconductor Lasers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE69907618T 1999-01-07 1999-08-31 Störunanfälliges Lasersystem Expired - Lifetime DE69907618T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/227,105 US6222860B1 (en) 1999-01-07 1999-01-07 Laser system tolerating disturbances using multiple modes
US227105 1999-01-07

Publications (2)

Publication Number Publication Date
DE69907618D1 true DE69907618D1 (de) 2003-06-12
DE69907618T2 DE69907618T2 (de) 2004-03-11

Family

ID=22851763

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69907618T Expired - Lifetime DE69907618T2 (de) 1999-01-07 1999-08-31 Störunanfälliges Lasersystem

Country Status (4)

Country Link
US (1) US6222860B1 (de)
EP (1) EP1018791B1 (de)
JP (1) JP2000208865A (de)
DE (1) DE69907618T2 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060193354A1 (en) * 2003-02-05 2006-08-31 Yehuda Rosenblatt External Cavity Tunable Laser and Control
CN100353622C (zh) * 2005-01-27 2007-12-05 中国计量学院 No2差分吸收探测中一对转动拉曼激光源的产生方法及装置
DE102005040661B3 (de) * 2005-08-26 2006-12-28 Leica Microsystems Semiconductor Gmbh Koordinatenmessvorrichtung
EP3254345A4 (de) 2015-02-02 2018-10-10 Wi-Charge Ltd. Verteilte gekoppelte resonator-laser
US10527492B2 (en) 2017-05-16 2020-01-07 Li-Cor, Inc. Mode matching method for absorption spectroscopy systems
FR3091925B1 (fr) 2019-01-18 2021-01-29 Ap2E Système de cavité optique résonnante a rétroaction optique, adaptée à la détection de traces de gaz par spectrométrie de Raman
US10847948B2 (en) * 2019-03-13 2020-11-24 King Fahd University Of Petroleum And Minerals Self-injection locked tunable laser

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57124493A (en) * 1981-01-26 1982-08-03 Mitsubishi Electric Corp Coupler for semiconductor laser and optical fiber
US4622672A (en) * 1984-01-20 1986-11-11 At&T Bell Laboratories Self-stabilized semiconductor lasers
US4972424A (en) 1989-05-17 1990-11-20 Hughes Aircraft Company Automatic dither stabilization of a laser cavity
US5153671A (en) 1990-05-11 1992-10-06 Boc Health Care, Inc. Gas analysis system having buffer gas inputs to protect associated optical elements
US5245405A (en) 1990-05-11 1993-09-14 Boc Health Care, Inc. Constant pressure gas cell
US5065401A (en) 1991-02-26 1991-11-12 Spectra Diode Laboratories, Inc. Pulse jitter reduction method for a laser diode or array
JP3184359B2 (ja) 1993-03-19 2001-07-09 富士通株式会社 半導体レーザ制御方法および半導体レーザ制御装置
US5432610A (en) 1994-04-15 1995-07-11 Hewlett-Packard Company Diode-pumped power build-up cavity for chemical sensing
US5659559A (en) 1994-06-28 1997-08-19 Sdl, Inc. Apparatus for generating a stabilized laser source
JPH08167875A (ja) * 1994-12-14 1996-06-25 Sony Corp 光空間伝送装置
US5642375A (en) 1995-10-26 1997-06-24 Hewlett-Packard Company Passively-locked external optical cavity
DE19642409B4 (de) * 1995-10-26 2011-05-12 Agilent Technologies, Inc. (n.d.Ges.d. Staates Delaware), Santa Clara "Lasersystem mit externem Resonator"
US5684623A (en) 1996-03-20 1997-11-04 Hewlett Packard Company Narrow-band tunable optical source
US6058128A (en) * 1996-03-25 2000-05-02 Sdl, Inc. Apparatus for providing a stabilized laser source
US5914972A (en) * 1997-03-24 1999-06-22 Sdl, Inc. Thermal compensators for waveguide DBR laser sources

Also Published As

Publication number Publication date
US6222860B1 (en) 2001-04-24
EP1018791A1 (de) 2000-07-12
EP1018791B1 (de) 2003-05-07
JP2000208865A (ja) 2000-07-28
DE69907618T2 (de) 2004-03-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US