DE69828219D1 - Lichtmessvorrichtung zur einfachen und hochgenauen Bestimmung der optischen Leistung - Google Patents

Lichtmessvorrichtung zur einfachen und hochgenauen Bestimmung der optischen Leistung

Info

Publication number
DE69828219D1
DE69828219D1 DE69828219T DE69828219T DE69828219D1 DE 69828219 D1 DE69828219 D1 DE 69828219D1 DE 69828219 T DE69828219 T DE 69828219T DE 69828219 T DE69828219 T DE 69828219T DE 69828219 D1 DE69828219 D1 DE 69828219D1
Authority
DE
Germany
Prior art keywords
measuring device
optical power
highly accurate
accurate determination
light measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69828219T
Other languages
English (en)
Other versions
DE69828219T2 (de
Inventor
Takashi Sakamoto
Keita Katoh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Application granted granted Critical
Publication of DE69828219D1 publication Critical patent/DE69828219D1/de
Publication of DE69828219T2 publication Critical patent/DE69828219T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
DE69828219T 1997-06-06 1998-06-04 Lichtmessvorrichtung zur einfachen und hochgenauen Bestimmung der optischen Leistung Expired - Lifetime DE69828219T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP14946397A JP3276306B2 (ja) 1997-06-06 1997-06-06 光測定器
JP14946397 1997-06-06

Publications (2)

Publication Number Publication Date
DE69828219D1 true DE69828219D1 (de) 2005-01-27
DE69828219T2 DE69828219T2 (de) 2005-12-15

Family

ID=15475688

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69828219T Expired - Lifetime DE69828219T2 (de) 1997-06-06 1998-06-04 Lichtmessvorrichtung zur einfachen und hochgenauen Bestimmung der optischen Leistung

Country Status (4)

Country Link
US (1) US6043480A (de)
EP (1) EP0882962B1 (de)
JP (1) JP3276306B2 (de)
DE (1) DE69828219T2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4660113B2 (ja) * 2004-04-27 2011-03-30 株式会社東芝 ファイバブラッググレーティング物理量計測装置
US7619727B2 (en) * 2006-06-07 2009-11-17 Raybit Systems Inc. Apparatus for detecting wavelength and measuring optical power
JP5266785B2 (ja) 2008-02-19 2013-08-21 富士通株式会社 光検出装置および光検出方法
JP4644732B2 (ja) * 2008-09-18 2011-03-02 シャープ株式会社 光変調型検出装置および電子機器
US9354113B1 (en) * 2010-11-05 2016-05-31 Stc.Unm Impact ionization devices under dynamic electric fields
KR101906974B1 (ko) * 2011-04-25 2018-10-12 삼성전자주식회사 광센싱 장치 및 그 구동 방법
US10128398B1 (en) 2014-05-23 2018-11-13 Stc.Unm Resonance avalanche photodiodes for dynamic biasing
WO2022221141A1 (en) * 2021-04-12 2022-10-20 Milwaukee Electric Tool Corporation Laser level system with automatic detector alignment
EP4323722A1 (de) * 2021-04-12 2024-02-21 Milwaukee Electric Tool Corporation Lasernivelliervorrichtung mit automatischer detektorausrichtung

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3581643A (en) * 1967-05-02 1971-06-01 Yashica Co Ltd Light measuring device
US3687558A (en) * 1971-07-16 1972-08-29 Us Air Force Laser power-energy meter
US4310243A (en) * 1979-10-19 1982-01-12 Beckman Instruments, Inc. Spectrophotometer with photomultiplier tube dark signal compensation
US4927266A (en) * 1987-03-30 1990-05-22 Anritsu Corporation Optical signal generating apparatus and optical power meter calibrating system using the same
JP2560747B2 (ja) * 1987-09-22 1996-12-04 ミノルタ株式会社 光電変換装置
US5043608A (en) * 1989-08-24 1991-08-27 Tektronix, Inc. Avalanche photodiode non-linearity cancellation

Also Published As

Publication number Publication date
EP0882962A2 (de) 1998-12-09
US6043480A (en) 2000-03-28
EP0882962A3 (de) 2000-03-15
EP0882962B1 (de) 2004-12-22
JP3276306B2 (ja) 2002-04-22
DE69828219T2 (de) 2005-12-15
JPH10339667A (ja) 1998-12-22

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Legal Events

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8364 No opposition during term of opposition