DE69825204D1 - Eigenkalibrierung eines Oszilloskops mittels eines Rechteck-Testsignals - Google Patents

Eigenkalibrierung eines Oszilloskops mittels eines Rechteck-Testsignals

Info

Publication number
DE69825204D1
DE69825204D1 DE69825204T DE69825204T DE69825204D1 DE 69825204 D1 DE69825204 D1 DE 69825204D1 DE 69825204 T DE69825204 T DE 69825204T DE 69825204 T DE69825204 T DE 69825204T DE 69825204 D1 DE69825204 D1 DE 69825204D1
Authority
DE
Germany
Prior art keywords
test signal
digitizer
calibration
self
oscilloscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69825204T
Other languages
English (en)
Other versions
DE69825204T2 (de
Inventor
Joseph M Schachner
Viktor Hungerbuehler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lecroy Corp
Original Assignee
Lecroy Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lecroy Corp filed Critical Lecroy Corp
Application granted granted Critical
Publication of DE69825204D1 publication Critical patent/DE69825204D1/de
Publication of DE69825204T2 publication Critical patent/DE69825204T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/002—Testing or calibrating of apparatus covered by the other groups of this subclass of cathode ray oscilloscopes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE69825204T 1997-04-30 1998-04-30 Eigenkalibrierung eines Oszilloskops mittels eines Rechteck-Testsignals Expired - Fee Related DE69825204T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US4430097P 1997-04-30 1997-04-30
US44300P 1997-04-30

Publications (2)

Publication Number Publication Date
DE69825204D1 true DE69825204D1 (de) 2004-09-02
DE69825204T2 DE69825204T2 (de) 2005-07-21

Family

ID=21931597

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69825204T Expired - Fee Related DE69825204T2 (de) 1997-04-30 1998-04-30 Eigenkalibrierung eines Oszilloskops mittels eines Rechteck-Testsignals

Country Status (6)

Country Link
US (1) US6269317B1 (de)
EP (1) EP0875764B1 (de)
JP (1) JPH1144710A (de)
AT (1) ATE272216T1 (de)
CA (1) CA2236385C (de)
DE (1) DE69825204T2 (de)

Families Citing this family (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6571186B1 (en) * 1999-09-14 2003-05-27 Textronix, Inc. Method of waveform time stamping for minimizing digitization artifacts in time interval distribution measurements
US6518800B2 (en) * 2000-05-31 2003-02-11 Texas Instruments Incorporated System and method for reducing timing mismatch in sample and hold circuits using the clock
US6407687B2 (en) * 2000-06-28 2002-06-18 Texas Instruments Incorporated System and method for reducing timing mismatch in sample and hold circuits using an FFT and subcircuit reassignment
US6483448B2 (en) * 2000-06-28 2002-11-19 Texas Instruments Incorporated System and method for reducing timing mismatch in sample and hold circuits using an FFT and decimation
US6775628B2 (en) * 2001-11-27 2004-08-10 Teradyne, Inc. Low distortion frequency tracking technique
US7283917B2 (en) * 2001-12-12 2007-10-16 Alcatel Canada Inc. System and method for calibrating an adjustable delay time for a delay module
US6919728B2 (en) * 2002-02-27 2005-07-19 Lecroy Corporation Calibration cache and database
US6784819B2 (en) * 2002-06-27 2004-08-31 Teradyne, Inc. Measuring skew between digitizer channels using fourier transform
DE10312208B3 (de) * 2003-03-19 2004-07-01 Lucas Automotive Gmbh Verfahren und Vorrichtung zum Erfassen einer Drehzahl, insbesondere einer Raddrehzahl eines Kraftfahrzeugs
CA2484951A1 (en) * 2004-09-27 2006-03-27 Veris Industries, Llc Method and apparatus for phase determination
DE602005006765D1 (de) * 2005-01-11 2008-06-26 Anritsu Corp Zeitverschachtelungstyps und das bauelement verwe
US7386409B2 (en) * 2005-02-25 2008-06-10 Lecroy Corporation Method and apparatus for artifact signal reduction in systems of mismatched interleaved digitizers
US7183953B2 (en) * 2005-03-31 2007-02-27 Teradyne, Inc. Calibrating automatic test equipment containing interleaved analog-to-digital converters
US7148828B2 (en) * 2005-05-03 2006-12-12 Agilent Technologies, Inc. System and method for timing calibration of time-interleaved data converters
US20070036255A1 (en) * 2005-08-09 2007-02-15 Wolfe Robert T Synchronization of data streams from data acquisition processors using a common signal
US7450043B2 (en) * 2006-10-31 2008-11-11 Lecroy Corporation Method of compensating for deterministic jitter due to interleave error
CA2609619A1 (en) 2007-09-10 2009-03-10 Veris Industries, Llc Status indicator
CA2609629A1 (en) 2007-09-10 2009-03-10 Veris Industries, Llc Current switch with automatic calibration
CA2609611A1 (en) 2007-09-10 2009-03-10 Veris Industries, Llc Split core status indicator
US8212548B2 (en) 2008-06-02 2012-07-03 Veris Industries, Llc Branch meter with configurable sensor strip arrangement
US8446143B2 (en) * 2008-06-27 2013-05-21 National Instruments Corporation Self-calibration circuit with gyrated output impedance
US8421443B2 (en) 2008-11-21 2013-04-16 Veris Industries, Llc Branch current monitor with calibration
US8421639B2 (en) 2008-11-21 2013-04-16 Veris Industries, Llc Branch current monitor with an alarm
US9335352B2 (en) 2009-03-13 2016-05-10 Veris Industries, Llc Branch circuit monitor power measurement
CN101576610B (zh) * 2009-05-27 2012-01-11 秦轲 一种在示波器中提高数据采样精度的装置和方法
EP2363961A1 (de) * 2010-03-04 2011-09-07 BAE SYSTEMS plc Abtastung
WO2011107801A1 (en) * 2010-03-04 2011-09-09 Bae Systems Plc Sampling
US8788234B2 (en) * 2010-10-15 2014-07-22 Tektronix, Inc. Method of calibrating interleaved digitizer channels
US10006948B2 (en) 2011-02-25 2018-06-26 Veris Industries, Llc Current meter with voltage awareness
US9146264B2 (en) 2011-02-25 2015-09-29 Veris Industries, Llc Current meter with on board memory
US9329996B2 (en) 2011-04-27 2016-05-03 Veris Industries, Llc Branch circuit monitor with paging register
US9306590B2 (en) 2011-05-26 2016-04-05 Tektronix, Inc. Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
US9568503B2 (en) 2011-05-26 2017-02-14 Tektronix, Inc. Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
US9432042B2 (en) 2011-05-26 2016-08-30 Tektronix, Inc. Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
US9250308B2 (en) 2011-06-03 2016-02-02 Veris Industries, Llc Simplified energy meter configuration
US8705677B2 (en) 2011-09-27 2014-04-22 Teledyne Lecroy, Inc. Multiple channel distributed system and method
US9410552B2 (en) 2011-10-05 2016-08-09 Veris Industries, Llc Current switch with automatic calibration
US9886419B2 (en) * 2012-07-26 2018-02-06 Tektronix, Inc. System for improving probability of transient event detection
JP6629511B2 (ja) * 2014-03-04 2020-01-15 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． 試験測定装置及び補償値決定方法
CN105652104A (zh) * 2014-11-11 2016-06-08 江苏绿扬电子仪器集团有限公司 数字串行信号分析仪前置通道的自校正装置及方法
US9525427B1 (en) * 2015-09-11 2016-12-20 Tektronix, Inc. Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter
US10371730B2 (en) 2015-12-28 2019-08-06 Veris Industries, Llc Branch current monitor with client level access
US10371721B2 (en) 2015-12-28 2019-08-06 Veris Industries, Llc Configuration system for a power meter
US10408911B2 (en) 2015-12-28 2019-09-10 Veris Industries, Llc Network configurable system for a power meter
US10274572B2 (en) 2015-12-28 2019-04-30 Veris Industries, Llc Calibration system for a power meter
US11215650B2 (en) 2017-02-28 2022-01-04 Veris Industries, Llc Phase aligned branch energy meter
US11193958B2 (en) 2017-03-03 2021-12-07 Veris Industries, Llc Non-contact voltage sensor
US10705126B2 (en) 2017-05-19 2020-07-07 Veris Industries, Llc Energy metering with temperature monitoring
CN107422203A (zh) * 2017-07-03 2017-12-01 中国电力科学研究院 一种校核冲击分流器的系统和方法
US11187726B2 (en) * 2018-03-08 2021-11-30 Rohde & Schwarz Gmbh & Co. Kg Oscilloscope and method for operating an oscilloscope
CN117546417A (zh) * 2021-04-22 2024-02-09 希尔纳公司 利用片上电路的adc自校准和方法
EP4183049B1 (de) * 2021-04-22 2024-07-03 Ciena Corporation Adc-selbstkalibrierung mit on-chip-schaltung und verfahren
US11558061B2 (en) 2021-04-22 2023-01-17 Ciena Corporation ADC self-calibration with on-chip circuit and method
CN113252958A (zh) * 2021-07-15 2021-08-13 深圳市鼎阳科技股份有限公司 一种数字示波器及其通道间延迟差的自动校准方法
CN117389128B (zh) * 2023-12-08 2024-02-23 深圳市山海半导体科技有限公司 一种数字时钟自动校准方法及系统

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56115026A (en) 1980-02-18 1981-09-10 Sony Tektronix Corp Analog-digital converter
US5055845A (en) 1984-03-30 1991-10-08 Datajet, Inc. Signal digitizing method and system utilizing time delay of the input signal
US4627268A (en) 1985-07-19 1986-12-09 Hewlett-Packard Company Method for calibrating instruments for time interval measurements
JPH0628340B2 (ja) 1985-12-24 1994-04-13 ソニ−・テクトロニクス株式会社 アナログ・デジタル変換装置用校正方法
GB8627533D0 (en) 1986-11-18 1986-12-17 Gould Electronics Calibration of components in measuring/indicating device
US5488369A (en) 1986-11-18 1996-01-30 Gould Electronics, Ltd. High speed sampling apparatus and method for calibrating the same
US4763105A (en) 1987-07-08 1988-08-09 Tektronix, Inc. Interleaved digitizer array with calibrated sample timing
US4768017A (en) 1987-07-22 1988-08-30 Sonotek, Inc. Circuit for providing high sampling rate resolution using slow sampling rate
US4843309A (en) 1988-03-21 1989-06-27 Tektronix, Inc. Waveform timing alignment system for digital oscilloscopes
US4940931A (en) * 1988-06-24 1990-07-10 Anritsu Corporation Digital waveform measuring apparatus having a shading-tone display function
US4962380A (en) * 1989-09-21 1990-10-09 Tektronix, Inc. Method and apparatus for calibrating an interleaved digitizer
US5239299A (en) 1991-08-06 1993-08-24 Trw Inc. Digital equalization of time interleaved analog to digital converters
USD335093S (en) * 1991-09-23 1993-04-27 Snap-On Tools Corporation Digital oscilloscope
US5352976A (en) 1992-01-31 1994-10-04 Tektronix, Inc. Multi-channel trigger dejitter
US5621310A (en) * 1994-07-15 1997-04-15 Tektronix, Inc. High frequency calibration circuit
US5521599A (en) 1994-10-14 1996-05-28 Tektronix, Inc. High speed analog signal sampling system
JPH09166623A (ja) 1995-12-14 1997-06-24 Hitachi Denshi Ltd サンプリングディジタイザ

Also Published As

Publication number Publication date
EP0875764B1 (de) 2004-07-28
US6269317B1 (en) 2001-07-31
DE69825204T2 (de) 2005-07-21
ATE272216T1 (de) 2004-08-15
EP0875764A2 (de) 1998-11-04
CA2236385A1 (en) 1998-10-30
CA2236385C (en) 2004-12-21
JPH1144710A (ja) 1999-02-16
EP0875764A3 (de) 2000-06-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee