DE69014790D1 - Eichung eines Lichtwellenanalysators zum Prüfen von optischen Vorrichtungen. - Google Patents

Eichung eines Lichtwellenanalysators zum Prüfen von optischen Vorrichtungen.

Info

Publication number
DE69014790D1
DE69014790D1 DE69014790T DE69014790T DE69014790D1 DE 69014790 D1 DE69014790 D1 DE 69014790D1 DE 69014790 T DE69014790 T DE 69014790T DE 69014790 T DE69014790 T DE 69014790T DE 69014790 D1 DE69014790 D1 DE 69014790D1
Authority
DE
Germany
Prior art keywords
lightwave
analyzer
calibration
optical devices
testing optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69014790T
Other languages
English (en)
Other versions
DE69014790T2 (de
Inventor
Michael G Hart
Roger W Wong
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE69014790D1 publication Critical patent/DE69014790D1/de
Application granted granted Critical
Publication of DE69014790T2 publication Critical patent/DE69014790T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE69014790T 1989-08-08 1990-07-25 Eichung eines Lichtwellenanalysators zum Prüfen von optischen Vorrichtungen. Expired - Fee Related DE69014790T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/391,057 US5175492A (en) 1989-08-08 1989-08-08 Calibration and error correction for electrical-source-to-e/o-device impedance mismatch and o/e-device-to-electrical-receiver impedance mismatch in a lightwave component analyzer

Publications (2)

Publication Number Publication Date
DE69014790D1 true DE69014790D1 (de) 1995-01-19
DE69014790T2 DE69014790T2 (de) 1995-06-01

Family

ID=23545043

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69014790T Expired - Fee Related DE69014790T2 (de) 1989-08-08 1990-07-25 Eichung eines Lichtwellenanalysators zum Prüfen von optischen Vorrichtungen.

Country Status (4)

Country Link
US (1) US5175492A (de)
EP (1) EP0418509B1 (de)
JP (1) JP3028835B2 (de)
DE (1) DE69014790T2 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5546325A (en) * 1993-02-04 1996-08-13 International Business Machines Corporation Automated system, and corresponding method, for testing electro-optic modules
US5471055A (en) * 1993-05-28 1995-11-28 The United States Of America As Represented By The Secretary Of The Army Focal plane array test facility
JP3424865B2 (ja) * 1994-11-15 2003-07-07 松下電器産業株式会社 光マルチパス測定方法
JP3453746B2 (ja) * 1995-02-09 2003-10-06 横河電機株式会社 光ファイバ検査装置
DE754939T1 (de) * 1995-02-02 1997-07-10 Yokogawa Electric Corp., Musashino, Tokio/Tokyo Messvorrichtung für optische fasern
US5808920A (en) * 1996-03-19 1998-09-15 Digital Lightwave, Inc. Communications line test apparatus with an improved graphical user interface
US6188968B1 (en) * 1998-05-18 2001-02-13 Agilent Technologies Inc. Removing effects of adapters present during vector network analyzer calibration
US6397160B1 (en) * 1999-06-04 2002-05-28 Teradyne, Inc. Power sensor module for microwave test systems
US6479979B1 (en) * 1999-07-09 2002-11-12 Srico, Inc. Opto-electric device for measuring the root-mean-square value of an alternating current voltage
US20040097996A1 (en) 1999-10-05 2004-05-20 Omnisonics Medical Technologies, Inc. Apparatus and method of removing occlusions using an ultrasonic medical device operating in a transverse mode
US6919728B2 (en) * 2002-02-27 2005-07-19 Lecroy Corporation Calibration cache and database
US6876935B2 (en) * 2002-09-24 2005-04-05 Murata Manufacturing Co., Ltd. Method for correcting measurement error, method of determining quality of electronic component, and device for measuring characteristic of electronic component
US6982405B2 (en) * 2003-04-28 2006-01-03 Dell Products L.P. System and method for using a photodiode to self-test an optical drive
US7794414B2 (en) 2004-02-09 2010-09-14 Emigrant Bank, N.A. Apparatus and method for an ultrasonic medical device operating in torsional and transverse modes
US8116638B2 (en) * 2006-05-30 2012-02-14 Harris Corporation Radio frequency (RF) signal receiver using optical processing and associated methods
US8508237B2 (en) * 2007-12-20 2013-08-13 Agilent Technologies, Inc. Network analyzer calibrator having electrical and electrooptical components
DE102008014039B4 (de) * 2008-03-13 2010-02-18 Spinner Gmbh Anordnung zum Kalibrieren eines Vektornetzwerkanalysators
CN101339234B (zh) * 2008-07-31 2012-05-09 国网电力科学研究院武汉南瑞有限责任公司 便携式cvt误差测试方法及装置
US9618599B2 (en) * 2011-09-28 2017-04-11 Keysight Technologies, Inc. Characterization and correction of voltage probe, current probe and cable
JP5835807B2 (ja) * 2012-07-04 2015-12-24 日本電信電話株式会社 光デバイスの周波数測定装置
US10171174B1 (en) * 2017-07-05 2019-01-01 Suzhou Liuyaosi Information Technology Co., Ltd. Method and system for optical vector analysis
US11041894B2 (en) 2017-08-18 2021-06-22 Rohde & Schwarz Gmbh & Co. Kg Vector network analyzer with digital interface

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4199816A (en) * 1978-06-28 1980-04-22 Humphrey Instruments, Inc. Optical calibration apparatus and procedure
US4816767A (en) * 1984-01-09 1989-03-28 Hewlett-Packard Company Vector network analyzer with integral processor
US4726676A (en) * 1986-02-06 1988-02-23 General Signal Corporation Optical signal power measurement method and apparatus
US4799789A (en) * 1987-02-27 1989-01-24 Anritsu Corporation Chromatic dispersion measuring system for optical fibers
US4845423A (en) * 1987-09-21 1989-07-04 Hewlett-Packard Company Electrically short air line for network analyzer calibration
JP3175935B2 (ja) * 1987-09-30 2001-06-11 株式会社東芝 光ファイバ応用センサ
US4921347A (en) * 1988-01-25 1990-05-01 Hewlett-Packard Company Method and apparatus for calibrating a lightwave component measurement system
JP2659554B2 (ja) * 1988-05-30 1997-09-30 浜松ホトニクス株式会社 光強度相関装置
US5041997A (en) * 1989-02-06 1991-08-20 Hewlett-Packard Company Lightwave component analyzer

Also Published As

Publication number Publication date
EP0418509A2 (de) 1991-03-27
JPH03206935A (ja) 1991-09-10
EP0418509B1 (de) 1994-12-07
DE69014790T2 (de) 1995-06-01
US5175492A (en) 1992-12-29
EP0418509A3 (en) 1992-07-01
JP3028835B2 (ja) 2000-04-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee