DE69733789D1 - Hochauflösendes Stromversorgungsprüfsystem - Google Patents

Hochauflösendes Stromversorgungsprüfsystem

Info

Publication number
DE69733789D1
DE69733789D1 DE69733789T DE69733789T DE69733789D1 DE 69733789 D1 DE69733789 D1 DE 69733789D1 DE 69733789 T DE69733789 T DE 69733789T DE 69733789 T DE69733789 T DE 69733789T DE 69733789 D1 DE69733789 D1 DE 69733789D1
Authority
DE
Germany
Prior art keywords
current
power supply
high resolution
test system
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69733789T
Other languages
English (en)
Other versions
DE69733789T2 (de
Inventor
Hans Manhaeve
Stefaan Kerckenaere
Viera Stopjakova
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Interuniversitair Microelektronica Centrum vzw IMEC
Katholieke Hogeschool Vives
Original Assignee
Katholieke Hogeschool Brugge Oostende KHBO
Interuniversitair Microelektronica Centrum vzw IMEC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Katholieke Hogeschool Brugge Oostende KHBO, Interuniversitair Microelektronica Centrum vzw IMEC filed Critical Katholieke Hogeschool Brugge Oostende KHBO
Application granted granted Critical
Publication of DE69733789D1 publication Critical patent/DE69733789D1/de
Publication of DE69733789T2 publication Critical patent/DE69733789T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE69733789T 1996-06-05 1997-05-29 Hochauflösendes Stromversorgungsprüfsystem Expired - Lifetime DE69733789T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US1935796P 1996-06-05 1996-06-05
US19357P 1996-06-05

Publications (2)

Publication Number Publication Date
DE69733789D1 true DE69733789D1 (de) 2005-09-01
DE69733789T2 DE69733789T2 (de) 2006-06-01

Family

ID=21792768

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69733789T Expired - Lifetime DE69733789T2 (de) 1996-06-05 1997-05-29 Hochauflösendes Stromversorgungsprüfsystem

Country Status (4)

Country Link
US (2) US6118293A (de)
EP (1) EP0811850B1 (de)
AT (1) ATE300741T1 (de)
DE (1) DE69733789T2 (de)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE300741T1 (de) * 1996-06-05 2005-08-15 Imec Inter Uni Micro Electr Hochauflösendes stromversorgungsprüfsystem
EP0880172B1 (de) * 1997-05-23 2007-01-17 Matsushita Electric Industrial Co., Ltd. Integrierte Halbleiterschaltung mit Testmode- und Normalbetriebsstrompfaden
WO2000029860A2 (en) * 1998-11-13 2000-05-25 Broadcom Corporation Dynamic register with iddq testing capability
US6859058B2 (en) * 1999-05-11 2005-02-22 Interuniversitair Microelektronica Centrum (Imec Uzw) Method and apparatus for testing electronic devices
US6496028B1 (en) * 1999-05-11 2002-12-17 Interuniversitair Micro-Elektronica Centrum Method and apparatus for testing electronic devices
US6661246B1 (en) * 2000-10-23 2003-12-09 Advanced Micro Devices, Inc. Constant-current VDDQ testing of integrated circuits
US6629048B1 (en) * 2000-11-20 2003-09-30 Tektronix, Inc. Measurement test instrument and associated voltage management system for accessory device
US6563080B2 (en) * 2001-02-15 2003-05-13 Scimed Life Systems, Inc. Laser cutting of stents and other medical devices
US6664801B1 (en) * 2001-05-21 2003-12-16 Lsi Logic Corporation IDDQ test methodology based on the sensitivity of fault current to power supply variations
US20040193977A1 (en) * 2001-12-20 2004-09-30 Cirrus Logic, Inc. Non-invasive, low pin count test circuits and methods utilizing emulated stress conditions
US20030222672A1 (en) * 2002-05-31 2003-12-04 Paul Winer Testing optical displays
US6759864B2 (en) * 2002-06-20 2004-07-06 Agilent Technologies, Inc. System and method for testing integrated circuits by transient signal analysis
EP1378758B1 (de) * 2002-07-03 2005-12-28 Q-Star Test N.V. Vorrichtung zum Messen des Ruhestromes einer elektronischen Vorrichtung
ATE335206T1 (de) * 2002-09-20 2006-08-15 Koninkl Philips Electronics Nv Verfahren und einrichtung zur ruhestrombestimmung
US20040156731A1 (en) * 2003-02-06 2004-08-12 Bond James R. Straight-cut motor shaft with pinned eccentric
US6828775B2 (en) * 2003-02-21 2004-12-07 Semtech Corporation High-impedance mode for precision measurement unit
TWI292146B (en) * 2003-08-13 2008-01-01 Via Tech Inc Display controller and related method for calibrating display driving voltages accordign to input resistance of a monitor
US7292046B2 (en) * 2003-09-03 2007-11-06 Infineon Technologies Ag Simulated module load
US7003421B1 (en) * 2003-11-03 2006-02-21 Lsi Logic Corporation VDD over and undervoltage measurement techniques using monitor cells
CN100516910C (zh) * 2003-11-05 2009-07-22 国际商业机器公司 用于iddq电流测量的可热切换型电压总线
US7272767B2 (en) * 2005-04-29 2007-09-18 Freescale Semiconductor, Inc. Methods and apparatus for incorporating IDDQ testing into logic BIST
US7532492B2 (en) * 2005-12-20 2009-05-12 Tektronix, Inc. Host controlled voltage input system for an accessory device
KR20090002849A (ko) * 2007-07-04 2009-01-09 삼성전자주식회사 비트라인 누설 전류를 검출하는 메모리 장치
US8278960B2 (en) * 2009-06-19 2012-10-02 Freescale Semiconductor, Inc. Method and circuit for measuring quiescent current
US8476917B2 (en) * 2010-01-29 2013-07-02 Freescale Semiconductor, Inc. Quiescent current (IDDQ) indication and testing apparatus and methods
DE102010012584A1 (de) * 2010-03-23 2011-09-29 Astrium Gmbh Schaltungsanordnung zur aktiven Klemmung eines Eintakt-Durchflusswandlers
US8330505B2 (en) * 2011-03-31 2012-12-11 Analog Devices, Inc. Protection circuit for driving capacitive loads
US8928407B2 (en) * 2013-03-11 2015-01-06 Futurewei Technologies, Inc. Current conveyor circuit and method
US9797938B2 (en) 2014-03-28 2017-10-24 International Business Machines Corporation Noise modulation for on-chip noise measurement
JP2019095294A (ja) * 2017-11-22 2019-06-20 ローム株式会社 半導体集積回路、そのテスト方法
US10509063B2 (en) * 2017-11-28 2019-12-17 Fluke Corporation Electrical signal measurement device using reference signal
CN116008768B (zh) * 2023-03-24 2023-07-25 杭州飞仕得科技股份有限公司 一种导通压降测试电路与结温测试仪

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8900050A (nl) * 1989-01-10 1990-08-01 Philips Nv Inrichting voor het meten van een ruststroom van een geintegreerde monolitische digitale schakeling, geintegreerde monolitische digitale schakeling voorzien van een dergelijke inrichting en testapparaat voorzien van een dergelijke inrichting.
GB2228384A (en) * 1989-02-17 1990-08-22 Philips Electronic Associated Current conveyor circuit
US4985672A (en) * 1989-12-11 1991-01-15 Advantest Corporation Test equipment for a low current IC
US5332973A (en) * 1992-05-01 1994-07-26 The University Of Manitoba Built-in fault testing of integrated circuits
US5392293A (en) * 1993-02-26 1995-02-21 At&T Corp. Built-in current sensor for IDDQ testing
US5351012A (en) * 1993-04-02 1994-09-27 Elantec, Inc. Low input resistance current-mode feedback operational amplifier input stage
US5352989A (en) * 1993-04-02 1994-10-04 Elantec, Inc. Low input resistance amplifier stage
EP0672911A1 (de) * 1994-02-25 1995-09-20 ALCATEL BELL Naamloze Vennootschap Prüfeinrichtung für Ruheversorgungsstrom
JP3119335B2 (ja) * 1994-03-08 2000-12-18 横河電機株式会社 Ｉｃ試験装置
US5731700A (en) * 1994-03-14 1998-03-24 Lsi Logic Corporation Quiescent power supply current test method and apparatus for integrated circuits
ATE300741T1 (de) * 1996-06-05 2005-08-15 Imec Inter Uni Micro Electr Hochauflösendes stromversorgungsprüfsystem

Also Published As

Publication number Publication date
DE69733789T2 (de) 2006-06-01
EP0811850A3 (de) 1998-09-02
ATE300741T1 (de) 2005-08-15
US6441633B1 (en) 2002-08-27
EP0811850A2 (de) 1997-12-10
EP0811850B1 (de) 2005-07-27
US6118293A (en) 2000-09-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition