DE69733789D1 - Hochauflösendes Stromversorgungsprüfsystem - Google Patents
Hochauflösendes StromversorgungsprüfsystemInfo
- Publication number
- DE69733789D1 DE69733789D1 DE69733789T DE69733789T DE69733789D1 DE 69733789 D1 DE69733789 D1 DE 69733789D1 DE 69733789 T DE69733789 T DE 69733789T DE 69733789 T DE69733789 T DE 69733789T DE 69733789 D1 DE69733789 D1 DE 69733789D1
- Authority
- DE
- Germany
- Prior art keywords
- current
- power supply
- high resolution
- test system
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US1935796P | 1996-06-05 | 1996-06-05 | |
US19357P | 1996-06-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69733789D1 true DE69733789D1 (de) | 2005-09-01 |
DE69733789T2 DE69733789T2 (de) | 2006-06-01 |
Family
ID=21792768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69733789T Expired - Lifetime DE69733789T2 (de) | 1996-06-05 | 1997-05-29 | Hochauflösendes Stromversorgungsprüfsystem |
Country Status (4)
Country | Link |
---|---|
US (2) | US6118293A (de) |
EP (1) | EP0811850B1 (de) |
AT (1) | ATE300741T1 (de) |
DE (1) | DE69733789T2 (de) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0811850B1 (de) * | 1996-06-05 | 2005-07-27 | Interuniversitair Micro-Elektronica Centrum Vzw | Hochauflösendes Stromversorgungsprüfsystem |
KR100506667B1 (ko) * | 1997-05-23 | 2005-09-26 | 마츠시타 덴끼 산교 가부시키가이샤 | 반도체 집적회로 |
ATE240532T1 (de) * | 1998-11-13 | 2003-05-15 | Broadcom Corp | Dynamisches register mit der fähigkeit zur prüfung der ruhestromaufnahme (iddq) |
US6496028B1 (en) * | 1999-05-11 | 2002-12-17 | Interuniversitair Micro-Elektronica Centrum | Method and apparatus for testing electronic devices |
US6859058B2 (en) * | 1999-05-11 | 2005-02-22 | Interuniversitair Microelektronica Centrum (Imec Uzw) | Method and apparatus for testing electronic devices |
US6661246B1 (en) * | 2000-10-23 | 2003-12-09 | Advanced Micro Devices, Inc. | Constant-current VDDQ testing of integrated circuits |
US6629048B1 (en) * | 2000-11-20 | 2003-09-30 | Tektronix, Inc. | Measurement test instrument and associated voltage management system for accessory device |
US6563080B2 (en) * | 2001-02-15 | 2003-05-13 | Scimed Life Systems, Inc. | Laser cutting of stents and other medical devices |
US6664801B1 (en) * | 2001-05-21 | 2003-12-16 | Lsi Logic Corporation | IDDQ test methodology based on the sensitivity of fault current to power supply variations |
US20040193977A1 (en) * | 2001-12-20 | 2004-09-30 | Cirrus Logic, Inc. | Non-invasive, low pin count test circuits and methods utilizing emulated stress conditions |
US20030222672A1 (en) * | 2002-05-31 | 2003-12-04 | Paul Winer | Testing optical displays |
US6759864B2 (en) * | 2002-06-20 | 2004-07-06 | Agilent Technologies, Inc. | System and method for testing integrated circuits by transient signal analysis |
EP1378758B1 (de) | 2002-07-03 | 2005-12-28 | Q-Star Test N.V. | Vorrichtung zum Messen des Ruhestromes einer elektronischen Vorrichtung |
KR20050057517A (ko) * | 2002-09-20 | 2005-06-16 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 회로의 정지 전류를 테스팅하는 테스트 장치 및 디바이스테스트 방법과 집적 회로 |
US20040156731A1 (en) * | 2003-02-06 | 2004-08-12 | Bond James R. | Straight-cut motor shaft with pinned eccentric |
US6828775B2 (en) * | 2003-02-21 | 2004-12-07 | Semtech Corporation | High-impedance mode for precision measurement unit |
TWI292146B (en) * | 2003-08-13 | 2008-01-01 | Via Tech Inc | Display controller and related method for calibrating display driving voltages accordign to input resistance of a monitor |
US7292046B2 (en) * | 2003-09-03 | 2007-11-06 | Infineon Technologies Ag | Simulated module load |
US7003421B1 (en) * | 2003-11-03 | 2006-02-21 | Lsi Logic Corporation | VDD over and undervoltage measurement techniques using monitor cells |
CN100516910C (zh) * | 2003-11-05 | 2009-07-22 | 国际商业机器公司 | 用于iddq电流测量的可热切换型电压总线 |
US7272767B2 (en) * | 2005-04-29 | 2007-09-18 | Freescale Semiconductor, Inc. | Methods and apparatus for incorporating IDDQ testing into logic BIST |
US7532492B2 (en) * | 2005-12-20 | 2009-05-12 | Tektronix, Inc. | Host controlled voltage input system for an accessory device |
KR20090002849A (ko) * | 2007-07-04 | 2009-01-09 | 삼성전자주식회사 | 비트라인 누설 전류를 검출하는 메모리 장치 |
US8278960B2 (en) * | 2009-06-19 | 2012-10-02 | Freescale Semiconductor, Inc. | Method and circuit for measuring quiescent current |
US8476917B2 (en) * | 2010-01-29 | 2013-07-02 | Freescale Semiconductor, Inc. | Quiescent current (IDDQ) indication and testing apparatus and methods |
DE102010012584A1 (de) * | 2010-03-23 | 2011-09-29 | Astrium Gmbh | Schaltungsanordnung zur aktiven Klemmung eines Eintakt-Durchflusswandlers |
US8330505B2 (en) * | 2011-03-31 | 2012-12-11 | Analog Devices, Inc. | Protection circuit for driving capacitive loads |
US8928407B2 (en) * | 2013-03-11 | 2015-01-06 | Futurewei Technologies, Inc. | Current conveyor circuit and method |
US9797938B2 (en) | 2014-03-28 | 2017-10-24 | International Business Machines Corporation | Noise modulation for on-chip noise measurement |
JP2019095294A (ja) * | 2017-11-22 | 2019-06-20 | ローム株式会社 | 半導体集積回路、そのテスト方法 |
US10509063B2 (en) * | 2017-11-28 | 2019-12-17 | Fluke Corporation | Electrical signal measurement device using reference signal |
CN116008768B (zh) * | 2023-03-24 | 2023-07-25 | 杭州飞仕得科技股份有限公司 | 一种导通压降测试电路与结温测试仪 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL8900050A (nl) * | 1989-01-10 | 1990-08-01 | Philips Nv | Inrichting voor het meten van een ruststroom van een geintegreerde monolitische digitale schakeling, geintegreerde monolitische digitale schakeling voorzien van een dergelijke inrichting en testapparaat voorzien van een dergelijke inrichting. |
GB2228384A (en) * | 1989-02-17 | 1990-08-22 | Philips Electronic Associated | Current conveyor circuit |
US4985672A (en) * | 1989-12-11 | 1991-01-15 | Advantest Corporation | Test equipment for a low current IC |
US5332973A (en) * | 1992-05-01 | 1994-07-26 | The University Of Manitoba | Built-in fault testing of integrated circuits |
US5392293A (en) * | 1993-02-26 | 1995-02-21 | At&T Corp. | Built-in current sensor for IDDQ testing |
US5351012A (en) * | 1993-04-02 | 1994-09-27 | Elantec, Inc. | Low input resistance current-mode feedback operational amplifier input stage |
US5352989A (en) * | 1993-04-02 | 1994-10-04 | Elantec, Inc. | Low input resistance amplifier stage |
EP0672911A1 (de) * | 1994-02-25 | 1995-09-20 | ALCATEL BELL Naamloze Vennootschap | Prüfeinrichtung für Ruheversorgungsstrom |
JP3119335B2 (ja) * | 1994-03-08 | 2000-12-18 | 横河電機株式会社 | Ic試験装置 |
US5731700A (en) * | 1994-03-14 | 1998-03-24 | Lsi Logic Corporation | Quiescent power supply current test method and apparatus for integrated circuits |
EP0811850B1 (de) * | 1996-06-05 | 2005-07-27 | Interuniversitair Micro-Elektronica Centrum Vzw | Hochauflösendes Stromversorgungsprüfsystem |
-
1997
- 1997-05-29 EP EP97870078A patent/EP0811850B1/de not_active Expired - Lifetime
- 1997-05-29 DE DE69733789T patent/DE69733789T2/de not_active Expired - Lifetime
- 1997-05-29 AT AT97870078T patent/ATE300741T1/de not_active IP Right Cessation
- 1997-05-30 US US08/866,543 patent/US6118293A/en not_active Expired - Lifetime
-
2000
- 2000-07-17 US US09/617,694 patent/US6441633B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
ATE300741T1 (de) | 2005-08-15 |
EP0811850B1 (de) | 2005-07-27 |
EP0811850A2 (de) | 1997-12-10 |
US6441633B1 (en) | 2002-08-27 |
DE69733789T2 (de) | 2006-06-01 |
EP0811850A3 (de) | 1998-09-02 |
US6118293A (en) | 2000-09-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |