DE69719534D1 - Spineffektabhängiger tunnelspeicher - Google Patents
Spineffektabhängiger tunnelspeicherInfo
- Publication number
- DE69719534D1 DE69719534D1 DE69719534T DE69719534T DE69719534D1 DE 69719534 D1 DE69719534 D1 DE 69719534D1 DE 69719534 T DE69719534 T DE 69719534T DE 69719534 T DE69719534 T DE 69719534T DE 69719534 D1 DE69719534 D1 DE 69719534D1
- Authority
- DE
- Germany
- Prior art keywords
- based tunnel
- tunnel storage
- spine
- spine effect
- effect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1659—Cell access
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5607—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using magnetic storage elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
- G11C14/0054—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a SRAM cell
- G11C14/0081—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a SRAM cell and the nonvolatile element is a magnetic RAM [MRAM] element or ferromagnetic cell
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/18—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being compounds
- H01F10/20—Ferrites
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/18—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being compounds
- H01F10/20—Ferrites
- H01F10/205—Hexagonal ferrites
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3254—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
- H10B61/10—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having two electrodes, e.g. diodes or MIM elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
- H10B61/20—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors
- H10B61/22—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors of the field-effect transistor [FET] type
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Power Engineering (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Semiconductor Memories (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US3023696P | 1996-11-08 | 1996-11-08 | |
US30236P | 1996-11-08 | ||
US08/965,333 US6021065A (en) | 1996-09-06 | 1997-11-06 | Spin dependent tunneling memory |
PCT/US1997/020373 WO1998020496A1 (en) | 1996-11-08 | 1997-11-07 | Spin dependent tunneling memory |
US965333 | 1997-11-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69719534D1 true DE69719534D1 (de) | 2003-04-10 |
DE69719534T2 DE69719534T2 (de) | 2004-04-08 |
Family
ID=26705805
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69735780T Expired - Lifetime DE69735780T2 (de) | 1996-11-08 | 1997-11-07 | Ferromagnetischer Speicher vom fip-flop Typ |
DE69719534T Expired - Lifetime DE69719534T2 (de) | 1996-11-08 | 1997-11-07 | Spineffektabhängiger tunnelspeicher |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69735780T Expired - Lifetime DE69735780T2 (de) | 1996-11-08 | 1997-11-07 | Ferromagnetischer Speicher vom fip-flop Typ |
Country Status (6)
Country | Link |
---|---|
US (1) | US6021065A (de) |
EP (1) | EP0937302B8 (de) |
JP (1) | JP2002515183A (de) |
CA (1) | CA2269539A1 (de) |
DE (2) | DE69735780T2 (de) |
WO (1) | WO1998020496A1 (de) |
Families Citing this family (60)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6590750B2 (en) * | 1996-03-18 | 2003-07-08 | International Business Machines Corporation | Limiting magnetoresistive electrical interaction to a preferred portion of a magnetic region in magnetic devices |
US6147900A (en) * | 1997-11-06 | 2000-11-14 | Nonvolatile Electronics, Incorporated | Spin dependent tunneling memory |
US6072382A (en) * | 1998-01-06 | 2000-06-06 | Nonvolatile Electronics, Incorporated | Spin dependent tunneling sensor |
US6269027B1 (en) * | 1998-04-14 | 2001-07-31 | Honeywell, Inc. | Non-volatile storage latch |
EP0971424A3 (de) * | 1998-07-10 | 2004-08-25 | Interuniversitair Microelektronica Centrum Vzw | Spin-Valve Struktur und Herstellungsverfahren |
CN1249398C (zh) * | 1998-09-07 | 2006-04-05 | 坤特精密仪器有限公司 | 采用细长导电体之间的隧道效应电流的测量方法 |
US6016269A (en) * | 1998-09-30 | 2000-01-18 | Motorola, Inc. | Quantum random address memory with magnetic readout and/or nano-memory elements |
US6483736B2 (en) | 1998-11-16 | 2002-11-19 | Matrix Semiconductor, Inc. | Vertically stacked field programmable nonvolatile memory and method of fabrication |
DE19914488C1 (de) * | 1999-03-30 | 2000-05-31 | Siemens Ag | Vorrichtung zur Bewertung der Zellenwiderstände in einem magnetoresistiven Speicher |
SG85643A1 (en) * | 1999-05-21 | 2002-01-15 | Inst Data Storage | Magnetic memory storage cell and process for reading and writing data from and to same |
US6219274B1 (en) * | 1999-06-08 | 2001-04-17 | Tdk Corporation | Ferromagnetic tunnel magnetoresistance effect element and method of producing the same |
US6343032B1 (en) * | 1999-07-07 | 2002-01-29 | Iowa State University Research Foundation, Inc. | Non-volatile spin dependent tunnel junction circuit |
US6317359B1 (en) * | 1999-07-07 | 2001-11-13 | Iowa State University Research Foundation, Inc. | Non-volatile magnetic circuit |
US6542000B1 (en) | 1999-07-30 | 2003-04-01 | Iowa State University Research Foundation, Inc. | Nonvolatile programmable logic devices |
US6178111B1 (en) | 1999-12-07 | 2001-01-23 | Honeywell Inc. | Method and apparatus for writing data states to non-volatile storage devices |
US6473336B2 (en) | 1999-12-16 | 2002-10-29 | Kabushiki Kaisha Toshiba | Magnetic memory device |
US8575719B2 (en) | 2000-04-28 | 2013-11-05 | Sandisk 3D Llc | Silicon nitride antifuse for use in diode-antifuse memory arrays |
US6396733B1 (en) | 2000-07-17 | 2002-05-28 | Micron Technology, Inc. | Magneto-resistive memory having sense amplifier with offset control |
US6493258B1 (en) | 2000-07-18 | 2002-12-10 | Micron Technology, Inc. | Magneto-resistive memory array |
GB0019618D0 (en) * | 2000-08-09 | 2000-09-27 | Scient Generics Ltd | Spin memory device |
US6392922B1 (en) | 2000-08-14 | 2002-05-21 | Micron Technology, Inc. | Passivated magneto-resistive bit structure and passivation method therefor |
US6363007B1 (en) | 2000-08-14 | 2002-03-26 | Micron Technology, Inc. | Magneto-resistive memory with shared wordline and sense line |
US6493259B1 (en) | 2000-08-14 | 2002-12-10 | Micron Technology, Inc. | Pulse write techniques for magneto-resistive memories |
US6724654B1 (en) | 2000-08-14 | 2004-04-20 | Micron Technology, Inc. | Pulsed write techniques for magneto-resistive memories |
US6538921B2 (en) * | 2000-08-17 | 2003-03-25 | Nve Corporation | Circuit selection of magnetic memory cells and related cell structures |
DE10060432A1 (de) * | 2000-12-05 | 2002-07-25 | Infineon Technologies Ag | Magnetoresistiver Speicher und Verfahren zu seinem Auslesen |
JP2002230965A (ja) * | 2001-01-24 | 2002-08-16 | Internatl Business Mach Corp <Ibm> | 不揮発性メモリ装置 |
US6515895B2 (en) * | 2001-01-31 | 2003-02-04 | Motorola, Inc. | Non-volatile magnetic register |
US6674664B2 (en) | 2001-05-07 | 2004-01-06 | Nve Corporation | Circuit selected joint magnetoresistive junction tunneling-giant magnetoresistive effects memory cells |
US6744086B2 (en) | 2001-05-15 | 2004-06-01 | Nve Corporation | Current switched magnetoresistive memory cell |
US6693826B1 (en) | 2001-07-30 | 2004-02-17 | Iowa State University Research Foundation, Inc. | Magnetic memory sensing method and apparatus |
US6485989B1 (en) | 2001-08-30 | 2002-11-26 | Micron Technology, Inc. | MRAM sense layer isolation |
US6777730B2 (en) * | 2001-08-31 | 2004-08-17 | Nve Corporation | Antiparallel magnetoresistive memory cells |
US6821848B2 (en) | 2002-04-02 | 2004-11-23 | Hewlett-Packard Development Company, L.P. | Tunnel-junction structures and methods |
US6783995B2 (en) | 2002-04-30 | 2004-08-31 | Micron Technology, Inc. | Protective layers for MRAM devices |
US6739132B2 (en) | 2002-04-30 | 2004-05-25 | Adc Telecommunications, Inc. | Thermal micro-actuator based on selective electrical excitation |
WO2003105156A1 (ja) * | 2002-06-05 | 2003-12-18 | 松下電器産業株式会社 | 不揮発性メモリ回路及びその駆動方法並びにそのメモリ回路を用いた半導体装置 |
US6714441B1 (en) | 2002-09-17 | 2004-03-30 | Micron Technology, Inc. | Bridge-type magnetic random access memory (MRAM) latch |
AU2003275147A1 (en) * | 2002-09-30 | 2004-04-23 | Seagate Technology Llc | Suppression of thermal noise using spin transfer in magnetoresistive elements |
US7126200B2 (en) * | 2003-02-18 | 2006-10-24 | Micron Technology, Inc. | Integrated circuits with contemporaneously formed array electrodes and logic interconnects |
US7112454B2 (en) | 2003-10-14 | 2006-09-26 | Micron Technology, Inc. | System and method for reducing shorting in memory cells |
WO2005043545A1 (en) * | 2003-10-31 | 2005-05-12 | Agency For Science, Technology And Research | Nano-contacted magnetic memory device |
FR2866750B1 (fr) * | 2004-02-23 | 2006-04-21 | Centre Nat Rech Scient | Memoire magnetique a jonction tunnel magnetique et procede pour son ecriture |
FR2869445B1 (fr) * | 2004-04-26 | 2006-07-07 | St Microelectronics Sa | Element de memoire vive magnetique |
JP2005317739A (ja) * | 2004-04-28 | 2005-11-10 | Toshiba Corp | 磁気記憶装置およびその製造方法 |
US7339818B2 (en) | 2004-06-04 | 2008-03-04 | Micron Technology, Inc. | Spintronic devices with integrated transistors |
CA2573406A1 (en) * | 2004-07-27 | 2006-02-02 | University Of Toronto | Tunable magnetic switch |
US20060262593A1 (en) * | 2004-07-27 | 2006-11-23 | Stephane Aouba | Magnetic memory composition and method of manufacture |
US7777607B2 (en) * | 2004-10-12 | 2010-08-17 | Allegro Microsystems, Inc. | Resistor having a predetermined temperature coefficient |
US7701756B2 (en) | 2005-12-21 | 2010-04-20 | Governing Council Of The University Of Toronto | Magnetic memory composition and method of manufacture |
US20070279969A1 (en) * | 2006-06-02 | 2007-12-06 | Raytheon Company | Intrusion detection apparatus and method |
US7795862B2 (en) | 2007-10-22 | 2010-09-14 | Allegro Microsystems, Inc. | Matching of GMR sensors in a bridge |
FR2924851B1 (fr) * | 2007-12-05 | 2009-11-20 | Commissariat Energie Atomique | Element magnetique a ecriture assistee thermiquement. |
FR2925747B1 (fr) | 2007-12-21 | 2010-04-09 | Commissariat Energie Atomique | Memoire magnetique a ecriture assistee thermiquement |
FR2929041B1 (fr) * | 2008-03-18 | 2012-11-30 | Crocus Technology | Element magnetique a ecriture assistee thermiquement |
FR2931011B1 (fr) | 2008-05-06 | 2010-05-28 | Commissariat Energie Atomique | Element magnetique a ecriture assistee thermiquement |
JP5526141B2 (ja) * | 2009-09-29 | 2014-06-18 | 株式会社東芝 | 磁性発振素子 |
DE102010055754A1 (de) * | 2010-12-22 | 2012-06-28 | Sensitec Gmbh | Magnetoresistives Sensorelement |
CN105393306B (zh) * | 2013-06-29 | 2018-08-21 | 英特尔公司 | 用于存储器和逻辑单元的磁性元件 |
US11187764B2 (en) | 2020-03-20 | 2021-11-30 | Allegro Microsystems, Llc | Layout of magnetoresistance element |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5390061A (en) * | 1990-06-08 | 1995-02-14 | Hitachi, Ltd. | Multilayer magnetoresistance effect-type magnetic head |
US5173873A (en) * | 1990-06-28 | 1992-12-22 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | High speed magneto-resistive random access memory |
FR2665011B1 (fr) * | 1990-07-20 | 1992-09-18 | Thomson Csf | Tete magnetique de lecture a effet magneto-resistif. |
US5251170A (en) * | 1991-11-04 | 1993-10-05 | Nonvolatile Electronics, Incorporated | Offset magnetoresistive memory structures |
JP3270765B2 (ja) * | 1992-03-03 | 2002-04-02 | ローム株式会社 | 不揮発性記憶素子 |
US5448515A (en) * | 1992-09-02 | 1995-09-05 | Mitsubishi Denki Kabushiki Kaisha | Magnetic thin film memory and recording/reproduction method therefor |
US5420819A (en) * | 1992-09-24 | 1995-05-30 | Nonvolatile Electronics, Incorporated | Method for sensing data in a magnetoresistive memory using large fractions of memory cell films for data storage |
US5576915A (en) * | 1993-03-15 | 1996-11-19 | Kabushiki Kaisha Toshiba | Magnetoresistive head with antiferromagnetic sublayers interposed between first and second spin-valve units to exchange bias inner magnetic films thereof |
US5452163A (en) * | 1993-12-23 | 1995-09-19 | International Business Machines Corporation | Multilayer magnetoresistive sensor |
US5561368A (en) * | 1994-11-04 | 1996-10-01 | International Business Machines Corporation | Bridge circuit magnetic field sensor having spin valve magnetoresistive elements formed on common substrate |
JP3672954B2 (ja) * | 1994-12-26 | 2005-07-20 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
US5629922A (en) * | 1995-02-22 | 1997-05-13 | Massachusetts Institute Of Technology | Electron tunneling device using ferromagnetic thin films |
US5650958A (en) * | 1996-03-18 | 1997-07-22 | International Business Machines Corporation | Magnetic tunnel junctions with controlled magnetic response |
US5640343A (en) * | 1996-03-18 | 1997-06-17 | International Business Machines Corporation | Magnetic memory array using magnetic tunnel junction devices in the memory cells |
US5648930A (en) * | 1996-06-28 | 1997-07-15 | Symbios Logic Inc. | Non-volatile memory which is programmable from a power source |
US5966322A (en) * | 1996-09-06 | 1999-10-12 | Nonvolatile Electronics, Incorporated | Giant magnetoresistive effect memory cell |
-
1997
- 1997-11-06 US US08/965,333 patent/US6021065A/en not_active Expired - Lifetime
- 1997-11-07 DE DE69735780T patent/DE69735780T2/de not_active Expired - Lifetime
- 1997-11-07 DE DE69719534T patent/DE69719534T2/de not_active Expired - Lifetime
- 1997-11-07 JP JP52181098A patent/JP2002515183A/ja active Pending
- 1997-11-07 EP EP97949382A patent/EP0937302B8/de not_active Expired - Lifetime
- 1997-11-07 WO PCT/US1997/020373 patent/WO1998020496A1/en active IP Right Grant
- 1997-11-07 CA CA002269539A patent/CA2269539A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO1998020496A1 (en) | 1998-05-14 |
JP2002515183A (ja) | 2002-05-21 |
US6021065A (en) | 2000-02-01 |
EP0937302A4 (de) | 2000-09-20 |
EP0937302B1 (de) | 2003-03-05 |
DE69735780D1 (de) | 2006-06-01 |
DE69735780T2 (de) | 2006-12-07 |
EP0937302A1 (de) | 1999-08-25 |
DE69719534T2 (de) | 2004-04-08 |
EP0937302B8 (de) | 2012-10-24 |
CA2269539A1 (en) | 1998-05-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |