DE69714117T2 - Heteroübergang-PIN-Photodiode - Google Patents

Heteroübergang-PIN-Photodiode

Info

Publication number
DE69714117T2
DE69714117T2 DE69714117T DE69714117T DE69714117T2 DE 69714117 T2 DE69714117 T2 DE 69714117T2 DE 69714117 T DE69714117 T DE 69714117T DE 69714117 T DE69714117 T DE 69714117T DE 69714117 T2 DE69714117 T2 DE 69714117T2
Authority
DE
Germany
Prior art keywords
pin photodiode
heterojunction pin
heterojunction
photodiode
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69714117T
Other languages
English (en)
Other versions
DE69714117D1 (de
Inventor
Tadao Ishibashi
Tomofumi Furuta
Naofumi Shimizu
Koichi Nagata
Yutaka Matsuoka
Masaaki Tomizawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP08370496A external-priority patent/JP3687700B2/ja
Priority claimed from JP2868297A external-priority patent/JPH10223647A/ja
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Application granted granted Critical
Publication of DE69714117D1 publication Critical patent/DE69714117D1/de
Publication of DE69714117T2 publication Critical patent/DE69714117T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
    • H01L31/105Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/548Amorphous silicon PV cells

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Light Receiving Elements (AREA)
DE69714117T 1996-04-05 1997-04-04 Heteroübergang-PIN-Photodiode Expired - Lifetime DE69714117T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP08370496A JP3687700B2 (ja) 1996-04-05 1996-04-05 フォトダイオード
JP2868297A JPH10223647A (ja) 1997-02-13 1997-02-13 半導体装置

Publications (2)

Publication Number Publication Date
DE69714117D1 DE69714117D1 (de) 2002-08-29
DE69714117T2 true DE69714117T2 (de) 2003-03-06

Family

ID=26366820

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69714117T Expired - Lifetime DE69714117T2 (de) 1996-04-05 1997-04-04 Heteroübergang-PIN-Photodiode

Country Status (3)

Country Link
US (1) US5818096A (de)
EP (1) EP0800219B1 (de)
DE (1) DE69714117T2 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007006211B3 (de) * 2007-02-08 2008-07-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Heteroübergang-pin-Photodiode und deren Verwendung

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US6262465B1 (en) * 1998-09-25 2001-07-17 Picometrix, Inc. Highly-doped P-type contact for high-speed, front-side illuminated photodiode
US6326649B1 (en) 1999-01-13 2001-12-04 Agere Systems, Inc. Pin photodiode having a wide bandwidth
US7473754B1 (en) 2000-10-17 2009-01-06 Ppg Industries Ohio, Inc. Optical resin composition
US6429499B1 (en) 2000-05-18 2002-08-06 International Business Machines Corporation Method and apparatus for a monolithic integrated MESFET and p-i-n optical receiver
US7202102B2 (en) * 2001-11-27 2007-04-10 Jds Uniphase Corporation Doped absorption for enhanced responsivity for high speed photodiodes
JP4061057B2 (ja) * 2001-12-04 2008-03-12 Nttエレクトロニクス株式会社 フォトダイオード
KR100766174B1 (ko) * 2002-02-01 2007-10-10 피코메트릭스 인코포레이티드 개선된 광검출기
WO2003065418A2 (en) * 2002-02-01 2003-08-07 Picometrix, Inc. Planar avalanche photodiode
US20050029541A1 (en) * 2002-02-01 2005-02-10 Ko Cheng C. Charge controlled avalanche photodiode and method of making the same
US7110629B2 (en) * 2002-07-22 2006-09-19 Applied Materials, Inc. Optical ready substrates
US6831309B2 (en) * 2002-12-18 2004-12-14 Agilent Technologies, Inc. Unipolar photodiode having a schottky junction contact
US6815790B2 (en) * 2003-01-10 2004-11-09 Rapiscan, Inc. Position sensing detector for the detection of light within two dimensions
US6740908B1 (en) 2003-03-18 2004-05-25 Agilent Technologies, Inc. Extended drift heterostructure photodiode having enhanced electron response
US7256470B2 (en) * 2005-03-16 2007-08-14 Udt Sensors, Inc. Photodiode with controlled current leakage
US7279731B1 (en) * 2006-05-15 2007-10-09 Udt Sensors, Inc. Edge illuminated photodiodes
US7709921B2 (en) 2008-08-27 2010-05-04 Udt Sensors, Inc. Photodiode and photodiode array with improved performance characteristics
US8120023B2 (en) 2006-06-05 2012-02-21 Udt Sensors, Inc. Low crosstalk, front-side illuminated, back-side contact photodiode array
US7242069B2 (en) * 2003-05-05 2007-07-10 Udt Sensors, Inc. Thin wafer detectors with improved radiation damage and crosstalk characteristics
US8035183B2 (en) * 2003-05-05 2011-10-11 Udt Sensors, Inc. Photodiodes with PN junction on both front and back sides
US7656001B2 (en) 2006-11-01 2010-02-02 Udt Sensors, Inc. Front-side illuminated, back-side contact double-sided PN-junction photodiode arrays
US8519503B2 (en) * 2006-06-05 2013-08-27 Osi Optoelectronics, Inc. High speed backside illuminated, front side contact photodiode array
US7576369B2 (en) * 2005-10-25 2009-08-18 Udt Sensors, Inc. Deep diffused thin photodiodes
US7880258B2 (en) * 2003-05-05 2011-02-01 Udt Sensors, Inc. Thin wafer detectors with improved radiation damage and crosstalk characteristics
US7655999B2 (en) * 2006-09-15 2010-02-02 Udt Sensors, Inc. High density photodiodes
US8164151B2 (en) * 2007-05-07 2012-04-24 Osi Optoelectronics, Inc. Thin active layer fishbone photodiode and method of manufacturing the same
US7057254B2 (en) * 2003-05-05 2006-06-06 Udt Sensors, Inc. Front illuminated back side contact thin wafer detectors
US8686529B2 (en) * 2010-01-19 2014-04-01 Osi Optoelectronics, Inc. Wavelength sensitive sensor photodiodes
CN1856860A (zh) * 2003-05-29 2006-11-01 应用材料股份有限公司 埋置式波导检测器
EP1627454A4 (de) * 2003-05-29 2007-04-25 Applied Materials Inc Auf verunreinigungen basierende wellenleiterdetektoren
TWI228320B (en) * 2003-09-09 2005-02-21 Ind Tech Res Inst An avalanche photo-detector(APD) with high saturation power, high gain-bandwidth product
US7205624B2 (en) 2003-10-07 2007-04-17 Applied Materials, Inc. Self-aligned implanted waveguide detector
WO2007027615A1 (en) * 2005-09-01 2007-03-08 Applied Materials, Inc. Ridge technique for fabricating an optical detector and an optical waveguide
GB0606540D0 (en) * 2006-03-31 2006-05-10 Univ London Photodetector
US9178092B2 (en) 2006-11-01 2015-11-03 Osi Optoelectronics, Inc. Front-side illuminated, back-side contact double-sided PN-junction photodiode arrays
US20100053802A1 (en) * 2008-08-27 2010-03-04 Masaki Yamashita Low Power Disk-Drive Motor Driver
WO2009071916A1 (en) * 2007-12-06 2009-06-11 The University Of Sheffield Infrared avalanche photodiode structure with low excess noise and its manufacturing method
TW201001736A (en) * 2008-06-19 2010-01-01 Univ Nat Central A high-speed avalanche photodiode
BRPI0919221A2 (pt) 2008-09-15 2015-12-08 Osi Optoelectronics Inc fotodiodo de espinha de peixe de camada ativa fina com uma camada n+ rasa e método de fabricação do mesmo
US8399909B2 (en) 2009-05-12 2013-03-19 Osi Optoelectronics, Inc. Tetra-lateral position sensing detector
JP2014090138A (ja) * 2012-10-31 2014-05-15 Ntt Electornics Corp フォトダイオード
US8912615B2 (en) 2013-01-24 2014-12-16 Osi Optoelectronics, Inc. Shallow junction photodiode for detecting short wavelength light
EP2808908B1 (de) 2013-05-31 2023-04-19 Mellanox Technologies, Ltd. Schneller Fotodetektor
LT6044B (lt) 2013-07-22 2014-06-25 Valstybinis mokslinių tyrimų institutas Fizinių ir technologijos mokslų centras Didelės spartos fotodiodas
US11152410B2 (en) 2019-12-19 2021-10-19 Globalfoundries Singapore Pte. Ltd. Image sensor with reduced capacitance transfer gate

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4608586A (en) * 1984-05-11 1986-08-26 At&T Bell Laboratories Back-illuminated photodiode with a wide bandgap cap layer
JPS62169376A (ja) * 1986-01-21 1987-07-25 Nec Corp フオトダイオ−ド
US5051804A (en) * 1989-12-01 1991-09-24 The United States Of America As Represented By The United States Department Of Energy Photodetector having high speed and sensitivity
JP2719230B2 (ja) * 1990-11-22 1998-02-25 キヤノン株式会社 光起電力素子
US5576559A (en) * 1994-11-01 1996-11-19 Intevac, Inc. Heterojunction electron transfer device
JP2601231B2 (ja) * 1994-12-22 1997-04-16 日本電気株式会社 超格子アバランシェフォトダイオード

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007006211B3 (de) * 2007-02-08 2008-07-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Heteroübergang-pin-Photodiode und deren Verwendung

Also Published As

Publication number Publication date
US5818096A (en) 1998-10-06
EP0800219B1 (de) 2002-07-24
EP0800219A3 (de) 1998-07-08
DE69714117D1 (de) 2002-08-29
EP0800219A2 (de) 1997-10-08

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Legal Events

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8364 No opposition during term of opposition